| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/22/2007 | WO2007021536A2 Method and policy execution engine for regulating an incoming call in a communication system |
| 02/22/2007 | WO2007021436A2 Directional power detection by quadrature sampling |
| 02/22/2007 | WO2007020866A1 Detection device and inspection device |
| 02/22/2007 | WO2007020756A1 Tester |
| 02/22/2007 | WO2007020129A1 Battery sensor unit |
| 02/22/2007 | WO2006062812A3 Line short localization in lcd pixel arrays |
| 02/22/2007 | WO2006023032B1 Cross-monitoring sensor system and method |
| 02/22/2007 | WO2005119279A3 Method and apparatus for multi-level scan compression |
| 02/22/2007 | WO2005106817A8 Method and apparatus for dynamically determining when to use quality of service reservation in internet media applications |
| 02/22/2007 | WO2005103967A3 Restricted scan reordering technique to enhance delay fault coverage |
| 02/22/2007 | WO2005084232A3 Router configured for outputting update messages specifying a detected attribute change |
| 02/22/2007 | WO2005079503A3 System and method for end to end route control |
| 02/22/2007 | US20070043995 Semiconductor integrated circuit |
| 02/22/2007 | US20070043994 Obtaining test data for a device |
| 02/22/2007 | US20070043993 System and method for protection of data contained in an integrated circuit |
| 02/22/2007 | US20070043992 Pattern implementation technique |
| 02/22/2007 | US20070043991 Deserializer circuitry for high-speed serial data receivers on programmable logic device integrated circuits |
| 02/22/2007 | US20070043990 Providing precise timing control within a standardized test instrumentation chassis |
| 02/22/2007 | US20070043989 Method for specifying failure position in scan chain |
| 02/22/2007 | US20070043988 Configurable voltage regulator |
| 02/22/2007 | US20070043987 Configurable voltage regulator |
| 02/22/2007 | US20070043986 Method for testing an electronic circuit comprising a test mode secured by the use of a signature, and associated electronic circuit |
| 02/22/2007 | US20070043985 Memory control method and memory controller |
| 02/22/2007 | US20070041512 Calibration method and apparatus |
| 02/22/2007 | US20070041362 Security gatekeeper for a packetized voice communication network |
| 02/22/2007 | US20070041351 Method and system effecting communications in a wireless communication network |
| 02/22/2007 | US20070041331 Approach for managing the consumption of resources using adaptive random sampling |
| 02/22/2007 | US20070040717 System monitor in a programmable logic device |
| 02/22/2007 | US20070040572 Electrical inspection method and method of fabricating semiconductor display devices |
| 02/22/2007 | US20070040571 Method and apparatus for testing power MOSFET devices |
| 02/22/2007 | US20070040570 Method for testing semiconductor devices and an apparatus therefor |
| 02/22/2007 | US20070040569 Method for testing semiconductor devices and an apparatus therefor |
| 02/22/2007 | US20070040568 Semiconductor device, driving method and inspection method thereof |
| 02/22/2007 | US20070040567 Method for test strip manufacturing and test card analysis |
| 02/22/2007 | US20070040566 Testing assembly for electric test of electric package and testing socket thereof |
| 02/22/2007 | US20070040565 Compliant probes and test methodology for fine pitch wafer level devices and interconnects |
| 02/22/2007 | US20070040564 Circuit card synchronization within a standardized test instrumentation chassis |
| 02/22/2007 | US20070040563 Method for burning chips |
| 02/22/2007 | US20070040560 Search coil mount for facilitating inspection of a generator rotor in situ |
| 02/22/2007 | US20070040549 Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object |
| 02/22/2007 | US20070040548 Active matrix panel inspection device, inspection method, and active matrix oled panel manufacturing method |
| 02/22/2007 | US20070040544 High-voltage measuring device |
| 02/22/2007 | US20070040268 Device package and methods for the fabrication and testing thereof |
| 02/22/2007 | US20070040241 Wafer inspection device |
| 02/22/2007 | DE112005000745T5 Testgerät, Phaseneinstellverfahren und Speichersteuerung Test device, memory controller and Phaseneinstellverfahren |
| 02/22/2007 | DE112005000386T5 Duales Regelungssystem zum Halten der Temperatur eines IC-Chips in der Nähe eines Sollwertes Dual control system for maintaining the temperature of IC-chips near a set point |
| 02/22/2007 | DE112004002813T5 Prüfgerät für Bildsensoren Tester for image sensors |
| 02/22/2007 | DE10343301B4 Verfahren und System zum Charakterisieren eines Jitter von wiederholten Mustern A method and system for characterizing a jitter of repeated patterns |
| 02/22/2007 | DE102006033646A1 Semiconductor components test-device, has write unit coupled to control unit for writing chip identification data into semiconductor elements |
| 02/22/2007 | DE102006031874A1 Verfahren zur Detektion und Diagnose von Isolationsfehlern in Brennstoffzellenhybridfahrzeugen Method for the detection and diagnosis of insulation faults in fuel cell hybrid vehicles |
| 02/22/2007 | DE102006000397A1 Antriebsstrangbatterie-Lebensdauervorhersage- und Warngeräte Powertrain battery Lebensdauervorhersage- and Warning Devices |
| 02/22/2007 | DE102005039587A1 Batteriesensoreinheit Battery sensor unit |
| 02/22/2007 | DE102005039526A1 Verfahren und Diagnosevorrichtung zur selektiven Prüfung von Empfangsantennen in einem Mehrantennensystem The method and diagnostic apparatus for the selective examination of receive antennas in a multiple antenna system |
| 02/22/2007 | DE102005039348A1 Semiconductor component with test interface operation method, involves having component provided in test operation mode over first pin with clock rate signal synchronized with test environment |
| 02/22/2007 | DE102005039347A1 Semiconductor elements emulating method e.g. for testing semiconductor components during production, involves transferring component into first condition in which information of input and of output buffer is not changed |
| 02/22/2007 | DE102005038948A1 Measurement process for use with thick film resistance elements is used in a two or four wire mode |
| 02/22/2007 | DE102005038077A1 Test apparatus for a microphone esp. a wireless microphone whereby the test results are at least temporarily stored in memory |
| 02/22/2007 | DE102005037821A1 Ladeeinrichtung für Akkumulatoren und Verfahren zur Ermittlung von einer Schichtung von Elektrolyt mit unterschiedlicher Säuredichte und/oder von Sulfatanteilen in der aktiven Masse der positiven Platten in Akkumulatoren Charger for batteries and method for determining a stratification of the electrolyte with varying acid density and / or sulfate contents in the active material of the positive plates in accumulators |
| 02/22/2007 | CA2619338A1 Directional power detection by quadrature sampling |
| 02/22/2007 | CA2556324A1 High-voltage measuring device |
| 02/21/2007 | EP1755158A1 Failure analysis system and failure area displaying method |
| 02/21/2007 | EP1755135A2 Circuit arrangement for the collection and evaluation of electrical and physical measured variables in an electrical switchgear |
| 02/21/2007 | EP1754978A2 Remaining-battery-capacity estimating apparatus, remaining-battery-capacity estimating method, and remaining-battery-capacity estimating computer program |
| 02/21/2007 | EP1754977A2 Battery state of charge estimator |
| 02/21/2007 | EP1754976A1 Test Fixture With Clamping Top Plate Using Magnetic Force |
| 02/21/2007 | EP1754275A1 Method and apparatus for automatic determination of lead-acid battery specific gravity |
| 02/21/2007 | EP1754251A1 Low temperature epitaxial growth of silicon-containing films using uv radiation |
| 02/21/2007 | EP1754075A1 Test method and test device for testing an integrated circuit |
| 02/21/2007 | EP1754074A2 Contactless interfacing of test signals with a device under test |
| 02/21/2007 | EP1754073A2 Method and apparatus for pipelined scan compression |
| 02/21/2007 | EP1754072A2 Thermal optical chuck |
| 02/21/2007 | EP1754071A2 System and method for detecting link failures |
| 02/21/2007 | EP1754070A1 Method and device for controlling the operation of an electric element of a motor vehicle |
| 02/21/2007 | EP1754051A1 Method for correcting the influence of signal transmission lines on changes of signal transit times when conducting ultrasonic measurements |
| 02/21/2007 | EP1247063B1 Scanning force microscope probe cantilever with reflective structure |
| 02/21/2007 | CN2872383Y Multi-station tester according to power-supplier standard and its multiplexer |
| 02/21/2007 | CN2872382Y Distributed galvanic-battery on-line monitor |
| 02/21/2007 | CN2872381Y Intellignt lithium-ion battery inspector |
| 02/21/2007 | CN2872380Y Inserted fuse tester with illuminating function |
| 02/21/2007 | CN2872379Y Device for testing multiple chips simultaneouslly and single chip tester |
| 02/21/2007 | CN2872378Y Authentication probe for cable fault tester |
| 02/21/2007 | CN2872377Y Remote-controlled low-voltage power-supply circuit breaking alarming device |
| 02/21/2007 | CN2872376Y Off-circuit or short-circuit monitor |
| 02/21/2007 | CN2872375Y Anti-intrusion break monitor |
| 02/21/2007 | CN2872374Y Electric-cable water sensor |
| 02/21/2007 | CN2872373Y Fast digital wire-core inspector |
| 02/21/2007 | CN2872372Y Small electric current sensor |
| 02/21/2007 | CN2872371Y Ageing testing system |
| 02/21/2007 | CN1918850A Methods and apparatus for controlling the flow of multiple signal sources over a single full duplex Ethernet link |
| 02/21/2007 | CN1918680A 电弧故障检测器 An arc fault detector |
| 02/21/2007 | CN1918476A Method and device for testing a phase locked loop |
| 02/21/2007 | CN1918460A Measuring device, in particular a temperature measuring transducer |
| 02/21/2007 | CN1917360A Motor controller and control method thereof, and error detecting apparatus of inverter |
| 02/21/2007 | CN1917329A Direct power feed bus controller for cars, and control method |
| 02/21/2007 | CN1917320A Protection circuit for fault electric arc, and method for detecting fault electric arc |
| 02/21/2007 | CN1917316A Overpressure resistant adapter for switchgear insulated by gases |
| 02/21/2007 | CN1917005A Display device and its enable circuit |
| 02/21/2007 | CN1917002A Method for testing liquid crystal display |
| 02/21/2007 | CN1916653A Deterioration judging device and method, computer program |
| 02/21/2007 | CN1916652A Method for detecting gas production rate inside lithium ion battery, and detection device |