| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/21/2007 | CN1916651A Method and system for determining location of phase-to-earth fault |
| 02/21/2007 | CN1916650A Device for automatic sensing polarity of battery |
| 02/21/2007 | CN1916649A Device and method for electrically inspecting printed circuit board |
| 02/21/2007 | CN1916648A Method for testing soft display dielectric layer, and device |
| 02/21/2007 | CN1916647A Testing fixture connected to socket, and testing method |
| 02/21/2007 | CN1916646A Signal sensing device |
| 02/21/2007 | CN1916645A Banks of elastic probe, and fabricating method |
| 02/21/2007 | CN1916644A Cantalever type probe card in high frequency |
| 02/21/2007 | CN1916643A Device for testing integrated electric apparatus |
| 02/21/2007 | CN1916641A Test system for electric components |
| 02/21/2007 | CN1301409C Method and system for compensating thermally induced motion of probe cards |
| 02/21/2007 | CN1301402C Method for inspecting location of inspected device and object on printing circuit board |
| 02/20/2007 | US7181717 Method and apparatus for placement of components onto programmable logic devices |
| 02/20/2007 | US7181705 Hierarchical test circuit structure for chips with multiple circuit blocks |
| 02/20/2007 | US7181664 Method on scan chain reordering for lowering VLSI power consumption |
| 02/20/2007 | US7181663 Wireless no-touch testing of integrated circuits |
| 02/20/2007 | US7181662 On-chip test apparatus |
| 02/20/2007 | US7181661 Method and system for broadcasting data to multiple tap controllers |
| 02/20/2007 | US7181660 Reconstruction of non-deterministic algorithmic tester stimulus used as input to a device under test |
| 02/20/2007 | US7181658 Method for testing semiconductor memory device and test circuit for semiconductor memory device |
| 02/20/2007 | US7181648 Method to assist identification of a defective functional unit in a technical system |
| 02/20/2007 | US7181360 Methods and systems for generating test plans for communication devices |
| 02/20/2007 | US7181358 Method, apparatus and database using a map of linked data nodes for storing test numbers |
| 02/20/2007 | US7181352 Method of determining current-voltage characteristics of a device |
| 02/20/2007 | US7181350 Blood glucose meter/modem interface arrangement |
| 02/20/2007 | US7181132 Method and system for loading substrate supports into a substrate holder |
| 02/20/2007 | US7180971 Selecting between two TAP circuits with MODE/TCK and TCK/MODE signals |
| 02/20/2007 | US7180872 DSLAM-hosted information storage functionality |
| 02/20/2007 | US7180866 Rerouting in connection-oriented communication networks and communication systems |
| 02/20/2007 | US7180865 System and method for analyzing frame relay communications |
| 02/20/2007 | US7180858 Tool for measuring available bandwidth in computer networks |
| 02/20/2007 | US7180857 Apparatus and method for flow control |
| 02/20/2007 | US7180853 Method and apparatus for performing a connection admission control |
| 02/20/2007 | US7180355 Level shifter circuit with stress test function |
| 02/20/2007 | US7180323 Thin film transistor liquid crystal display (TFT-LCD) source driver for implementing a self burn-in test and a method thereof |
| 02/20/2007 | US7180322 Closed loop feedback control of integrated circuits |
| 02/20/2007 | US7180321 Tester interface module |
| 02/20/2007 | US7180320 Adaptive integrated circuit based on transistor current measurements |
| 02/20/2007 | US7180319 Selecting groups of dies for wafer testing |
| 02/20/2007 | US7180318 Multi-pitch test probe assembly for testing semiconductor dies having contact pads |
| 02/20/2007 | US7180317 High resolution analytical probe station |
| 02/20/2007 | US7180316 Probe head with machined mounting pads and method of forming same |
| 02/20/2007 | US7180315 Substrate with patterned conductive layer |
| 02/20/2007 | US7180314 Self-calibrating electrical test probe calibratable while connected to an electrical component under test |
| 02/20/2007 | US7180313 Test device for wafer testing digital semiconductor circuits |
| 02/20/2007 | US7180312 Probe card and method for manufacturing probe card |
| 02/20/2007 | US7180302 Method and system for determining cracks and broken components in armor |
| 02/20/2007 | US7180301 Power monitor-glitch trap system |
| 02/20/2007 | US7180300 System and method of locating ground fault in electrical power distribution system |
| 02/20/2007 | US7180299 Arc fault detector |
| 02/20/2007 | US7180298 Method and device for judging the condition of secondary batteries and method for regenerating secondary batteries |
| 02/20/2007 | US7180297 Protective relay test device |
| 02/20/2007 | US7180284 Testing circuits on substrates |
| 02/20/2007 | US7180283 Wafer lifting device |
| 02/20/2007 | US7180281 Electrical component and method of manufacturing the same |
| 02/20/2007 | US7180278 Real current sense apparatus for a DC-to-DC converter |
| 02/20/2007 | US7180272 Malfunction detecting apparatus for on-vehicle charging system |
| 02/20/2007 | US7179553 Method for detecting electrical defects in membrane electrode assemblies |
| 02/20/2007 | US7178236 Method for constructing a membrane probe using a depression |
| 02/20/2007 | CA2461449C Smart awa |
| 02/19/2007 | CA2556498A1 Testing loop impedance in an rccb electrical test circuit |
| 02/16/2007 | CA2556133A1 Rfid inlays and methods of their manufacture |
| 02/15/2007 | WO2007019077A2 Obtaining test data for a device |
| 02/15/2007 | WO2007019072A2 Vertical probe card and air cooled probe head system |
| 02/15/2007 | WO2007018081A1 Semiconductor testing device, performance board and interface plate |
| 02/15/2007 | WO2007018020A1 Semiconductor testing apparatus |
| 02/15/2007 | WO2007017953A1 Electronic component testing apparatus |
| 02/15/2007 | WO2007017839A2 Testing of an integrated circuit that contains secret information |
| 02/15/2007 | WO2007017838A1 Testing of an integrated circuit that contains secret information |
| 02/15/2007 | WO2006120112A3 Method for determining the condition of a long body |
| 02/15/2007 | WO2005101878A8 Method and system for monitoring the health of wireless telecommunication networks |
| 02/15/2007 | US20070038911 Direct logic diagnostics with signature-based fault dictionaries |
| 02/15/2007 | US20070038910 Semiconductor integrated circuit design apparatus and semiconductor integrated circuit design method |
| 02/15/2007 | US20070038909 Scan driver, display device having the same and method of driving a display device |
| 02/15/2007 | US20070038908 Design data structure for semiconductor integrated circuit and apparatus and method for designing the same |
| 02/15/2007 | US20070038427 Load current evaluation device, load current evaluation method, and recording medium containing load current evaluation program |
| 02/15/2007 | US20070038405 Waveform generator, waveform shaper, and testing apparatus |
| 02/15/2007 | US20070037945 Anionic polymers composed of dicarboxylic acids and uses thereof |
| 02/15/2007 | US20070037418 Process of forming socket contacts |
| 02/15/2007 | US20070037302 Method of preparing electrode |
| 02/15/2007 | US20070037300 Systems and methods for plasma processing of microfeature workpieces |
| 02/15/2007 | US20070036256 Apparatus for and method of measuring clock skew |
| 02/15/2007 | US20070036082 Method and system for testing network device logic |
| 02/15/2007 | US20070036081 Method and device for detecting defects of electromagnetic protection for electric harnesses |
| 02/15/2007 | US20070036077 Methods, systems, and computer program products for implementing data transformation processes |
| 02/15/2007 | US20070036076 Methods, systems, and computer program products for automatic creation of data tables and elements |
| 02/15/2007 | US20070036010 Memory apparatus |
| 02/15/2007 | US20070035325 Directional power detection by quadrature sampling |
| 02/15/2007 | US20070035324 Integrated circuit having electrically isolatable test circuitry |
| 02/15/2007 | US20070035323 Method for fabricating electronic circuit module and integrated circuit device |
| 02/15/2007 | US20070035322 Testing method detecting localized failure on a semiconductor wafer |
| 02/15/2007 | US20070035321 Device and method for testing mixed-signal circuits |
| 02/15/2007 | US20070035320 Semiconductor integrated circuit which can be burn-in-tested even when packaged and method of burn-in-testing semiconductor integrated circuit even when the semiconductor integrated circuit is packaged |
| 02/15/2007 | US20070035319 Electrical connector |
| 02/15/2007 | US20070035318 Donut-type parallel probe card and method of testing semiconductor wafer using same |
| 02/15/2007 | US20070035317 Multimeter having off-device display device and selection device |
| 02/15/2007 | US20070035307 State variable and parameter estimator comprising several partial models for an electrical energy storage device |
| 02/15/2007 | US20070035292 Vacuum circuit interrupter including circuit monitoring leakage or loss of vacuum and method of monitoring a vacuum interrupter for leakage or loss of vacuum |
| 02/15/2007 | US20070035291 IC sorter |
| 02/15/2007 | DE202006018427U1 Loading level indicator for an accumulator with a liquid electrolyte comprises a ball retainer having a gas bubble collecting channel starting between the first upper channel delimiting wall of a ball guiding channel and the tip |