Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
03/2007
03/08/2007WO2007026433A1 Work handling apparatus
03/08/2007WO2007026191A1 Circuit interconnect testing arrangement and approach therefor
03/08/2007WO2007026019A1 Device and method for balancing charge between the individual cells of a double-layer capacitor
03/08/2007WO2007025961A1 Method for preparation of a planar sample body and preparation
03/08/2007WO2007025692A1 Method and device for measuring differential voltages at the terminals of elements of a battery with transformation into periodic signal
03/08/2007WO2006126130A3 Device, system and method for testing and analysing integrated circuits
03/08/2007WO2006117765A3 Method for analyzing an integrated circuit, apparatus and integrated circuit
03/08/2007WO2006081082A3 Combination of high-side and low-side current sensing in system for providing power over communication link
03/08/2007WO2006073737A3 A method and apparatus for increasing the operating frequency of a system for testing electronic devices
03/08/2007WO2006030435A3 Efficient protection mechanisms for protecting multicast traffic in a ring topology network utilizing label switching protocols
03/08/2007US20070054425 Apparatus for measuring semiconductor physical characteristics
03/08/2007US20070053119 Earth leakage detection device
03/08/2007US20070052440 Directional power detection by quadrature sampling
03/08/2007US20070052439 System and method for checking decoupling of power supply in printed wiring board
03/08/2007US20070052438 Methods and apparatus for testing electronic circuits
03/08/2007US20070052437 Packaged circuit module for improved installation and operation
03/08/2007US20070052436 Device design-for-test and burn-in-board with minimal external components and increased testing capacity
03/08/2007US20070052435 Broadband wireless ad-hoc modem and network testbed
03/08/2007US20070052434 Cooling apparatus and testing machine using the same
03/08/2007US20070052433 Coaxial probe, method for production thereof, and device for measuring in the near electromagnetic field on systems at a submicrometric distance
03/08/2007US20070052432 Probe card
03/08/2007US20070052426 On-line transformer condition monitoring
03/08/2007US20070052423 Method and an apparatus for estimating saturated polarization and a method for estimating residual discharge capacity
03/08/2007US20070052412 Magnetic-field-measuring device
03/08/2007US20070051984 Rewiring substrates strip with several semiconductor component positions
03/08/2007US20070051888 System and method for determining a cross sectional feature of a structural element using a reference structural element
03/08/2007US20070051595 Method for monitoring contact consumption in multiple contact switches
03/08/2007DE202006018837U1 Elektrowerkzeug mit Schutzschaltung Power tools with protective circuit
03/08/2007DE19807739B4 Kombinierter Integrierter Speicher- und Logikschaltkreis und Testverfahren hierfür Combined Integrated memory and logic circuit and test method therefor
03/08/2007DE102006028080A1 Klemmtesthalterung für eine Hochfrequenzminiatursonderanordnung Terminal test fixture for high frequency miniature special arrangement
03/08/2007DE102005042423A1 Apparatus for monitoring the insulation around a heating cable of underfloor heating whilst the cable is being laid
03/08/2007DE102005041614A1 Halbleiter-Bauelement-Testsystem mit Test-Schnittstellen-Einrichtung The semiconductor device testing system with the test interface device
03/08/2007DE102005041511A1 Verfahren und Einrichtung zur Erfassung und Überwachung von Isolationsstrecken und Berührungsspannungen im Trolley-Bus Method and apparatus for recording and monitoring of insulation distances and touch voltages in the trolley bus
03/08/2007DE102005039886A1 Leistungsbedarfskontrolliertes modulares System Power consumption Controlled modular system
03/08/2007DE10152273B4 Verfahren und Vorrichtung zur Überwachung eines redundanten Abschaltpfades Method and apparatus for monitoring a redundant shutdown path
03/07/2007EP1760477A2 Anomaly detection method of battery pack, battery pack and electronic apparatus
03/07/2007EP1760459A2 Method and system for automatically determining electrical properties of a semiconductor wafer or sample
03/07/2007EP1759913A2 Method and apparatus for detecting and monitoring the isolation distances and chassis-contact voltage of a trolley-bus
03/07/2007EP1759220A1 Improved jitter generation
03/07/2007EP1759219A1 Method and apparatus to reduce jitter by adjusting vertical offset
03/07/2007EP1642337B1 Offset dependent resistor for measuring misalignment of stitched masks
03/07/2007CN2877211Y Antistatic screening test box
03/07/2007CN2876799Y Tester for protecting plate of lithium cell
03/07/2007CN2876798Y Detector for probe module of charger
03/07/2007CN2876797Y Detector for fault of braking lamp
03/07/2007CN2876796Y Detector for fault of distributing line
03/07/2007CN2876795Y Improved leak electricity detecting circuit
03/07/2007CN2876792Y Over current protection digital current-meter for testing electric insulation performance
03/07/2007CN2876790Y Intelligent tester for prevention performance of insulation gloves and boots
03/07/2007CN2876788Y Multi-point battery voltage real-time monitor
03/07/2007CN1926676A Probe positioning and bonding device and probe bonding method
03/07/2007CN1926463A Method for inspecting array substrates
03/07/2007CN1926440A Test circuit and method for hierarchical core
03/07/2007CN1926439A System and method for reducing temperature variation during burn in
03/07/2007CN1926438A See-saw interconnect assembly with dielectric carrier grid providing spring suspension
03/07/2007CN1926437A Circuit board inspecting device and circuit board inspection method
03/07/2007CN1926422A Testing facilities for image sensor
03/07/2007CN1925086A Digital full automatic breaker over-loading short cut testing test stand
03/07/2007CN1925041A Data storage device testing method and data storage device making method
03/07/2007CN1924963A Organic electro luminescence display (OELD) to perform sheet unit test and testing method using the OELD
03/07/2007CN1924602A Battery coulometric detection alarm device and method thereof
03/07/2007CN1924601A Drive circuit detection method for two-dimensional display
03/07/2007CN1924600A Device characteristics measuring system
03/07/2007CN1924599A Conduction checking device and method for printed base plate
03/07/2007CN1924598A Method for detecting short circuit of non-aqueous electrolyte secondary batteries
03/07/2007CN1924597A Cable detection apparatus and scanning method thereof
03/07/2007CN1924596A Method for evaluating lifespan of integrated circuit chip products
03/07/2007CN1924595A Virtual instrument technique based gas insulation combined electric appliances online detecting method
03/07/2007CN1924594A High-voltage transmission line lightning stroke flashover path detection method
03/07/2007CN1924593A DC electric filed detection method of insulator for high-voltage DC transmission line
03/07/2007CN1924592A Detecting method and equipment for digital wave filter
03/07/2007CN1924591A Characteristic evaluating device and characteristic evaluating method
03/07/2007CN1303721C Battery of possessing function for displaying surplus energy and method
03/07/2007CN1303679C Connector and method of manufacturing the same
03/07/2007CN1303668C Compound integrated circuit design verification method
03/07/2007CN1303662C Directly connected interface unit for memory test machine and integrated circuit sorter
03/07/2007CN1303531C Semiconductor device
03/07/2007CN1303522C Design method for switch equipment on-line state monitor special chip
03/07/2007CN1303429C 多重插座侦测器 Multiple socket detector
03/07/2007CN1303425C Method and device for determining DC motor operating state and state variety thereof
03/07/2007CN1303420C Method for checking image
03/06/2007US7188326 Methods for designing and testing semiconductor integrated circuits with plural clock groups
03/06/2007US7188323 Restricted scan reordering technique to enhance delay fault coverage
03/06/2007US7188291 Circuit and method for testing a circuit having memory array and addressing and control unit
03/06/2007US7188290 Data alignment for telecommunications networks
03/06/2007US7188289 Test circuit and circuit test method
03/06/2007US7188288 Semiconductor LSI circuit with scan circuit, scan circuit system, scanning test system and method
03/06/2007US7188287 Semiconductor apparatus
03/06/2007US7188286 Accelerated scan circuitry and method for reducing scan test data volume and execution time
03/06/2007US7188285 Scan test circuit with reset control circuit
03/06/2007US7188284 Error detecting circuit
03/06/2007US7188283 Communication signal testing with a programmable logic device
03/06/2007US7188277 Integrated circuit
03/06/2007US7188276 Apparatus and method for testing a computer system by utilizing FPGA and programmable memory module
03/06/2007US7188043 Boundary scan analysis
03/06/2007US7188037 Method and apparatus for testing circuit boards
03/06/2007US7188036 Internal bias measure with onboard ADC for electronic devices
03/06/2007US7188010 Device and method for converting a diagnostic interface to SPI standard
03/06/2007US7187654 Rate-controlled optical burst switching
03/06/2007US7187653 Method and system for performing a logical loopback test