| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/03/2007 | US7200154 QoS link protocol (QLP) |
| 04/03/2007 | US7200111 Method for improving TCP performance over wireless links |
| 04/03/2007 | US7200110 Method and apparatus for prioritized release of connections in a communications network |
| 04/03/2007 | US7200109 Method and system for protecting frame relay traffic over SONET rings |
| 04/03/2007 | US7200108 Method and apparatus for recovery from faults in a loop network |
| 04/03/2007 | US7199989 Digital protection relay with time sync function |
| 04/03/2007 | US7199611 System to temporarily modify an output waveform |
| 04/03/2007 | US7199602 Inspection method and inspection device for display device and active matrix substrate used for display device |
| 04/03/2007 | US7199601 Method and testing apparatus for testing integrated circuits |
| 04/03/2007 | US7199600 Semiconductor device testing method and testing equipment |
| 04/03/2007 | US7199599 Integrated circuit socket with removable support |
| 04/03/2007 | US7199598 Burn-in substrate for semiconductor devices |
| 04/03/2007 | US7199597 Dual feedback control system for maintaining the temperature of an IC-chip near a set-point |
| 04/03/2007 | US7199596 Manual testing instrument |
| 04/03/2007 | US7199593 Apparatus and methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer |
| 04/03/2007 | US7199590 Screening method for laminated ceramic capacitors |
| 04/03/2007 | US7199589 Method for controlling a switching converter and control device for a switching converter |
| 04/03/2007 | US7199588 Method and system for determining the buffer action of a battery |
| 04/03/2007 | US7199587 Portable circuit interrupter tester and method |
| 04/03/2007 | US7199577 Characterizing multiple DC supplies decoupling capacitors in PCB by anti-resonant frequencies |
| 04/03/2007 | US7199576 Apparatus for testing processing electronics |
| 04/03/2007 | US7199575 TFT-LCD source driver with built-in test circuit and method for testing the same |
| 04/03/2007 | US7199574 Semiconductor test apparatus |
| 04/03/2007 | US7199573 Electronic circuit with test unit |
| 04/03/2007 | US7199571 Probe apparatus for use in a separable connector, and systems including same |
| 04/03/2007 | US7199557 Apparatus, methods and computer program products for estimation of battery reserve life using adaptively modified state of health indicator-based reserve life models |
| 04/03/2007 | US7199489 Battery communication system |
| 04/03/2007 | US7199435 Semiconductor devices containing on-chip current sensor and methods for making such devices |
| 04/03/2007 | US7199307 Structure and method for embedding capacitors in z-connected multi-chip modules |
| 04/03/2007 | US7199039 Interconnect routing over semiconductor for editing through the back side of an integrated circuit |
| 04/03/2007 | US7198978 Method for fabricating semiconductor device and apparatus for fabricating the same |
| 04/03/2007 | US7198963 Methodologies for efficient inspection of test structures using electron beam scanning and step and repeat systems |
| 04/03/2007 | US7198962 Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step |
| 04/03/2007 | US7197946 Torque measuring device for electric motors and method to measure the torque of an electric motor |
| 04/03/2007 | CA2291657C Method and device for testing electronic equipment |
| 03/29/2007 | WO2007035664A2 Apparatus and method of testing singulated dies |
| 03/29/2007 | WO2007035644A2 System and method for validating radio frequency identification tags |
| 03/29/2007 | WO2007035488A2 Arc fault detection and confirmation using voltage and current analysis |
| 03/29/2007 | WO2007034921A1 Electrical contact and socket for electrical component |
| 03/29/2007 | WO2007034863A1 Wafer inspecting apparatus, wafer inspecting method and computer program |
| 03/29/2007 | WO2007033983A1 Method and device for determining the battery state of a battery in a circuit with a starter for an internal combustion engine |
| 03/29/2007 | WO2007033981A1 Method and system for processing an image for testing a cdd/cmos sensor |
| 03/29/2007 | WO2007016699A3 Method and system for debug and test using replicated logic |
| 03/29/2007 | WO2007011196B1 A method of earth fault identification and location in three-phase electrical network |
| 03/29/2007 | WO2007005516A3 Connector-to-pad pcb translator for a tester and method of fabricatio |
| 03/29/2007 | WO2006128005A3 Implementation of automatic protection switching for media packets transmitted over an ethernet switching fabric |
| 03/29/2007 | WO2006010120A3 A method and apparatus for calibrating and/or deskewing communications channels |
| 03/29/2007 | WO2005100160A3 Apparatus for reducing deflection of a mobile member in a chamber |
| 03/29/2007 | WO2005072473A3 System and method for binding a client to a server |
| 03/29/2007 | WO2005001897A3 Non-invasive, low pin count test circuits and methods utilizing emulated stress conditions |
| 03/29/2007 | US20070072321 Device package and methods for the fabrication and testing thereof |
| 03/29/2007 | US20070072319 Integrated circuit capacitor structure |
| 03/29/2007 | US20070072318 Method For Predicting The Formation Of Silicon Nanocrystals In Embedded Oxide Matrices |
| 03/29/2007 | US20070072317 Method for Predicting Contributions of Silicon Interstitials to N-Type Dopant Transient Enhanced Diffusion During a PN Junction Formation |
| 03/29/2007 | US20070072315 Method and system for reliability similarity of semiconductor devices |
| 03/29/2007 | US20070072313 Anisotropic conductive connector and circuit device inspection method |
| 03/29/2007 | US20070070910 Managing OAM packets in a communications network |
| 03/29/2007 | US20070069763 Electrical connecting apparatus |
| 03/29/2007 | US20070069762 Input buffer with automatic switching point adjustment circuitry, and synchronous DRAM device including same |
| 03/29/2007 | US20070069761 Automated laser header testing |
| 03/29/2007 | US20070069760 System and method for characterizing silicon wafers |
| 03/29/2007 | US20070069759 Systems and Methods for Controlling Deposition of a Charge on a Wafer for Measurement of One or More Electrical Properties of the Wafer |
| 03/29/2007 | US20070069758 Performance board, test apparatus, board for diagnosis, and diagnosis method |
| 03/29/2007 | US20070069757 Inspection method of contact failure of semiconductor device and semiconductor device to which inspection method is applied |
| 03/29/2007 | US20070069756 Test fixture |
| 03/29/2007 | US20070069755 Pin electronics driver |
| 03/29/2007 | US20070069754 Gel package structural enhancement of compression system board connections |
| 03/29/2007 | US20070069753 Gel package structural enhancement of compression system board connections |
| 03/29/2007 | US20070069752 Electronic device test apparatus |
| 03/29/2007 | US20070069751 Curved spring structure with elongated section located under cantilevered section |
| 03/29/2007 | US20070069750 Method for fabricating a plurality of elastic probes in a row |
| 03/29/2007 | US20070069749 Method for fabricating a plurality of elastic probes in a row |
| 03/29/2007 | US20070069748 Probe assembly |
| 03/29/2007 | US20070069747 Probe tile for probing semiconductor wafer |
| 03/29/2007 | US20070069746 Probing card and inspection apparatus for microstructure |
| 03/29/2007 | US20070069745 Probe card for integrated circuits |
| 03/29/2007 | US20070069744 Board for probe card, inspection apparatus, photo-fabrication apparatus and photo-fabrication method |
| 03/29/2007 | US20070069743 Sheet-like probe, process for producing the same and its application |
| 03/29/2007 | US20070069737 System and method for adaptable testing of backplane interconnections and a test tool incorporating the same |
| 03/29/2007 | US20070069736 Static timing based IR drop analysis |
| 03/29/2007 | US20070069735 Battery sensor and method for the operation of a battery sensor |
| 03/29/2007 | US20070069734 Automotive vehicle electrical system diagnostic device |
| 03/29/2007 | US20070069718 Test fixture for collecting particulate material |
| 03/29/2007 | US20070069717 Self-shielded electronic components |
| 03/29/2007 | US20070069252 Insulated gate semiconductor device having a clamping element to clamp gate-emitter voltage and method of manufacturing thereof |
| 03/29/2007 | DE112005000986T5 Gleichstrom-Prüfvorrichtung DC Tester |
| 03/29/2007 | DE10393854T5 Strommessvorrichtung mit aufgeprägter Spannung und dafür verwendete Strompuffer mit Schaltern Current measuring device with the applied voltage and current used for buffer with switches |
| 03/29/2007 | DE102006044838A1 Battery state monitoring, for the starter of an internal combustion motor, determines a single value for a measured variable correlated with the minimum battery voltage for starting |
| 03/29/2007 | DE102006042768A1 Process to operate overload protection switch by measuring voltage drop across switch |
| 03/29/2007 | DE102005046282A1 Electronic device`s e.g. control device, residual current detection device for motor vehicle, has electrical and sense conductors arranged on insulating material, where reduction of insulating characteristics is detected by sense conductor |
| 03/29/2007 | DE102005045257A1 Radio receiver`s actual sensitivity determining method, involves supplying signal as test signal with intensity if determined level of internal noise of receiver is less than permitted sensitivity of receiver |
| 03/28/2007 | EP1767955A1 Test emulator, test module emulator, test apparatus, and record medium storing program therein |
| 03/28/2007 | EP1767954A1 Semiconductor integrated circuit, inspecting apparatus and semiconductor integrated circuit inspecting method |
| 03/28/2007 | EP1767953A1 Inspection equipment of circuit board and inspection method of circuit board |
| 03/28/2007 | EP1767005A1 Method and system for scanning and detecting metallic cross-connects |
| 03/28/2007 | EP1766900A2 Transparent service provider |
| 03/28/2007 | EP1766821A1 Dynamic forwarding adjacency |
| 03/28/2007 | EP1766632A1 System and method for testing a data storage device without revealing memory content |
| 03/28/2007 | EP1766428A1 Testing a pipeline in an ic |
| 03/28/2007 | EP1766427A1 Substrate with patterned conductive layer |