| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 03/06/2007 | US7187652 Multi-constraint routing system and method |
| 03/06/2007 | US7187650 Fibre channel frame-mode GFP with distributed delimiter |
| 03/06/2007 | US7187204 Circuit for inspecting semiconductor device and inspecting method |
| 03/06/2007 | US7187194 Device for probe card power bus voltage drop reduction |
| 03/06/2007 | US7187192 Semiconductor test device having clock recovery circuit |
| 03/06/2007 | US7187191 Sensor device for determining the layer thickness of a thin layer |
| 03/06/2007 | US7187190 Contact pad arrangement on a die |
| 03/06/2007 | US7187189 Burn-in testing apparatus and method |
| 03/06/2007 | US7187188 Chuck with integrated wafer support |
| 03/06/2007 | US7187187 Signal acquisition probing system using a micro-cavity laser |
| 03/06/2007 | US7187186 Methods and systems for determining one or more properties of a specimen |
| 03/06/2007 | US7187182 Process for the connection of electrical loads to the terminals of an amplifier, and for detection of a possible defect of connection of these loads |
| 03/06/2007 | US7187181 Arc detection method utilizing a dynamic processing module |
| 03/06/2007 | US7187179 Wiring test structures for determining open and short circuits in semiconductor devices |
| 03/06/2007 | US7187177 Method of monitoring a power distribution unit |
| 03/06/2007 | US7187165 Method and system for implicitly encoding preferred probing locations in a printed circuit board design for use in tester fixture build |
| 03/06/2007 | US7187164 Apparatus for calibrating a probe station |
| 03/06/2007 | US7187163 Parametric measuring circuit for minimizing oscillation effect |
| 03/06/2007 | US7187162 Tools and methods for disuniting semiconductor wafers |
| 03/06/2007 | US7187002 Wafer collective reliability evaluation device and wafer collective reliability evaluation method |
| 03/06/2007 | US7186574 CMP process metrology test structures |
| 03/06/2007 | US7185549 Pressure point detector |
| 03/01/2007 | WO2007024656A2 Architecture and method for testing of an integrated circuit device |
| 03/01/2007 | WO2007024291A1 Method and apparatus for managing a communication link |
| 03/01/2007 | WO2007024093A1 System and method for estimating a state vector associated with a battery |
| 03/01/2007 | WO2007023851A1 Probe device and method of regulating contact pressure between object to be inspected and probe |
| 03/01/2007 | WO2007023849A1 Voltage monitor and electric power storage using same |
| 03/01/2007 | WO2007023730A1 Testing apparatus and program |
| 03/01/2007 | WO2007023596A1 Anisotropic conductive sheet, production method thereof, connection method and inspection method |
| 03/01/2007 | WO2007023557A1 Electronic component test apparatus and temperature control method in electronic component test apparatus |
| 03/01/2007 | WO2007023556A1 Tcp handling apparatus |
| 03/01/2007 | WO2007023458A2 Controlling embedded memory access |
| 03/01/2007 | WO2007003036B1 Method and system for luminance characterization |
| 03/01/2007 | WO2006138655A3 Apparatus and method for controlling die force in a semiconductor device testing assembly |
| 03/01/2007 | WO2006115635A3 Automatic configuration of streaming processor architectures |
| 03/01/2007 | WO2006111910A3 Test prepared integrated circuit with an internal power supply domain |
| 03/01/2007 | WO2006104886A3 Resilient probes for electrical testing |
| 03/01/2007 | WO2006044836A3 Determining bidirectional path quality within a wireless mesh network |
| 03/01/2007 | WO2006036494A3 Method and apparatus for determining concentration of defects and/or impurities in a semiconductor wafer |
| 03/01/2007 | WO2006031280A3 Probe arrays and method for making |
| 03/01/2007 | WO2006017102A3 Transparent service provider |
| 03/01/2007 | WO2005115068A8 High density interconnect system having rapid fabrication cycle |
| 03/01/2007 | WO2004113937A8 Method and circuit arrangement for the self-testing of a reference voltage in electronic components |
| 03/01/2007 | US20070050693 Systems and methods for diagnosing rate dependent errors using LBIST |
| 03/01/2007 | US20070050692 Test mode control circuit |
| 03/01/2007 | US20070050691 Single event functional interrupt detection system |
| 03/01/2007 | US20070048884 Method and apparatus for localizing production errors in a semiconductor component part |
| 03/01/2007 | US20070048582 Alignment structure for a proton exchange membrane fuel cell |
| 03/01/2007 | US20070047584 Interleaving data packets in a packet-based communication system |
| 03/01/2007 | US20070047449 Cable modem analysis system and method therefor for an HFC cable network |
| 03/01/2007 | US20070047437 Method and apparatus for controlling retransmissions in a wireless communications system |
| 03/01/2007 | US20070047158 Magneto-resistance effect element, magneto-resistance effect head, magneto-resistance transducer system, and magnetic storage system |
| 03/01/2007 | US20070046322 Liquid crystal display panel and liquid crystal display apparatus having the same |
| 03/01/2007 | US20070046321 Apparatus and method for inspecting liquid crystal display |
| 03/01/2007 | US20070046320 Method and apparatus for testing liquid crystal display |
| 03/01/2007 | US20070046319 LCD inspection apparatus |
| 03/01/2007 | US20070046318 Apparatus and method for inspecting liquid crystal display |
| 03/01/2007 | US20070046317 Apparatus and method for inspecting liquid crystal display |
| 03/01/2007 | US20070046316 Test circuit for flat panel display device |
| 03/01/2007 | US20070046315 Packaged circuit module for improved installation and operation |
| 03/01/2007 | US20070046314 Process for testing IC wafer |
| 03/01/2007 | US20070046313 Mounting Spring Elements on Semiconductor Devices, and Wafer-Level Testing Methodology |
| 03/01/2007 | US20070046312 Printed circuit board for real-time clock IC and manufacturing method for printed circuit board for real-time clock IC |
| 03/01/2007 | US20070046311 Systems and methods for sensing obstructions associated with electrical testing of microfeature workpieces |
| 03/01/2007 | US20070046310 Method and system for automatically determining electrical properties of a semiconductor wafer or sample |
| 03/01/2007 | US20070046309 Testing system and method allowing adjustment of signal transmit timing |
| 03/01/2007 | US20070046308 Test modes for a semiconductor integrated circuit device |
| 03/01/2007 | US20070046307 Body for keeping a wafer, heater unit and wafer prober |
| 03/01/2007 | US20070046306 Wafer holder, heater unit having the wafer holder, and wafer prober having the heater unit |
| 03/01/2007 | US20070046305 Wafer holder and wafer prober having the same |
| 03/01/2007 | US20070046304 Construction Structures and Manufacturing Processes for Integrated Circuit Wafer Probe Card Assemblies |
| 03/01/2007 | US20070046303 Probe card, apparatus and method for inspecting an object |
| 03/01/2007 | US20070046302 Apparatus for testing electric cables |
| 03/01/2007 | US20070046301 System and method for modulation mapping |
| 03/01/2007 | US20070046294 Method and apparatus to select a parameter/mode based on a time measurement |
| 03/01/2007 | US20070046293 Connector, connector testing apparatus and method |
| 03/01/2007 | US20070046284 Integrated Process Condition Sensing Wafer and Data Analysis System |
| 03/01/2007 | US20070046283 Solder material test apparatus, and method of controlling the same |
| 03/01/2007 | US20070046282 Method and apparatus for semi-automatic generation of test grid environments in grid computing |
| 03/01/2007 | DE202006018397U1 Betätigungsüberwachung für Hochspannungsschalter in Verteilnetzen Activity monitoring for high voltage switch in distribution |
| 03/01/2007 | DE202006016130U1 Meßanordnung Measuring device |
| 03/01/2007 | DE19537358B4 IC-Träger IC carrier |
| 03/01/2007 | DE112005000395T5 System und Verfahren zur Übergabe von Baugruppen System and method for transferring components |
| 03/01/2007 | DE112005000210T5 Impulsbreiten-Einstellschaltung, Impulsbreiten-Einstellverfahren und Halbleiterprüfvorrichtung Pulse width setting, pulse width adjustment and semiconductor test |
| 03/01/2007 | DE102006030633A1 Sockel für ein Prüfgerät Socket for a testing device |
| 03/01/2007 | DE102005045564A1 Electrical equipment test and diagnosis adapter has curved hollow tubes fitting into housing connection openings and gripping individual cable wires |
| 03/01/2007 | DE102005041238A1 On-line analysis to localize earth leakages, in balanced to ground electrical supply systems, is a compact unit for alternating and direct current supplies without disconnecting circuits and interrupting production |
| 03/01/2007 | DE102005041048A1 Integrated circuit component, has control logic circuit with output connected with control input of phase locked loop counter to apply control signal to loop counter after receiving overflow indicating signal from reference clock counter |
| 03/01/2007 | DE102005041024A1 Vorrichtung und Verfahren zum kontinuierlichen Erzeugen einer fehlerfreien Trägerbahn Apparatus and method for continuously producing a defect-free carrier web |
| 03/01/2007 | DE102005040316A1 Current measuring device for use in motor vehicle battery, has control cores with control windings for magnetically saturating control cores for controlling effective length of air gap, where component part is arranged between control cores |
| 03/01/2007 | DE102005039550A1 Anordnung mit einem Piezoaktor und ein Verfahren zu dessen Herstellung Arrangement having a piezoelectric actuator and a method for its preparation |
| 03/01/2007 | DE102005038895A1 Schaltung mit einem kapazitiven Element und Verfahren zum Prüfen derselben Circuit with a capacitive element and method for testing the same |
| 02/28/2007 | EP1758282A1 Test apparatus |
| 02/28/2007 | EP1758227A2 Battery charging/discharging apparatus and battery charging/discharging method |
| 02/28/2007 | EP1758178A2 Method and device for detecting production defects in a semiconductor element |
| 02/28/2007 | EP1758158A2 Silicon wafer surface defect evaluation method |
| 02/28/2007 | EP1758028A1 A system for monitoring connection pattern of data ports |
| 02/28/2007 | EP1757948A2 Coil deterioration diagnostic method and coil deterioration diagnostic apparatus |
| 02/28/2007 | EP1757947A1 Test device and test method |
| 02/28/2007 | EP1756606A1 Supporting calibration and diagnostics in an open architecture test system |