| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 03/20/2007 | US7194669 Method and circuit for at-speed testing of scan circuits |
| 03/20/2007 | US7194668 Event based test method for debugging timing related failures in integrated circuits |
| 03/20/2007 | US7194667 System for storing device test information on a semiconductor device using on-device logic for determination of test results |
| 03/20/2007 | US7194666 Bit error rate tester implemented in a programmable logic device |
| 03/20/2007 | US7194570 Method and device for selecting the operating mode of an integrated circuit |
| 03/20/2007 | US7194373 Device testing control |
| 03/20/2007 | US7194366 System and method for estimating reliability of components for testing and quality optimization |
| 03/20/2007 | US7194362 Switching circuit and individual voltmeter apparatus |
| 03/20/2007 | US7194317 Fast plant test for model-based control |
| 03/20/2007 | US7194076 Apparatus and method for network-initiated real-time multi-party communications |
| 03/20/2007 | US7194052 Data capture circuit with self-test capability |
| 03/20/2007 | US7194029 Multi-pair gigabit ethernet transceiver having adaptive disabling or circuit elements |
| 03/20/2007 | US7194028 Multi-Pair Gigabit Ethernet Transceiver having decision feedback equalizer |
| 03/20/2007 | US7193973 Data transmission apparatus and method |
| 03/20/2007 | US7193968 Sample netflow for network traffic data collection |
| 03/20/2007 | US7193964 Hitless protection switching |
| 03/20/2007 | US7193917 Semiconductor storage device, test method therefor, and test circuit therefor |
| 03/20/2007 | US7193882 Semiconductor memory device |
| 03/20/2007 | US7193728 Processing apparatus, processing method and position detecting device |
| 03/20/2007 | US7193522 Apparatus and circuit for use with capacitive presence detection systems |
| 03/20/2007 | US7193428 Low threshold current switch |
| 03/20/2007 | US7193427 Method and apparatus for measuring relative, within-die leakage current and/or providing a temperature variation profile using a leakage inverter and ring oscillator |
| 03/20/2007 | US7193426 Test system and test structure for testing an integrated circuit and an integrated circuit having a test structure |
| 03/20/2007 | US7193425 Semiconductor test device |
| 03/20/2007 | US7193424 Electrical scanning probe microscope apparatus |
| 03/20/2007 | US7193423 Wafer-to-wafer alignments |
| 03/20/2007 | US7193422 Patch panel system |
| 03/20/2007 | US7193421 Method and device for determining the state of a vehicle battery |
| 03/20/2007 | US7193410 Transistor monitor for a multiphase circuit |
| 03/20/2007 | US7193407 Test apparatus and testing method |
| 03/20/2007 | US7192790 Manufacturing method for a semiconductor device |
| 03/20/2007 | US7192789 Method for monitoring an ion implanter |
| 03/20/2007 | US7192667 Device and method for controlling fuel cell system |
| 03/20/2007 | US7192019 Pallet and method for transferring the same |
| 03/15/2007 | WO2007030323A2 Detecting degradation of components during reliability-evaluation studies |
| 03/15/2007 | WO2007030183A1 Timeslot conversion in a cellular communication system |
| 03/15/2007 | WO2007029673A1 Accumulator state detection device |
| 03/15/2007 | WO2007029566A1 Sampling device and test apparatus |
| 03/15/2007 | WO2007029513A1 Timing generator, test device, and timing generation method |
| 03/15/2007 | WO2007029473A1 Vehicle, power supply and current detector of vehicle |
| 03/15/2007 | WO2007029463A1 Test equipment and test method |
| 03/15/2007 | WO2007029422A1 Semiconductor device inspecting apparatus and power supply unit |
| 03/15/2007 | WO2007028977A1 High voltage insulation monitoring sensor |
| 03/15/2007 | WO2007028960A1 Current measurement circuit and method of diagnosing faults in same |
| 03/15/2007 | WO2007028605A1 Method and device to quantify active carrier profiles in ultra-shallow semiconductor structures |
| 03/15/2007 | WO2005121824A3 Thermal optical chuck |
| 03/15/2007 | WO2005008729A3 Method and apparatus for scrambling cell content in an integrated circuit |
| 03/15/2007 | US20070061659 Methods for testing a plurality of semiconductor devices in parallel and related apparatus |
| 03/15/2007 | US20070061658 Testing Circuit and Related Method of Injecting a Time Jitter |
| 03/15/2007 | US20070061657 Delay fault testing apparatus |
| 03/15/2007 | US20070061656 Test data generator, test system and method thereof |
| 03/15/2007 | US20070061655 Path data transmission unit |
| 03/15/2007 | US20070061654 Semiconductor integrated circuit and test method |
| 03/15/2007 | US20070061653 Built-in self-repairable memory |
| 03/15/2007 | US20070061652 Built-in self test for a thermal processing system |
| 03/15/2007 | US20070061651 Shift register circuit |
| 03/15/2007 | US20070061650 Semiconductor device with test interface |
| 03/15/2007 | US20070061649 Semiconductor Devices Including Test Circuits and Related Methods of Testing |
| 03/15/2007 | US20070061648 Shift register, scanning line driving circuit, matrix type device, electro-optic device, and electronic device |
| 03/15/2007 | US20070061647 Scan Chain Disable Function for Power Saving |
| 03/15/2007 | US20070061646 Selectable jtag or trace access with data store and output |
| 03/15/2007 | US20070061645 Register file initialization to prevent unknown outputs during test |
| 03/15/2007 | US20070061644 Scan verification for a device under test |
| 03/15/2007 | US20070061643 Substrate and testing method thereof |
| 03/15/2007 | US20070061642 System and method of uncorrelated code hopping in a communications system |
| 03/15/2007 | US20070061641 Apparatus and method for generating test driver |
| 03/15/2007 | US20070061640 Integrated circuit tester with software-scaleable channels |
| 03/15/2007 | US20070061096 Method and system for testing assembled mobile devices |
| 03/15/2007 | US20070059915 Method of forming an electrical contact |
| 03/15/2007 | US20070058476 Semiconductor memory device |
| 03/15/2007 | US20070057712 High frequency divider state correction circuit |
| 03/15/2007 | US20070057689 Mother substrate, substrate for display panel and method of manufacturing display panel |
| 03/15/2007 | US20070057688 Compensation for electric drifts of mos transistors |
| 03/15/2007 | US20070057687 High current electron beam inspection |
| 03/15/2007 | US20070057686 Burn-in system |
| 03/15/2007 | US20070057685 Lateral interposer contact design and probe card assembly |
| 03/15/2007 | US20070057684 Massively parallel interface for electronic circuit |
| 03/15/2007 | US20070057683 Method for controlling parallelism between probe card and mounting table, storage medium storing inspection program, and inspection apparatus |
| 03/15/2007 | US20070057682 Signal probe and probe assembly |
| 03/15/2007 | US20070057681 Clamping top plate using magnetic force |
| 03/15/2007 | US20070057678 Arc fault circuit interrupter system |
| 03/15/2007 | US20070057677 Measuring device, and method for locating a partial discharge |
| 03/15/2007 | US20070057676 Pulse shunt that allows for the use of light emitting diodes in vehicles that have a pulsed lamp check function in their external lighting system and/or trailers connected thereto |
| 03/15/2007 | US20070057664 Power detector for mismatched load |
| 03/15/2007 | US20070056929 Plasma etching apparatus and plasma etching method |
| 03/15/2007 | DE10392735T5 Invertierereinrichtung Invertierereinrichtung |
| 03/15/2007 | DE10358642B4 Diagnoseverfahren für eine Brennstoffzelle Diagnostic method for a fuel cell |
| 03/15/2007 | DE102006041016A1 Pulsoximeter`s function tester, has control unit producing input current for pulsoximeter such that distribution and variable of current produced by tester correspond to current of sensor connected to pulsoximeter |
| 03/15/2007 | DE102006030360A1 Verfahren und Vorrichtung zum selektiven Zugreifen auf und zum Konfigurieren von einzelnen Chips eines Halbleiterwafers Method and apparatus for selectively accessing and configuring individual chips of a semiconductor wafer |
| 03/15/2007 | DE102005048237B3 Precision positioner for head of instrument testing semiconductor components, includes arm swinging about axis, carrying head in holder turned about further axis |
| 03/15/2007 | DE102004040859B4 Elektrische Reihenklemme und Prüfstecker zur Verwendung bei einer elektrischen Klemme Electrical terminal and test for use in an electrical terminal |
| 03/15/2007 | CA2623388A1 High voltage insulation monitoring sensor |
| 03/14/2007 | EP1763138A2 Circuit of a vehicle |
| 03/14/2007 | EP1763014A1 Organic electro luminescence display (OELD), OELD motherboard and testing method |
| 03/14/2007 | EP1762857A1 Apparatus and method for controlling frequency of an I/O clock for an integrated circuit during test |
| 03/14/2007 | EP1762856A1 Fault Diagnosis Apparatus and Method for System-on-Chip (SOC) |
| 03/14/2007 | EP1762855A1 JTAG port |
| 03/14/2007 | EP1762853A2 Device and method for determining a load current |
| 03/14/2007 | EP1761997A1 System and method for detecting an operational fault condition in a power supply |
| 03/14/2007 | EP1761989A1 Method and apparatus for testing uniterruptible power supply |