Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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05/01/2007 | US7212940 Transmitter and transmitter testing method |
05/01/2007 | US7212892 In-vehicle system control device |
05/01/2007 | US7212496 Remote test unit |
05/01/2007 | US7212495 Signaling for reserving a communications path |
05/01/2007 | US7212027 Disconnection and short detecting circuit that can detect disconnection and short of a signal line transmitting a differential clock signal |
05/01/2007 | US7212025 Testing method for array substrate |
05/01/2007 | US7212024 Inspection apparatus for liquid crystal drive substrates |
05/01/2007 | US7212023 System and method for accurate negative bias temperature instability characterization |
05/01/2007 | US7212022 System and method for measuring time dependent dielectric breakdown with a ring oscillator |
05/01/2007 | US7212021 Manufacturing integrated circuits and testing on-die power supplies using distributed programmable digital current sinks |
05/01/2007 | US7212020 Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer |
05/01/2007 | US7212019 Probe needle for testing semiconductor chips and method for producing said probe needle |
05/01/2007 | US7212018 Dual tip probe |
05/01/2007 | US7212017 Electron beam apparatus with detailed observation function and sample inspecting and observing method using electron beam apparatus |
05/01/2007 | US7212016 Apparatus and methods for measuring resistance of conductive layers |
05/01/2007 | US7212013 Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer |
05/01/2007 | US7212011 Capacitor deterioration judgment method |
05/01/2007 | US7212010 Method and device for detecting a contact point on a shaft of a rotating machine |
05/01/2007 | US7212009 Fluid detection cable |
05/01/2007 | US7212008 Surveillance device detection utilizing non linear junction detection and reflectometry |
05/01/2007 | US7212005 Ignition coil tester |
05/01/2007 | US7211997 Planarity diagnostic system, E.G., for microelectronic component test systems |
05/01/2007 | US7211996 Semiconductor device having a connection inspecting circuit for inspecting connections of power source terminals and grounding terminals, and inspection method for the same |
05/01/2007 | US7211995 Method and system for detecting electronic component failures |
05/01/2007 | US7211994 Lightning and electro-magnetic pulse location and detection for the discovery of land line location |
05/01/2007 | US7211987 Electric device with intelligent battery system therein |
05/01/2007 | US7211982 Variable-structure diagnostics approach achieving optimized low-frequency data sampling for EMA motoring subsystem |
05/01/2007 | US7211343 Fuel cell system and method for voltage monitoring for a fuel cell system |
05/01/2007 | US7211155 Apparatuses and methods for cleaning test probes |
05/01/2007 | US7210634 Circuit for generating an identification code for an IC |
05/01/2007 | CA2282486C Inspection system |
04/26/2007 | WO2007048125A2 Systems and methods for providing customer feedback |
04/26/2007 | WO2007047721A2 Methods and apparatus for utilizing an optical reference |
04/26/2007 | WO2007047479A2 Control plane to data plane binding |
04/26/2007 | WO2007047178A2 Integrated circuit package resistance measurement |
04/26/2007 | WO2007046237A1 Insulation inspecting device and insulation inspecting method |
04/26/2007 | WO2007045673A1 Method for predicting the power capacity of an electrical energy store |
04/26/2007 | WO2007045196A1 Device for recognising the direction of data transmission between communication parameters |
04/26/2007 | WO2007045004A1 Device for measuring the loss factor |
04/26/2007 | WO2007015582B1 Providing precise timing control between multiple standardized test instrumentation chassis |
04/26/2007 | WO2007014875A3 Method for checking an inductive load |
04/26/2007 | WO2006131514A3 Device forming a logic gate for detecting a logic error |
04/26/2007 | WO2006121485A3 Bi-directional mos current sense circuit |
04/26/2007 | US20070094645 Programmable Extended Compression Mask for Dynamic Trace |
04/26/2007 | US20070094644 Programmable Extended Compression Mask for Dynamic Trace |
04/26/2007 | US20070094632 Method in an integrated circuit (IC) manufacturing process for identifying and redirecting ICs mis-processed during their manufacture |
04/26/2007 | US20070094562 Apparatus and method for unified debug for simulation |
04/26/2007 | US20070094561 Methods for distribution of test generation programs |
04/26/2007 | US20070094560 Reducing the soft error vulnerbility of stored data |
04/26/2007 | US20070094559 Wiring structure and method of semiconductor integrated circuit |
04/26/2007 | US20070094558 Apparatus and method for testing an IEEE1394 port |
04/26/2007 | US20070094557 Semiconductor integrated circuit tester |
04/26/2007 | US20070094556 Methods for distributing programs for generating test data |
04/26/2007 | US20070094546 Progressive Extended Compression Mask for Dynamic Trace |
04/26/2007 | US20070094545 Progressive Extended Compression Mask for Dynamic Trace |
04/26/2007 | US20070094537 Address Range Comparator for Detection of Multi-Size Memory Accesses With Data Matching Qualification and Full or Partial Overlap |
04/26/2007 | US20070093977 Fault Management of HTS Power Cable |
04/26/2007 | US20070090856 Non-contact detecting device for a panel |
04/26/2007 | US20070090855 Method and apparatus for testing bumped die |
04/26/2007 | US20070090854 Semiconductor device and method for manufacturing the same |
04/26/2007 | US20070090853 Method and arrangement for predicting thermally-induced deformation of substrate, and a semiconductor device |
04/26/2007 | US20070090852 Process for checking the quality of the metallization of a printed circuit |
04/26/2007 | US20070090851 Probe sensing pads and methods of detecting positions of probe needles relative to probe sensing pads |
04/26/2007 | US20070090850 Semiconductor integrated circuit tester with interchangeable tester module |
04/26/2007 | US20070090849 Method and apparatus for a DUT contactor |
04/26/2007 | US20070090848 Design-for-test circuit for low pin count devices |
04/26/2007 | US20070090847 Stepped PCB for probe card, probe card having the same and method for clamping the probe card |
04/26/2007 | US20070090844 Battery monitoring system |
04/26/2007 | US20070090843 Method and device for determining the charge of a battery |
04/26/2007 | US20070090801 Battery cell voltage and impedance measuring circuit |
04/26/2007 | US20070090635 Method of determining charging capacitance of capacitor |
04/26/2007 | US20070089500 System and method for diagnosing a controller in a limited rotation motor system |
04/26/2007 | US20070089287 Method for manufacturing magnetostrictive torque sensor |
04/26/2007 | DE202007000857U1 Vorrichtung zur Erzeugung reproduzierbarer, transienter Lastsituationen in einem Stromkreis An apparatus for generating a reproducible, transient overload situations in a circuit |
04/26/2007 | DE19729009B4 Ladevorrichtung für das Laden verschiedener Arten von Akkumulatorenbatterien Loader for loading different types of Batteries |
04/26/2007 | DE19648659B4 Verfahren zur Bestimmung von Degradationsprozessen in Halbleiterlasern A method for the determination of degradation in semiconductor lasers |
04/26/2007 | DE19636416B4 Verfahren und Vorrichtung zur Bestimmung der Empfindlichkeit eines Kohlenwasserstoffsensors für eine Brennkraftmaschine Method and apparatus for determining the sensitivity of a hydrocarbon sensor for an internal combustion engine |
04/26/2007 | DE19527972B4 Messschaltung unter Verwendung eines Messfühlers zum Erfassen und Orten von Wassereinbrüchen Measuring circuit using a probe for detecting and locating water leaks |
04/26/2007 | DE112005001349T5 Taktgenerator und Halbleitertestvorrichtung Clock generator and semiconductor test apparatus |
04/26/2007 | DE112005001249T5 Quellenstrom-Messvorrichtung und Prüfvorrichtung Source current-measuring device and testing unit |
04/26/2007 | DE112005000837T5 Digitale Teilnehmer-Leitungs-Benutzerkapazitäts-Schätzung Digital subscriber line user capacity estimation |
04/26/2007 | DE112004002826T5 Bildsensor-Prüfsystem Image sensor testing system |
04/26/2007 | DE10201645B4 Verfahren zur Codierung und Authentifizierung von Halbleiterschaltungen A method of coding and authentication of semiconductor circuits |
04/26/2007 | DE102006041817A1 Verfahren und Anordnung zum Testen eines Halbleiterbauelements mit gestapelten Einzelchips Method and apparatus for testing a semiconductor device with stacked dice |
04/26/2007 | DE102006034191A1 Contactor integrated device under test (DUT) board used in automated test equipment (ATE) industry has raised contactor pads provided on outer layer of multi-layer printed circuit board and directly connectable to solder balls of DUT |
04/26/2007 | DE102006008445B3 Electrical plate testing device, has light emitting diode switched parallel to induction coil, and primary transmitter provided as hand apparatus which produces electromagnetic field such that induction coil is activated |
04/26/2007 | DE102006008443B3 Electrical printed circuit board testing device, has diode for alternating current connected to switching transistor which is switched at output of light emitting diode, and emitter switched at conductor end carrying reference potential |
04/26/2007 | DE102005050788A1 Electronic control device functional testing method for use in vehicle, involves connecting short-circuit load with connection of control devices for functional testing during manufacturing of devices, and controlling load unit by devices |
04/26/2007 | DE102005050563A1 Verfahren zur Vorhersage der Leistungsfähigkeit elektrischer Energiespeicher A method for predicting the performance of electrical energy storage |
04/26/2007 | DE102005049598A1 Hybrid Chuck Hybrid Chuck |
04/26/2007 | DE102005048872A1 Testkopfeinrichtung Test head device |
04/26/2007 | DE102004044425A1 Non-mains supplied vending machine for use in locations without a convenient electricity network connection has a solar power supply and a non- rechargeable battery for charging the unit's rechargeable battery |
04/26/2007 | DE10007434B4 Trägermodul für eine Mikro-BGA-Vorrichtung Support module for a micro-BGA device |
04/26/2007 | CA2626376A1 Device for measuring the loss factor |
04/25/2007 | EP1777824A1 Parametric ADC-test |
04/25/2007 | EP1777535A2 System and method for glitch detection in a secure microcontroller |
04/25/2007 | EP1777534A1 Semiconductor device and a method of testing the same |
04/25/2007 | EP1777533A1 Monitoring device for an array of electrical units |
04/25/2007 | EP1777532A1 Method and driving apparatus for testing an antenna |
04/25/2007 | EP1777511A2 Scanning system for inspecting anomalies on surfaces |