| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/07/2007 | CN1908575A Detecting needle alignment proving circuit and proving method in semiconductor device |
| 02/07/2007 | CN1299545C Electronic device |
| 02/07/2007 | CN1299408C Filling liquid heat conductive medium temperature control device for semiconductor laser parameter test |
| 02/07/2007 | CN1299344C Device for testing semiconductor device |
| 02/07/2007 | CN1299343C Semiconductor device for charge-up damage evaluation and charge-up damage evaluation method |
| 02/07/2007 | CN1299342C Test carrier plate |
| 02/07/2007 | CN1299120C Detector and detection head of multi-channel, low input capacitance signal |
| 02/06/2007 | US7174521 System and method for product yield prediction |
| 02/06/2007 | US7174502 Synchronization error detection circuit |
| 02/06/2007 | US7174492 AC coupled line testing using boundary scan test methodology |
| 02/06/2007 | US7174491 Digital system and method for testing analogue and mixed-signal circuits or systems |
| 02/06/2007 | US7174490 Test system rider utilized for automated at-speed testing of high serial pin count multiple gigabit per second devices |
| 02/06/2007 | US7174489 Semiconductor memory test device |
| 02/06/2007 | US7174488 Echo canceler-based mechanism for performing and reporting fault diagnostic testing of repeatered telecommunication line |
| 02/06/2007 | US7174279 Test system with differential signal measurement |
| 02/06/2007 | US7174264 Fault diagnosis apparatus |
| 02/06/2007 | US7174255 Self-processing integrated damage assessment sensor for structural health monitoring |
| 02/06/2007 | US7173903 Vehicle active network with communication path redundancy |
| 02/06/2007 | US7173882 Methods and systems for performing horological functions using time cells |
| 02/06/2007 | US7173549 Semiconductor integrated circuit in which voltage down converter output can be observed as digital value and voltage down converter output voltage is adjustable |
| 02/06/2007 | US7173447 Method and apparatus for diagnosing fault in semiconductor device |
| 02/06/2007 | US7173446 Mechanism to stabilize power delivered to a device under test |
| 02/06/2007 | US7173445 Sensor for inspection instrument and inspection instrument |
| 02/06/2007 | US7173444 Structure and method for parallel testing of dies on a semiconductor wafer |
| 02/06/2007 | US7173443 Semiconductor test system |
| 02/06/2007 | US7173442 Integrated printed circuit board and test contactor for high speed semiconductor testing |
| 02/06/2007 | US7173441 Prefabricated and attached interconnect structure |
| 02/06/2007 | US7173440 Probing apparatus and test method including electrical shielding |
| 02/06/2007 | US7173439 Guide for tip to transmission path contact |
| 02/06/2007 | US7173433 Circuit property measurement method |
| 02/06/2007 | US7173432 Method and machine for repetitive testing of an electrical component |
| 02/06/2007 | US7173431 Cable tester |
| 02/06/2007 | US7173429 Activity-based battery monitor with a universal current measuring apparatus |
| 02/06/2007 | US7173428 Portable circuit interrupter shutoff testing device and method |
| 02/06/2007 | US7173397 Battery system, battery monitoring method and apparatus |
| 02/06/2007 | US7173314 Storage device having a probe and a storage cell with moveable parts |
| 02/06/2007 | US7173243 Non-feature-dependent focusing |
| 02/06/2007 | CA2236283C Ground fault circuit interrupter system with uncommitted contacts |
| 02/03/2007 | CA2516346A1 Battery charge testing apparatus |
| 02/01/2007 | WO2007013768A1 Apparatus for measuring partial discharge and measuring system including the apparatus |
| 02/01/2007 | WO2007013578A1 Timing generator and semiconductor test instrument |
| 02/01/2007 | WO2007013577A1 Timing generator and semiconductor test device |
| 02/01/2007 | WO2007013341A1 Electronic component device testing apparatus |
| 02/01/2007 | WO2007013306A1 Semiconductor logic circuit device test vector generation method and test vector generation program |
| 02/01/2007 | WO2007012504A1 Method for regulating charging of nickel cadmium and nickel metal hydride batteries, and power supply unit |
| 02/01/2007 | WO2007012456A1 Measurement arrangement for measuring the inductance and resistance value of an inductive sensor |
| 02/01/2007 | US20070028154 Valid-transmission verifying circuit and a semiconductor device including the same |
| 02/01/2007 | US20070027643 Systems and methods for monitoring and storing performance and maintenance data related to an electrical component |
| 02/01/2007 | US20070027569 Semiconductor production system |
| 02/01/2007 | US20070025257 Efficient switching architecture with reduced stub lengths |
| 02/01/2007 | US20070025240 Bypass switch for an ethernet device and method of bypassing devices in an ethernet network |
| 02/01/2007 | US20070024315 Method and apparatus for testing liquid crystal display |
| 02/01/2007 | US20070024314 Test system and single-chip tester capable of testing a plurality of chips simultaneously |
| 02/01/2007 | US20070024313 Chuck top, wafer holder having the chuck top, and wafer prober having the chuck top |
| 02/01/2007 | US20070024312 Device and method for the testing of integrated semiconductor circuits on wafers |
| 02/01/2007 | US20070024311 Semiconductor test apparatus |
| 02/01/2007 | US20070024310 Open offset canceling method and an impedance measuring apparatus using the method |
| 02/01/2007 | US20070024309 Integrated systems testing |
| 02/01/2007 | US20070024308 Integrated systems testing |
| 02/01/2007 | US20070024307 Connection unit, a board for mounting a device under test, a probe card and a device interfacing part |
| 02/01/2007 | US20070024306 Integrated circuit load board and method having on-board test circuit |
| 02/01/2007 | US20070024305 Apparatuses for inspecting pogo pins of an electrical die sorting system and a method for performing the same |
| 02/01/2007 | US20070024304 Wafer holder, heater unit used for wafer prober and having wafer holder, and wafer prober |
| 02/01/2007 | US20070024303 Method of electrical testing |
| 02/01/2007 | US20070024302 Low-current pogo probe card |
| 02/01/2007 | US20070024301 Electrical feedback detection system for multi-point probes |
| 02/01/2007 | US20070024300 Method for manufacturing integrated circuit, measurement apparatus for integrated circuit, and wafer |
| 02/01/2007 | US20070024299 Body for keeping a wafer and wafer prober using the same |
| 02/01/2007 | US20070024298 Torsion spring probe contactor design |
| 02/01/2007 | US20070024297 Post and tip design for a probe contact |
| 02/01/2007 | US20070024296 Portable manipulator for stackable semiconductor test system |
| 02/01/2007 | US20070024295 Probe for an atomic force microscope |
| 02/01/2007 | US20070024294 Apparatus to inspect TFT substrate and method of inspecting TFT substrate |
| 02/01/2007 | US20070024293 Method and apparatus of electromagnetic measurement |
| 02/01/2007 | US20070024288 Apparatus and Method for Detecting an Error in a Power Signal |
| 02/01/2007 | US20070024272 Voltage injector and detector for printed circuit board testing |
| 02/01/2007 | US20070024271 Integrated systems testing |
| 02/01/2007 | US20070024242 Battery management system and driving method thereof |
| 02/01/2007 | US20070023658 Method of inspecting pattern and inspecting instrument |
| 02/01/2007 | US20070023656 Method for inspecting substrate, and method and apparatus for inspecting array substrates |
| 02/01/2007 | DE19648475B4 Kontaktstruktur, Prüfkarten und Herstellungsverfahren Contact structure, test cards and manufacturing processes |
| 02/01/2007 | DE112005000268T5 Testgerät und Testverfahren Test apparatus and test procedure |
| 02/01/2007 | DE112004002805T5 Verfahren und Gerät zum Messen von elektrischen Hochfrequenzcharakteristika einer elektronischen Vorrichtung und Verfahren zum Kalibrieren von Geräten zum Messen von elektrischen Hochfrequenzcharakteristika Method and apparatus for measuring high-frequency electrical characteristics of an electronic device and method for calibrating apparatus for measuring high-frequency electrical characteristics |
| 02/01/2007 | DE10328719B4 Verfahren zum Testen von elektronischen Bauteilen A method for testing electronic components |
| 02/01/2007 | DE102005046374B3 Detecting open-circuit common fuse, blocking current supply to vehicle components, opens component switches and determines potentials at associated nodes |
| 02/01/2007 | DE102005035031A1 Device for testing integrated semiconductor circuits on wafers, includes nozzle for spraying purging gas on to surface of wafers |
| 02/01/2007 | DE102005034730B3 Verfahren um Erfassen einer Zugehörigkeit eines Notlichtversorgungsgeräts zu einem elektronischen Vorschaltgeräts in einem DALI-Netzwerk Method for detecting an association of a Notlichtversorgungsgeräts to an electronic ballast in a DALI network |
| 02/01/2007 | DE102005021586B3 Semiconductor chip tested for intact flanks and edges, includes electronic test circuit integrated into semiconductor chip |
| 02/01/2007 | DE102004001956B4 Umverdrahtungssubstratstreifen mit mehreren Halbleiterbauteilpositionen Rewiring substrate having a plurality of semiconductor component positions |
| 02/01/2007 | DE10125910B4 Verfahren und Schaltung zur Erkennung von Motor-Isolationsfehlern Method and circuit for detection of motor insulation faults |
| 02/01/2007 | DE10007399B4 Kragenförmige Kontakthülsenkonfiguration für Federfühler Collar-shaped contact tube configuration for Spring Probe |
| 01/31/2007 | EP1748299A1 Electronic circuit, system with an electronic circuit and method to test an electronic circuit |
| 01/31/2007 | EP1747617A2 System and method for generating a jittered test signal |
| 01/31/2007 | EP1747476A1 Battery state recognition |
| 01/31/2007 | EP1747475A1 Carrier module for adapting non-standard instrument cards to test systems |
| 01/31/2007 | EP1747437A1 Thermal protection for a vlsi chip through reduced c4 usage |
| 01/31/2007 | CN2865104Y Small current grounding fault line selecting device based on variable controller |
| 01/31/2007 | CN2864893Y Plane display panel detecting instrument with accurate positioning unit |
| 01/31/2007 | CN2864708Y Accumulator tester |
| 01/31/2007 | CN2864707Y Ultra-low frequency high-voltage generator |