| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/11/2007 | CN1945887A Separated area current detecting system for proton exchange film fuel cell |
| 04/11/2007 | CN1945883A System and method for controlling cathode stoichiometry to minimize rh excursions during transients |
| 04/11/2007 | CN1945882A Cell voltage measuring terminals for fuel cell stack and fuel cell system |
| 04/11/2007 | CN1945349A Flexible generating device for embedded AC motor complex fault |
| 04/11/2007 | CN1945348A Flexible generating device for AC motor complex fault |
| 04/11/2007 | CN1945347A Air passage and its control method |
| 04/11/2007 | CN1945346A Solar simulator and method for driving the same |
| 04/11/2007 | CN1945345A Detecting device and method for mixed power automobile battery remainder |
| 04/11/2007 | CN1945344A Online detector for inductive load loop electric switch state |
| 04/11/2007 | CN1945343A Device for detecting water base fire extinguishing device jet electric insulation property |
| 04/11/2007 | CN1945340A Detecting apparatus for circuit board |
| 04/11/2007 | CN1945339A Carousel device, system and method for electronic circuit tester |
| 04/11/2007 | CN1945305A Test method and device for repeated nanosecond pulse medium breakdown characteristic |
| 04/11/2007 | CN1310468C On-line monitoring method of communication network equipment battery |
| 04/11/2007 | CN1310419C Torque computation unit for vehicle generator |
| 04/11/2007 | CN1310381C Methanism for preventing pipe line from wearing-out and processing apparatus for the same |
| 04/11/2007 | CN1310343C Method for producing avalanche slot optical detector and detector |
| 04/11/2007 | CN1310300C Method for testing chips of wideband data communicatioin chip |
| 04/11/2007 | CN1310299C Hazard detection and elimination method based on circuit static time-delay property |
| 04/11/2007 | CN1310034C Automatic electrostatic instant warning device and method thereof |
| 04/10/2007 | US7203913 Semiconductor integrated circuit device, method of testing the same, database for design of the same and method of designing the same |
| 04/10/2007 | US7203883 Integrated circuit |
| 04/10/2007 | US7203882 Clustering-based approach for coverage-directed test generation |
| 04/10/2007 | US7203880 Generating an abbreviated netlist including pseudopin inputs and output nodes |
| 04/10/2007 | US7203879 Built-in-test diagnostic and maintenance support system and process |
| 04/10/2007 | US7203878 System and method for performing predictable signature analysis in the presence of multiple data streams |
| 04/10/2007 | US7203877 Failure analysis and testing of semi-conductor devices using intelligent software on automated test equipment (ATE) |
| 04/10/2007 | US7203876 Method and apparatus for controlling AC power during scan operations in scannable latches |
| 04/10/2007 | US7203875 Test systems and methods with compensation techniques |
| 04/10/2007 | US7203872 Cache based physical layer self test |
| 04/10/2007 | US7203619 Biometric quality control process |
| 04/10/2007 | US7203616 Method and system for the interactive testing of assembled wireless communication devices |
| 04/10/2007 | US7203613 IC analog debugging and calibration thereof |
| 04/10/2007 | US7203460 Automated test of receiver sensitivity and receiver jitter tolerance of an integrated circuit |
| 04/10/2007 | US7203229 Apparatus for and method of measuring jitter |
| 04/10/2007 | US7203174 Auto detection of SGMII and GBIC modes |
| 04/10/2007 | US7203170 Network switch port with weighted random early discard |
| 04/10/2007 | US7203160 System and method for controlling duplexing in an ATM switching system |
| 04/10/2007 | US7203159 Line card-sourced ESF framing protection switch FDL signaling |
| 04/10/2007 | US7202951 Laser-based cleaning device for film analysis tool |
| 04/10/2007 | US7202704 Leakage sensing and keeper circuit for proper operation of a dynamic circuit |
| 04/10/2007 | US7202695 Apparatus and method for inspecting a liquid crystal display panel |
| 04/10/2007 | US7202694 Current sensing structure for integrated power switches |
| 04/10/2007 | US7202693 Combined pick, place, and press apparatus |
| 04/10/2007 | US7202692 Semiconductor chip and method of testing the same |
| 04/10/2007 | US7202691 Non-contact method for acquiring charge-voltage data on miniature test areas of semiconductor product wafers |
| 04/10/2007 | US7202690 Substrate inspection device and substrate inspecting method |
| 04/10/2007 | US7202689 Sensor differentiated fault isolation |
| 04/10/2007 | US7202688 Output buffer circuit having signal path used for testing and integrated circuit and test method including the same |
| 04/10/2007 | US7202687 Systems and methods for wireless semiconductor device testing |
| 04/10/2007 | US7202686 Socket and test apparatus |
| 04/10/2007 | US7202685 Embedded probe-enabling socket with integral probe structures |
| 04/10/2007 | US7202684 Thermal stratification test apparatus and method providing cyclical and steady-state stratified environments |
| 04/10/2007 | US7202683 Cleaning system, device and method |
| 04/10/2007 | US7202682 Composite motion probing |
| 04/10/2007 | US7202681 Motherboard memory slot ribbon cable and apparatus |
| 04/10/2007 | US7202680 Touch probe |
| 04/10/2007 | US7202679 Contactor having conductive particles in a hole as a contact electrode |
| 04/10/2007 | US7202678 Resistive probe tips |
| 04/10/2007 | US7202677 Socket for mating with electronic component, particularly semiconductor device with spring packaging, for fixturing, testing, burning-in or operating such a component |
| 04/10/2007 | US7202672 Partial discharge sensor |
| 04/10/2007 | US7202657 Manual actuator for loading leadless microcircuit packages in a circuit tester |
| 04/10/2007 | US7200930 Probe for semiconductor devices |
| 04/05/2007 | WO2007038480A1 Pin electronics driver |
| 04/05/2007 | WO2007038479A1 Data capture in automatic test equipment |
| 04/05/2007 | WO2007038199A1 Single camera three-point vision alignment system for a device handler |
| 04/05/2007 | WO2007037314A1 Signal measuring device |
| 04/05/2007 | WO2007037017A1 Consumed power analyzing method, and consumed power analyzing device |
| 04/05/2007 | WO2007037013A1 Semiconductor analyzer |
| 04/05/2007 | WO2007036723A1 Reconfigurable integrated circuits |
| 04/05/2007 | WO2007036649A1 Device for analyzing an integrated circuit |
| 04/05/2007 | WO2007036601A1 Method, circuit board and test apparatus for testing solder joints |
| 04/05/2007 | WO2007036555A2 Switching device comprising a temperature detection unit |
| 04/05/2007 | WO2007036034A1 Method of preparing an integrated circuit die for imaging |
| 04/05/2007 | WO2007010480A3 Method of manufacturing a system in package |
| 04/05/2007 | WO2007010452A3 Emulation and debug interfaces for testing an integrated circuit with an asynchronous microcontroller |
| 04/05/2007 | WO2007010452A2 Emulation and debug interfaces for testing an integrated circuit with an asynchronous microcontroller |
| 04/05/2007 | WO2007007111A3 Current measurement apparatus |
| 04/05/2007 | WO2006133995A3 Monolithically integrated semiconductor assembly comprising a power component and method for producing a monolithically integrated semiconductor assembly |
| 04/05/2007 | WO2006102419A3 Automated electrical wiring inspection system |
| 04/05/2007 | WO2006075122A3 Latch circuit including a data retention latch |
| 04/05/2007 | WO2006072583A3 Method for beam calibration and usage of a calibration body |
| 04/05/2007 | WO2006020133A3 One time operating state detecting method and apparatus |
| 04/05/2007 | WO2005072287A3 Remote bist for high speed test and redundancy calculation |
| 04/05/2007 | US20070079206 Method and apparatus to control operation of multimedia device |
| 04/05/2007 | US20070079205 Circuit simulation with decoupled self-heating analysis |
| 04/05/2007 | US20070079204 Integrated Circuit Testing Module Including Signal Shaping Interface |
| 04/05/2007 | US20070079203 Testing a multibank memory module |
| 04/05/2007 | US20070079202 Integrated circuit arrangement and method of operating such a circuit arrangement |
| 04/05/2007 | US20070079201 Power-saving apparatus according to the operating mode of an embedded memory |
| 04/05/2007 | US20070079200 Input-output device testing |
| 04/05/2007 | US20070079199 User data driven test control software application that requires no software maintenance |
| 04/05/2007 | US20070079198 Semiconductor integrated circuit apparatus and interface test method |
| 04/05/2007 | US20070079197 Apparatus and method for automatically self-calibrating a duty cycle circuit for maximum chip performance |
| 04/05/2007 | US20070079196 Information terminal device |
| 04/05/2007 | US20070079195 Time-series data analyzing apparatus |
| 04/05/2007 | US20070079194 Apparatus and method for controlling frequency of an i/o clock for an integrated circuit during test |
| 04/05/2007 | US20070079193 Scannable Latch |
| 04/05/2007 | US20070079192 Scan driver and organic light emitting display device having the same |
| 04/05/2007 | US20070079191 Scan driving circuit and organic light emitting display using the same |