Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
01/2007
01/17/2007EP1744169A2 Means of detecting faults in alternators
01/17/2007EP1744167A1 Sheet-like probe, method of producing the probe, and application of the probe
01/17/2007EP1744166A1 Sheet-like probe, method of producing the probe, and application of the probe
01/17/2007EP1743243A2 Apparatus and method for improving emulation speed of high-level languages in on-chip emulation systems
01/17/2007EP1743184A2 Method and arrangement for determining operating parameters of an electrochemical storage battery
01/17/2007EP1743183A1 Wireless quality-of-service detection method
01/17/2007EP1743182A2 Intelligent probe card architecture
01/17/2007EP1743159A1 Method of assessing the risk of whiskers appearing on the surface of a metallic deposit
01/17/2007EP1503218B1 Method for diagnosing deterioration of coil and system for diagnosing deterioration of coil
01/17/2007CN2859732Y LCD module testing instrument
01/17/2007CN2859731Y LCD element testing instrument
01/17/2007CN2859682Y Circuit fault annunciator
01/17/2007CN2859558Y Stepless load-adjusting apparatus for motor group test
01/17/2007CN2859557Y Antistatic hand-loop self-checking unit
01/17/2007CN2859556Y Circuit open failure sensor for electric heater
01/17/2007CN2859555Y Vehicle electric system failure diagnosis tool
01/17/2007CN2859554Y DC ground connection fault indicator
01/17/2007CN2859553Y Equiform uniformity field measuring instrument
01/17/2007CN2859552Y Resistance tester for accumulator separator
01/17/2007CN2859551Y Intellectual power cable phase detecting instrument
01/17/2007CN2859547Y Digital display track circuit failure detecting instrument
01/17/2007CN2859544Y Electronic tester and electronic testing system
01/17/2007CN1898575A Method and device for estimating remaining service life of coil
01/17/2007CN1898574A High sensitivity magnetic built-in current sensor
01/17/2007CN1898573A Method and apparatus for identifying intermittent earth fault
01/17/2007CN1898572A Conductive contact holder, conductive contact unit and process for producing conductive contact holder
01/17/2007CN1898555A Substrate inspection device
01/17/2007CN1897793A Method of treating and probing a via
01/17/2007CN1897094A Liquid-crystal display panel and its inspection
01/17/2007CN1897059A Circuit and remote controller to control the sending power with the consequence checking the battery remaining voltage
01/17/2007CN1897002A Method for identifying a physical failure location and system for combining pure logic and physical layout information
01/17/2007CN1896762A Battery charger with battery life judging function
01/17/2007CN1896761A Improved accumulator testing system and method
01/17/2007CN1896760A Method for determining short circuit between windings of power generator rotor with load automatically
01/17/2007CN1896759A Method and apparatus for electrical testing of a unit under test, as well as a method for production of apparatus which is used for testing
01/17/2007CN1896758A Cable monitoring system and monitoring method thereof
01/17/2007CN1896757A Phase-shifting fail ture by couting discrimination
01/17/2007CN1896756A Cable-fault on-line distance measurement based on artifical nerve network mode
01/17/2007CN1896755A Display apparatus for detecting cable connection state
01/17/2007CN1896754A Methods and apparatus for unpowered testing of circuit devices
01/17/2007CN1896752A Antenna coupling tester
01/17/2007CN1896749A Inspection device for display panel and interface used therein
01/17/2007CN1896748A Apparatus for hot-probing integrated semiconductor circuits on wafers
01/17/2007CN1896725A Device for inspecting a wafer
01/17/2007CN1896709A Method for gearbox testboard of wind-driven generator set
01/17/2007CN1295859C Method for measuring modulation efficiency of generating set primary frequency-modulation
01/17/2007CN1295793C Semiconductor storage apparatus
01/17/2007CN1295772C Semiconductor epitaxial wafer and method for measuring withstand voltage thereof
01/17/2007CN1295746C Semiconductor device and its manufacturing method and testing method of semiconductor device
01/17/2007CN1295517C Method for detecting travelling-wave protection device
01/17/2007CN1295516C Current measuring method and arrangement
01/16/2007US7165200 System and method for characterizing a signal path using a sub-chip sampler
01/16/2007US7165199 Tap time division multiplexing
01/16/2007US7165198 System for testing an integrated circuit using multiple test modes
01/16/2007US7165196 Method for testing serializers/de-serializers
01/16/2007US7165018 Address range comparator for detection of multi size memory accesses with data matching qualification and full or partial overlap
01/16/2007US7165014 Partial discharge monitoring apparatus and partial discharge remote monitoring system for rotating electric machines
01/16/2007US7165004 Dynamically adaptable semiconductor parametric testing
01/16/2007US7165002 Test device for dynamic memory modules
01/16/2007US7164661 System and method for providing a two-way satellite system
01/16/2007US7164653 Shared bandwidth reservation in PL, ATM, FR and IP/MPLS networks
01/16/2007US7164652 System and method for detecting failures and re-routing connections in a communication network
01/16/2007US7164362 Apparatus for driving a brushless motor
01/16/2007US7164285 Directional power detection by quadrature sampling
01/16/2007US7164284 Dynamic gamma for a liquid crystal display
01/16/2007US7164283 Auto-recovery wafer testing apparatus and wafer testing method
01/16/2007US7164282 Methods and apparatus for determining an average electrical response to a conductive layer on a substrate
01/16/2007US7164281 Circuit board component ambient moisture exposure monitoring
01/16/2007US7164280 Electrical test device
01/16/2007US7164279 System for evaluating probing networks
01/16/2007US7164278 Device for releasable connecting an interface with a test equipment
01/16/2007US7164274 Cable diagnostics using time domain reflectometry and applications using the same
01/16/2007US7164273 Power source monitor
01/16/2007US7164264 Dynamic silicon characterization observability using functional clocks for system or run-time process characterization
01/16/2007US7164257 Method and system for protection of a lithium-based multicell battery pack including a heat sink
01/16/2007US7164243 System and method for establishing motor efficiency during balanced or unbalanced operating conditions
01/16/2007US7164149 Semiconductor device, semiconductor device manufacturing method, and semiconductor device test method
01/16/2007US7163833 Display panel and manufacturing method of display panel
01/16/2007US7163826 Method of fabricating multi layer devices on buried oxide layer substrates
01/16/2007US7162911 Semiconductor acceleration sensor and method of testing the same
01/11/2007WO2007005878A1 Clock jitter estimation apparatus, systems, and methods
01/11/2007WO2007005662A2 Testing of receivers with separate linear o/e module and host used in communication links
01/11/2007WO2007005586A1 System and method for using model analysis to generate directed test vectors
01/11/2007WO2007005558A2 Contactless magnetic potentiometer
01/11/2007WO2007005516A2 Connector-to-pad pcb translator for a tester and method of fabricatio
01/11/2007WO2007005446A2 Method and apparatus for determining stuck-at fault locations in cell chains using scan chains
01/11/2007WO2007005133A2 Automated monitoring of a network
01/11/2007WO2007005042A1 Esd component ground clip
01/11/2007WO2007004698A1 Leakage current detection apparatus and leakage current detection method
01/11/2007WO2007004691A1 Electric field/magnetic field sensor and method for fabricating them
01/11/2007WO2007004289A1 Testing circuit, wafer, measuring apparatus, device manufacturing method and display device
01/11/2007WO2007004002A1 Method for determining an asynchronous engine temperature and unit for controlling the power supply of an engine therefor
01/11/2007WO2007003988A1 Device and method for compensating for voltage drops
01/11/2007WO2007003460A1 Method for identifying preset values of an electric accumulator
01/11/2007WO2007003036A1 Method and system for luminance characterization
01/11/2007WO2006104947B1 Apparatus and method for managing battery performance of a wireless device
01/11/2007WO2006068937A3 A method and system for producing signals to test semiconductor devices
01/11/2007WO2005124966A3 Method and apparatus for detecting impedance
01/11/2007WO2005048062A3 Method and apparatus for co-verification of digital designs
01/11/2007US20070011546 IC output signal path with switch, bus holder, and buffer