Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
03/2007
03/14/2007EP1761968A1 System for monitoring a group of electrochemical cells and device therefor
03/14/2007EP1761951A2 Lead solder indicator and method
03/14/2007EP1761947A1 Method and apparatus for reducing aspect ratio dependent etching in time division multiplexed etch processes
03/14/2007EP1761790A2 Systems and methods for testing radio frequency identification tags
03/14/2007EP1761789A1 A sensor system for measuring an electric potential signal of an object
03/14/2007EP1488246A4 System and method for monitoring a packet network
03/14/2007EP1364221B1 Planarizing interposer
03/14/2007CN2879587Y Fault diagnosing device for vehicle illumination part
03/14/2007CN2879504Y Simple type multifunctional distribution automatic system
03/14/2007CN2879397Y Vacuum breaker with contact abrasion thickness detecting device
03/14/2007CN2879212Y New high-voltage transducer low energy consuming load testing device
03/14/2007CN2879211Y Telephone testing machine
03/14/2007CN2879210Y Hall detecting frock
03/14/2007CN2879209Y On-line monitoring device for transmission Lines dynamic monitoring capacity enlargement system
03/14/2007CN2879208Y Insulating resistance detecting switch for high-voltage motor
03/14/2007CN2879207Y Vehicle mounted electron device interference simulator having breadth adjustable large-power wave clipper
03/14/2007CN2879206Y Microwave leakage detecting device for microwave heating equipment
03/14/2007CN2879197Y Wiring device for battery testing equipment
03/14/2007CN2879196Y chip testing modular
03/14/2007CN2879195Y 测试装置 Testing device
03/14/2007CN2878138Y Lighting monitoring device for peripheral vehicle body
03/14/2007CN1930766A Power converter, inverter x-ray high voltage unit, fluoroscopic system, x-ray CT system, MRI system
03/14/2007CN1930750A High impedance fault detection
03/14/2007CN1930729A Method of and device for determining at least one characteristic parameter of a resonant structure
03/14/2007CN1930718A Fuel cell system failure diagnosis method, failure diagnosis device using same, and fuel cell system
03/14/2007CN1930673A Turning device for heavy object
03/14/2007CN1930662A Low temperature epitaxial growth of silicon-containing films using UV radiation
03/14/2007CN1930514A Board inspecting method, array board inspecting method and array board inspecting equipment
03/14/2007CN1930483A 电源装置 Power supply unit
03/14/2007CN1930482A Probe and probe manufacturing method
03/14/2007CN1929281A Abnormity determining device for electric vehicle
03/14/2007CN1929223A Integrated automation converting station debugging apparatus
03/14/2007CN1929188A Anomaly detection method of battery pack, battery pack and electronic apparatus
03/14/2007CN1929087A Appearance detection device
03/14/2007CN1929033A 半导体器件 Semiconductor devices
03/14/2007CN1928580A Electric power sensing method for fuel cell and its application
03/14/2007CN1928579A Electric motor load judgment method
03/14/2007CN1928578A Test circuit and test method thereof
03/14/2007CN1928577A Chip testing method and related devices
03/14/2007CN1928576A Chip testing system and method
03/14/2007CN1928575A 芯片测试机制与相关方法 Chip testing mechanism and related methods
03/14/2007CN1928574A Traveling wave accidents distance measuring device for hour and minute composite sampling electric transmission line
03/14/2007CN1928573A Fault diagnosis apparatus and method for system-on-chip (soc)
03/14/2007CN1928572A Single-phase grounding monitoring device for low voltage ungrounded system
03/14/2007CN1928417A Opposition method between steam generator rotor and acceleration tank
03/14/2007CN1305281C Inter connected network protocol packet error processing equipment and its method
03/14/2007CN1305181C Connecting component
03/14/2007CN1304847C Automatic detector for dielectric strength between commutator segments
03/13/2007US7191415 Clearance inspection apparatus and clearance inspection method
03/13/2007US7191413 Method and apparatus for thermal testing of semiconductor chip designs
03/13/2007US7191374 Method of and program product for performing gate-level diagnosis of failing vectors
03/13/2007US7191373 Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (DFD) techniques
03/13/2007US7191372 Integrated data download
03/13/2007US7191371 System and method for sequential testing of high speed serial link core
03/13/2007US7191370 Data transmitter device, repeater device, data transmission/reception device, and data communication method
03/13/2007US7191368 Single platform electronic tester
03/13/2007US7191265 JTAG and boundary scan automatic chain selection
03/13/2007US7191259 Method and apparatus for fast integer within-range compare
03/13/2007US7191113 Method and system for short-circuit current modeling in CMOS integrated circuits
03/13/2007US7191077 Smart battery charging system, method, and computer program product
03/13/2007US7190822 Method for customizing an integrated circuit element
03/13/2007US7190714 Peripheral device receiver detection in a high noise environment
03/13/2007US7190704 Cable modem system with sample and packet synchronization
03/13/2007US7190677 System and method for multiple test access in a communication network
03/13/2007US7190675 Adaptive access control in LAN relaying apparatus
03/13/2007US7190667 Link level packet flow control mechanism
03/13/2007US7190606 Test mode control device using nonvolatile ferroelectric memory
03/13/2007US7190593 Semiconductor integrated circuit device
03/13/2007US7190583 Self contained, liquid to air cooled, memory test engineering workstation
03/13/2007US7190459 Multi beam scanning with bright/dark field imaging
03/13/2007US7190458 Use of scanning beam for differential evaluation of adjacent regions for change in reflectivity
03/13/2007US7190446 System for processing electronic devices
03/13/2007US7190186 Method and apparatus for determining concentration of defects and/or impurities in a semiconductor wafer
03/13/2007US7190185 Methodology to measure many more transistors on the same test area
03/13/2007US7190184 Systems for wafer level burn-in of electronic devices
03/13/2007US7190183 Selecting die placement on a semiconductor wafer to reduce test time
03/13/2007US7190182 Test probe for finger tester and corresponding finger tester
03/13/2007US7190181 Probe station having multiple enclosures
03/13/2007US7190179 Contact probe
03/13/2007US7190175 Orthogonal microwave imaging probe
03/13/2007US7190174 Method for calibrating timing clock
03/13/2007US7190172 Cable tester
03/13/2007US7190171 Detecting method and detecting apparatus for detecting internal of rechargeable battery, rechargeable battery pack having said detecting apparatus therein, apparatus having said detecting apparatus therein, program in which said detecting method is incorporated, and medium in which said program is stored
03/13/2007US7190170 Particle doped magnetic coil
03/13/2007US7190157 Method and apparatus for layout independent test point placement on a printed circuit board
03/13/2007US7190155 Test apparatus and testing method
03/13/2007US7190144 System and method for adjusting a PID controller in a limited rotation motor system
03/13/2007US7190074 Reconstructed semiconductor wafers including alignment droplets contacting alignment vias
03/13/2007US7189923 Digital electronic apparatus with suppressed radiant noise
03/13/2007US7189585 Display panel, display panel inspection method, and display panel manufacturing method
03/13/2007US7189332 Apparatus and method for detecting an endpoint in a vapor phase etch
03/12/2007CA2559142A1 Light management system having networked intelligent luminaire managers with enhanced diagnostics capabilities
03/08/2007WO2007027702A2 Automotive vehicle electrical system diagnostic device
03/08/2007WO2007027086A1 Method and system for determining a network structure or layout of at least a part of an electricity transport network
03/08/2007WO2007026877A1 Circuit board inspecting apparatus and circuit board inspecting method
03/08/2007WO2007026774A1 Probe card
03/08/2007WO2007026663A1 Circuit board inspection instrument, circuit board inspection method, and anisotropic conductivity connector
03/08/2007WO2007026563A1 Calibration board for electronic component testing apparatus
03/08/2007WO2007026508A1 Semiconductor device and test mode control circuit
03/08/2007WO2007026458A1 Wafer-level burn-in method and wafer-level burn-in apparatus