| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/25/2007 | EP1776641A2 Method of increasing ddr memory bandwidth in ddr sdram modules |
| 04/25/2007 | EP1776596A1 Testing of a circuit that has an asynchronous timing circuit |
| 04/25/2007 | EP1776595A1 Scan-testable logic circuit |
| 04/25/2007 | EP1597597B1 Method for measuring the current consumption of an electric radiator in a vehicle ventilation, heating or air conditioning system |
| 04/25/2007 | EP0804468B1 Method of making an omega-functionalized amino acid derivative |
| 04/25/2007 | CN2893893Y High-voltage circuit breaker pragram operating instrument |
| 04/25/2007 | CN2893721Y Automatic monitor for vehicle signaling lamp |
| 04/25/2007 | CN1954227A Contactless interfacing of test signals with a device under test |
| 04/25/2007 | CN1954226A Oscillation detecting apparatus and test apparatus |
| 04/25/2007 | CN1954225A Method for manufacturing semiconductor integrated circuit device |
| 04/25/2007 | CN1954224A Increase productivity at wafer test using probe retest data analysis |
| 04/25/2007 | CN1954223A TCP handling device |
| 04/25/2007 | CN1954222A TCP handling device |
| 04/25/2007 | CN1954221A Earth leakage detection device |
| 04/25/2007 | CN1954220A Method of operating a shielded connection, and communications network |
| 04/25/2007 | CN1954202A Image sensor test device |
| 04/25/2007 | CN1953638A Electron beam accelerator and ceramic stage with electrically-conductive layer or coating therefor |
| 04/25/2007 | CN1953010A Drive breadboard circuit of high voltage waveform of initialization waveform of tank-type plasma display panel |
| 04/25/2007 | CN1952675A Special electronic load box of fuel battery and the manufacture method thereof |
| 04/25/2007 | CN1952674A Detecting clamping fixture of de-to-ac converter |
| 04/25/2007 | CN1952673A Efficiency measuring system and method of voltage control circuit |
| 04/25/2007 | CN1952672A Polarity finder of electronic device of automatic braiding machine and testing method thereof |
| 04/25/2007 | CN1952668A Voltage detector of universal serial bus interface |
| 04/25/2007 | CN1952667A Probe sheet adhesive holder, probe card, semiconductor inspection apparatus, and method for manufacturing semiconductor device |
| 04/25/2007 | CN1952666A Clamp for testing semiconductor photoelectronic device |
| 04/25/2007 | CN1952631A Junction temperature prediction method and apparatus for use in a power conversion module |
| 04/25/2007 | CN1312868C A multichannel testing method |
| 04/25/2007 | CN1312804C Estimating apparatus and method of input and output enabling powers for secondary cell |
| 04/25/2007 | CN1312751C Method for directly calculating interface defect quantity of MOS FET |
| 04/25/2007 | CN1312485C Magnetic-field analysing process of rotary motor |
| 04/25/2007 | CN1312484C Single node sampled voltage-current characteristic digital detecting circuit |
| 04/25/2007 | CN1312483C Loading location system |
| 04/24/2007 | US7210087 Method and system for simulating a modular test system |
| 04/24/2007 | US7210086 Long running test method for a circuit design analysis |
| 04/24/2007 | US7210085 Method and apparatus for test and repair of marginally functional SRAM cells |
| 04/24/2007 | US7210083 System and method for implementing postponed quasi-masking test output compression in integrated circuit |
| 04/24/2007 | US7210082 Method for performing ATPG and fault simulation in a scan-based integrated circuit |
| 04/24/2007 | US7210081 Apparatus and methods for assessing reliability of assemblies using programmable logic devices |
| 04/24/2007 | US7210080 Method for testing chip configuration settings |
| 04/24/2007 | US7210079 Apparatus and method for adapting a level sensitive device to produce edge-triggered behavior |
| 04/24/2007 | US7210078 Error bit method and circuitry for oscillation-based characterization |
| 04/24/2007 | US7210007 Method of verifying a system in which a plurality of master devices share a storage device |
| 04/24/2007 | US7209857 Method of evaluating shape of semiconductor wafer and apparatus for evaluating shape of semiconductor wafer |
| 04/24/2007 | US7209853 Measuring apparatus and program |
| 04/24/2007 | US7209852 Circuit for producing a variable frequency clock signal having a high frequency low jitter pulse component |
| 04/24/2007 | US7209851 Method and structure to develop a test program for semiconductor integrated circuits |
| 04/24/2007 | US7209850 Active tester for vehicle circuit evaluation |
| 04/24/2007 | US7209849 Test system, added apparatus, and test method |
| 04/24/2007 | US7209843 Circuit inspection method, method of manufacturing liquid-crystal display, and circuit inspection apparatus |
| 04/24/2007 | US7209804 System and method for providing remote monitoring of voltage power transmission and distribution devices |
| 04/24/2007 | US7209452 Method and system for retrieving link management interface status for a logical port |
| 04/24/2007 | US7209451 Apparatus and method for efficient detection and suppression of corrupted fibre channel frames in a protected transmission medium |
| 04/24/2007 | US7209447 Method and apparatus for measuring packet connection quality of service |
| 04/24/2007 | US7209445 Method and system for extending the reach of a data communication channel using a flow control interception device |
| 04/24/2007 | US7209443 Bandwidth updating method and bandwidth updating apparatus |
| 04/24/2007 | US7209440 Method and apparatus for preventing blocking in a quality of service switch |
| 04/24/2007 | US7209434 Path modifying method, label switching node and administrative node in label transfer network |
| 04/24/2007 | US7209235 Accurate positioning of components of a optical assembly |
| 04/24/2007 | US7208971 Manual probe carriage system and method of using the same |
| 04/24/2007 | US7208969 Optimize parallel testing |
| 04/24/2007 | US7208968 Test system for testing integrated chips and an adapter element for a test system |
| 04/24/2007 | US7208967 Socket connection test modules and methods of using the same |
| 04/24/2007 | US7208966 Contact probe, measuring pad used for the contact probe, and method of manufacturing the contact probe |
| 04/24/2007 | US7208965 Planar view TEM sample preparation from circuit layer structures |
| 04/24/2007 | US7208964 Probe card |
| 04/24/2007 | US7208959 Methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer |
| 04/24/2007 | US7208958 Antenna for detection of partial discharges in a chamber of an electrical instrument |
| 04/24/2007 | US7208957 Method for non-contact testing of fixed and inaccessible connections without using a sensor plate |
| 04/24/2007 | US7208955 Power relay or switch contact tester |
| 04/24/2007 | US7208938 Test tray for handler |
| 04/24/2007 | US7208937 Hybrid AC/DC-coupled channel for testing |
| 04/24/2007 | US7208936 Socket lid and test device |
| 04/24/2007 | US7208935 Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer |
| 04/24/2007 | US7208934 Apparatus for identification of locations of a circuit within an integrated circuit having low speed performance |
| 04/24/2007 | US7208914 Apparatus and method for predicting the remaining discharge time of a battery |
| 04/24/2007 | US7208759 Semiconductor integrated circuit device and method of testing the same |
| 04/24/2007 | US7208724 Apparatus and method of detecting probe tip contact with a surface |
| 04/24/2007 | US7208330 Method for varying the uniformity of a dopant as it is placed in a substrate by varying the speed of the implant across the substrate |
| 04/24/2007 | US7208328 Method and system for analyzing defects of an integrated circuit wafer |
| 04/19/2007 | WO2007044753A2 Interactive bandwidth modeling and node estimation |
| 04/19/2007 | WO2007044740A2 Artificial spinal disc replacement system and method |
| 04/19/2007 | WO2007043977A1 Probe for testing integrated circuit devices |
| 04/19/2007 | WO2007043482A1 Testing apparatus, pin electronic card, electric device and switch |
| 04/19/2007 | WO2007043480A1 Testing apparatus, program, and recording medium |
| 04/19/2007 | WO2007043177A1 Insert, test tray and semiconductor testing apparatus |
| 04/19/2007 | WO2007042651A1 Device for reading information on a digital bus without a wire connection to the network |
| 04/19/2007 | WO2007042622A1 A jtag testing arrangement for an integrated circuit |
| 04/19/2007 | WO2007042551A1 Test head device |
| 04/19/2007 | WO2007042159A1 Electric machine control system |
| 04/19/2007 | WO2007005662A8 Testing of receivers with separate linear o/e module and host used in communication links |
| 04/19/2007 | WO2006138655A9 Apparatus and method for controlling die force in a semiconductor device testing assembly |
| 04/19/2007 | WO2006096361A3 Apparatus and method for controlling temperature in a chuck system |
| 04/19/2007 | WO2006071817A3 Intelligent storage engine for disk drive operations with reduced local bus traffic |
| 04/19/2007 | WO2006068938A3 Bi-directional buffer for interfacing test system channel |
| 04/19/2007 | WO2006065439A3 An efficient mechanism for fast recovery in case of border router node failure in a computer network |
| 04/19/2007 | WO2006028857A3 Ieee std.1149.4 compatible analog bist methodology |
| 04/19/2007 | US20070089014 Semiconductor integrated circuit and method of fabricating the same |
| 04/19/2007 | US20070089013 System and method for testing ports of a computer |
| 04/19/2007 | US20070089012 System and method for testing a light emitting diode panel |
| 04/19/2007 | US20070089011 Method and apparatus to monitor stress conditions in a system |