| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/15/2007 | US7219287 Automated fault diagnosis in a programmable device |
| 05/15/2007 | US7219286 Built off self test (BOST) in the kerf |
| 05/15/2007 | US7219285 Flash memory |
| 05/15/2007 | US7219284 Decode logic selecting IC scan path parts |
| 05/15/2007 | US7219283 IC with TAP, STP and lock out controlled output buffer |
| 05/15/2007 | US7219282 Boundary scan with strobed pad driver enable |
| 05/15/2007 | US7219281 Boundary scan of integrated circuits |
| 05/15/2007 | US7219280 Integrated circuit with test signal routing module |
| 05/15/2007 | US7219279 Software testing |
| 05/15/2007 | US7219278 Configurator arrangement and approach therefor |
| 05/15/2007 | US7219275 Method and apparatus for providing flexible modular redundancy allocation for memory built in self test of SRAM with redundancy |
| 05/15/2007 | US7219269 Self-calibrating strobe signal generator |
| 05/15/2007 | US7219113 Pseudo-random binary sequence checker with automatic synchronization |
| 05/15/2007 | US7219029 Method for testing a memory device and memory device for carrying out the method |
| 05/15/2007 | US7219028 Apparatus for testing hard disk drive |
| 05/15/2007 | US7219023 Method and device for the detection of fault current arcing in electric circuits |
| 05/15/2007 | US7218771 Cam reference for inspection of contour images |
| 05/15/2007 | US7218633 Personal area network with automatic attachment and detachment |
| 05/15/2007 | US7218608 Random early detection algorithm using an indicator bit to detect congestion in a computer network |
| 05/15/2007 | US7218605 Temporary halting method in router and network |
| 05/15/2007 | US7218201 High pressure resistance body element |
| 05/15/2007 | US7218132 System and method for accurate negative bias temperature instability characterization |
| 05/15/2007 | US7218131 Inspection probe, method for preparing the same, and method for inspecting elements |
| 05/15/2007 | US7218129 System, apparatus and method for controlling temperature of an integrated circuit under test |
| 05/15/2007 | US7218128 Method and apparatus for locating and testing a chip |
| 05/15/2007 | US7218127 Method and apparatus for probing an electronic device in which movement of probes and/or the electronic device includes a lateral component |
| 05/15/2007 | US7218126 Inspection method and apparatus for circuit pattern |
| 05/15/2007 | US7218125 Apparatus and method for performing a four-point voltage measurement for an integrated circuit |
| 05/15/2007 | US7218123 Centralized HIRF detection system |
| 05/15/2007 | US7218120 Fault detection circuit for a driver circuit |
| 05/15/2007 | US7218119 System and method for reducing current in a device during testing |
| 05/15/2007 | US7218117 Handheld tester for starting/charging systems |
| 05/15/2007 | US7218097 Wafer test equipment and method of aligning test equipment |
| 05/15/2007 | US7218096 Adjusting device for chip adapter testing pin |
| 05/15/2007 | US7218095 Method and apparatus for electromagnetic interference shielding in an automated test system |
| 05/15/2007 | US7218094 Wireless test system |
| 05/15/2007 | US7218093 Reduced chip testing scheme at wafer level |
| 05/15/2007 | US7218079 Electrochemical energy store and method for determining the wear to an electrochemical energy store |
| 05/15/2007 | US7218078 Back-up power system and monitoring system therefor |
| 05/15/2007 | US7217990 Tape package having test pad on reverse surface and method for testing the same |
| 05/15/2007 | US7217942 Plasma leak monitoring method, plasma processing apparatus and plasma processing method |
| 05/15/2007 | US7217580 Method for processing an integrated circuit |
| 05/15/2007 | US7217579 Voltage contrast test structure |
| 05/15/2007 | US7217371 Optical control interface between controller and process chamber |
| 05/15/2007 | CA2433545C Battery charger/tester with storage media |
| 05/10/2007 | WO2007053538A2 Errors visibility enhancement methods for video testing |
| 05/10/2007 | WO2007053240A2 Tandem handler system and method for reduced index time |
| 05/10/2007 | WO2007052557A1 Method for manufacturing conductive contact holder, and conductive contact holder |
| 05/10/2007 | WO2007052358A1 Electrical connector |
| 05/10/2007 | WO2007052344A1 Sip with built-in test circuit |
| 05/10/2007 | WO2007052090A1 Device and a method for configuring input/output pads |
| 05/10/2007 | WO2007051718A2 Structure and method for monitoring stress-induced degradation of conductive interconnects |
| 05/10/2007 | WO2005041259A3 A system-level test architecture for delivery of compressed tests |
| 05/10/2007 | US20070106965 Semiconductor integrated circuit device, method of testing the same, database for design of the same and method of designing the same |
| 05/10/2007 | US20070105339 Method of fabricating multi layer MEMS and microfluidic devices |
| 05/10/2007 | US20070105248 Method of inspecting semiconductor device |
| 05/10/2007 | US20070104357 Method for Characterizing Defects on Semiconductor Wafers |
| 05/10/2007 | US20070103284 System and apparatus for vehicle electrical power analysis |
| 05/10/2007 | US20070103184 TDDB test pattern and method for testing TDDB of MOS capacitor dielectric |
| 05/10/2007 | US20070103183 Isolation Buffers With Controlled Equal Time Delays |
| 05/10/2007 | US20070103182 Circuit Board, Electronic Device Including a Circuit Board, and Method of Manufacturing a Circuit Board |
| 05/10/2007 | US20070103181 System and method of mitigating effects of component deflection in a probe card analyzer |
| 05/10/2007 | US20070103180 Universal wafer carrier for wafer level die burn-in |
| 05/10/2007 | US20070103179 Socket base adaptable to a load board for testing ic |
| 05/10/2007 | US20070103178 Probe sheet adhesion holder, probe card, semiconductor test device, and manufacturing method of semiconductor device |
| 05/10/2007 | US20070103177 Probes of probe card and the method of making the same |
| 05/10/2007 | US20070103176 Semi-automatic multiplexing system for automated semiconductor wafer testing |
| 05/10/2007 | US20070103175 Static instrumentation macros for fast declaration free dynamic probes |
| 05/10/2007 | US20070103174 Direct current test apparatus |
| 05/10/2007 | US20070103169 Process and apparatus for evaluating the degree of vacuum in closed bodies with transparent walls |
| 05/10/2007 | US20070103168 Loop impedance meter |
| 05/10/2007 | US20070103167 Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer |
| 05/10/2007 | US20070103166 Electronic circuit |
| 05/10/2007 | US20070103165 Ground testing method and apparatus |
| 05/10/2007 | US20070103164 Voltage verification unit |
| 05/10/2007 | US20070103163 Inverter system |
| 05/10/2007 | US20070103144 Calibration pattern and calibration jig |
| 05/10/2007 | US20070103141 Duty cycle measurment circuit for measuring and maintaining balanced clock duty cycle |
| 05/10/2007 | US20070103121 Method and system for battery protection |
| 05/10/2007 | US20070103116 Method and system for battery protection employing sampling of measurements |
| 05/10/2007 | US20070102701 Structure and Method for Parallel Testing of Dies on a Semiconductor Wafer |
| 05/10/2007 | DE112005001751T5 Prüfgerät für elektronische Bauelemente und Verfahren zur Konfiguration des Prüfgerätes An electronic component tester and method for configuring the tester |
| 05/10/2007 | DE10326317B4 Testsystem zum Testen von integrierten Bausteinen Test system for testing integrated ICs |
| 05/10/2007 | DE10210264B4 Ein Testvektorkomprimierungsverfahren A test vector compression method |
| 05/10/2007 | DE102006050346A1 Einrichtung zum Detektieren des Ladungszustands einer Sekundärbatterie Means for detecting the state of charge of a secondary battery |
| 05/10/2007 | DE102006050086A1 Sendeempfänger und Anpasssystem für einen Sendeempfänger Transceiver and fitting system for a transceiver |
| 05/10/2007 | DE102006043120A1 Breitband-Ultrahochfrequenz-Teilentladungssignal-und -Mustergenerator High-ultra-high frequency partial discharge signal and -Mustergenerator |
| 05/10/2007 | DE102006035045A1 Verfahren und Vorrichtung zum Eliminieren der Indexzeit einer automatischen Testausrüstung Method and apparatus for eliminating the time index of an automatic test equipment |
| 05/10/2007 | DE102005053146A1 Messspitze zur Hochfrequenzmessung Probe for high frequency measurement |
| 05/10/2007 | DE102005052269A1 Integrierte Schaltung mit integrierter Testhilfe-Teilschaltung Integrated circuit with integrated debugger subcircuit |
| 05/10/2007 | DE102005017865B4 Wartung des Blitzschutzes einer Windenergieanlage Maintenance of lightning protection of a wind turbine |
| 05/10/2007 | DE102004057775B4 Handhabungsvorrichtung zum Zuführen von elektronischen Bauelementen, insbesondere IC's, zu einer Testvorrichtung Handling device for feeding electronic components, in particular ICs, to a test device |
| 05/10/2007 | DE10144705B4 Vorrichtung zum Einstellen der Temperatur von Halbleiterbausteinen auf Testsystemen A device for adjusting the temperature of semiconductor devices on test systems |
| 05/10/2007 | DE10003282B4 Kontaktstruktur Contact structure |
| 05/09/2007 | EP1783889A1 Device for monitoring the harmonics rate in the supply of a synchronous electric machine with permanent magnet excitation |
| 05/09/2007 | EP1783505A1 Compressed logic sample storage |
| 05/09/2007 | EP1783504A1 Semiconductor test system |
| 05/09/2007 | EP1783503A1 Tester and testing method |
| 05/09/2007 | EP1783502A1 System and method to carry out hot and/or cold tests on electronic components and relative test chamber |
| 05/09/2007 | EP1782612A1 Cable verification unit |