Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
05/2007
05/01/2007US7212940 Transmitter and transmitter testing method
05/01/2007US7212892 In-vehicle system control device
05/01/2007US7212496 Remote test unit
05/01/2007US7212495 Signaling for reserving a communications path
05/01/2007US7212027 Disconnection and short detecting circuit that can detect disconnection and short of a signal line transmitting a differential clock signal
05/01/2007US7212025 Testing method for array substrate
05/01/2007US7212024 Inspection apparatus for liquid crystal drive substrates
05/01/2007US7212023 System and method for accurate negative bias temperature instability characterization
05/01/2007US7212022 System and method for measuring time dependent dielectric breakdown with a ring oscillator
05/01/2007US7212021 Manufacturing integrated circuits and testing on-die power supplies using distributed programmable digital current sinks
05/01/2007US7212020 Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer
05/01/2007US7212019 Probe needle for testing semiconductor chips and method for producing said probe needle
05/01/2007US7212018 Dual tip probe
05/01/2007US7212017 Electron beam apparatus with detailed observation function and sample inspecting and observing method using electron beam apparatus
05/01/2007US7212016 Apparatus and methods for measuring resistance of conductive layers
05/01/2007US7212013 Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer
05/01/2007US7212011 Capacitor deterioration judgment method
05/01/2007US7212010 Method and device for detecting a contact point on a shaft of a rotating machine
05/01/2007US7212009 Fluid detection cable
05/01/2007US7212008 Surveillance device detection utilizing non linear junction detection and reflectometry
05/01/2007US7212005 Ignition coil tester
05/01/2007US7211997 Planarity diagnostic system, E.G., for microelectronic component test systems
05/01/2007US7211996 Semiconductor device having a connection inspecting circuit for inspecting connections of power source terminals and grounding terminals, and inspection method for the same
05/01/2007US7211995 Method and system for detecting electronic component failures
05/01/2007US7211994 Lightning and electro-magnetic pulse location and detection for the discovery of land line location
05/01/2007US7211987 Electric device with intelligent battery system therein
05/01/2007US7211982 Variable-structure diagnostics approach achieving optimized low-frequency data sampling for EMA motoring subsystem
05/01/2007US7211343 Fuel cell system and method for voltage monitoring for a fuel cell system
05/01/2007US7211155 Apparatuses and methods for cleaning test probes
05/01/2007US7210634 Circuit for generating an identification code for an IC
05/01/2007CA2282486C Inspection system
04/2007
04/26/2007WO2007048125A2 Systems and methods for providing customer feedback
04/26/2007WO2007047721A2 Methods and apparatus for utilizing an optical reference
04/26/2007WO2007047479A2 Control plane to data plane binding
04/26/2007WO2007047178A2 Integrated circuit package resistance measurement
04/26/2007WO2007046237A1 Insulation inspecting device and insulation inspecting method
04/26/2007WO2007045673A1 Method for predicting the power capacity of an electrical energy store
04/26/2007WO2007045196A1 Device for recognising the direction of data transmission between communication parameters
04/26/2007WO2007045004A1 Device for measuring the loss factor
04/26/2007WO2007015582B1 Providing precise timing control between multiple standardized test instrumentation chassis
04/26/2007WO2007014875A3 Method for checking an inductive load
04/26/2007WO2006131514A3 Device forming a logic gate for detecting a logic error
04/26/2007WO2006121485A3 Bi-directional mos current sense circuit
04/26/2007US20070094645 Programmable Extended Compression Mask for Dynamic Trace
04/26/2007US20070094644 Programmable Extended Compression Mask for Dynamic Trace
04/26/2007US20070094632 Method in an integrated circuit (IC) manufacturing process for identifying and redirecting ICs mis-processed during their manufacture
04/26/2007US20070094562 Apparatus and method for unified debug for simulation
04/26/2007US20070094561 Methods for distribution of test generation programs
04/26/2007US20070094560 Reducing the soft error vulnerbility of stored data
04/26/2007US20070094559 Wiring structure and method of semiconductor integrated circuit
04/26/2007US20070094558 Apparatus and method for testing an IEEE1394 port
04/26/2007US20070094557 Semiconductor integrated circuit tester
04/26/2007US20070094556 Methods for distributing programs for generating test data
04/26/2007US20070094546 Progressive Extended Compression Mask for Dynamic Trace
04/26/2007US20070094545 Progressive Extended Compression Mask for Dynamic Trace
04/26/2007US20070094537 Address Range Comparator for Detection of Multi-Size Memory Accesses With Data Matching Qualification and Full or Partial Overlap
04/26/2007US20070093977 Fault Management of HTS Power Cable
04/26/2007US20070090856 Non-contact detecting device for a panel
04/26/2007US20070090855 Method and apparatus for testing bumped die
04/26/2007US20070090854 Semiconductor device and method for manufacturing the same
04/26/2007US20070090853 Method and arrangement for predicting thermally-induced deformation of substrate, and a semiconductor device
04/26/2007US20070090852 Process for checking the quality of the metallization of a printed circuit
04/26/2007US20070090851 Probe sensing pads and methods of detecting positions of probe needles relative to probe sensing pads
04/26/2007US20070090850 Semiconductor integrated circuit tester with interchangeable tester module
04/26/2007US20070090849 Method and apparatus for a DUT contactor
04/26/2007US20070090848 Design-for-test circuit for low pin count devices
04/26/2007US20070090847 Stepped PCB for probe card, probe card having the same and method for clamping the probe card
04/26/2007US20070090844 Battery monitoring system
04/26/2007US20070090843 Method and device for determining the charge of a battery
04/26/2007US20070090801 Battery cell voltage and impedance measuring circuit
04/26/2007US20070090635 Method of determining charging capacitance of capacitor
04/26/2007US20070089500 System and method for diagnosing a controller in a limited rotation motor system
04/26/2007US20070089287 Method for manufacturing magnetostrictive torque sensor
04/26/2007DE202007000857U1 Vorrichtung zur Erzeugung reproduzierbarer, transienter Lastsituationen in einem Stromkreis An apparatus for generating a reproducible, transient overload situations in a circuit
04/26/2007DE19729009B4 Ladevorrichtung für das Laden verschiedener Arten von Akkumulatorenbatterien Loader for loading different types of Batteries
04/26/2007DE19648659B4 Verfahren zur Bestimmung von Degradationsprozessen in Halbleiterlasern A method for the determination of degradation in semiconductor lasers
04/26/2007DE19636416B4 Verfahren und Vorrichtung zur Bestimmung der Empfindlichkeit eines Kohlenwasserstoffsensors für eine Brennkraftmaschine Method and apparatus for determining the sensitivity of a hydrocarbon sensor for an internal combustion engine
04/26/2007DE19527972B4 Messschaltung unter Verwendung eines Messfühlers zum Erfassen und Orten von Wassereinbrüchen Measuring circuit using a probe for detecting and locating water leaks
04/26/2007DE112005001349T5 Taktgenerator und Halbleitertestvorrichtung Clock generator and semiconductor test apparatus
04/26/2007DE112005001249T5 Quellenstrom-Messvorrichtung und Prüfvorrichtung Source current-measuring device and testing unit
04/26/2007DE112005000837T5 Digitale Teilnehmer-Leitungs-Benutzerkapazitäts-Schätzung Digital subscriber line user capacity estimation
04/26/2007DE112004002826T5 Bildsensor-Prüfsystem Image sensor testing system
04/26/2007DE10201645B4 Verfahren zur Codierung und Authentifizierung von Halbleiterschaltungen A method of coding and authentication of semiconductor circuits
04/26/2007DE102006041817A1 Verfahren und Anordnung zum Testen eines Halbleiterbauelements mit gestapelten Einzelchips Method and apparatus for testing a semiconductor device with stacked dice
04/26/2007DE102006034191A1 Contactor integrated device under test (DUT) board used in automated test equipment (ATE) industry has raised contactor pads provided on outer layer of multi-layer printed circuit board and directly connectable to solder balls of DUT
04/26/2007DE102006008445B3 Electrical plate testing device, has light emitting diode switched parallel to induction coil, and primary transmitter provided as hand apparatus which produces electromagnetic field such that induction coil is activated
04/26/2007DE102006008443B3 Electrical printed circuit board testing device, has diode for alternating current connected to switching transistor which is switched at output of light emitting diode, and emitter switched at conductor end carrying reference potential
04/26/2007DE102005050788A1 Electronic control device functional testing method for use in vehicle, involves connecting short-circuit load with connection of control devices for functional testing during manufacturing of devices, and controlling load unit by devices
04/26/2007DE102005050563A1 Verfahren zur Vorhersage der Leistungsfähigkeit elektrischer Energiespeicher A method for predicting the performance of electrical energy storage
04/26/2007DE102005049598A1 Hybrid Chuck Hybrid Chuck
04/26/2007DE102005048872A1 Testkopfeinrichtung Test head device
04/26/2007DE102004044425A1 Non-mains supplied vending machine for use in locations without a convenient electricity network connection has a solar power supply and a non- rechargeable battery for charging the unit's rechargeable battery
04/26/2007DE10007434B4 Trägermodul für eine Mikro-BGA-Vorrichtung Support module for a micro-BGA device
04/26/2007CA2626376A1 Device for measuring the loss factor
04/25/2007EP1777824A1 Parametric ADC-test
04/25/2007EP1777535A2 System and method for glitch detection in a secure microcontroller
04/25/2007EP1777534A1 Semiconductor device and a method of testing the same
04/25/2007EP1777533A1 Monitoring device for an array of electrical units
04/25/2007EP1777532A1 Method and driving apparatus for testing an antenna
04/25/2007EP1777511A2 Scanning system for inspecting anomalies on surfaces