| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/25/2006 | US20060109022 Test structure design for reliability test |
| 05/25/2006 | US20060109021 Method for modeling inductive effects on circuit performance |
| 05/25/2006 | US20060109020 Method for capacitance measurement in silicon |
| 05/25/2006 | US20060109019 On-die monitoring device power grid |
| 05/25/2006 | US20060109018 Arrangement for contacting an integrated circuit in a package |
| 05/25/2006 | US20060109017 Probe card having deeply recessed trench and method for manufacturing the same |
| 05/25/2006 | US20060109016 Microprobe tips and methods for making |
| 05/25/2006 | US20060109015 Probe module for testing chips with electrical and optical input/output interconnects, methods of use, and methods of fabrication |
| 05/25/2006 | US20060109014 Test pad and probe card for wafer acceptance testing and other applications |
| 05/25/2006 | US20060109009 Method and device for the detection of fault current arcing in electric circuits |
| 05/25/2006 | US20060108997 Apparatus and method for detecting photon emissions from transistors |
| 05/25/2006 | US20060108984 Method and system for battery protection |
| 05/25/2006 | US20060108875 Integrity testing of isolation means in an uninterruptible power supply |
| 05/24/2006 | EP1659415A2 Integrity testing of isolation means in an uninterruptible power supply |
| 05/24/2006 | EP1659414A1 Capacitor deterioration judgment method |
| 05/24/2006 | EP1658509A1 System for detecting and locating faults in an electric fence |
| 05/24/2006 | EP1364436B1 Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (dfd) techniques |
| 05/24/2006 | EP1290458B1 Method for measuring fault locations in high frequency cables and lines |
| 05/24/2006 | EP1212626A4 Method for testing circuits |
| 05/24/2006 | EP1129362A4 Method and apparatus for minimizing semiconductor wafer arcing during semiconductor wafer processing |
| 05/24/2006 | EP0836196B1 Improvements in or relating to non-volatile memory devices |
| 05/24/2006 | DE69831900T2 Programmier-Modus-Auswahl mit JTAG Schaltungen Programming mode selection with JTAG circuits |
| 05/24/2006 | DE19861240B4 Optical type voltage sensor for IC testing equipment |
| 05/24/2006 | DE10355187B4 Verfahren und Vorrichtung zur Timinganalyse einer Schaltung Method and device for timing analysis of a circuit |
| 05/24/2006 | DE102004057772B3 Insertable calibration device for programmable tester programs transmission time point so occurrences of calibration signal edge and reference signal edge essentially coincide to compensate for signal transition time differences |
| 05/24/2006 | CN2783677Y Fault detector for louderspeakers of broad casting line |
| 05/24/2006 | CN2783676Y Online fault detector for louderspeaker of broad casting line |
| 05/24/2006 | CN2783342Y Accumulator use state monitor |
| 05/24/2006 | CN2783341Y Cell tester |
| 05/24/2006 | CN2783340Y Impedance load test controller for generator |
| 05/24/2006 | CN2783339Y Device for measuring gas monoatomic dielectric constant |
| 05/24/2006 | CN2783338Y Small current grounding line selector |
| 05/24/2006 | CN2783337Y Test terminal for multi-card connector |
| 05/24/2006 | CN2783336Y Imitation screen test and control system |
| 05/24/2006 | CN2783331Y Electronic circuit board test instrument |
| 05/24/2006 | CN1778033A Ac servo driver motor power line disconnection detection method |
| 05/24/2006 | CN1777815A Automated circuit board test actuator system |
| 05/24/2006 | CN1777814A Measuring device, and method for locating a partial discharge |
| 05/24/2006 | CN1777311A Mobile communication terminal of displaying time that cell needs to finish charging and displaying method thereof |
| 05/24/2006 | CN1776956A Charging system of spare cell and method for providing system management and support srevice |
| 05/24/2006 | CN1776759A Intelligent transformer power line anti theft device |
| 05/24/2006 | CN1776446A Breakage-proof transplanting suction cup for monomer solar cell on-line test |
| 05/24/2006 | CN1776445A Battery capacity rapid detecting instrument |
| 05/24/2006 | CN1776444A Method for generating test mode for integrated circuit design a alogue environment and storage medium |
| 05/24/2006 | CN1776443A Baking device |
| 05/24/2006 | CN1776442A Method for detecting gallium nitride base LED quality good or not |
| 05/24/2006 | CN1776441A Device for detecting transformer winding state utilizing sweep frequency power source exciting |
| 05/24/2006 | CN1776440A Wiring identifying device and method |
| 05/24/2006 | CN1776439A Detection device for sensing radio front-end radiofrequency signal |
| 05/24/2006 | CN1776437A Method for measuring power cable equipment live or not |
| 05/24/2006 | CN1257411C Unusual detector for vehicle carried electric loading driving system |
| 05/23/2006 | US7051302 Method for reducing pin overhead in non-scan design for testability |
| 05/23/2006 | US7051301 System and method for building a test case including a summary of instructions |
| 05/23/2006 | US7051257 Means scanning scan path parts sequentially and capturing response simultaneously |
| 05/23/2006 | US7051256 Processor emulator transferring data with emulation controller continuously without interruption |
| 05/23/2006 | US7051255 Method and apparatus for reducing power dissipation in latches during scan operation |
| 05/23/2006 | US7051254 Semiconductor integrated circuit device and method for designing a semiconductor integrated circuit device |
| 05/23/2006 | US7051252 Ibist identification loopback scheme |
| 05/23/2006 | US7051239 Method and apparatus for efficiently implementing trace and/or logic analysis mechanisms on a processor chip |
| 05/23/2006 | US7051008 Method and system for determining state-of-health of a nickel-metal hydride battery using an intelligent system |
| 05/23/2006 | US7050939 Method and apparatus for evaluating automotive window regulators |
| 05/23/2006 | US7050933 Biometric quality control process |
| 05/23/2006 | US7050923 Network-based system for configuring a measurement system using configuration information generated based on a user specification |
| 05/23/2006 | US7050921 Electronic test program with run selection |
| 05/23/2006 | US7050920 Semiconductor device having a test circuit for testing an output circuit |
| 05/23/2006 | US7050402 Wireless communications with frequency band selection |
| 05/23/2006 | US7050399 Transport network with circuitry for monitoring packet path accommodated in STM path |
| 05/23/2006 | US7050397 Apparatus, and associated method, for facilitating retransmission of data packets in a packet radio communication system that utilizes a feedback acknowledgement scheme |
| 05/23/2006 | US7050395 Method and apparatus for disabling an interface between network element data processing units |
| 05/23/2006 | US7050392 In-order delivery of frames during topology change |
| 05/23/2006 | US7050391 Method and apparatus for efficient link redundancy |
| 05/23/2006 | US7050281 Device and method for determining rare short circuit |
| 05/23/2006 | US7050105 Electronic camera and battery voltage controlling method employed therein for successively, rather than simultaneously, operating camera portions during conditions of low battery voltage |
| 05/23/2006 | US7050024 Predictive control boost current method and apparatus |
| 05/23/2006 | US7049910 Circuit interrupting device with reset lockout and reverse wiring protection and method of manufacture |
| 05/23/2006 | US7049844 Test patterns for optical measurements on multiple binary gratings |
| 05/23/2006 | US7049843 Signal acquisition probing system using a micro-cavity laser capable of sensing DC voltages |
| 05/23/2006 | US7049842 Simultaneous pin short and continuity test on IC packages |
| 05/23/2006 | US7049841 Heater-equipped pusher, electronic component handling apparatus, and temperature control method for electronic component |
| 05/23/2006 | US7049840 Hybrid interconnect and system for testing semiconductor dice |
| 05/23/2006 | US7049839 Method and related apparatus for chip testing |
| 05/23/2006 | US7049838 Semiconductor device tester with slanted contact ends |
| 05/23/2006 | US7049837 Probe sheet, probe card, semiconductor test equipment and semiconductor device fabrication method |
| 05/23/2006 | US7049836 Anisotropic conductivity connector, conductive paste composition, probe member, and wafer inspection device, and wafer inspecting method |
| 05/23/2006 | US7049835 Probe card for high speed testing |
| 05/23/2006 | US7049834 Semiconductor device test method and semiconductor device tester |
| 05/23/2006 | US7049833 Method for optimizing the accuracy of an electronic circuit |
| 05/23/2006 | US7049832 Circuit arrangement and method for determining the load current through an inductive load connected to a supply voltage in a clocked manner |
| 05/23/2006 | US7049826 Inspection device and inspection method |
| 05/23/2006 | US7049825 DC ground fault detection with resistive centering |
| 05/23/2006 | US7049822 Combination battery, light bulb, and fuse tester |
| 05/23/2006 | US7049809 System, method, and apparatus for handling and testing individual sliders in a row-like format in single slider processing systems |
| 05/23/2006 | US7049804 Electric potential measuring apparatus, and image forming apparatus |
| 05/23/2006 | US7049719 Synchronous machine |
| 05/23/2006 | US7049713 Pulsed current generator circuit with charge booster |
| 05/23/2006 | US7049700 Semiconductor test board having laser patterned conductors |
| 05/23/2006 | US7049632 Method and apparatus for optical probing of integrated circuit operation |
| 05/23/2006 | US7049586 Multi beam scanning with bright/dark field imaging |
| 05/23/2006 | US7049577 Semiconductor handler interface auto alignment |
| 05/23/2006 | US7049527 Conductor-pattern testing method, and electro-optical device |