Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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02/08/2007 | WO2007015952A2 Portable manipulator for stackable semiconductor test system |
02/08/2007 | WO2007015582A1 Providing precise timing control between multiple standardized test instrumentation chassis |
02/08/2007 | WO2007015581A1 Providing precise timing control within a standardized test instrumentation chassis |
02/08/2007 | WO2007015580A1 Circuit card synchronization within a standardized test instrumentation chassis |
02/08/2007 | WO2007014945A1 Method and device for monitoring a first voltage value |
02/08/2007 | WO2007014875A2 Method for checking an inductive load |
02/08/2007 | WO2007014493A1 Aging room used for the last assembling process of lcd panel modules |
02/08/2007 | WO2006124415A3 Porcelain enamel having a metallic appearance |
02/08/2007 | WO2005082752A3 Device handling system and method |
02/08/2007 | US20070033474 Production test technique for RF circuits using embedded test sensors |
02/08/2007 | US20070033473 LSI inspection module, control method for LSI inspection module, communication method between LSI inspection module and inspection apparatus, and LSI inspection method |
02/08/2007 | US20070033472 VLCT Programmation/Read Protocol |
02/08/2007 | US20070033471 Hardware Configuration of pBIST |
02/08/2007 | US20070033470 Emulation Cache Access for Tag View Reads |
02/08/2007 | US20070033469 ROM-Based Memory Testing |
02/08/2007 | US20070033468 System, apparatus and method of improving logical built-in self test (LBIST) AC fault isolations |
02/08/2007 | US20070033467 Method and device for protecting a memory against attacks by error injection |
02/08/2007 | US20070033466 Method and apparatus for handling of clock information in serial link ports |
02/08/2007 | US20070033465 Apparatus and method for a single wire interface between a intergated circuit and JTAG test and emulation apparatus |
02/08/2007 | US20070033464 Efficient clocking scheme for ultra high-speed systems |
02/08/2007 | US20070033463 Integrated circuit comprising a test mode secured by detection of the state of a control signal |
02/08/2007 | US20070033462 Test circuit and test method |
02/08/2007 | US20070033461 Method and system for encryption-based design obfuscation for an integrated circuit |
02/08/2007 | US20070033460 System and method for scan testing |
02/08/2007 | US20070033459 Method for enabling scan of defective ram prior to repair |
02/08/2007 | US20070033458 Diagnostic Method and Apparatus For Non-Destructively Observing Latch Data |
02/08/2007 | US20070033457 Circuit board and method for manufacturing the same |
02/08/2007 | US20070033456 Integrated circuit test system and associated methods |
02/08/2007 | US20070033455 Load testing of a telecommunication network |
02/08/2007 | US20070033454 Method and apparatus for securing communications ports in an electronic device |
02/08/2007 | US20070033453 Test of ram address decoder for resistive open defects |
02/08/2007 | US20070032982 Integrated circuit with signature computation |
02/08/2007 | US20070032970 Apparatus and method for estimation of intial phase of a brushless motor |
02/08/2007 | US20070031618 Noncontact sensor |
02/08/2007 | US20070030023 Method and apparatus for inspecting flexible display medium layer |
02/08/2007 | US20070030022 Device for defeating reverse engineering of integrated circuits by optical means |
02/08/2007 | US20070030021 Probe station thermal chuck with shielding for capacitive current |
02/08/2007 | US20070030020 Power sink for IC temperature control |
02/08/2007 | US20070030019 Power sink for IC temperature control |
02/08/2007 | US20070030018 Docking device actuated by pressure means |
02/08/2007 | US20070030017 Needle alignment verification circuit and method for semiconductor device |
02/08/2007 | US20070030011 Apparatus for testing cables |
02/08/2007 | US20070030010 Connector crosstalk and return loss cancellation |
02/08/2007 | US20070029994 Semiconductor device and inspection method of semiconductor device and wireless chip |
02/08/2007 | US20070029991 Vibration transducer using changes in polarization of light passing through an optical fiber |
02/08/2007 | US20070029988 Method and structure for variable pitch microwave probe assembly |
02/08/2007 | US20070029549 Providing current control over wafer borne semiconductor devices using overlayer patterns |
02/08/2007 | US20070029468 Measurement of current-voltage characteristic curves of solar cells and solar modules |
02/08/2007 | DE19940232B4 Testgerät für ein Computersystem und Verfahren zum Testen eines Computersystems Test device for a computer system and method for testing a computer system |
02/08/2007 | DE19880767C5 Diagnose-Vorrichtung zum Überprüfen eines Teilsystems eines Kraftfahrzeuges Diagnostic apparatus for inspecting a subsystem of a motor vehicle |
02/08/2007 | DE19805722B4 Verfahren und Vorrichtung zur Überwachung von elektrischen Leitungen Method and device for monitoring of electrical lines |
02/08/2007 | DE112005000591T5 Testgerät und Testverfahren Test apparatus and test procedure |
02/08/2007 | DE112005000403T5 Versatzeinstellverfahren, Versatzeinstellgerät und Testgerät Versatzeinstellverfahren, Versatzeinstellgerät and testing equipment |
02/08/2007 | DE10360109B4 Leistungsschnittstellenschaltung für eine aktive Antenne und Verfahren zur Speisung einer entfernt befindlichen aktiven Antenne A power interface circuit for an active antenna and method for feeding an active antenna remotely located |
02/08/2007 | DE10357984B4 Verfahren zur Bestimmung einer stationären Batterie-Klemmenspannung A method for determining a stationary battery terminal voltage |
02/08/2007 | DE10315240B4 Rechnergestütztes Prüfverfahren für eine Anordnung elektrischer Geräte, ein auf einem Datenträger gespeichertes Computerprogramm und Rechner! Computer-based test methods for an array of electrical equipment, a computer program stored on a disk and computer! |
02/08/2007 | DE10314462B4 Anordnung zum Prüfen von elektrischen Leiterplatten Arrangement for testing electrical circuit boards |
02/08/2007 | DE10307972B4 Verfahren zur Erkennung und Ortung von niederohmigen und hochohmigen Erdschlüssen in elektrischen Versorgungsnetzen Method for detecting and locating high-impedance low and ground faults in electrical supply networks |
02/08/2007 | DE10302531B4 Messeinrichtung und Messverfahren für Elektromotoren Measuring device and methods of measurement of electric motors |
02/08/2007 | DE102006031091A1 Halbleiterprüfvorrichtung Semiconductor testing |
02/08/2007 | DE102005058469B4 Verfahren zum Berechnen des Ladezustands einer Batterie zum Verhindern des Memory-Effekts A method of calculating the state of charge of a battery for preventing the memory effect |
02/08/2007 | DE102005036856A1 Tastkopf mit Drucksensor Probe with pressure sensor |
02/08/2007 | DE102005036808A1 Druckmittelbetätigte Dockingvorrichtung Fluid-actuated docking device |
02/08/2007 | DE102005036769A1 Verfahren zum Überprüfen einer induktiven Last A method for checking an inductive load |
02/08/2007 | DE102005036288A1 Active probe for e.g. oscilloscope, has repeater isolating probe tip from signal lines, and switching device conductively connecting probe tip with signal line such that excitation signal applied to signal line is injectable into circuit |
02/08/2007 | DE102005036047A1 Verfahren und Vorrichtung zur Überprüfung eines ersten Spannungswertes Method and apparatus for checking a first voltage value |
02/08/2007 | DE10159165B4 Vorrichtung zum Messen und/oder Kalibrieren eines Testkopfes A device for measuring and / or calibrating a test head |
02/08/2007 | DE10115491B4 Verfahren zum Prüfen eines vom Gehäuse befreiten Chips A method of testing a liberated from the housing chips |
02/08/2007 | DE10043397B4 Flash-Speicherbauelement mit Programmierungszustandsfeststellungsschaltung und das Verfahren dafür Flash memory device with programming state detection circuit and method thereof |
02/07/2007 | EP1750345A2 Battery pack with integrated battery protection circuit |
02/07/2007 | EP1750344A2 Battery pack with integrated battery protection circuit |
02/07/2007 | EP1750139A2 Voltage measurement apparatus and electrically-driven tool |
02/07/2007 | EP1750138A1 Device for monitoring the charge voltage of an energy store |
02/07/2007 | EP1750136A1 Sheet-like probe, method of producing the probe, and application of the probe |
02/07/2007 | EP1749358A2 System and method for providing channels in application server and transaction-based systems |
02/07/2007 | EP1749214A2 Data rate shifting methods and techniques |
02/07/2007 | CN2867488Y Wireless device for testing cell quantity of electricity |
02/07/2007 | CN2867351Y Single cell voltage testing circuit for fuel cell |
02/07/2007 | CN1910466A Constant measuring device and method for rotating motor |
02/07/2007 | CN1910465A Testing of circuits with multiple clock domains |
02/07/2007 | CN1910464A Jtag test architecture for multi-chip pack |
02/07/2007 | CN1910463A Test architecture and method |
02/07/2007 | CN1910460A Probe guard |
02/07/2007 | CN1909752A Laser reparation method for organic el element and laser reparation device |
02/07/2007 | CN1909290A Intelligent earthing rod system for electric power operation |
02/07/2007 | CN1909280A 电池管理系统及其驱动方法 Battery management system and driving method thereof |
02/07/2007 | CN1909228A Test circuit built-in semiconductor chip |
02/07/2007 | CN1909202A Testing device and its method |
02/07/2007 | CN1908987A Method for diagnosing accidents of waveshape recognition based substation locomotive traction circuit |
02/07/2007 | CN1908691A Battery capacity measuring method and device thereof |
02/07/2007 | CN1908690A Border scanning system and method |
02/07/2007 | CN1908689A Chip socket burnt-in seat |
02/07/2007 | CN1908688A Built-in type low-voltage cable detecting device |
02/07/2007 | CN1908687A Voltage type tester for short-circuit and earth-fault indicator |
02/07/2007 | CN1908686A Optical signal type tester for short-circuit and earth-fault indicator |
02/07/2007 | CN1908685A Substrate detection device and control method therefor |
02/07/2007 | CN1908682A Circuit for detecting input voltage of transformers |
02/07/2007 | CN1908680A Surging current detecting circuit |
02/07/2007 | CN1908678A Socket for inspection apparatus |
02/07/2007 | CN1908636A Film-carried appearance detection method and device for mounting electronic elements |