| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/28/2007 | EP1756605A1 Method and system for simulating a modular test system |
| 02/28/2007 | EP1756604A1 Datalog support in a modular test system |
| 02/28/2007 | EP1756603A1 Method and system for controlling interchangeable components in a modular test system |
| 02/28/2007 | EP1756602A2 Method and structure to develop a test program for semiconductor integrated circuits |
| 02/28/2007 | EP1756601A2 Method and structure to develop a test program for semiconductor integrated circuits |
| 02/28/2007 | EP1756600A2 Local area network measurement test device |
| 02/28/2007 | EP1756599A2 Qam signal analysis in a network |
| 02/28/2007 | EP1567876B1 Secondary battery replacement method |
| 02/28/2007 | EP1430319B1 Electronic device |
| 02/28/2007 | CN2874762Y DC output load fuse detector |
| 02/28/2007 | CN2874628Y 1553B bus hand held type detector |
| 02/28/2007 | CN2874526Y GPS navigation plate detector |
| 02/28/2007 | CN2874525Y Detector for electronic equipment |
| 02/28/2007 | CN2874524Y Thyrester tube core parameter detection mould |
| 02/28/2007 | CN2874523Y Complex dielectric constant detector of cylindrical high Q resonant chamber and microwave electric medium |
| 02/28/2007 | CN2874522Y Single phase earthing selecting line and positioning device of general small earthing current system |
| 02/28/2007 | CN2874521Y Cable fault pre-determined spot detector |
| 02/28/2007 | CN2874520Y Built-in D/A converter anti-electricity monitor for single phase electric meter limit type voltage monolithic chip machine |
| 02/28/2007 | CN2874519Y Circuit fault detector |
| 02/28/2007 | CN2874518Y Power supply device burning test box |
| 02/28/2007 | CN2874517Y Dismantling type Helmholtz coil |
| 02/28/2007 | CN2874512Y High voltage detection warning instrument for battery |
| 02/28/2007 | CN2874503Y Chip detection circuit board |
| 02/28/2007 | CN2874502Y Adhesive sheet element detection clamp |
| 02/28/2007 | CN2874487Y General carrier for printed circuit board |
| 02/28/2007 | CN1922754A Nickel-hydride battery life determining method and life determining apparatus |
| 02/28/2007 | CN1922502A An electronic stream processing circuit with test access |
| 02/28/2007 | CN1922501A Aging testing apparatus and method |
| 02/28/2007 | CN1922500A Method of inspecting array substrate and method of manufacturing array substrate |
| 02/28/2007 | CN1922495A Electric connector |
| 02/28/2007 | CN1922494A Needle-like member, conductive contact, and conductive contact unit |
| 02/28/2007 | CN1922493A Adapter for circuit board examination and device for circuit board examination |
| 02/28/2007 | CN1921638A Service-oriented protection scheme for a radio access network |
| 02/28/2007 | CN1920590A Digital DC coulometer |
| 02/28/2007 | CN1920589A Interface circuit coupling semiconductor test apparatus with tested semiconductor device |
| 02/28/2007 | CN1920588A Device for failure analysis of surge protector lightning protection component |
| 02/28/2007 | CN1920587A Multilayer wiring substrate and BVH broken wire detection method |
| 02/28/2007 | CN1920586A Wire short /open circuit test set |
| 02/28/2007 | CN1920585A Substrate detector and substrate detection method |
| 02/28/2007 | CN1920578A Method of manufacturing a probe and a detection card |
| 02/28/2007 | CN1920577A Modular high frequency detection card |
| 02/28/2007 | CN1920540A Device and method for inspecting the surface of a wafer |
| 02/28/2007 | CN1920510A Daylight contrast measuring apparatus for flat panel display device |
| 02/28/2007 | CN1302613C Measurement for current change rate in switch reluctance motor |
| 02/28/2007 | CN1302595C Controller for electricity recharge/discharge |
| 02/28/2007 | CN1302388C Hierarchical built-in self-test for system-on-chip design |
| 02/28/2007 | CN1302286C Probe contacting system having plane adjusting mechanism |
| 02/27/2007 | US7185295 Chip design verifying and chip testing apparatus and method |
| 02/27/2007 | US7185255 Test apparatus |
| 02/27/2007 | US7185254 Method and apparatus for generating test patterns used in testing semiconductor integrated circuit |
| 02/27/2007 | US7185253 Compacting circuit responses |
| 02/27/2007 | US7185252 Measurement circuit and method for serially merging single-ended signals to analyze them |
| 02/27/2007 | US7185251 Method and apparatus for affecting a portion of an integrated circuit |
| 02/27/2007 | US7185250 Tap with separate scan cell in series with instruction register |
| 02/27/2007 | US7185249 Method and apparatus for secure scan testing |
| 02/27/2007 | US7185248 Failure analysis system and failure analysis method of logic LSI |
| 02/27/2007 | US7185247 Pseudo bus agent to support functional testing |
| 02/27/2007 | US7185239 On-chip timing characterizer |
| 02/27/2007 | US7184925 Emulation of operational characteristics of electronic device |
| 02/27/2007 | US7184923 Method for analyzing measurement data of device under test, program, measurement data analyzing system |
| 02/27/2007 | US7184917 Method and system for controlling interchangeable components in a modular test system |
| 02/27/2007 | US7184915 Tiered built-in self-test (BIST) architecture for testing distributed memory modules |
| 02/27/2007 | US7184914 Sensor signal processor |
| 02/27/2007 | US7184911 Determination apparatus and method of calibrating the apparatus |
| 02/27/2007 | US7184905 Method and system for monitoring power supplies |
| 02/27/2007 | US7184626 Wafer-level testing of optical and optoelectronic chips |
| 02/27/2007 | US7184408 Method and apparatus for programmable generation of traffic streams |
| 02/27/2007 | US7184407 Detecting, reporting and mitigating hidden nodes in a wireless data network |
| 02/27/2007 | US7184333 Semiconductor memory having a dummy signal line connected to dummy memory cell |
| 02/27/2007 | US7184305 Nonvolatile semiconductor storage device and row-line short defect detection method |
| 02/27/2007 | US7183845 Gain control methods and systems in an amplifier assembly |
| 02/27/2007 | US7183828 Shift clock generator, timing generator and test apparatus |
| 02/27/2007 | US7183792 Method and system for detecting a mode of operation of an integrated circuit, and a memory device including same |
| 02/27/2007 | US7183791 Reliability circuit for applying an AC stress signal or DC measurement to a transistor device |
| 02/27/2007 | US7183790 System and method for testing devices utilizing capacitively coupled signaling |
| 02/27/2007 | US7183789 Comparing on die response and expected response applied to outputs |
| 02/27/2007 | US7183788 Wireless radio frequency technique design and method for testing of integrated circuits and wafers |
| 02/27/2007 | US7183787 Contact resistance device for improved process control |
| 02/27/2007 | US7183786 Modifying a semiconductor device to provide electrical parameter monitoring |
| 02/27/2007 | US7183785 Test system and method for reduced index time |
| 02/27/2007 | US7183784 Integrated circuit burn-in test system and associated methods |
| 02/27/2007 | US7183783 Method and apparatus for pad aligned multiprobe wafer testing |
| 02/27/2007 | US7183782 Stage for placing target object |
| 02/27/2007 | US7183781 Incorporation of isolation resistor(s) into probes using probe tip spring pins |
| 02/27/2007 | US7183780 Electrical open/short contact alignment structure for active region vs. gate region |
| 02/27/2007 | US7183776 System and method for performing online partial discharge testing |
| 02/27/2007 | US7183775 Systems and methods for determining whether a heat sink is installed |
| 02/27/2007 | US7183774 Method of detecting partial discharges and diagnostic system for electrical apparatus |
| 02/27/2007 | US7183773 Method and circuit arrangement for the self-testing of a reference voltage in electronic components |
| 02/27/2007 | US7183759 Optical probes with spacing sensors for the wafer level testing of optical and optoelectronic chips |
| 02/27/2007 | US7183758 Automatic exchange of degraders in accelerated testing of computer chips |
| 02/27/2007 | US7183747 Method and circuit arrangement for determining the average current consumption of a battery-operated apparatus |
| 02/27/2007 | US7183671 Semiconductor device and method for producing the same |
| 02/27/2007 | US7183570 IC with comparator receiving expected and mask data from pads |
| 02/27/2007 | US7183194 Method of forming socket contacts |
| 02/27/2007 | US7181841 Method of confirming connection of a terminal connecting portion |
| 02/22/2007 | WO2007022538A2 Test pads for measuring properties of a wafer |
| 02/22/2007 | WO2007022446A2 Electronic device having an interface supported testing mode |
| 02/22/2007 | WO2007021828A2 Systems and methods for flow signature formation and use |
| 02/22/2007 | WO2007021732A2 Selectable jtag or trace access with data store and output |