| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/05/2007 | US20070079190 Product reliability analysis |
| 04/05/2007 | US20070079189 Method and system for generating a global test plan and identifying test requirements in a storage system environment |
| 04/05/2007 | US20070079188 Signal integrity self-test architecture |
| 04/05/2007 | US20070077762 Method of accelerating test of semiconductor device |
| 04/05/2007 | US20070077667 Semiconductor wafer test system |
| 04/05/2007 | US20070077666 Efficient provision of alignment marks on semiconductor wafer |
| 04/05/2007 | US20070077665 Tool for creating customized user interface definitions for a generic utility supporting on-demand creation of field device editor graphical user interfaces |
| 04/05/2007 | US20070076613 Method for dynamically adjusting token bucket sizes |
| 04/05/2007 | US20070076599 System and method for providing integrated services across cryptographic boundaries in a network |
| 04/05/2007 | US20070075728 AC Power Supply Testing Module And Method For Booting A Main Board |
| 04/05/2007 | US20070075727 Inspection device and inspection method for active matrix panel, and manufacturing method for active matrix organic light emitting diode panel |
| 04/05/2007 | US20070075726 Interposer and test assembly for testing electronic devices |
| 04/05/2007 | US20070075725 Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer |
| 04/05/2007 | US20070075724 Thermal optical chuck |
| 04/05/2007 | US20070075723 Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer |
| 04/05/2007 | US20070075722 Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer |
| 04/05/2007 | US20070075721 Burn-in testing apparatus and method |
| 04/05/2007 | US20070075720 Test pattern of semiconductor device and test method using the same |
| 04/05/2007 | US20070075719 Method of testing semiconductor devices and handler used for testing semiconductor devices |
| 04/05/2007 | US20070075718 Layout for DUT arrays used in semiconductor wafer testing |
| 04/05/2007 | US20070075717 Lateral interposer contact design and probe card assembly |
| 04/05/2007 | US20070075716 Probe for testing a device under test |
| 04/05/2007 | US20070075715 Contact Carriers (Tiles) For Populating Larger Substrates With Spring Contacts |
| 04/05/2007 | US20070075714 Dual-chamber solution packaging system |
| 04/05/2007 | US20070075713 Tester for in-circuit testing bed of nails fixture and testing circuit thereof |
| 04/05/2007 | US20070075710 Methods and systems for detecting a capacitance using sigma-delta measurement techniques |
| 04/05/2007 | US20070075709 Method and apparatus for detecting minute oscillation and WiBro repeater having the same |
| 04/05/2007 | US20070075702 Insert having independently movable latch mechanism for semiconductor package |
| 04/05/2007 | US20070075037 Dimension monitoring method and system |
| 04/05/2007 | US20070074392 Membrane probing system |
| 04/05/2007 | DE10260238B4 Adapter zum Testen einer oder mehrerer Leiteranordnungen und Verfahren Adapter for testing one or more printed circuit assemblies and methods |
| 04/05/2007 | DE10220343B4 Vorrichtung und Verfahren zum Prüfen von Leiterplatten und Prüfsonde Apparatus and method for testing circuit boards and probe |
| 04/05/2007 | DE102006043366A1 Production of a contact device used in the production of integrated circuits comprises preparing a support substrate having a contact connection on the main surface, forming an elastic protrusion and forming a conducting structure |
| 04/05/2007 | DE102006043134A1 Method for measuring frequency of signal under test involves measuring time of prescribed phase of signal under test and calculating slope of approximate line related to prescribed phase and measured time or reciprocal of slope as frequency |
| 04/05/2007 | DE102006043132A1 Verfahren und Gerät zum Messen des Eingangsschwellenpegels eines Prüflings Method and apparatus for measuring the input threshold level of an examinee |
| 04/05/2007 | DE102006034754A1 Vorrichtung und Verfahren zum Testen eines Halbleiterbauelements und Eye-Mask-Generator Apparatus and method for testing a semiconductor device and Eye Mask Generator |
| 04/05/2007 | DE102005050112A1 Process to diagnose the dielectric ageing of an electrical component by comparison of used condition with original condition |
| 04/05/2007 | DE102005047483A1 Probe e.g. passive wave guide probe, for e.g. oscilloscope, has two test prods that are provided on changing device, where changing device is connected to probe and is alternately connected to electric waveguide that runs inside probe |
| 04/05/2007 | DE102005046814A1 Electronic and electromechanical component e.g. semiconductor component, tempering and testing device, has translatory movable transport rails attached to heating and cooling sections |
| 04/05/2007 | DE102005045218A1 Determining state of battery in circuit with starter for combustion engine involves detecting parameter correlated with current change/level when starting, deriving measure of current flowing during starting, deriving state from measure |
| 04/05/2007 | DE102005045095A1 Verfahren zum Bestimmen des Abbrandes von Kontakten eines elektromagnetischen Schaltgerätes und elektromagnetisches Schaltgerät mit einer nach diesem Verfahren arbeitenden Einrichtung A method for determining the erosion of contacts of an electromagnetic switching device, and electromagnetic switching device with a device operating according to this method |
| 04/05/2007 | CA2623474A1 Compressed video packet scheduling system |
| 04/04/2007 | EP1769660A1 Ic socket |
| 04/04/2007 | EP1769409A2 Hardware/software design tool and language specification mechanism enabling efficient technology retargeting and optimization |
| 04/04/2007 | EP1769258A1 Dynamic line rating system with real-time tracking of conductor creep to establish the maximum allowable conductor loading as limited by clearance |
| 04/04/2007 | EP1769257A2 Increase productivity at wafer test using probe retest data analysis |
| 04/04/2007 | EP1769256A2 Method and system for determining cracks and broken components in armor |
| 04/04/2007 | EP1769255A2 Apparatus and method for interconnect verification |
| 04/04/2007 | EP1690316B1 Antenna coupler |
| 04/04/2007 | CN2886898Y DC power supply cabinet |
| 04/04/2007 | CN2886895Y Multifunctional microcomputer controller for DC power supply system |
| 04/04/2007 | CN2886596Y Improvement on status display of electric bicycle charger |
| 04/04/2007 | CN2886595Y Multi-parameter collecting device used for modularized storage battery |
| 04/04/2007 | CN2886594Y A device in universal leakage circuit breaker testing bench, for detecting switching on/off condition of circuit breaker |
| 04/04/2007 | CN2886593Y Handle positioning device for universal leakage circuit breaker testing bench |
| 04/04/2007 | CN2886592Y A universal testing bench for leakage circuit breaker used for step motor's dual-limit protection |
| 04/04/2007 | CN2886590Y A device for monitoring insulation of vacuum switch |
| 04/04/2007 | CN2886589Y A damage detector for electrical power cable |
| 04/04/2007 | CN2886588Y Universal fault indicator for high voltage grid |
| 04/04/2007 | CN2886587Y A device for online and offline detecting local discharging |
| 04/04/2007 | CN2886586Y A device for detecting circuit integrity of lighting cable |
| 04/04/2007 | CN2886585Y A device for measuring anti-disturbance capacity of meter wave antenna |
| 04/04/2007 | CN2886584Y Radiation testing platform |
| 04/04/2007 | CN1942925A Simultaneous physical and protocol layer analysis |
| 04/04/2007 | CN1942774A Method of displaying remaining battery power, and electronic apparatus |
| 04/04/2007 | CN1942773A Inspection unit |
| 04/04/2007 | CN1942772A TCP handling device |
| 04/04/2007 | CN1942771A TCP Handling device |
| 04/04/2007 | CN1942770A Method and apparatus for characterising a three phase transformer using a single phase power supply |
| 04/04/2007 | CN1942029A Method for using active organic light-emitting diodes array pixel circuit |
| 04/04/2007 | CN1941544A Battery charger |
| 04/04/2007 | CN1941209A Operation guiding electricity saver of embedded memory |
| 04/04/2007 | CN1941066A Multiple display device system and method for automatically setting display-mode |
| 04/04/2007 | CN1940585A Battery module managing device for master-slave radio data secrete discrimination and tracting method |
| 04/04/2007 | CN1940584A Information handling system capable of detecting frequency lock and method thereof |
| 04/04/2007 | CN1940583A Method and arrangment for testing a stacked die semiconductor device |
| 04/04/2007 | CN1940582A Method and apparatus for inspecting mark on semi-conductor element |
| 04/04/2007 | CN1940581A Method and device for inspecting display unit connecting state |
| 04/04/2007 | CN1940580A Circuit-board characteristic impedance measuring system and method |
| 04/04/2007 | CN1940575A Non-planar PC testing board |
| 04/04/2007 | CN1940574A Test socket |
| 04/04/2007 | CN1940573A 测试夹具 Test Fixture |
| 04/04/2007 | CN1940572A Integrated circuit testing card |
| 04/04/2007 | CN1940567A Transferring clipper |
| 04/04/2007 | CN1940540A Defect inspection apparatus and defect inspection method |
| 04/04/2007 | CN1940518A Fall impacting device and its testing method |
| 04/04/2007 | CN1309139C Pole transformer load monitoring system using wireless internet |
| 04/04/2007 | CN1308893C Method for generating characteristic palette of circuit board in circuit board inspection system |
| 04/04/2007 | CN1308741C Inspection apparatus for inspecting a display module |
| 04/04/2007 | CN1308697C Circuit for measuring capacitance and analysis method of wiring character |
| 04/04/2007 | CN1308696C Antenna testing method |
| 04/03/2007 | US7200825 Methodology of quantification of transmission probability for minority carrier collection in a semiconductor chip |
| 04/03/2007 | US7200788 Radio reception system that inhibits transmission of acknowledgment or negative acknowledgment signal for a data channel when control information of a control channel exceeds a reception capability of a receiver |
| 04/03/2007 | US7200786 Built-in self-analyzer for embedded memory |
| 04/03/2007 | US7200785 Sequential tester for longest prefix search engines |
| 04/03/2007 | US7200784 Accelerated scan circuitry and method for reducing scan test data volume and execution time |
| 04/03/2007 | US7200783 Removable and replaceable TAP domain selection circuitry |
| 04/03/2007 | US7200780 Semiconductor memory including error correction function |
| 04/03/2007 | US7200509 Vacuum chamber with two-stage longitudinal translation for circuit board testing |
| 04/03/2007 | US7200499 Calculation device calculating available capacity of secondary battery and method of calculating the same |