| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/25/2007 | US20070022349 Test apparatus with tester channel availability identification |
| 01/25/2007 | US20070022348 Reducing the uncorrectable error rate in a lockstepped dual-modular redundancy system |
| 01/25/2007 | US20070022347 Systems, methods and computer programs for calibrating an automated circuit test system |
| 01/25/2007 | US20070022346 Test apparatus and test method |
| 01/25/2007 | US20070022345 Pseudo-random test generator in an integrated circuit |
| 01/25/2007 | US20070022344 Digital storage element architecture comprising dual scan clocks and gated scan output |
| 01/25/2007 | US20070022343 Semiconductor integrated circuit, method for testing semiconductor integrated circuit, and computer readable medium for the same |
| 01/25/2007 | US20070022342 Parallel test mode for multi-core processors |
| 01/25/2007 | US20070022341 Method and system for protecting processors from unauthorized debug access |
| 01/25/2007 | US20070022340 Method and apparatus for determining stuck-at fault locations in cell chains using scan chains |
| 01/25/2007 | US20070022339 Digital design component with scan clock generation |
| 01/25/2007 | US20070022338 Sequential Scan Technique for Testing Integrated Circuits With Reduced Power, Time and/or Cost |
| 01/25/2007 | US20070022337 Method and apparatus to verify non-deterministic results in an efficient random manner |
| 01/25/2007 | US20070022336 Digital storage element with enable signal gating |
| 01/25/2007 | US20070022335 Methods and apparatus for interfacing between test system and memory |
| 01/25/2007 | US20070022332 Background block erase check for flash memories |
| 01/25/2007 | US20070022331 Single-ended ethernet management system and method |
| 01/25/2007 | US20070021938 Parameter extracting method |
| 01/25/2007 | US20070021934 Measuring or test device comprising interchangeable functional units |
| 01/25/2007 | US20070021669 Apparatus and methods of cortical surface registration and deformation tracking for patient-to-image alignment in relation to image-guided surgery |
| 01/25/2007 | US20070020780 Method of processing semiconductor substrate responsive to a state of chamber contamination |
| 01/25/2007 | US20070019209 Condition assessment system for a structure including a semiconductor material |
| 01/25/2007 | US20070018680 Liquid crystal display panel and testing and manufacturing methods thereof |
| 01/25/2007 | US20070018679 Semiconductor test device using leakage current and compensation system of leakage current |
| 01/25/2007 | US20070018678 Method and circuit for reducing degradation in a regulated circuit |
| 01/25/2007 | US20070018677 Methods for wafer level burn-in |
| 01/25/2007 | US20070018676 Apparatus for testing semiconductor circuits |
| 01/25/2007 | US20070018675 Semiconductor wafer examination method and semiconductor chip manufacturing method |
| 01/25/2007 | US20070018674 Apparatus and method for testing semiconductor device |
| 01/25/2007 | US20070018673 Electronic component testing apparatus |
| 01/25/2007 | US20070018672 Method and apparatus for engineering a testability interposer for testing sockets and connectors on printed circuit boards |
| 01/25/2007 | US20070018671 System and method for early qualification of semiconductor devices |
| 01/25/2007 | US20070018670 Electrostatic discharge testing |
| 01/25/2007 | US20070018669 Testing with high speed pulse generator |
| 01/25/2007 | US20070018668 Testing system and testing method for a link control card |
| 01/25/2007 | US20070018667 LSI test socket for BGA |
| 01/25/2007 | US20070018666 Spring contact pin for an IC chip tester |
| 01/25/2007 | US20070018665 Probe station with low noise characteristics |
| 01/25/2007 | US20070018664 Probe card, test apparatus having the probe card, and test method using the test apparatus |
| 01/25/2007 | US20070018663 Method and apparatus for manufacturing and probing test probe access structures on vias |
| 01/25/2007 | US20070018662 Condition assessment method for a structure including a semiconductor material |
| 01/25/2007 | US20070018656 Short-circuit detection in electric path connecting drive device and load |
| 01/25/2007 | US20070018655 Concept for Compensating Piezo-Influences on an Integrated Semiconductor Circuit |
| 01/25/2007 | US20070018654 Device and method for determining at least one variable associated with the electromagnetic radiation of an object being tested |
| 01/25/2007 | US20070018653 Apparatus and method for testing system board |
| 01/25/2007 | US20070018651 Broad-band low-inductance cables for making Kelvin connections to electrochemical cells and batteries |
| 01/25/2007 | US20070018638 Electrical test circuit with active-load and output sampling capability |
| 01/25/2007 | US20070018637 Apparatus and method for testing circuit characteristics by using eye mask |
| 01/25/2007 | US20070018636 Method and program for controlling an apparatus for measurement of characteristics of a semiconductor device under test |
| 01/25/2007 | US20070018635 Optical reflectometry analysis with a time-adjustment of partial responses |
| 01/25/2007 | US20070018634 Method and device for measuring electric field distribution of semiconductor device |
| 01/25/2007 | US20070018633 Probe use in electric test |
| 01/25/2007 | US20070018615 Device and method for determining operating parameters of a battery |
| 01/25/2007 | US20070017896 Method for controlling a process for fabricating integrated devices |
| 01/25/2007 | DE102005034475A1 Vorrichtung Device |
| 01/25/2007 | DE102005034300A1 Ball lightning generator station for serial generation of ball lightning, has captor device for magnetically capturing ball lightning removed from generator |
| 01/25/2007 | DE102005033669A1 Verfahren und Schaltungsanordnung zum Ermitteln des Vorliegens eines Falschanschlusses eines elektrischen Geräts, insbesondere Hausgerätes an einer Netzwechselspannungsquelle Method and circuit for detecting the presence of a false connection of an electrical device, in particular domestic appliance to an AC voltage source |
| 01/25/2007 | DE102005033135A1 Vorrichtung zur Fehlerstromerkennung in einer elektronischen Einrichtung Apparatus for fault current detection in an electronic device |
| 01/25/2007 | DE102005032978A1 Electronic component e.g. integrated circuit, centering device, has centering slider with starting inclination, which presses component into center position, during movement of component in direction of connection contact |
| 01/25/2007 | DE102004045719B4 Gedruckte-Schaltungsplatine-Testzugangspunktstrukturen und Verfahren zum Herstellen derselben Printed circuit board test access point structures and method of making same |
| 01/25/2007 | DE10115880B4 Testschaltung zum kritischen Testen einer synchronen Speicherschaltung Test circuit for critical testing a synchronous memory circuit |
| 01/24/2007 | EP1746702A2 Battery pack with integrated battery protection circuit |
| 01/24/2007 | EP1746429A1 Device for testing integrated circuits on a wafer and use of it |
| 01/24/2007 | EP1746428A1 Timing generator and semiconductor testing apparatus |
| 01/24/2007 | EP1746277A2 Apparatus and method for testing a piezoelectric injector |
| 01/24/2007 | EP1745607A1 Digital subscriber line user capacity estimation |
| 01/24/2007 | EP1745595A2 Efficient protection mechanisms in a ring topology network utilizing label switching protocols |
| 01/24/2007 | EP1745489A1 Compression of data traces for an integrated circuit with multiple memories |
| 01/24/2007 | EP1745373A2 Defect location identification for microdevice manufacturing and test |
| 01/24/2007 | EP1745302A1 Non-contact cable state testing |
| 01/24/2007 | EP1745301A2 Integrated acceptance testing |
| 01/24/2007 | EP1692056A4 Pulsed current generator circuit with charge booster |
| 01/24/2007 | EP1407292B1 Imaging sonar and a detection system using one such sonar |
| 01/24/2007 | CN2862259Y Hard disk testing fixture |
| 01/24/2007 | CN2862219Y Electric examination measuring instrument for business |
| 01/24/2007 | CN2862215Y Wireless fault indicating device |
| 01/24/2007 | CN2862057Y Insulated in-line monitoring system verifying device for high-voltage electrical equipment |
| 01/24/2007 | CN2862056Y Multi-path circulating testing device for accumulator group |
| 01/24/2007 | CN2862055Y Load testing device for intellectual moveable generating set |
| 01/24/2007 | CN2862054Y Network IC tester |
| 01/24/2007 | CN2862053Y Simulated discontinuity testing device |
| 01/24/2007 | CN2862045Y Integrated circuit parallel testing adapter |
| 01/24/2007 | CN2862044Y Feeling spindle removing device |
| 01/24/2007 | CN2862043Y Step brazing type spheroid grid array movable testing seat |
| 01/24/2007 | CN1902622A A method and systems for resource bunlding in a communications network |
| 01/24/2007 | CN1902502A Delay fault test circuitry and related method |
| 01/24/2007 | CN1902501A Method and apparatus for calibrating a metrology tool |
| 01/24/2007 | CN1901378A Method for detecting AD converter |
| 01/24/2007 | CN1900731A Logic module detecting system and method |
| 01/24/2007 | CN1900730A Optimized list label detecting point and method for optimizing it |
| 01/24/2007 | CN1900729A Electric parameter detecting circuit for light emitting diode |
| 01/24/2007 | CN1900728A Method and apparatus for engineering a testability interposer for testing sockets and connectors on printed circuit boards |
| 01/24/2007 | CN1297029C Diagnosis device and method for fuel battery |
| 01/24/2007 | CN1296999C Semiconductor integrated circuit with shortened pad pitch |
| 01/24/2007 | CN1296998C Semiconductor device, semiconductor package, and method for testing semiconductor device |
| 01/24/2007 | CN1296719C Probe based information storage for probes used for opens detection in in-circuit testing |
| 01/24/2007 | CN1296718C Automatic detection method |
| 01/24/2007 | CN1296717C Aeolotropism conductive sheet, its manufacture process and products using same |
| 01/24/2007 | CN1296716C Probe device and its manufacturing method |
| 01/23/2007 | US7168032 Data synchronization for a test access port |