| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/09/2007 | EP1782093A1 Ultrahigh-frequency testing device for transponders |
| 05/09/2007 | EP1782084A1 Equipment control device for providing information about an operating state of the equipment |
| 05/09/2007 | EP1723571A4 Methods and apparatus for data analysis |
| 05/09/2007 | EP1283751B1 Inspection machine for surface mount passive component |
| 05/09/2007 | CN2898851Y Movable telecommunication alarming device of electric vehicle |
| 05/09/2007 | CN2898850Y Electric-brush central line checker |
| 05/09/2007 | CN2898849Y Automatic checking platform of movable gas relay |
| 05/09/2007 | CN2898848Y Monitoring circuit for maintaining driven-circuit switching transistor |
| 05/09/2007 | CN2898847Y Para-position point searching device |
| 05/09/2007 | CN2898846Y Short-circuit and grounded-fault indicator |
| 05/09/2007 | CN2898845Y Power-supply circuit fault indicator |
| 05/09/2007 | CN2898844Y Electric cable signal identifier |
| 05/09/2007 | CN2898843Y Endurance tester of electric starting system for motorcycle |
| 05/09/2007 | CN2898841Y Microcomputer integrated electroprobe |
| 05/09/2007 | CN2898837Y Interface device of testing clamp |
| 05/09/2007 | CN2898836Y Mainboard rack device |
| 05/09/2007 | CN1961218A Double side probing of semiconductor devices |
| 05/09/2007 | CN1960596A Multiple stage type print circuit board of probe card |
| 05/09/2007 | CN1960393A Mobile communication terminal and charger for displaying cell state |
| 05/09/2007 | CN1960294A Automatic fault reporting system of communication line |
| 05/09/2007 | CN1960160A Vehicle alternator monitoring system and related failure monitoring method |
| 05/09/2007 | CN1960113A Backpack type emergency power supply |
| 05/09/2007 | CN1959651A Device for testing RS232 ports |
| 05/09/2007 | CN1959645A Device and method for checking up bit wide confersion data |
| 05/09/2007 | CN1959426A Method for processing vectors tested digitally |
| 05/09/2007 | CN1959425A Semiconductor apparatus testing arrangement and semiconductor apparatus testing method |
| 05/09/2007 | CN1959424A General type test instrument for communication ports |
| 05/09/2007 | CN1959423A Method for detecting faults of single board, and testing device |
| 05/09/2007 | CN1959403A Method and device for testing oxide of grid electrode by using fuse wire |
| 05/09/2007 | CN1959385A Checking apparatus and checking method for loading product |
| 05/09/2007 | CN1959366A Luminous flux measurement device of using standard light source in narrow beam for LED, and testing method |
| 05/09/2007 | CN1315135C Compliant electrical contact |
| 05/09/2007 | CN1314976C Universal test interface between device under test and test head |
| 05/09/2007 | CN1314975C Integrated circuit with power supply test interface |
| 05/09/2007 | CN1314972C Current transformer failure metering and electric larceny proof real-time on-line detection method and apparatus |
| 05/08/2007 | US7216315 Error portion detecting method and layout method for semiconductor integrated circuit |
| 05/08/2007 | US7216312 Determining one or more reachable states in a circuit using distributed computing and one or more partitioned data structures |
| 05/08/2007 | US7216281 Format control circuit and semiconductor test device |
| 05/08/2007 | US7216280 Method of generating test patterns to efficiently screen inline resistance delay defects in complex ASICs |
| 05/08/2007 | US7216279 Testing with high speed pulse generator |
| 05/08/2007 | US7216278 Method and BIST architecture for fast memory testing in platform-based integrated circuit |
| 05/08/2007 | US7216277 Self-repairing redundancy for memory blocks in programmable logic devices |
| 05/08/2007 | US7216276 Apparatus and method for testing and debugging an integrated circuit |
| 05/08/2007 | US7216275 Method and apparatus for accessing hidden data in a boundary scan test interface |
| 05/08/2007 | US7216274 Flexible scan architecture |
| 05/08/2007 | US7216273 Method for testing non-deterministic device data |
| 05/08/2007 | US7216271 Testing apparatus and a testing method |
| 05/08/2007 | US7216269 Signal transmit-receive device, circuit, and loopback test method |
| 05/08/2007 | US7216268 Method and arrangement to estimate transmission channel characteristics |
| 05/08/2007 | US7216246 Electronic apparatus and supply power setting method for the apparatus |
| 05/08/2007 | US7216051 Power short circuit testing of an electronics assembly employing pre-characterized power off resistance of an electronic component thereof from a power boundary |
| 05/08/2007 | US7216045 Selection of wavelengths for integrated circuit optical metrology |
| 05/08/2007 | US7216044 Battery state diagnosing device and battery state diagnosing method |
| 05/08/2007 | US7215651 System and method for retransmission of data |
| 05/08/2007 | US7215646 Method and apparatus for estimating and reporting the quality of a wireless communication channel |
| 05/08/2007 | US7215639 Congestion management for packet routers |
| 05/08/2007 | US7215598 Imaging sonar and detection system using such a sonar |
| 05/08/2007 | US7215361 Method for automated testing of the modulation transfer function in image sensors |
| 05/08/2007 | US7215134 Apparatus for determining burn-in reliability from wafer level burn-in |
| 05/08/2007 | US7215133 Contactless circuit testing for adaptive wafer processing |
| 05/08/2007 | US7215132 Integrated circuit and circuit board |
| 05/08/2007 | US7215131 Segmented contactor |
| 05/08/2007 | US7215130 Testing and display of electrical system impedance |
| 05/08/2007 | US7215128 Output circuit for semiconductor device, semiconductor device having output circuit, and method of adjusting characteristics of output circuit |
| 05/08/2007 | US7215127 Detecting fixture and method thereof for detecting capacitors |
| 05/08/2007 | US7215126 Apparatus and method for testing a signal path from an injection point |
| 05/08/2007 | US7215015 Imaging system |
| 05/08/2007 | US7214961 Semiconductor testing device and semiconductor testing method |
| 05/08/2007 | US7214552 Eliminating systematic process yield loss via precision wafer placement alignment |
| 05/08/2007 | US7214551 Multiple gate electrode linewidth measurement and photoexposure compensation method |
| 05/03/2007 | WO2007051001A1 Method to locate logic errors and defects in digital circuits |
| 05/03/2007 | WO2007050865A1 Method and apparatus for automatic test equipment |
| 05/03/2007 | WO2007050799A2 Incorporating manufacturing variations in the analysis of integrated circuit design |
| 05/03/2007 | WO2007050430A2 An apparatus and methods for controlling operation of a single-phase voltage regulator in a three-phase power system |
| 05/03/2007 | WO2007050182A1 Algoristic spring as probe |
| 05/03/2007 | WO2007050155A1 Battery analysis system and method |
| 05/03/2007 | WO2007049715A1 Interference exclusion capability tester |
| 05/03/2007 | WO2007049490A1 Delay lock loop circuit, timing generator, semiconductor test device, semiconductor integrated circuit, and delay amount calibration method |
| 05/03/2007 | WO2007049476A1 Testing apparatus and testing method |
| 05/03/2007 | WO2007049475A1 Testing apparatus, fixture board and pin electronics card |
| 05/03/2007 | WO2007049331A1 Connecting device, iddq test method and semiconductor integrated circuit |
| 05/03/2007 | WO2007049173A1 Ic testing methods and apparatus |
| 05/03/2007 | WO2007049172A1 Ic testing methods and apparatus |
| 05/03/2007 | WO2007049171A1 Ic testing methods and apparatus |
| 05/03/2007 | WO2007048367A1 Method and device for determining the ageing of a battery |
| 05/03/2007 | WO2007048366A1 Method and device for controlling the operating point of a battery |
| 05/03/2007 | WO2007032944A3 Arc fault circuit interrupter system |
| 05/03/2007 | US20070101227 Digital measuring system and method for integrated circuit chip operating parameters |
| 05/03/2007 | US20070101226 Method of test pattern generation in ic design simulation system |
| 05/03/2007 | US20070101225 Circuit and method of testing semiconductor memory devices |
| 05/03/2007 | US20070101224 Circuit for Generating Data Strobe Signal in DDR Memory Device, and Method Therefor |
| 05/03/2007 | US20070101223 Electronic test apparatus and method for testing at least one circuit unit |
| 05/03/2007 | US20070101222 Shift registers free of timing race boundary scan registers with two-phase clock control |
| 05/03/2007 | US20070101221 Method, apparatus and computer program product for implementing scan-chain-specific control signals as part of a scan chain |
| 05/03/2007 | US20070101220 Systems and methods for accessing input/output devices |
| 05/03/2007 | US20070101219 Semiconductor testing apparatus and method of calibrating the same |
| 05/03/2007 | US20070101218 Shift register system and method for driving a shift register system |
| 05/03/2007 | US20070101217 Serial data input/output method and apparatus |
| 05/03/2007 | US20070101216 Method to locate logic errors and defects in digital circuits |
| 05/03/2007 | US20070101215 Automated device testing using intertwined stimulus-generation and response validation specifications for managing DUT's that generate out-of-order responses |