| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/19/2007 | US20070089010 Test apparatus for digitized test responses, method for testing semiconductor devices and diagnosis method for a semiconductor device |
| 04/19/2007 | US20070089009 Semiconductor device |
| 04/19/2007 | US20070089008 Method and apparatus for performing test pattern autograding |
| 04/19/2007 | US20070089007 Method and apparatus for measuring test coverage |
| 04/19/2007 | US20070089006 IO self test method and apparatus for memory |
| 04/19/2007 | US20070089005 Semiconductor storage device and memory test circuit |
| 04/19/2007 | US20070089004 Method and apparatus for accelerating through-the pins LBIST simulation |
| 04/19/2007 | US20070089003 Method and apparatus for test connectivity, communication, and control |
| 04/19/2007 | US20070089002 Pc-connectivity for on-chip memory |
| 04/19/2007 | US20070089001 System and Method for Defect-Based Scan Analysis |
| 04/19/2007 | US20070089000 Scan driving circuit and organic light emitting display using the same |
| 04/19/2007 | US20070088999 Test Output Compaction for Responses with Unknown Values |
| 04/19/2007 | US20070088998 Serializer/deserializer circuit for jitter sensitivity characterization |
| 04/19/2007 | US20070088997 Generation and self-synchronizing detection of sequences using addressable memories |
| 04/19/2007 | US20070088996 Test device and method for circuit device and manufacturing method for the same |
| 04/19/2007 | US20070088995 System including a buffered memory module |
| 04/19/2007 | US20070088994 Electronic device testing system, method, and control device utilized in same |
| 04/19/2007 | US20070088519 Electronic circuit comprising a secret sub-module |
| 04/19/2007 | US20070086139 Method for controlling an electronic overcurrent trip for low-voltage circuit breakers |
| 04/19/2007 | US20070085694 Monitoring of alarm system wiring |
| 04/19/2007 | US20070085591 Level shifter circuit with stress test function |
| 04/19/2007 | US20070085559 Test device |
| 04/19/2007 | US20070085558 On-chip voltage regulator using feedback on process/product parameters |
| 04/19/2007 | US20070085557 Method and apparatus for burn-in optimization |
| 04/19/2007 | US20070085556 Planar voltage contrast test structure |
| 04/19/2007 | US20070085555 Dual arcuate blade probe |
| 04/19/2007 | US20070085554 Replaceable modular probe head |
| 04/19/2007 | US20070085550 Non-contact reflectometry system and method |
| 04/19/2007 | US20070085549 Apparatus and method for determining a faulted phase of a three-phase ungrounded power system |
| 04/19/2007 | US20070085548 Insulation degradation diagnostic device |
| 04/19/2007 | US20070085525 Detection of lightning |
| 04/19/2007 | DE4411820B4 Elektrischer Steckverbinder zur elektrischen Prüfung einer äußeren Hülle An electrical connector for electrical testing of an outer shell |
| 04/19/2007 | DE112005001085T5 Zustandserfassungsvorrichtung und Schaltsteuervorrichtung einer Leistungsschaltvorrichtung, welche die Zustandserfassungsvorrichtung verwendet State detecting device and the shift control device of a power switching apparatus which uses the state detecting device |
| 04/19/2007 | DE112005001080T5 Verfahren und Vorrichtung zum Verbessern der Frequenzauflösung eines direkten digitalen Synthesizers A method and apparatus for improving the frequency resolution of a direct digital synthesizer |
| 04/19/2007 | DE10306620B4 Integrierte Testschaltung in einer integrierten Schaltung Integrated test circuit in an integrated circuit |
| 04/19/2007 | DE10246741B4 Verfahren und Halbleitereinrichtung zum Abgleich von Schnittstelleneinrichtungen The method and semiconductor device for comparison of interface means |
| 04/19/2007 | DE10243603B4 Verfahren zur Verwendung beim Trimmen, Halbleiter-Bauelement-Test-Gerät zum Durchführen des Verfahrens und Halbleiter-Bauelement-Test-System A method for use in trimming the semiconductor device test apparatus for performing the method and semiconductor device testing system |
| 04/19/2007 | DE102006041463A1 Verfahren und Vorrichtung zum Beurteilen eines Leistungsabfalls einer Batterie Method and apparatus for judging a performance degradation of a battery |
| 04/19/2007 | DE102006032261A1 Batterieladegerät mit Batterielebensdauer-Prüffunktion Battery charger with battery life test function |
| 04/19/2007 | DE102005047901A1 Apparatus for identifying users in an electrical network i.e. electricity consumers based on a generated model |
| 04/19/2007 | DE102005047894A1 Testing method for testing the operating ability of two-core measuring transducers in automation systems emits a test signal as a load-independent loop co-current via a two-wire lead |
| 04/19/2007 | DE102004030602B4 Paralleler Datenbus und Verfahren zum Betreiben eines parallelen Datenbusses Parallel data bus and method for operating a parallel data bus |
| 04/19/2007 | CA2621477A1 Artificial spinal disc replacement system and method |
| 04/19/2007 | CA2559681A1 Control unit connectable to expansion unit |
| 04/18/2007 | EP1775793A1 Nickel-hydride battery life determining method and life determining apparatus |
| 04/18/2007 | EP1775596A2 Mobile terminal displaying remaining battery capacity and method thereof |
| 04/18/2007 | EP1775595A1 Integrated circuit test simulator |
| 04/18/2007 | EP1774654A1 Method and device for the connection of inputs for microcontrollers and corresponding microcontroller |
| 04/18/2007 | EP1774583A2 Method and apparatus for producing co-planar bonding pads on a substrate |
| 04/18/2007 | EP1774353A1 Method for managing a rechargeable battery storage |
| 04/18/2007 | EP1774352A1 Vehicle battery arrangement comprising electronic components |
| 04/18/2007 | EP1774351A1 State and parameter estimator comprising an integral or differential portion for electrical energy stores |
| 04/18/2007 | EP1774350A2 System and method for battery conservation in wireless stations |
| 04/18/2007 | EP1774349A1 Fuel tank system |
| 04/18/2007 | EP1157279B1 Low-cost configuration for monitoring and controlling parametric measurement units in automatic test equipment |
| 04/18/2007 | CN2891434Y Abnormal signal extractor for AC motor device |
| 04/18/2007 | CN2891381Y Receptacle with electrical leakage indication function |
| 04/18/2007 | CN2891133Y Tele-controlled and telemetric online monitoring and diagnostic apparatus |
| 04/18/2007 | CN2890947Y Power battery management system for hybrid electric vehicle |
| 04/18/2007 | CN2890946Y High voltage isolator for insulation detection of high voltage motor |
| 04/18/2007 | CN2890945Y High-efficiency electronic cable tester for dense cable |
| 04/18/2007 | CN2890944Y Integrated hand-held high voltage discharge fault position detector |
| 04/18/2007 | CN2890943Y Portable direct current system earthing fault detector |
| 04/18/2007 | CN2890942Y Insulation part damage positioning detector for high voltage electric apparatus |
| 04/18/2007 | CN2890941Y IC module tester |
| 04/18/2007 | CN2890939Y Small super-broad band double-taper measuring antenna |
| 04/18/2007 | CN2890936Y Non-residual voltage online detection counter |
| 04/18/2007 | CN2890925Y 测试装置 Test device |
| 04/18/2007 | CN2890923Y Split type testing jig |
| 04/18/2007 | CN2890922Y Automobile speed regulating keyboard plate detector |
| 04/18/2007 | CN2890921Y Improved structure of IC detection seat |
| 04/18/2007 | CN2890920Y Test jip for display module of printed circuit board |
| 04/18/2007 | CN1950983A Power supply device |
| 04/18/2007 | CN1950911A Safety protective instrumentation system and its handling method |
| 04/18/2007 | CN1950711A State recognizing device and switching controller of power switching apparatus using state recognizing device |
| 04/18/2007 | CN1950710A Timing generator and semiconductor testing device |
| 04/18/2007 | CN1950709A Probing a device |
| 04/18/2007 | CN1949583A Battery device |
| 04/18/2007 | CN1949478A Method and system for removing impairment of integrated circuit |
| 04/18/2007 | CN1949326A Display device and testing method for display device |
| 04/18/2007 | CN1948988A Apparatus and method of measuring charges in a battery on the basis of the voltage and portable electric instrument with the same |
| 04/18/2007 | CN1948987A Dynamic thrust and vertical force testing device of single side type linear induced motor |
| 04/18/2007 | CN1948986A 30MW steam turbien electric generator type testing table |
| 04/18/2007 | CN1948985A Press key function testing system and method |
| 04/18/2007 | CN1948984A Seamless connecting method and device of multi-board combined testing action group chain circuit |
| 04/18/2007 | CN1948983A Apparatus and method of auto-regulating testing clock frequency |
| 04/18/2007 | CN1948982A IC tester |
| 04/18/2007 | CN1948981A High speed Acceptable testing process for wafer |
| 04/18/2007 | CN1948980A Remote short circuit multi-phase detecting method and detecting device thereof |
| 04/18/2007 | CN1948979A Identifying system and method |
| 04/18/2007 | CN1948978A Electronic device detecting appliance |
| 04/18/2007 | CN1948977A Non-contacting intelligent card noise detecting method and detecting circuit thereof |
| 04/18/2007 | CN1948972A Positioning unit for probe device |
| 04/18/2007 | CN1948971A Probe calliper electrical contacting device |
| 04/18/2007 | CN1948970A High power digital varistor and testing method thereof |
| 04/18/2007 | CN1311622C Motor driver |
| 04/18/2007 | CN1311593C Bead lattice array connector |
| 04/18/2007 | CN1311391C Error portion detecting method, layout method for mask layout stage of semiconductor integrated circuit |
| 04/18/2007 | CN1311240C Method and apparatus for recycling cryogenic liquid or gas from test chambers |
| 04/17/2007 | US7207019 Test circuit inserting method and apparatus for a semiconductor integrated circuit |