Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
03/2007
03/22/2007WO2007032192A1 Testing device, testing method, program, and recording medium
03/22/2007WO2007032184A1 Semiconductor device, semiconductor chip, method for testing wiring between chips and method for switching wiring between chips
03/22/2007WO2007032077A1 Tcp handler
03/22/2007WO2006115812A3 Method and system for debugging using replicated logic and trigger logic
03/22/2007WO2006036537A3 Critical current testing techniques for superconducting conductors
03/22/2007US20070067693 Method of testing driving circuit and driving circuit for display device
03/22/2007US20070067692 Random number generation including skewness control
03/22/2007US20070067691 LSI design system, logic correction support equipment, logic correction support method used therefor, and program therefor
03/22/2007US20070067690 Dynamic miscompare
03/22/2007US20070067689 In-circuit testing system and method
03/22/2007US20070067688 Method and system for selectively masking test responses
03/22/2007US20070067687 Integrated Circuit Testing Module Configured for Set-up and Hold Time Testing
03/22/2007US20070067686 Method and apparatus for testing an integrated device's input/output (I/O)
03/22/2007US20070067685 Testing apparatus and testing method
03/22/2007US20070067519 Linking addressable shadow port and protocol for serial bus networks
03/22/2007US20070067129 Device and method for testing integrated circuits
03/22/2007US20070066042 Method of forming an electrical contact
03/22/2007US20070065957 Method for manufacturing semiconductor device
03/22/2007US20070065956 Contact probe, measuring pad used for the contact probe, and method of manufacturing the contact probe
03/22/2007US20070065713 Method for detecting acid stratification in a battery
03/22/2007US20070064598 Systems and Methods for Flow Signature Formation and Use
03/22/2007US20070064510 Method And Apparatus For Evaluating And Optimizing A Signaling System
03/22/2007US20070064359 Motor power line break detection method in ac servo driver
03/22/2007US20070063750 Timing vernier using a delay locked loop
03/22/2007US20070063746 Active load arrangement
03/22/2007US20070063727 Apparatus and method for measuring TFT pixel driving current
03/22/2007US20070063726 Integrated systems testing
03/22/2007US20070063725 Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object
03/22/2007US20070063724 Tandem handler system and method for reduced index time
03/22/2007US20070063723 Electrical circuit and method for testing electronic component
03/22/2007US20070063722 Method and apparatus for testing bumped die
03/22/2007US20070063721 Apparatus And Method Of Testing Singulated Dies
03/22/2007US20070063720 Probe card transfer assist apparatus, and inspection equipment and method using same
03/22/2007US20070063719 Probe card clamp mechanism and probe apparatus
03/22/2007US20070063718 Contact assembly and LSI chip inspecting device using the same
03/22/2007US20070063717 Electromagnetic wave generation source searching method and current probe used therefor
03/22/2007US20070063716 Optically enhanced probe alignment
03/22/2007US20070063715 High bandwidth probe
03/22/2007US20070063714 High bandwidth probe
03/22/2007US20070063708 Rectifier open diode detection
03/22/2007US20070063706 Repair device for decorative light shunt
03/22/2007US20070063690 High sensitivity magnetic built-in current sensor
03/22/2007US20070063311 Rewiring Substrate Strip Having a Plurality of Semiconductor Component Positions
03/22/2007DE10335164B4 Vorrichtung und Verfahren zum parallelen Testen von mehreren integrierten Schaltkreisen Apparatus and method for parallel testing of a plurality of integrated circuits
03/22/2007DE102006024798B3 Automotive lead-acid battery has electrolyte float gauge depth detector with ball cage
03/22/2007DE102005056972A1 Energy storage module for motor vehicle, especially with hybrid drive, comprises energy storage unit and electronic unit mounted on support
03/22/2007DE102005045183A1 Test unit for digitized test results and testing an diagnostic method for semiconductor components has reference signal generator and signal extractor
03/22/2007DE102005044194A1 Method of measuring the relative phases between a periodic digital test signal and a periodic digital reference signal
03/22/2007CA2529177A1 Line tone adapter for a cable test system
03/21/2007EP1764895A1 Battery pack and battery system
03/21/2007EP1763678A1 Evaluation of an output signal of a device under test
03/21/2007EP1763677A2 Circuit arrangement and method of testing an application circuit provided in said circuit arrangement
03/21/2007EP1763632A1 Motor vehicle energy management comprising a supplementary starter diagnostic function
03/21/2007EP1232592A4 Active-passive flow switch failover technology
03/21/2007EP0973224B1 Method for measuring residual capacity of secondary cell having nickel hydroxide positive plate
03/21/2007CN2881935Y Connector base for gas density correction relay
03/21/2007CN2881665Y Power battery analyzer
03/21/2007CN2881664Y Fault diagnosis device for asynchronous dynamo of beam pump
03/21/2007CN2881663Y Lifting device for supporting board of combined test table of leakage circuit breaker
03/21/2007CN2881662Y On-off device for combined test table of leakage circuit breaker
03/21/2007CN2881661Y Quality detector for circuit breaker
03/21/2007CN2881660Y High voltage large current energy-feeding type crystal brake tube valve used by combined test device
03/21/2007CN2881659Y Real-time monitoring system for current leakage and action frequency of lightning protector
03/21/2007CN2881658Y Universal test interface for camera module of mobile phone
03/21/2007CN2881657Y Test device of liquid crystal module
03/21/2007CN2881652Y Universal test interface equipment and its universal test system
03/21/2007CN2881651Y Testing socket for electrical property of electric package
03/21/2007CN2881650Y Testing apparatus
03/21/2007CN1934763A Method and apparatus for monitoring energy storage devices
03/21/2007CN1934745A Power system and its management method
03/21/2007CN1934701A Method for controlling heat of circuit, apparatus, and system
03/21/2007CN1934698A 半导体器件 Semiconductor devices
03/21/2007CN1934654A Testing apparatus and testing method
03/21/2007CN1934455A Test device and test method
03/21/2007CN1934454A Dual feedback control system for maintaining the temperature of an IC-chip near a set-point
03/21/2007CN1933277A Method for charger identifying battery variety
03/21/2007CN1933119A Contactor having contact electrodes formed by laser processing
03/21/2007CN1932771A CDROM test clamping device
03/21/2007CN1932544A Multi-field coupling measuring system
03/21/2007CN1932540A Method for differentiating electrical system oscillation and fault according to phase
03/21/2007CN1932539A Transformer partial discharge super high frequency detector
03/21/2007CN1932538A Weight gravity tester
03/21/2007CN1932537A Transient electromagnetic pulse field analog test system
03/21/2007CN1932534A Data processing method for spectrum analyzer
03/21/2007CN1932529A Module detecting card
03/21/2007CN1932527A Probe card clamp mechanism and probe apparatus
03/21/2007CN1932526A Signal probe and probe assembly
03/21/2007CN1932491A Substrate inspection system
03/21/2007CN1306686C Motor driver
03/21/2007CN1306672C Method of diagnosing partial discharge in gas-insulated apparatus and partial discharge diagnosing system for carrying out the same
03/21/2007CN1306632C Battery pack
03/21/2007CN1306581C Sorting handler for burn-in tester
03/21/2007CN1306579C Device for seating semiconductor device in semiconductor test handler
03/21/2007CN1306578C Method for measuring semiconductor product reliability
03/21/2007CN1306468C Test platform for radio audio frequency processing circuit board
03/21/2007CN1306355C Integrated circuit security and method therefor
03/21/2007CN1306278C Aging circuit for organic electroluminescence device and driving method thereof
03/21/2007CN1306277C Manipulator for a test head with active compliance
03/20/2007US7194671 Mechanism handling race conditions in FRC-enabled processors
03/20/2007US7194670 Command multiplier for built-in-self-test