| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/03/2007 | US20070101214 Self-testing apparatus with controllable environmental stress screening (ESS) |
| 05/03/2007 | US20070101213 Modeling error correction capability with estimation of defect parameters |
| 05/03/2007 | US20070100573 Transmitter and transmitter testing method |
| 05/03/2007 | US20070099446 Electrical connecting apparatus |
| 05/03/2007 | US20070099402 Method for fabricating reliable semiconductor structure |
| 05/03/2007 | US20070099314 Modeling device variations in integrated circuit design |
| 05/03/2007 | US20070099313 Method of design based process control optimization |
| 05/03/2007 | US20070099312 Structure and method for parallel testing of dies on a semiconductor wafer |
| 05/03/2007 | US20070096769 Electronic meter supporting added functionality |
| 05/03/2007 | US20070096768 Method of repairing gate line on TFT array substrate |
| 05/03/2007 | US20070096767 Method of preventing display panel from burn-in defect |
| 05/03/2007 | US20070096766 Chopper type comparator |
| 05/03/2007 | US20070096765 Bluetooth-enable intelligent electronic device |
| 05/03/2007 | US20070096764 Immersion exposure apparatus and method of manufacturing semiconductor device |
| 05/03/2007 | US20070096763 Methods and apparatus for utilizing an optical reference |
| 05/03/2007 | US20070096762 Measuring apparatus, measuring method, and test apparatus |
| 05/03/2007 | US20070096761 Semiconductor apparatus testing arrangement and semiconductor apparatus testing method |
| 05/03/2007 | US20070096760 Method and apparatus for testing a semiconductor structure having top-side and bottom-side connections |
| 05/03/2007 | US20070096759 Analog built-in self-test module |
| 05/03/2007 | US20070096758 Method and apparatus for eliminating automated testing equipment index time |
| 05/03/2007 | US20070096757 Resource matrix, system, and method for operating same |
| 05/03/2007 | US20070096756 Automatic testing equipment instrument card and probe cabling system and apparatus |
| 05/03/2007 | US20070096755 Method and apparatus for automatic test equipment |
| 05/03/2007 | US20070096754 Method and system for analyzing single event upset in semiconductor devices |
| 05/03/2007 | US20070096753 Electronically resettable current protection for die testing |
| 05/03/2007 | US20070096749 Electrical connecting apparatus and contact |
| 05/03/2007 | US20070096748 Current sensing circuit |
| 05/03/2007 | US20070096747 Non-linear observers in electric power networks |
| 05/03/2007 | US20070096746 Monitoring device for an array of electrical units |
| 05/03/2007 | US20070096745 Filling level and/or limit level measuring device with flexible connecting piece |
| 05/03/2007 | US20070096743 Method and apparatus for judging deterioration of battery |
| 05/03/2007 | US20070096721 Apparatus for verifying a mobile communication system and method thereof |
| 05/03/2007 | US20070096720 Impedance calibration for source series terminated serial link transmitter |
| 05/03/2007 | US20070095789 Method for automatic determination of semiconductor plasma chamber matching and source of fault by comprehensive plasma monitoring |
| 05/03/2007 | US20070095788 Method of controlling a chamber based upon predetermined concurrent behavoir of selected plasma parameters as a function of selected chamber paramenters |
| 05/03/2007 | DE19800461B4 Untersuchungsspannvorrichtung Investigation jig |
| 05/03/2007 | DE19513872B4 Verfahren und Schaltungsanordnung zum Prüfen von Kraftfahrzeug-Antennen Method and circuit for testing automotive antennas |
| 05/03/2007 | DE112005001517T5 Synchronisation zwischen Niedrigfrequenz- und Hochfrequenzdigitalsignalen Synchronization between low frequency and high frequency digital signals |
| 05/03/2007 | DE112005001466T5 Signallesevorrichtung und Prüfvorrichtung Signal reading device and testing unit |
| 05/03/2007 | DE112005001355T5 Vorrichtung zum Analysieren von Breitbandsignalen, Breitband-Periodenjitter und Breitbandversatz An apparatus for analyzing wideband signals, wideband period and wideband skew |
| 05/03/2007 | DE112005001308T5 Bi-direktionale Stromerkennung durch Überwachen der VS Spannung in einer Halb- oder Vollbrückenschaltung Bi-directional current detection by monitoring the voltage VS in a half or full bridge circuit |
| 05/03/2007 | DE112005001304T5 Heizgerät-Leistungssteuerschaltung und Einbrennvorrichtung, die selbige verwendet Heater power control circuit and burn-in, the used selbige |
| 05/03/2007 | DE112005001303T5 Verfahren zum Überwachen einer Einbrennvorrichtung A method for monitoring a burn- |
| 05/03/2007 | DE10310140B4 Testvorrichtung zum Test von integrierten Bausteinen sowie Verfahren zum Betrieb einer Testvorrichtung A test device for testing of integrated devices, and methods for operating a test apparatus |
| 05/03/2007 | DE10236900B4 Verfahren zum Durchführen eines Bitfehlerratentests und Bitfehlerratentestsystem A method for performing a bit error rate and Bitfehlerratentestsystem |
| 05/03/2007 | DE102006051172A1 Testing device for testing a semiconductor device comprises a section for producing a test pattern, side generators, a selecting section for the generators and a section for feeding a test signal to the semiconductor device |
| 05/03/2007 | DE102005051814A1 Electronic test apparatus e.g. for testing circuits, has clock signal generator and driver having several subunits each generating phase-shifted driver signal in response to clock signal |
| 05/03/2007 | DE102005046736A1 Vorrichtung und Verfahren zum Beladen einer Sockel- bzw. Adapter-Einrichtung mit einem entsprechenden Halbleiter-Bauelement Apparatus and method for loading a socket or adapter device with a corresponding semiconductor device |
| 05/03/2007 | DE102005025449B4 Verfahren und Vorrichtung zur Messung einer dielektrischen Antwort eines elektrischen Isoliersystems Method and apparatus for measuring a dielectric response of an electrical insulating |
| 05/03/2007 | DE102004014731B4 Mess-Schaltung für den Ausgang eines Leistungsverstärkers sowie ein die Mess-Schaltung umfassender Leistungsverstärker Measuring circuit for the output of a power amplifier and a measuring circuit comprehensive power amplifier |
| 05/03/2007 | DE10043193B4 Prüfgerät für Halbleitersubstrate Tester for semiconductor substrates |
| 05/02/2007 | EP1780886A1 Ac rotary machine constant measuring apparatus |
| 05/02/2007 | EP1780739A1 Thinning filter and test device |
| 05/02/2007 | EP1780553A1 Dischargeable capacitance determining method |
| 05/02/2007 | EP1780552A1 Electronic device for diagnosing anomalies in electrical harnesses of a motor vehicle |
| 05/02/2007 | EP1779471A2 Mechanically reconfigurable vertical tester interface for ic probing |
| 05/02/2007 | EP1779127A2 Evanescent microwave probe with enhanced resolution and sensitivity |
| 05/02/2007 | EP1665489B1 Method and circuit arrangement for the detection of ground faults on electronic trips for low-voltage circuit breakers comprising serially connected measuring amplifiers |
| 05/02/2007 | EP1597605B1 Testing of electronic circuits |
| 05/02/2007 | EP1559116A4 Probe station with low noise characteristics |
| 05/02/2007 | EP1344070B1 Method and device for monitoring the function of an output stage with pulse width modulation |
| 05/02/2007 | EP1278072B1 Device for judging life of auxiliary battery |
| 05/02/2007 | CN2896700Y Data-transmission interface converting circuit |
| 05/02/2007 | CN2896693Y Generator end three-phase-voltage monitoring symmetric output transmitter |
| 05/02/2007 | CN2896297Y DC motor fault detector |
| 05/02/2007 | CN2896296Y AC multi-line cut-off alarm |
| 05/02/2007 | CN2896295Y Multi-purpose electromagnetic valve induction test pen |
| 05/02/2007 | CN2896287Y Detection needle |
| 05/02/2007 | CN2896286Y Sheet-type resistance pressurizing test clamp |
| 05/02/2007 | CN2896285Y Sheet-type resistance network pressurizing, ageing sieving clamp |
| 05/02/2007 | CN1957262A Probe card configuration for low mechanical flexural strength electrical routing substrates |
| 05/02/2007 | CN1957260A Sheet probe, manufacturing method and application therefor |
| 05/02/2007 | CN1957259A Sheetlike probe, its manufacturing method and its application |
| 05/02/2007 | CN1955752A Method for monitoring charging process of battery of mobile terminal |
| 05/02/2007 | CN1955751A Method and apparatus for eliminating automated testing equipment index time |
| 05/02/2007 | CN1955750A Modal checking method and system of vacuum electronic device |
| 05/02/2007 | CN1955749A Broad band uhf local discharge signal and graphics generator |
| 05/02/2007 | CN1955748A Method and device of providing impedance calibration for source series terminated serial link transmitter |
| 05/02/2007 | CN1955747A Equipment detection monitoring control method and system |
| 05/02/2007 | CN1955745A Phase measuring method in on-line monitoring of high-voltage electric equipment |
| 05/02/2007 | CN1955741A Method and apparatus for a dut contactor |
| 05/02/2007 | CN1955717A Reducing of error alarm in PCB detection |
| 05/02/2007 | CN1314298C Device and method for testing panel display |
| 05/02/2007 | CN1314215C Serial shaking measuring method based on frequency spectrum analysis |
| 05/02/2007 | CN1314182C Battery pack charging system |
| 05/02/2007 | CN1314181C Method for resetting battery charge state of hybrid power electric vehicle |
| 05/02/2007 | CN1314162C Detecting method for internal state of rechargeable battery, device and equipment with said device |
| 05/02/2007 | CN1313865C Inspection method and device for liquid crystal driving substrate |
| 05/02/2007 | CN1313831C Signalling system |
| 05/01/2007 | US7213216 Method and system for debugging using replicated logic and trigger logic |
| 05/01/2007 | US7213188 Accessing test modes using command sequences |
| 05/01/2007 | US7213187 Digital logic test method to systematically approach functional coverage completely and related apparatus and system |
| 05/01/2007 | US7213186 Memory built-in self test circuit with full error mapping capability |
| 05/01/2007 | US7213185 Built-in self test circuit for integrated circuits |
| 05/01/2007 | US7213184 Testing of modules operating with different characteristics of control signals using scan based techniques |
| 05/01/2007 | US7213183 Integrated circuit |
| 05/01/2007 | US7213182 Test apparatus and test method |
| 05/01/2007 | US7213171 IEEE 1149.1 tap instruction scan with augmented TLM scan mode |
| 05/01/2007 | US7213159 Method for testing and verifying power management features of computer system |
| 05/01/2007 | US7212941 Non-deterministic protocol packet testing |