| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/17/2007 | US7206989 Integrated circuit having multiple modes of operation |
| 04/17/2007 | US7206985 Method and apparatus for calibrating a test system for an integrated semiconductor circuit |
| 04/17/2007 | US7206984 Built-in self test circuit and test method for storage device |
| 04/17/2007 | US7206983 Segmented addressable scan architecture and method for implementing scan-based testing of integrated circuits |
| 04/17/2007 | US7206982 Diagnostic mechanism for an integrated circuit |
| 04/17/2007 | US7206981 Compliance testing through test equipment |
| 04/17/2007 | US7206713 Method of adjusting strobe timing and function testing device for semiconductor device |
| 04/17/2007 | US7206711 System and method for automatically comparing test points of a PCB |
| 04/17/2007 | US7206704 Battery management system and apparatus |
| 04/17/2007 | US7206703 System and method for testing packaged devices using time domain reflectometry |
| 04/17/2007 | US7206549 System and method for testing wireless devices |
| 04/17/2007 | US7206340 Characterizing jitter of repetitive patterns |
| 04/17/2007 | US7206309 High availability packet forward apparatus and method |
| 04/17/2007 | US7206284 Method and apparatus for automatic congestion avoidance for differentiated service flows |
| 04/17/2007 | US7206282 Method and apparatus to balance flow loads in a multipurpose networking device |
| 04/17/2007 | US7206281 Calculating physical routes in a communication network |
| 04/17/2007 | US7205900 Water detecting system and related method of portable electric device |
| 04/17/2007 | US7205860 Electromagnetic interface module for balanced data communication |
| 04/17/2007 | US7205854 On-chip transistor degradation monitoring |
| 04/17/2007 | US7205784 Probe for combined signals |
| 04/17/2007 | US7205783 Semiconductor integrated circuit, and electrostatic withstand voltage test method and apparatus therefor |
| 04/17/2007 | US7205782 Scanned impedance imaging system method and apparatus |
| 04/17/2007 | US7205773 Method for calibrating a pulsed measurement system |
| 04/17/2007 | US7205772 Arc fault detector and method |
| 04/17/2007 | US7205771 Current-measuring circuit arrangement |
| 04/17/2007 | US7205758 Systems and methods for adjusting threshold voltage |
| 04/17/2007 | US7204708 Socket for semiconductor device |
| 04/17/2007 | US7204008 Method of making an electronics module |
| 04/12/2007 | WO2007041002A1 Voltage sensors and voltage sensing methods for gas insulated switchgear |
| 04/12/2007 | WO2007040799A2 Test fixture for collecting particulate material |
| 04/12/2007 | WO2007040668A2 Stacked contact bump |
| 04/12/2007 | WO2007040406A1 System and method for monitoring of electrical cables |
| 04/12/2007 | WO2007039017A1 Process and device for the error-protected evaluation of a position indicator, in particular a potentiometer |
| 04/12/2007 | WO2007038877A1 Apparatus and method for measuring deflection of a printed circuit board |
| 04/12/2007 | WO2007024656A9 Architecture and method for testing of an integrated circuit device |
| 04/12/2007 | WO2007021434A3 Multi-port test-set for switch module in network analyzer |
| 04/12/2007 | WO2007018829A3 Measurement of current-voltage characteristic curves of solar cells and solar modules |
| 04/12/2007 | WO2006104879A3 Apparatus, system and method for testing electronic elements |
| 04/12/2007 | WO2005111796A3 Defect location identification for microdevice manufacturing and test |
| 04/12/2007 | US20070083804 Method and apparatus for analyzing delay in circuit, and computer product |
| 04/12/2007 | US20070083801 Test apparatus, program and recording medium |
| 04/12/2007 | US20070082462 Wafer having indicator for first die and method of attaching die of the wafer |
| 04/12/2007 | US20070082417 Method and structure for reducing prior level edge interference with critical dimension measurement |
| 04/12/2007 | US20070081451 Method for controlling redundancy and transmission device using the same |
| 04/12/2007 | US20070080706 Logic circuit for board power-supply evaluation and board power-supply evaluating method |
| 04/12/2007 | US20070080705 System and Method for the Probing of a Wafer |
| 04/12/2007 | US20070080704 Semi-conductor chip package capable of detecting open and short |
| 04/12/2007 | US20070080703 Camera based pin grid array (PGA) inspection system with pin base mask and low angle lighting |
| 04/12/2007 | US20070080702 Temperature control in an integrated circuit |
| 04/12/2007 | US20070080701 Apparatus for measuring on-chip characteristics in semiconductor circuits and related methods |
| 04/12/2007 | US20070080700 Carousel device, system and method for electronic circuit tester |
| 04/12/2007 | US20070080699 System and method for pulsed signal device characterization utilizing an adaptive matched filterbank |
| 04/12/2007 | US20070080698 Contact System for Wafer Level Testing |
| 04/12/2007 | US20070080694 Apparatus and method for fuel cell resistance test |
| 04/12/2007 | US20070080677 Shield for Tester Load Board |
| 04/12/2007 | DE69636226T2 Taktsignalgenerator Clock signal generator |
| 04/12/2007 | DE4122371C5 Mikroprozessorgesteuertes elektronisches Meßgerät Microprocessor-controlled electronic measuring instrument |
| 04/12/2007 | DE19758077B4 Einrichtung zum Steuern des Prüfens integrierter Schaltkreise und Verfahren zum Steuern des Prüfens integrierter Schaltkreise Means for controlling the testing of integrated circuits and methods for controlling the testing of integrated circuits |
| 04/12/2007 | DE102006045001A1 Ein Verfahren und eine Regeleinheit zur Regelung eines Energieniveaus A method and a control unit for controlling an energy level |
| 04/12/2007 | DE102005047159A1 High speed integrated logic test circuit for self test use has output feedback and integrated core with test pattern generator and analysis logic |
| 04/12/2007 | DE102005046040A1 Elektrische Steckverbindung und Verfahren zur Identifizierung eines Akkumulators Electrical connector and method for identifying a battery |
| 04/12/2007 | DE102005045216A1 Device for determining the temperature of a vehicle battery having a pole connected with a clip to an electrical consumer comprises a temperature sensor coupled with the clip |
| 04/12/2007 | DE102005032227B4 System zur Ruhestrommessung in Kraftfahrzeugen System for quiescent current measurement in motor vehicles |
| 04/12/2007 | DE102005024649B4 Vorrichtung und Verfahren zum Messen von Jitter Apparatus and method for measuring jitter |
| 04/12/2007 | DE102005024075B4 Verfahren und Vorrichtung zur Messung eines in einem elektrischen Leiter fließenden Stroms Method and device for measuring a current flowing in an electrical conductor |
| 04/12/2007 | DE102004056133B4 Verfahren zur Erfassung einer Offsetdrift bei einer Wheatstone-Meßbrücke A method for detecting an offset drift in a Wheatstone measuring bridge |
| 04/12/2007 | DE102004028745B4 Anschussklemmen-Prüfvorrichtung Anschussklemmen Tester |
| 04/12/2007 | DE102004008402B4 Handhabungsvorrichtung, insbesondere zum Positionieren eines Testkopfs an einer Prüfeinrichtung Handling device, in particular for positioning a test head of a test device |
| 04/12/2007 | DE10164822B4 Delay circuit for electronic device testing apparatus, generates desired time delay by changing junction capacitance of FET through which shaped signal passes |
| 04/12/2007 | DE10106801B4 Schwingungsmessverfahren und Frequenzmessvorrichtung Vibration measurement methods and frequency measuring device |
| 04/12/2007 | CA2626186A1 System and method for monitoring of electrical cables |
| 04/12/2007 | CA2625190A1 Apparatus and method for measuring deflection of a printed circuit board |
| 04/11/2007 | EP1772965A2 Electronic device and control method thereof |
| 04/11/2007 | EP1772943A2 Battery pack with state of charge indicator |
| 04/11/2007 | EP1772739A2 Methods and apparatus for monitoring the condition of a machine |
| 04/11/2007 | EP1772738A2 Method of diagnosing the ageing of electrical installations using lost factor measurements at frequencies lower than the frequencies of the public electrical power networks |
| 04/11/2007 | EP1771796A2 Testing suite for product functionality assurance and guided troubleshooting |
| 04/11/2007 | EP1771743A1 Method for determining time to failure of submicron metal interconnects |
| 04/11/2007 | EP1771741A1 Device and method for testing at least one conducting joint forming an electrical connection between an electric component and a printed circuit |
| 04/11/2007 | EP1771739A2 Cross-monitoring sensor system and method |
| 04/11/2007 | EP1676141B1 Evaluation circuit for detecting and/or locating faulty data words in a data stream |
| 04/11/2007 | EP1440328B1 Method and apparatus for calibration and validation of high performance dut power supplies |
| 04/11/2007 | EP1428021A4 Biometric quality control process |
| 04/11/2007 | EP1389336B1 Test method for testing a data memory |
| 04/11/2007 | EP1296145B1 Conductive contact |
| 04/11/2007 | CN2888462Y Timed starting circuit for testing of motor |
| 04/11/2007 | CN2888461Y SCM tester |
| 04/11/2007 | CN2888460Y Multi channel magnet real-time rapid detection device |
| 04/11/2007 | CN2888457Y Rapid measurement circuit for inductive DC resistance |
| 04/11/2007 | CN2888456Y Rapid measurement gauge for inductive DC resistance |
| 04/11/2007 | CN2888452Y Circuit board performance test assisting device |
| 04/11/2007 | CN2888451Y Probe head of micro-elastic contactor |
| 04/11/2007 | CN2888450Y Clamp |
| 04/11/2007 | CN1947026A Detection method for an electrical polyphase machine |
| 04/11/2007 | CN1947025A Direct current test apparatus |
| 04/11/2007 | CN1947024A System and method for detecting link failures |
| 04/11/2007 | CN1947023A Method for channel assignments in wireless systems |
| 04/11/2007 | CN1947022A Intelligent probe card architecture |
| 04/11/2007 | CN1947021A Wireless test cassette |
| 04/11/2007 | CN1945977A Lock detecting circuit and method for phase lock loop system |