| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 05/31/2006 | CN1779935A Apparatus and method for testing conductive bumps |
| 05/31/2006 | CN1779865A Memory test circuit and method |
| 05/31/2006 | CN1779480A Magnetic performance testing method for cold-rolled silicon steel sheets |
| 05/31/2006 | CN1779479A Realization of multiple-chip parallel test for asynchronous communication chip |
| 05/31/2006 | CN1779478A LCOS-driven chip tester and testing method thereof |
| 05/31/2006 | CN1779477A Method for determining time breakdown service life of grid dielectric |
| 05/31/2006 | CN1779476A Multifunctional grounded monitoring system |
| 05/31/2006 | CN1779475A Connection fault inspection between plates and socket structure forsingle plate and rear plate |
| 05/31/2006 | CN1779474A Method for measuring thin film transistor array of active matrix display panel |
| 05/31/2006 | CN1779473A Method and apparatus for inspecting planar display device by visula model |
| 05/31/2006 | CN1779472A Multiple frequency-converter ageing tester and testing method thereof |
| 05/31/2006 | CN1779471A Frequency-converter ageing tester |
| 05/31/2006 | CN1779469A Test pad, probe card and protection structure |
| 05/31/2006 | CN1779468A Wire-connected circular probe chunck basilar palte |
| 05/31/2006 | CN1779467A Wire-connected circular probe chunck basilar plate |
| 05/31/2006 | CN1258215C Chip elements transporting holder |
| 05/31/2006 | CN1258212C Connector for semiconductor device and method for testing semiconductor device |
| 05/31/2006 | CN1258096C Turn-to-turn short protection zero-sequence impedance discriminating method for parallel reactor |
| 05/31/2006 | CN1258095C Correcting method, quality checking method for electronic component and characteristic measuring system |
| 05/30/2006 | US7055141 Humanity interface development system of testing program of circuit board |
| 05/30/2006 | US7055138 Test executive system with tree structure for summarizing results |
| 05/30/2006 | US7055117 System and method for debugging system-on-chips using single or n-cycle stepping |
| 05/30/2006 | US7055079 Liquid crystal display driving circuit, verifying apparatus and error tolerance method thereof |
| 05/30/2006 | US7055078 Microprocessor with trace module |
| 05/30/2006 | US7055077 Systems and methods for circuit testing |
| 05/30/2006 | US7055062 Method, system and program product for establishing a self-diagnosing and self-repairing automated system |
| 05/30/2006 | US7055060 On-die mechanism for high-reliability processor |
| 05/30/2006 | US7055045 Automatic mode detection circuits for configuring a terminal as an output terminal in a first mode as an input terminal in a second mode |
| 05/30/2006 | US7054940 Adaptive cost of service for communication network based on level of network congestion |
| 05/30/2006 | US7054881 Method and system for reporting standardized and verified data |
| 05/30/2006 | US7054787 Embedded integrated circuit aging sensor system |
| 05/30/2006 | US7054772 Apparatus and method for monitoring and compensating for variation in solenoid resistance during use |
| 05/30/2006 | US7054358 Measuring apparatus and measuring method |
| 05/30/2006 | US7054356 Method and apparatus for testing serial connections |
| 05/30/2006 | US7054353 Radio receiver and channel estimator |
| 05/30/2006 | US7054273 Circuit integrity in a packet-switched network |
| 05/30/2006 | US7054270 Method for transmitting data from RLC layer in radio communication system |
| 05/30/2006 | US7054266 Switch provided with capability of switching a path |
| 05/30/2006 | US7054264 Interconnect and gateway protection in bidirectional ring networks |
| 05/30/2006 | US7054263 Synchronous change of switchplane |
| 05/30/2006 | US7054213 Method and circuit for determining sense amplifier sensitivity |
| 05/30/2006 | US7054209 Semiconductor memory device and test method thereof |
| 05/30/2006 | US7054007 Adjust pattern using optics; calibration adjustment substrate; forming semiconductors |
| 05/30/2006 | US7053897 Data analysis method and apparatus therefor |
| 05/30/2006 | US7053681 Comparator and method for amplifying an input signal |
| 05/30/2006 | US7053672 Method and apparatus for detecting semiconductor characterist variations |
| 05/30/2006 | US7053649 Image display device and method of testing the same |
| 05/30/2006 | US7053648 Distributed, load sharing power supply system for IC tester |
| 05/30/2006 | US7053647 Method of detecting potential bridging effects between conducting lines in an integrated circuit |
| 05/30/2006 | US7053646 Apparatus and method for use in testing a semiconductor wafer |
| 05/30/2006 | US7053645 System and method for detecting defects in a thin-film-transistor array |
| 05/30/2006 | US7053644 System for testing and burning in of integrated circuits |
| 05/30/2006 | US7053643 Radio frequency (RF) test probe |
| 05/30/2006 | US7053642 Method and apparatus for enabling reliable testing of printed circuit assemblies using a standard flying prober system |
| 05/30/2006 | US7053641 Interconnect having spring contacts |
| 05/30/2006 | US7053640 System and method for providing high RF signal isolation and low common ground inductance in an RF circuit testing environment |
| 05/30/2006 | US7053639 Probing fixture for semiconductor wafer |
| 05/30/2006 | US7053638 Surrounding structure for a probe card |
| 05/30/2006 | US7053637 Method for testing signal paths between an integrated circuit wafer and a wafer tester |
| 05/30/2006 | US7053636 Probe device for electrical testing an integrated circuit device and probe card using the same |
| 05/30/2006 | US7053635 Support member assembly for electroconductive contact members |
| 05/30/2006 | US7053634 Test pattern for testing contact resistance of a subject via hole |
| 05/30/2006 | US7053626 Device and method for monitoring the connection of an electrical supply unit |
| 05/30/2006 | US7053625 Method and apparatus for detecting wear in components of high voltage electrical equipment |
| 05/30/2006 | US7053624 Protective relay test device having a hand-held controller |
| 05/30/2006 | US7053598 Structure for detecting plug/unplug status of phone-jacks by single bit generated by a resistor network |
| 05/30/2006 | US7053496 Hybrid package with non-insertable and insertable conductive features, complementary receptacle, and methods of fabrication, assembly, and operation therefor |
| 05/30/2006 | US7052920 Layer-thickness detection methods and apparatus for wafers and the like, and polishing apparatus comprising same |
| 05/30/2006 | US7052180 LED junction temperature tester |
| 05/30/2006 | US7052179 Temperature detector |
| 05/30/2006 | US7052105 Battery residual capacity detection method and printing apparatus using the method |
| 05/30/2006 | US7051418 Supporting frames; flushing apertures; flat , self-supporting microstructures; etching; heating using electrical resistant grids |
| 05/30/2006 | CA2251224C Apparatus and method for measuring ventilation flow exiting a spinning rotor |
| 05/29/2006 | CA2488564A1 Methods and apparatus for indicating a fault condition in electrochemical cells and components |
| 05/26/2006 | WO2006055980A1 Automatic test system with synchronized instruments |
| 05/26/2006 | WO2006055906A2 Assembly for regulating the temperature of an integrated circuit |
| 05/26/2006 | WO2006055662A2 Maximum and minimum power limit calculator for parallel battery subpacks |
| 05/26/2006 | WO2006055661A2 Maximum and minimum power limit calculator for batteries and battery subpacks |
| 05/26/2006 | WO2006054765A1 Insert for electronic-parts-handling device, pusher, socket guide for test head, and electronic-parts-handling device |
| 05/26/2006 | WO2006054435A1 Testing apparatus |
| 05/26/2006 | WO2006054361A1 Insert and pusher for electronic component handling apparatus, socket guide for test head and electronic component handling apparatus |
| 05/26/2006 | WO2006054066A1 Determining the state of health of a battery |
| 05/26/2006 | WO2006053587A1 Integrated circuit and a method for testing a multi-tap integrated circuit |
| 05/26/2006 | WO2006053586A1 Integrated circuit and a method for secure testing |
| 05/26/2006 | WO2006053567A2 Compensation of simple fiberoptic faraday effect sensors |
| 05/26/2006 | WO2005101645A3 Apparatus for providing a high frequency loop back with a dc path for a parametric test |
| 05/26/2006 | WO2005071582A3 Detection of abnormal behaviour in dynamic systems |
| 05/26/2006 | WO2005069828A3 Thermal protection for electronic components during processing |
| 05/26/2006 | WO2004042786A3 High-frequency scan testability with low-speed testers |
| 05/26/2006 | CA2588395A1 Compensation of simple fiberoptic faraday effect sensors |
| 05/25/2006 | US20060112320 Test pattern compression with pattern-independent design-independent seed compression |
| 05/25/2006 | US20060112083 Object relation information management program, method, and apparatus |
| 05/25/2006 | US20060111863 Method of automatic adjustment of the control parameters of a magnetic suspension system |
| 05/25/2006 | US20060111854 Method and system for battery parameter estimation |
| 05/25/2006 | US20060110639 Fuel cell with a regulated output |
| 05/25/2006 | US20060109895 Transmission system, signal receiver, test apparatus and test head |
| 05/25/2006 | US20060109795 Multicast accounting control system and broadband access server |
| 05/25/2006 | US20060109025 Testing method for array substrate |
| 05/25/2006 | US20060109024 Method for measuring thin film transistor array of active matrix display panel |
| 05/25/2006 | US20060109023 T-coil apparatus and method for compensating capacitance |