| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/31/2007 | CN2864706Y Frequency changing dielectrometer |
| 01/31/2007 | CN2864705Y Device for detecting transformer winding state utilizing sweep frequency power source exciting |
| 01/31/2007 | CN2864704Y Circuit detecting instrument |
| 01/31/2007 | CN2864703Y Visual degree meter |
| 01/31/2007 | CN2864686Y Hand-held connecting device for detection |
| 01/31/2007 | CN2864685Y Microwave coplanar waveguide testing jig |
| 01/31/2007 | CN2864658Y Automatic product aging test facility |
| 01/31/2007 | CN2863585Y LED signal lamp with digital automatic detection function |
| 01/31/2007 | CN1906496A Probe device capable of being used for plural kinds of testers |
| 01/31/2007 | CN1906495A Method and system for analyzing circuit performance characteristic |
| 01/31/2007 | CN1906493A Electrically connecting apparatus and contactor |
| 01/31/2007 | CN1905369A Power detection circuit for non-contact IC card or RFID tag |
| 01/31/2007 | CN1905330A Air gap eccentric checking device and method for single-phase inductor |
| 01/31/2007 | CN1904675A Photoelectric characteristic offset checking and adjusting method and its device |
| 01/31/2007 | CN1904628A Electronic circuit, system with an electronic circuit and method for testing an electronic circuit |
| 01/31/2007 | CN1904627A Lightning protector and detection instrument of device and its detection method |
| 01/31/2007 | CN1904626A Transmission line system having uniform electric field |
| 01/31/2007 | CN1904625A Test system of luminous diode surface plate and its method |
| 01/31/2007 | CN1904577A Automatic test device and method of aviation circuit breaker fatigue life |
| 01/31/2007 | CN1298111C Low noise microwave synthesizer employing high frequency combs for tuning drift cancel loop |
| 01/31/2007 | CN1298038C Semiconductor device |
| 01/31/2007 | CN1298035C Water testing parameter analytical method |
| 01/31/2007 | CN1297962C Pick-up-device testing apparatus |
| 01/31/2007 | CN1297821C Intelligent pulse current multiple parameter digital measurer based on non-linear resistance sheet |
| 01/30/2007 | US7171642 Method and system for creating a netlist allowing current measurement through a sub-circuit |
| 01/30/2007 | US7171611 Apparatus for determining the access time and/or the minimally allowable cycle time of a memory |
| 01/30/2007 | US7171602 Event processing apparatus and method for high speed event based test system |
| 01/30/2007 | US7171601 Programmable jitter generator |
| 01/30/2007 | US7171600 Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device |
| 01/30/2007 | US7171599 Field programmable device |
| 01/30/2007 | US7171598 Tester system having a multi-purpose memory |
| 01/30/2007 | US7171597 Input/output compression test circuit |
| 01/30/2007 | US7171596 Circuit and method for testing embedded DRAM circuits through direct access mode |
| 01/30/2007 | US7171592 Self-testing circuit in semiconductor memory device |
| 01/30/2007 | US7171587 Automatic test system with easily modified software |
| 01/30/2007 | US7171580 Method and apparatus for enhancing system clock availability |
| 01/30/2007 | US7171536 Unusable block management within a non-volatile memory system |
| 01/30/2007 | US7171510 On-chip observability buffer to observer bus traffic |
| 01/30/2007 | US7171497 Progressive extended compression mask for dynamic trace |
| 01/30/2007 | US7171337 Event-based automated diagnosis of known problems |
| 01/30/2007 | US7171325 Method and system for wideband device measurement and modeling |
| 01/30/2007 | US7171324 System and method for removing measurement errors from measurement systems |
| 01/30/2007 | US7171322 Algorithm for estimation of multiple faults on a transmission line or waveguide |
| 01/30/2007 | US7171317 Load information display device and circuit breaker |
| 01/30/2007 | US7171186 Cellular mobile phone with user-data backup and available time display functionality |
| 01/30/2007 | US7171037 Optical inspection system and method for displaying imaged objects in greater than two dimensions |
| 01/30/2007 | US7170865 Communications system having enhanced fault tolerance |
| 01/30/2007 | US7170853 Vehicle active network topologies |
| 01/30/2007 | US7170600 Spectrometer using diffraction grating |
| 01/30/2007 | US7170457 Mobile electromagnetic compatibility (EMC) test laboratory |
| 01/30/2007 | US7170393 Method and apparatus for the automatic determination of network cable connections using RFID tags and an antenna grid |
| 01/30/2007 | US7170365 Ultrafast sampler with non-parallel shockline |
| 01/30/2007 | US7170311 Testing method for LCD panels |
| 01/30/2007 | US7170310 System and method using locally heated island for integrated circuit testing |
| 01/30/2007 | US7170309 TDDB test pattern and method for testing TDDB of MOS capacitor dielectric |
| 01/30/2007 | US7170308 On-chip voltage regulator using feedback on process/product parameters |
| 01/30/2007 | US7170307 System and method of mitigating effects of component deflection in a probe card analyzer |
| 01/30/2007 | US7170306 Connecting a probe card and an interposer using a compliant connector |
| 01/30/2007 | US7170305 Apparatus and method for terminating probe apparatus of semiconductor wafer |
| 01/30/2007 | US7170304 Selectively configurable probe structures, e.g., selectively configurable probe cards for testing microelectronic components |
| 01/30/2007 | US7170300 Apparatus and method for inspecting interface between ground layer and substrate of microstrip by using scattering parameters |
| 01/30/2007 | US7170299 Electronic fuse blow mimic and methods for adjusting electronic fuse blow |
| 01/30/2007 | US7170298 Methods for testing continuity of electrical paths through connectors of circuit assemblies |
| 01/30/2007 | US7170297 Transmission response measurement system and method of using time gating |
| 01/30/2007 | US7170296 Loop impedance meter |
| 01/30/2007 | US7170277 Shield for tester load boards |
| 01/30/2007 | US7170276 Device for compensating for heat deviation in a modular IC test handler |
| 01/30/2007 | US7170275 Method and apparatus for determining the temperature of a junction using voltage responses of the junction and a correction factor |
| 01/30/2007 | US7170251 System and method for diagnosing a controller in a limited rotation motor system |
| 01/30/2007 | US7170091 Probe look ahead: testing parts not currently under a probehead |
| 01/30/2007 | US7170090 Method and structure for testing metal-insulator-metal capacitor structures under high temperature at wafer level |
| 01/30/2007 | US7170056 Methodology and apparatus for leakage detection |
| 01/30/2007 | US7170031 Earth connections for workpieces |
| 01/30/2007 | US7169646 Interconnect assemblies and methods |
| 01/30/2007 | US7168974 Three phase lighted plugs and connectors for indicating the absence of at least one phase |
| 01/30/2007 | US7168163 Full wafer silicon probe card for burn-in and testing and test system including same |
| 01/30/2007 | US7168162 Method of manufacturing a probe card |
| 01/30/2007 | US7168150 Method of making a resonant frequency tag |
| 01/30/2007 | CA2334404C Method of and apparatus for measuring battery capacity |
| 01/29/2007 | CA2790174A1 System and method of determining standby time for mobile stations |
| 01/29/2007 | CA2558597A1 Method and system for detecting and isolating stray voltage |
| 01/29/2007 | CA2514164A1 System and method of determining standby time for mobile stations |
| 01/25/2007 | WO2007011661A1 Control electronics for li-ion batteries |
| 01/25/2007 | WO2007011590A2 Protocol optimization for wireless networks |
| 01/25/2007 | WO2007011507A2 Method and system for encryption-based design obfuscation for an integrated circuit |
| 01/25/2007 | WO2007011453A1 Pin electronics driver |
| 01/25/2007 | WO2007011196A1 A method of earth fault identification and location in three-phase electrical network |
| 01/25/2007 | WO2007010734A1 Semiconductor apparatus and method of testing semiconductor apparatus |
| 01/25/2007 | WO2007010691A1 Method and device for detecting charged state of battery |
| 01/25/2007 | WO2007010652A1 Inspecting apparatus |
| 01/25/2007 | WO2007010610A1 Pusher, pusher unit and semiconductor testing apparatus |
| 01/25/2007 | WO2007010493A2 Testable integrated circuit, system in package and test instruction set |
| 01/25/2007 | WO2007010480A2 Method of manufacturing a system in package |
| 01/25/2007 | WO2006019788A3 System and method for testing electronic device performance |
| 01/25/2007 | WO2006002309A3 Flexible m:n redundancy mechanism for packet inspection engine |
| 01/25/2007 | WO2005115068A3 High density interconnect system having rapid fabrication cycle |
| 01/25/2007 | WO2005081947A3 Miniature fluid-cooled heat sink with integral heater |
| 01/25/2007 | WO2005060061A3 Device for controlling a final power-output stage |
| 01/25/2007 | US20070022351 Method and apparatus that provide for configuration of hardware resources specified in a test template |
| 01/25/2007 | US20070022350 Built-in waveform edge deskew using digital-locked loops and coincidence detectors in an automated test equipment system |