| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 02/15/2007 | DE112004002808T5 Verfahren und Gerät zum Messen von elektrischen Hochfrequenzcharakteristika einer elektronischen Vorrichtung und Verfahren zum Kalibrieren von Geräten zum Messen von elektrischen Hochfrequenzcharakteristika Method and apparatus for measuring high-frequency electrical characteristics of an electronic device and method for calibrating apparatus for measuring high-frequency electrical characteristics |
| 02/15/2007 | DE10235458B4 Batteriesteuerungsverfahren und Batteriesteuerungsvorrichtung Battery and battery control device control method |
| 02/15/2007 | DE102006033188A1 Halbleiterbauelement, Testplatine, Testsystem, und Testverfahren A semiconductor device test board, the test system and test method |
| 02/15/2007 | DE102005038225A1 Verfahren und Vorrichtung für eine Überlastdetektion bei Handwerkzeugen Method and apparatus for detecting an overload for hand tools |
| 02/15/2007 | DE10158240B4 Systeme und Verfahren zum Erleichtern des Testens von Anschlussflächenempfängern integrierter Schaltungen Systems and methods for facilitating the testing of integrated circuits pad receivers |
| 02/14/2007 | EP1752780A2 Battery state of charge estimator |
| 02/14/2007 | EP1752779A2 Per-pin clock synthesis |
| 02/14/2007 | EP1752778A2 IC Sorter |
| 02/14/2007 | EP1752243A1 Machine tool comprising depth measurement for tools |
| 02/14/2007 | EP1751931A1 Service based bearer control and traffic flow template operation with mobile ip |
| 02/14/2007 | EP1751919A2 Method and apparatus for dynamically determining when to use quality of service reservation in internet media applications |
| 02/14/2007 | EP1751567A1 Method and apparatus for determining the available energy of a lithium ion battery |
| 02/14/2007 | EP1751566A1 Devices and methods for detecting operational failures of relays |
| 02/14/2007 | EP1751565A2 Method and apparatus for multi-level scan compression |
| 02/14/2007 | EP1751564A1 Sensor device for monitoring the operation of a pv system, and pv system with such a sensor device |
| 02/14/2007 | EP1751563A2 Broadband network and application service testing method and apparatus |
| 02/14/2007 | EP1751562A1 A method of monitoring line faults in a medium voltage network |
| 02/14/2007 | EP1751561A2 Bi-directional three-dimensional microwave scanning and volumetric mapping of a whole roll or pallet of paper |
| 02/14/2007 | EP1751560A1 Method of operating a shielded connection, and communications network |
| 02/14/2007 | EP1751557A2 Flexible microcircuit space transformer assembly |
| 02/14/2007 | EP1673637B1 Switch device |
| 02/14/2007 | EP1658509B1 System for detecting and locating faults in an electric fence |
| 02/14/2007 | EP1456881B1 Method for determining the esd/latch-up resistance of an integrated circuit |
| 02/14/2007 | EP1366417B1 Enhanced loopback testing of serial devices |
| 02/14/2007 | EP0899864B1 Induction motor controller |
| 02/14/2007 | CN2870273Y Intelligent control device of high-voltage breaker |
| 02/14/2007 | CN2870137Y Contact base for checking gas density relay |
| 02/14/2007 | CN2869924Y Detector |
| 02/14/2007 | CN2869880Y Cell detection device |
| 02/14/2007 | CN2869879Y Intelligent fault line-selection and positioning system |
| 02/14/2007 | CN2869878Y Microcomputer small-current earthing line-selection apparatus |
| 02/14/2007 | CN2869877Y Network cable quick-detection instrument |
| 02/14/2007 | CN2869876Y Fault detection device |
| 02/14/2007 | CN2869875Y Insulator dirt on-line mouitoring apparatus |
| 02/14/2007 | CN2869870Y Electric-field probe for electromagnetic compatibility near-field detection |
| 02/14/2007 | CN1914803A Pulsed current generator circuit with charge booster |
| 02/14/2007 | CN1914726A System and method pertaining to semiconductor dies |
| 02/14/2007 | CN1914701A Condition monitor for an electrical distribution device |
| 02/14/2007 | CN1914514A Method and apparatus for testing integrated circuits for susceptibility to latch-up |
| 02/14/2007 | CN1914488A Radiometric level gauge |
| 02/14/2007 | CN1913217A Powertrain battery life predicting and warning apparatuses |
| 02/14/2007 | CN1913118A Testing method for detecting localized failure on a semiconductor wafer |
| 02/14/2007 | CN1912930A Subsway rail car pulling circuit fault diagnosis system based on wave form identification |
| 02/14/2007 | CN1912645A Half-voltage stacked frequency thermal test method for asynchronous motor |
| 02/14/2007 | CN1912644A 半导体集成电路 The semiconductor integrated circuit |
| 02/14/2007 | CN1912643A Delay time measuring device and method |
| 02/14/2007 | CN1912642A Single-phase ground wire selecting equipment and method of neutral-point uneffect earthed system |
| 02/14/2007 | CN1912641A Method and system for detecting single-plate on position |
| 02/14/2007 | CN1912640A Apparatus for inspecting substrate and control method for the same |
| 02/14/2007 | CN1912637A Donut-type parallel probe card and method of testing semiconductor wafer using same |
| 02/14/2007 | CN1912636A Probe structure of preventing noise interference for semiconductor test board |
| 02/14/2007 | CN1912635A Probe card for testing image sensing chip |
| 02/14/2007 | CN1912634A Vertical probe card |
| 02/14/2007 | CN1912633A Semiconductor test plate structure for preventing noise interference |
| 02/14/2007 | CN1912632A Circuit board testing device |
| 02/14/2007 | CN1912631A Applied module of test plate |
| 02/14/2007 | CN1300893C Method and device for estimating remaining capacity of secondary cell, battery pack system, and electric vehicle |
| 02/14/2007 | CN1300597C Integrated assayer for photoelectric performance |
| 02/14/2007 | CN1300566C Insulation diagnosis method for electric appliance |
| 02/14/2007 | CN1299837C Pad coating system and its interlocking method |
| 02/13/2007 | US7178115 Manufacturing method and apparatus to avoid prototype-hold in ASIC/SOC manufacturing |
| 02/13/2007 | US7178113 Identification of an integrated circuit from its physical manufacture parameters |
| 02/13/2007 | US7178079 Reception data synchronizing apparatus and method, and recording medium with recorded reception data synchronizing program |
| 02/13/2007 | US7178078 Testing apparatus and testing method for an integrated circuit, and integrated circuit |
| 02/13/2007 | US7178077 Integrated circuit test apparatus |
| 02/13/2007 | US7178076 Architecture of an efficient at-speed programmable memory built-in self test |
| 02/13/2007 | US7178075 High-speed level sensitive scan design test scheme with pipelined test clocks |
| 02/13/2007 | US7178074 Method for testing functional circuit block |
| 02/13/2007 | US7178072 Methods and apparatus for storing memory test information |
| 02/13/2007 | US7178071 Device for and method of examining the signal performance of semiconductor circuits |
| 02/13/2007 | US7177965 Linking addressable shadow port and protocol for serial bus networks |
| 02/13/2007 | US7177941 Increasing TCP re-transmission process speed |
| 02/13/2007 | US7177458 Reduction of false alarms in PCB inspection |
| 02/13/2007 | US7177272 System and method for optimizing link throughput in response to non-congestion-related packet loss |
| 02/13/2007 | US7177271 Method and system for managing admission to a network |
| 02/13/2007 | US7177269 Router providing continuity of service of the state machines associated with the neighboring routers |
| 02/13/2007 | US7177268 Packet distributing device |
| 02/13/2007 | US7177020 Method and apparatus for analyzing the state of generation of foreign particles in semiconductor fabrication process |
| 02/13/2007 | US7176707 Back side component placement and bonding |
| 02/13/2007 | US7176706 Capacitance measurement method of micro structures of integrated circuits |
| 02/13/2007 | US7176705 Thermal optical chuck |
| 02/13/2007 | US7176704 Inspecting apparatus for semiconductor device |
| 02/13/2007 | US7176703 Test probe with thermally activated grip and release |
| 02/13/2007 | US7176702 Contact system for wafer level testing |
| 02/13/2007 | US7176701 Semiconductor device, temperature sensor, and electronic apparatus comprising it |
| 02/13/2007 | US7176693 Short circuit detecting circuit and abnormality monitoring signal generating circuit |
| 02/13/2007 | US7176675 Proximity sensitive defect monitor |
| 02/13/2007 | US7176674 Measurement of energy by means of a frequency converter |
| 02/13/2007 | US7176673 Direct current detection circuit |
| 02/13/2007 | US7176671 Current measuring device |
| 02/13/2007 | US7176560 Semiconductor device having a chip—chip structure |
| 02/13/2007 | US7176487 Semiconductor integrated circuit |
| 02/13/2007 | US7176044 For connecting microelectronic circuitry |
| 02/13/2007 | CA2379694C Extending synchronous busses by arbitrary lengths using native bus protocol |
| 02/13/2007 | CA2374437C Method and apparatus for delay-line time-domain reflectometry |
| 02/13/2007 | CA2235683C Method and apparatus for in situ field stator bar insulation capacitance mapping |
| 02/08/2007 | WO2007016699A2 Method and system for debug and test using replicated logic |
| 02/08/2007 | WO2007016599A1 Method and apparatus for cleaning a probe card |
| 02/08/2007 | WO2007016311A2 Congestion management over lossy network connections |
| 02/08/2007 | WO2007016038A2 Temperature control in ic sockets |