Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
03/2007
03/28/2007EP1766422A1 Method for measuring electric current in a plurality of conductors
03/28/2007EP1704491A4 A method and systems for resource bunlding in a communications network
03/28/2007CN2884515Y Upper/lower substrates cut-off and short circuit checker for plasma panel
03/28/2007CN2884413Y Delivery inspection apparatus used for plasma displaying screen
03/28/2007CN2884223Y Electronic loading circuit for DC power source safety short-circuit testing
03/28/2007CN2884222Y Device for measuring voltage of the break-end of cells
03/28/2007CN2884221Y Composition testing desk for multi-functional test of leakage circuit-breaker
03/28/2007CN2884220Y Device for checking electric relay
03/28/2007CN2884219Y On-line testing device for faults of three-phase full control bridge of crystal valve
03/28/2007CN2884218Y Device for test main cable of motor cycles
03/28/2007CN2884217Y Device for testing quartz joint of network RJ45/RJ11
03/28/2007CN2884216Y Current testing device
03/28/2007CN2884215Y On-line insulation testing device for insulator of high voltage power-supply placed on the top of electric power locomotive
03/28/2007CN2884211Y Apparatus for testing safety of electric engineering quality
03/28/2007CN2884206Y Probe for testing the picture elements of display panel
03/28/2007CN2884205Y Disassembling-free type device for detecting that if BIOS be of available
03/28/2007CN2884204Y Base for testing ball-grid array type integrated circuit
03/28/2007CN2884176Y Equipment for testing steering wheel
03/28/2007CN1939043A Electrical wire joint fault detection
03/28/2007CN1938969A Apparatus and method for transmitting data blocks based on priority
03/28/2007CN1938949A Circuit testing apparatus, circuit testing method, and signal distributing method therefor
03/28/2007CN1938842A Probe apparatus, wafer-inspecting apparatus provided with the probe apparatus, and the wafer-inspecting method
03/28/2007CN1938788A Test apparatus, phase adjusting method and memory controller
03/28/2007CN1938599A Method of testing an electrochemical device
03/28/2007CN1938598A System and method pertaining to burn-in testing
03/28/2007CN1938597A Measuring circuit for the output of a power amplifier and a power amplifier comprising the measuring circuit
03/28/2007CN1938596A Radiation information management device and communication device
03/28/2007CN1938594A Inspection block
03/28/2007CN1938398A Polymer dispersed liquid crystal formulations for modulator fabrication
03/28/2007CN1937386A Method and apparatus for fault detection in a switching power supply
03/28/2007CN1937326A Connecting component
03/28/2007CN1937303A Lead-acid battery detecting-repairing method and system
03/28/2007CN1937196A Test system and method for judging integrated circuit processing speed
03/28/2007CN1937066A Multi-CD player detection device and method therefor
03/28/2007CN1937040A Method for detecting CD machine and apparatus
03/28/2007CN1936990A Safety inspection system, method and programe and recording medium for recording program
03/28/2007CN1936615A Push-button service-life detection system and method
03/28/2007CN1936614A Drop and drag logic analyzer trigger
03/28/2007CN1936613A Logic pen with twelve frequency zone photo-acoustic indicator
03/28/2007CN1936612A Method for remote measuring high-voltage insulator zero-value by laser
03/28/2007CN1936611A On-line needle-bed detection device of detecting instrument
03/28/2007CN1936610A Method for detecting shield effect of electromagnetic-radiation-preventive clothing
03/28/2007CN1936609A Detection apparatus for cable assembly radio-frequency leakage and detection method
03/28/2007CN1936603A Apparatus and method for measuring pixel driving current
03/28/2007CN1936596A Connection point assembly and lsi chip detection device for the same
03/28/2007CN1936594A Probe card transfer assist apparatus, and inspection equipment and method using same
03/28/2007CN1936593A Simple-beam type microelectronic mechanical system detection card and producing method thereof
03/28/2007CN1936592A Testing electric clip
03/28/2007CN1307768C Method and apparatus for detecting a failed thyristor
03/28/2007CN1307648C A method for testing a memory array and a memory-based device so testable with a fault response signalizing mode for when finding predetermined correspondence between fault patterns signalizing one su
03/28/2007CN1307425C Ageing trolley detecting monitoring improving apparatus
03/27/2007US7197731 Virtual component having a detachable verification-supporting circuit, a method of verifying the same, and a method of manufacturing an integrated circuit
03/27/2007US7197726 Test structures for estimating dishing and erosion effects in copper damascene technology
03/27/2007US7197725 Semiconductor integrated circuit and testing method for the same
03/27/2007US7197721 Weight compression/decompression system
03/27/2007US7197693 Connection verification apparatus for verifying interconnection between multiple logic blocks
03/27/2007US7197684 Single-ended transmission for direct access test mode within a differential input and output circuit
03/27/2007US7197682 Semiconductor test device and timing measurement method
03/27/2007US7197681 Accelerated scan circuitry and method for reducing scan test data volume and execution time
03/27/2007US7197680 Communication interface for diagnostic circuits of an integrated circuit
03/27/2007US7197674 Method and apparatus for conditioning of a digital pulse
03/27/2007US7197429 Diagnosis system for household electric appliances
03/27/2007US7197418 Online specification of a system which compares determined devices and installed devices
03/27/2007US7197417 Method and structure to develop a test program for semiconductor integrated circuits
03/27/2007US7197416 Supporting calibration and diagnostics in an open architecture test system
03/27/2007US7197412 Method and integrated circuit for use by a handheld multiple function device
03/27/2007US7197178 Photoresist edge bead removal measurement
03/27/2007US7197069 Multi-pair gigabit ethernet transceiver having adaptive disabling of circuit elements
03/27/2007US7196782 Methods and systems for determining a thin film characteristic and an electrical property of a specimen
03/27/2007US7196571 Semiconductor integrated circuit device
03/27/2007US7196553 Sensor signal detection device
03/27/2007US7196537 Integrated circuit
03/27/2007US7196536 Method and apparatus for non-contact electrical probe
03/27/2007US7196535 Thermal control system for environmental test chamber
03/27/2007US7196534 Semiconductor test instrument
03/27/2007US7196533 Control system and method of semiconductor inspection system
03/27/2007US7196532 Test probe for semiconductor package
03/27/2007US7196531 Method of manufacturing a probe card
03/27/2007US7196530 Device testing contactor, method of producing the same, and device testing carrier
03/27/2007US7196529 Systems and methods for testing conductive members employing electromagnetic back scattering
03/27/2007US7196523 Battery charge/discharge monitoring circuit and method
03/27/2007US7196507 Apparatus for testing substrates
03/27/2007US7196496 Battery control circuit and electronic device
03/27/2007US7195937 Method for measuring withstand voltage of semiconductor epitaxial wafer and semiconductor epitaxial wafer
03/27/2007US7195935 Selective packaging of tested semiconductor devices
03/27/2007US7195934 Method and system for deposition tuning in an epitaxial film growth apparatus
03/27/2007US7195931 Split manufacturing method for advanced semiconductor circuits
03/27/2007US7195503 Electrical contactor, especially wafer level contactor, using fluid pressure
03/27/2007CA2433631C Bar code reading method and apparatus for a battery tester charger
03/27/2007CA2401714C System and method for surveying utility outages
03/27/2007CA2355783C Method and apparatus for testing fuel gas control systems for gas fired appliances
03/27/2007CA2307031C Electronic assembly video inspection system
03/27/2007CA2162763C Automated trouble-shooting mechanism resident in craftsperson's portable test and communications device
03/22/2007WO2007033204A2 Forwarding plane data communications channel for ethernet transport networks
03/22/2007WO2007032944A2 Arc fault circuit interrupter system
03/22/2007WO2007032904A2 Shared bond pad for testing a memory within a packaged semiconductor device
03/22/2007WO2007032697A1 A method for fault location in electric power lines
03/22/2007WO2007032456A1 Semiconductor devices and method of testing same
03/22/2007WO2007032382A1 Secondary cell degradation judgment method, secondary cell degradation judgment device, and power supply system
03/22/2007WO2007032194A1 Testing device, testing method, analyzing device, and program