Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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03/22/2007 | WO2007032192A1 Testing device, testing method, program, and recording medium |
03/22/2007 | WO2007032184A1 Semiconductor device, semiconductor chip, method for testing wiring between chips and method for switching wiring between chips |
03/22/2007 | WO2007032077A1 Tcp handler |
03/22/2007 | WO2006115812A3 Method and system for debugging using replicated logic and trigger logic |
03/22/2007 | WO2006036537A3 Critical current testing techniques for superconducting conductors |
03/22/2007 | US20070067693 Method of testing driving circuit and driving circuit for display device |
03/22/2007 | US20070067692 Random number generation including skewness control |
03/22/2007 | US20070067691 LSI design system, logic correction support equipment, logic correction support method used therefor, and program therefor |
03/22/2007 | US20070067690 Dynamic miscompare |
03/22/2007 | US20070067689 In-circuit testing system and method |
03/22/2007 | US20070067688 Method and system for selectively masking test responses |
03/22/2007 | US20070067687 Integrated Circuit Testing Module Configured for Set-up and Hold Time Testing |
03/22/2007 | US20070067686 Method and apparatus for testing an integrated device's input/output (I/O) |
03/22/2007 | US20070067685 Testing apparatus and testing method |
03/22/2007 | US20070067519 Linking addressable shadow port and protocol for serial bus networks |
03/22/2007 | US20070067129 Device and method for testing integrated circuits |
03/22/2007 | US20070066042 Method of forming an electrical contact |
03/22/2007 | US20070065957 Method for manufacturing semiconductor device |
03/22/2007 | US20070065956 Contact probe, measuring pad used for the contact probe, and method of manufacturing the contact probe |
03/22/2007 | US20070065713 Method for detecting acid stratification in a battery |
03/22/2007 | US20070064598 Systems and Methods for Flow Signature Formation and Use |
03/22/2007 | US20070064510 Method And Apparatus For Evaluating And Optimizing A Signaling System |
03/22/2007 | US20070064359 Motor power line break detection method in ac servo driver |
03/22/2007 | US20070063750 Timing vernier using a delay locked loop |
03/22/2007 | US20070063746 Active load arrangement |
03/22/2007 | US20070063727 Apparatus and method for measuring TFT pixel driving current |
03/22/2007 | US20070063726 Integrated systems testing |
03/22/2007 | US20070063725 Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object |
03/22/2007 | US20070063724 Tandem handler system and method for reduced index time |
03/22/2007 | US20070063723 Electrical circuit and method for testing electronic component |
03/22/2007 | US20070063722 Method and apparatus for testing bumped die |
03/22/2007 | US20070063721 Apparatus And Method Of Testing Singulated Dies |
03/22/2007 | US20070063720 Probe card transfer assist apparatus, and inspection equipment and method using same |
03/22/2007 | US20070063719 Probe card clamp mechanism and probe apparatus |
03/22/2007 | US20070063718 Contact assembly and LSI chip inspecting device using the same |
03/22/2007 | US20070063717 Electromagnetic wave generation source searching method and current probe used therefor |
03/22/2007 | US20070063716 Optically enhanced probe alignment |
03/22/2007 | US20070063715 High bandwidth probe |
03/22/2007 | US20070063714 High bandwidth probe |
03/22/2007 | US20070063708 Rectifier open diode detection |
03/22/2007 | US20070063706 Repair device for decorative light shunt |
03/22/2007 | US20070063690 High sensitivity magnetic built-in current sensor |
03/22/2007 | US20070063311 Rewiring Substrate Strip Having a Plurality of Semiconductor Component Positions |
03/22/2007 | DE10335164B4 Vorrichtung und Verfahren zum parallelen Testen von mehreren integrierten Schaltkreisen Apparatus and method for parallel testing of a plurality of integrated circuits |
03/22/2007 | DE102006024798B3 Automotive lead-acid battery has electrolyte float gauge depth detector with ball cage |
03/22/2007 | DE102005056972A1 Energy storage module for motor vehicle, especially with hybrid drive, comprises energy storage unit and electronic unit mounted on support |
03/22/2007 | DE102005045183A1 Test unit for digitized test results and testing an diagnostic method for semiconductor components has reference signal generator and signal extractor |
03/22/2007 | DE102005044194A1 Method of measuring the relative phases between a periodic digital test signal and a periodic digital reference signal |
03/22/2007 | CA2529177A1 Line tone adapter for a cable test system |
03/21/2007 | EP1764895A1 Battery pack and battery system |
03/21/2007 | EP1763678A1 Evaluation of an output signal of a device under test |
03/21/2007 | EP1763677A2 Circuit arrangement and method of testing an application circuit provided in said circuit arrangement |
03/21/2007 | EP1763632A1 Motor vehicle energy management comprising a supplementary starter diagnostic function |
03/21/2007 | EP1232592A4 Active-passive flow switch failover technology |
03/21/2007 | EP0973224B1 Method for measuring residual capacity of secondary cell having nickel hydroxide positive plate |
03/21/2007 | CN2881935Y Connector base for gas density correction relay |
03/21/2007 | CN2881665Y Power battery analyzer |
03/21/2007 | CN2881664Y Fault diagnosis device for asynchronous dynamo of beam pump |
03/21/2007 | CN2881663Y Lifting device for supporting board of combined test table of leakage circuit breaker |
03/21/2007 | CN2881662Y On-off device for combined test table of leakage circuit breaker |
03/21/2007 | CN2881661Y Quality detector for circuit breaker |
03/21/2007 | CN2881660Y High voltage large current energy-feeding type crystal brake tube valve used by combined test device |
03/21/2007 | CN2881659Y Real-time monitoring system for current leakage and action frequency of lightning protector |
03/21/2007 | CN2881658Y Universal test interface for camera module of mobile phone |
03/21/2007 | CN2881657Y Test device of liquid crystal module |
03/21/2007 | CN2881652Y Universal test interface equipment and its universal test system |
03/21/2007 | CN2881651Y Testing socket for electrical property of electric package |
03/21/2007 | CN2881650Y Testing apparatus |
03/21/2007 | CN1934763A Method and apparatus for monitoring energy storage devices |
03/21/2007 | CN1934745A Power system and its management method |
03/21/2007 | CN1934701A Method for controlling heat of circuit, apparatus, and system |
03/21/2007 | CN1934698A 半导体器件 Semiconductor devices |
03/21/2007 | CN1934654A Testing apparatus and testing method |
03/21/2007 | CN1934455A Test device and test method |
03/21/2007 | CN1934454A Dual feedback control system for maintaining the temperature of an IC-chip near a set-point |
03/21/2007 | CN1933277A Method for charger identifying battery variety |
03/21/2007 | CN1933119A Contactor having contact electrodes formed by laser processing |
03/21/2007 | CN1932771A CDROM test clamping device |
03/21/2007 | CN1932544A Multi-field coupling measuring system |
03/21/2007 | CN1932540A Method for differentiating electrical system oscillation and fault according to phase |
03/21/2007 | CN1932539A Transformer partial discharge super high frequency detector |
03/21/2007 | CN1932538A Weight gravity tester |
03/21/2007 | CN1932537A Transient electromagnetic pulse field analog test system |
03/21/2007 | CN1932534A Data processing method for spectrum analyzer |
03/21/2007 | CN1932529A Module detecting card |
03/21/2007 | CN1932527A Probe card clamp mechanism and probe apparatus |
03/21/2007 | CN1932526A Signal probe and probe assembly |
03/21/2007 | CN1932491A Substrate inspection system |
03/21/2007 | CN1306686C Motor driver |
03/21/2007 | CN1306672C Method of diagnosing partial discharge in gas-insulated apparatus and partial discharge diagnosing system for carrying out the same |
03/21/2007 | CN1306632C Battery pack |
03/21/2007 | CN1306581C Sorting handler for burn-in tester |
03/21/2007 | CN1306579C Device for seating semiconductor device in semiconductor test handler |
03/21/2007 | CN1306578C Method for measuring semiconductor product reliability |
03/21/2007 | CN1306468C Test platform for radio audio frequency processing circuit board |
03/21/2007 | CN1306355C Integrated circuit security and method therefor |
03/21/2007 | CN1306278C Aging circuit for organic electroluminescence device and driving method thereof |
03/21/2007 | CN1306277C Manipulator for a test head with active compliance |
03/20/2007 | US7194671 Mechanism handling race conditions in FRC-enabled processors |
03/20/2007 | US7194670 Command multiplier for built-in-self-test |