| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/23/2007 | US7168021 Built-in test circuit for an integrated circuit device |
| 01/23/2007 | US7168020 Circuit and method for testing embedded phase-locked loop circuit |
| 01/23/2007 | US7168019 Method and module for universal test of communication ports |
| 01/23/2007 | US7168018 Apparatus and method for reducing test resources in testing DRAMs |
| 01/23/2007 | US7168017 Memory devices with selectively enabled output circuits for test mode and method of testing the same |
| 01/23/2007 | US7168014 Propagating an error through a network |
| 01/23/2007 | US7168004 Technique for testability of semiconductor integrated circuit |
| 01/23/2007 | US7167811 Methods and apparatus for data analysis |
| 01/23/2007 | US7167449 Communication terminal device, method, program, recording medium, and integrated circuit for use in communication network system |
| 01/23/2007 | US7167443 System and method for packet level restoration of IP traffic using overhead signaling in a fiber optic ring network |
| 01/23/2007 | US7167404 Method and device for testing configuration memory cells in programmable logic devices (PLDS) |
| 01/23/2007 | US7167151 Active matrix substrate |
| 01/23/2007 | US7167030 Drive circuit and method of applying high voltage test thereon |
| 01/23/2007 | US7167028 Voltage detection circuit, power supply unit and semiconductor device |
| 01/23/2007 | US7167016 Operation mode setting circuit |
| 01/23/2007 | US7167015 Active cooling to reduce leakage power |
| 01/23/2007 | US7167014 Method for testing using a universal wafer carrier for wafer level die burn-in |
| 01/23/2007 | US7167013 Suction cap for IC sockets and IC socket assembly using same |
| 01/23/2007 | US7167012 Universal wafer carrier for wafer level die burn-in |
| 01/23/2007 | US7167011 Differential measurement probe having retractable double cushioned variable spacing probing tips with EOS/ESD protection capabilities |
| 01/23/2007 | US7167010 Pin-in elastomer electrical contactor and methods and processes for making and using the same |
| 01/23/2007 | US7167007 Apparatus and method for field testing MOV arresters |
| 01/23/2007 | US7166929 Diagnostic apparatus and diagnostic method for fuel cell |
| 01/23/2007 | US7165978 Socket for semiconductor device |
| 01/23/2007 | US7165322 Process of forming socket contacts |
| 01/23/2007 | CA2336126C Sensor cell for an electrochemical fuel cell stack |
| 01/18/2007 | WO2007009049A2 System and method for reading a test strip |
| 01/18/2007 | WO2007009008A2 System and method for data maintenance and integration including interpolation |
| 01/18/2007 | WO2007008961A2 Method and apparatus for parameter adjustment, testing, and configuration |
| 01/18/2007 | WO2007008790A2 Probe card assembly with an interchangeable probe insert |
| 01/18/2007 | WO2007007869A1 Connector for measuring electrical resistance, and apparatus and method for measuring electrical resistance of circuit board |
| 01/18/2007 | WO2007007835A1 Electronic component test device |
| 01/18/2007 | WO2007007736A1 Probe card |
| 01/18/2007 | WO2007007658A1 Testing apparatus |
| 01/18/2007 | WO2007007655A1 Battery system |
| 01/18/2007 | WO2007007544A1 Probe card |
| 01/18/2007 | WO2007007416A1 Device aligning table and handler provided with such device aligning table |
| 01/18/2007 | WO2007007406A1 Test equipment of electronic component |
| 01/18/2007 | WO2007007111A2 Current measurement apparatus |
| 01/18/2007 | WO2007006846A1 A battery detection interface |
| 01/18/2007 | WO2007006620A1 Device for triggering an electromagnetic actuator, and method for testing a first inductor of an electromagnetic actuator |
| 01/18/2007 | WO2007006501A1 Test apparatus with tester channel availability identification |
| 01/18/2007 | WO2007006437A1 Diagnostic method for load-testing self-excited three-phase generators in a motor vehicle |
| 01/18/2007 | WO2007006149A1 Means of detecting faults in alternators |
| 01/18/2007 | WO2007006121A1 Detecting the state-of-charge of a lithium ion battery in a hybrid electric vehicle |
| 01/18/2007 | WO2006126022A8 Battery monitor |
| 01/18/2007 | WO2006093635A3 Method and circuit for the detection of solder-joint failures in a digital electronic package |
| 01/18/2007 | WO2006090125A3 Detecting excess current leakage of a cmos device |
| 01/18/2007 | WO2006023744A3 Methods and apparatus for local outlier detection |
| 01/18/2007 | WO2006023032A3 Cross-monitoring sensor system and method |
| 01/18/2007 | US20070016836 Test pattern compression for an integrated circuit test environment |
| 01/18/2007 | US20070016835 Method and apparatus for parameter adjustment, testing, and configuration |
| 01/18/2007 | US20070016834 Reducing Power Dissipation During Sequential Scan Tests |
| 01/18/2007 | US20070016833 Method For Performing Built-In And At-Speed Test In System-On-Chip |
| 01/18/2007 | US20070016659 Network-based system for configuring a programmable hardware element in a system using hardware configuration programs generated based on a user specification |
| 01/18/2007 | US20070015297 Failure analysis vehicle for yield enhancement with self test at speed burnin capability for reliability testing |
| 01/18/2007 | US20070015296 Methods and systems for characterizing semiconductor materials |
| 01/18/2007 | US20070015295 Methods and systems for characterizing semiconductor materials |
| 01/18/2007 | US20070014652 Electronic component inspection apparatus |
| 01/18/2007 | US20070014292 Protocol optimization for wireless networks |
| 01/18/2007 | US20070014059 Method and system for determining location of phase-to-earth fault |
| 01/18/2007 | US20070013409 Digitally controlled high-voltage power supply and method therefor |
| 01/18/2007 | US20070013408 Inspection device for display panel and interface used therein |
| 01/18/2007 | US20070013407 Method for measuring FET characteristics |
| 01/18/2007 | US20070013406 System and method for reading a test strip |
| 01/18/2007 | US20070013405 Test head docking system and method |
| 01/18/2007 | US20070013404 Apparatus, customer tray, and method for testing semiconductor packages |
| 01/18/2007 | US20070013403 Apparatus for analyzing fault of semiconductor integrated circuit, method for the same, and computer readable medium for the same |
| 01/18/2007 | US20070013402 Shared memory bus architecture for system with processor and memory units |
| 01/18/2007 | US20070013401 Wafer-level burn-in and test |
| 01/18/2007 | US20070013400 Wafer level ac and/or dc testing |
| 01/18/2007 | US20070013399 Method of monitoring a semiconductor manufacturing trend |
| 01/18/2007 | US20070013398 Method of monitoring a semiconductor manufacturing trend |
| 01/18/2007 | US20070013397 Inspection system, inspection method, and method for manufacturing semiconductor device |
| 01/18/2007 | US20070013396 Universal pcb and smart card using the same |
| 01/18/2007 | US20070013395 On-die impedance calibration |
| 01/18/2007 | US20070013394 Dual feedback control system for maintaining the temperature of an ic-chip near a set-point |
| 01/18/2007 | US20070013393 Test probe and tester, method for manufacturing the test probe |
| 01/18/2007 | US20070013392 Interposer including air gap structure, methods of forming the same, semiconductor device including the interposer, and multi-chip package including the interposer |
| 01/18/2007 | US20070013391 Semiconductor integrated circuit device |
| 01/18/2007 | US20070013390 Contactor, contact structure provided with contactors, probe card, test apparatus, method of production of contact structure, and production apparatus of contact structure |
| 01/18/2007 | US20070013389 Adjusting analog electric circuit outputs |
| 01/18/2007 | US20070013387 Means of detecting faults in alternators |
| 01/18/2007 | US20070013386 Device for probe card power bus voltage drop reduction |
| 01/18/2007 | US20070013385 Apparatus and method for controlling die force in a semiconductor device testing assembly |
| 01/18/2007 | US20070013384 Method for single ended line testing and single ended line testing device |
| 01/18/2007 | US20070013383 Methods and apparatus for unpowered testing of open connections on power and ground nodes of circuit devices |
| 01/18/2007 | US20070013382 Method for detection and diagnosis of isolation faults in fuel cell hybrid vehicles |
| 01/18/2007 | US20070013380 Circuit breaker with integrated ammeter |
| 01/18/2007 | US20070013364 Internal sensor with disturbing current reduced by compensation branches |
| 01/18/2007 | US20070013363 Test structure design for reliability test |
| 01/18/2007 | US20070013362 Framework that maximizes the usage of testhead resources in in-circuit test system |
| 01/18/2007 | US20070013359 Integrated circuit and circuit board |
| 01/18/2007 | DE112005000420T5 Halbleiter-Prüfverfahren und System für dieses Semiconductor Test method and system for this |
| 01/18/2007 | DE112005000311T5 Messgerät, Messverfahren und Testgerät Measuring Instrument, Measurement methods and test equipment |
| 01/18/2007 | DE102006030063A1 Wiedereinschaltbarer elektronischer Trennschalter und Verfahren zum Betrieb dieses Trennschalters Wiedereinschaltbarer electronic isolation switch and method of operation of this circuit breaker |
| 01/18/2007 | DE102005032923A1 Diagnoseverfahren zur Lastprüfung von selbsterregten Drehstromgeneratoren im Kraftfahrzeug Diagnostic methods for load testing of self-excited alternators in motor vehicles |
| 01/18/2007 | DE102005032142A1 Verfahren zum Kontaktieren von Halbleiterbauteilen mit einem Testkontakt A method for bonding semiconductor components with a test contact |
| 01/18/2007 | DE102005031724A1 Electronic system e.g. brake system, diagnosing method for motor vehicle, involves characterizing functions of systems by function modules, and function dependently implementing diagnosis of system by diagnosing modules of functions |
| 01/18/2007 | DE102005031254A1 Verfahren zur Erkennung vorgebbarer Größen eines elektrischen Speichers Method for detecting specifiable sizes of an electric memory |