| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/10/2007 | CN1894792A Helical microelectronic contact and method for fabricating same |
| 01/10/2007 | CN1894591A Electronic circuit comprising a secret sub-module |
| 01/10/2007 | CN1894589A Anisotropic conductive connector, and inspection method for circuit device |
| 01/10/2007 | CN1894588A Systems and methods for connecting electrical components |
| 01/10/2007 | CN1893465A Hand-held tester and method for local area network cabling |
| 01/10/2007 | CN1892744A Apparatus and method for testing picture quality of liquid crystal display |
| 01/10/2007 | CN1892247A Air-conditioner telecontroller capable of judging cell condition and its starting method |
| 01/10/2007 | CN1892246A Systems, methods and computer programs for calibrating an automated circuit test system |
| 01/10/2007 | CN1892245A Methods and apparatus using a hierarchical test development tree to specify devices and their test setups |
| 01/10/2007 | CN1892244A Semiconductor test device |
| 01/10/2007 | CN1892243A Method for using internal semiconductor junctions to aid in non-contact testing |
| 01/10/2007 | CN1892242A Methods and apparatus for non-contact testing and diagnosing of open connections on non-probed nodes |
| 01/10/2007 | CN1892241A Circuit device of leakage current detector of lightning protector and its operating method |
| 01/10/2007 | CN1892240A On-line monitoring method for dissipative current value in leakage current of lightning protector |
| 01/10/2007 | CN1892239A Measurement method using solar simulator |
| 01/10/2007 | CN1892238A Method and apparatus that provide for configuration of hardware resources specified in a test template |
| 01/10/2007 | CN1892237A Testing apparatus and testing method using same |
| 01/10/2007 | CN1892196A Electronic component testing system |
| 01/10/2007 | CN1892194A Systems and methods for thermal sensing |
| 01/10/2007 | CN1294787C Method for mounting an electronic component |
| 01/10/2007 | CN1294423C Circuit for detecting electricity quantity of accumulator by intensifying transient current |
| 01/10/2007 | CN1294422C Device for testing chip with the help of printed circuit board |
| 01/10/2007 | CN1294421C Inspection device and inspection method for active matrix panel, and manufacturing method for active matrix organic light emitting diode panel |
| 01/09/2007 | US7162707 Scan path timing optimizing apparatus determining connection order of scan path circuits to realize optimum signal timings |
| 01/09/2007 | US7162674 Apparatus for selecting test patterns for logic circuit, computer implemented method for selecting test patterns, and computer program product for controlling a computer system so as to select test patterns |
| 01/09/2007 | US7162673 Scan chain registers that utilize feedback paths within latch units to support toggling of latch unit outputs during enhanced delay fault testing |
| 01/09/2007 | US7162672 Multilevel signal interface testing with binary test apparatus by emulation of multilevel signals |
| 01/09/2007 | US7162671 Semiconductor integrated circuit device, method of testing semiconductor integrated circuit device and method of manufacturing semiconductor integrated circuit device |
| 01/09/2007 | US7162670 IBIST interconnect and bridge fault detection scheme |
| 01/09/2007 | US7162660 Semiconductor memory and method of testing the same |
| 01/09/2007 | US7162652 Integrated circuit dynamic parameter management in response to dynamic energy evaluation |
| 01/09/2007 | US7162552 Programmable extended compression mask for dynamic trace |
| 01/09/2007 | US7162407 Testing a host's support for peripheral devices |
| 01/09/2007 | US7162398 Method for evaluating the dynamic perspective distortion of a transparent body and method for supporting the designing of a three-dimensionally curved shape of a transparent body |
| 01/09/2007 | US7162386 Dynamically adaptable semiconductor parametric testing |
| 01/09/2007 | US7162155 Optical packet switching apparatus and methods |
| 01/09/2007 | US7161915 Wireless quality-of-service detection method |
| 01/09/2007 | US7161904 System and method for hierarchical metering in a virtual router based network switch |
| 01/09/2007 | US7161900 Redundant ethernet transmission line system |
| 01/09/2007 | US7161899 Interlocking SONET/SDH network architecture |
| 01/09/2007 | US7161898 Common protection architecture for optical network |
| 01/09/2007 | US7161873 Method of detecting and locating a source of partial discharge in an electrical apparatus |
| 01/09/2007 | US7161776 Method for monitoring a power output stage |
| 01/09/2007 | US7161774 Magneto-resistance effect element, magneto-resistance effect head, magneto-resistance transducer system, and magnetic storage system |
| 01/09/2007 | US7161689 Apparatus and method for processing a microelectronic workpiece using metrology |
| 01/09/2007 | US7161493 Brush abrasion detector of vehicle generator |
| 01/09/2007 | US7161480 In-operation test of a signal path |
| 01/09/2007 | US7161375 Phase-loss detection for rotating field machine |
| 01/09/2007 | US7161374 Test pattern of semiconductor device and test method using the same |
| 01/09/2007 | US7161373 Method for testing using a universal wafer carrier for wafer level die burn-in |
| 01/09/2007 | US7161372 Input system for an operations circuit |
| 01/09/2007 | US7161371 Module part |
| 01/09/2007 | US7161370 Semiconductor testing device |
| 01/09/2007 | US7161368 Semiconductor component with internal heating |
| 01/09/2007 | US7161366 Method and apparatus for probe tip contact |
| 01/09/2007 | US7161365 Apparatus and method for making ground connection |
| 01/09/2007 | US7161364 Dermal phase meter with replaceable probe tips |
| 01/09/2007 | US7161363 Probe for testing a device under test |
| 01/09/2007 | US7161356 Voltage/current testing equipment for microfluidic devices |
| 01/09/2007 | US7161355 Voltage detection device and insulation detecting apparatus for non-grounded power supply including the voltage detection device |
| 01/09/2007 | US7161354 Leakage current or resistance measurement method, and monitoring apparatus and monitoring system of the same |
| 01/09/2007 | US7161352 Beam current measuring device and apparatus using the same |
| 01/09/2007 | US7161347 Test head for semiconductor integrated circuit tester |
| 01/09/2007 | US7161346 Method of holding an electronic component in a controlled orientation during parametric testing |
| 01/09/2007 | US7161344 Method and structure for variable pitch microwave probe assembly |
| 01/09/2007 | US7161327 Method for and arrangement comprising means for determining the available power capacity of an electric power supply |
| 01/09/2007 | US7161243 System and apparatus for socket and package power/ground bar to increase current carrying capacity for higher IC power delivery |
| 01/09/2007 | US7161175 Inter-dice signal transfer methods for integrated circuits |
| 01/09/2007 | US7160797 Method of bumping die pads for wafer testing |
| 01/09/2007 | US7160741 Planar voltage contrast test structure and method |
| 01/09/2007 | US7160143 System for monitoring connection pattern of data ports |
| 01/09/2007 | CA2434800C Testing apparatus with environmentally-controlled vibrator compartment |
| 01/09/2007 | CA2421641C Method of retrofitting a probe station |
| 01/04/2007 | WO2007002839A2 System and method for low latency data |
| 01/04/2007 | WO2007002297A2 Temporary planar electrical contact device and method using vertically-compressible nanotube contact structures |
| 01/04/2007 | WO2007002249A2 Method and apparatus for adjusting a multi-substrate probe structure |
| 01/04/2007 | WO2007001790A2 Probe for use in determining an attribute of a coating on a substrate |
| 01/04/2007 | WO2007000953A1 Semiconductor integrated circuit development support system |
| 01/04/2007 | WO2007000806A1 Semiconductor integrated circuit development support system |
| 01/04/2007 | WO2007000732A2 Method of servicing a pcf by rate limiting |
| 01/04/2007 | WO2007000070A1 A device and method for assessing the quality of a mobile phone or mobile phone network |
| 01/04/2007 | WO2006071668A3 Pin electronics with high voltage functionality |
| 01/04/2007 | WO2006071492A3 In-order fibre channel packet delivery |
| 01/04/2007 | WO2006065440A3 Fast reroute (frr) protection at the edge of a rfc 2547 network |
| 01/04/2007 | WO2006052715A3 System and method to decrease the route convergence time and find optimal routes in a wireless communication network |
| 01/04/2007 | WO2006047092A3 Active queue management methods and devices |
| 01/04/2007 | WO2005111638A3 Storage switch traffic bandwidth control |
| 01/04/2007 | US20070006056 Method and apparatus for enabling multipoint bus access |
| 01/04/2007 | US20070006035 Microcomputer and method for developing system program |
| 01/04/2007 | US20070006031 Testing apparatus and testing method |
| 01/04/2007 | US20070005283 Systems and methods for a distributed execution environment with per-command environment management |
| 01/04/2007 | US20070005274 Methods and apparatus for detecting failure of an isolation device |
| 01/04/2007 | US20070005118 Medical device testing apparatus |
| 01/04/2007 | US20070004245 Kelvin contact module for a microcircuit test system |
| 01/04/2007 | US20070004063 Technique for evaluating a fabrication of a die and wafer |
| 01/04/2007 | US20070004062 Display panel, display panel inspection method, and display panel manufacturing method |
| 01/04/2007 | US20070004059 Method of measuring alignment of measurement pattern |
| 01/04/2007 | US20070004055 Method for regulating temperature and circuit therefor |
| 01/04/2007 | US20070004042 Compositions and methods for helper-free production of recombinant adeno-associated viruses |
| 01/04/2007 | US20070002819 Reservation with access points |