| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 05/17/2007 | US20070113209 Chip design verifying and chip testing apparatus and method |
| 05/17/2007 | US20070113136 Detection rate calculation method of test pattern, recording medium, and detection rate calculation apparatus of test pattern |
| 05/17/2007 | US20070113135 Modular compaction of test responses |
| 05/17/2007 | US20070113134 Test data reporting and analyzing using data array and related data analysis |
| 05/17/2007 | US20070113133 System and method for testing a serial port |
| 05/17/2007 | US20070113132 Method and device for verifying timing in a semiconductor integrated circuit |
| 05/17/2007 | US20070113131 Semiconductor integrated circuit, and designing method and testing method thereof |
| 05/17/2007 | US20070113130 Low power testing of very large circuits |
| 05/17/2007 | US20070113129 Method and Apparatus for Testing Logic Circuit Designs |
| 05/17/2007 | US20070113128 Method and apparatus for synthesis of multimode X-tolerant compressor |
| 05/17/2007 | US20070113127 Circuit design system and circuit design program |
| 05/17/2007 | US20070113126 Testing and Recovery in a Multilayer Device |
| 05/17/2007 | US20070113125 System and method for testing a serial port |
| 05/17/2007 | US20070113124 Method of testing integrated circuit and apparatus therefor |
| 05/17/2007 | US20070113123 Method and system for network-on-chip and other integrated circuit architectures |
| 05/17/2007 | US20070112539 Device for the preparation execution and evaluation of a non-destructive analysis |
| 05/17/2007 | US20070112538 Concurrent control of semiconductor parametric testing |
| 05/17/2007 | US20070112529 Method for non-distructive measurement or comparison of a laser radiation content in optical components |
| 05/17/2007 | US20070111560 Conductive-contact holder and conductive-contact unit |
| 05/17/2007 | US20070111501 Processing method for semiconductor structure |
| 05/17/2007 | US20070109485 Substrate assembly, method of testing the substrate assembly, electrooptical device, method of manufacturing the electrooptical device, and electronic equipment |
| 05/17/2007 | US20070109042 Measuring circuit for the output of a power amplifier and a power amplifier comprising the measuring circuit |
| 05/17/2007 | US20070109011 Array Test Using The Shorting Bar And High Frequency Clock Signal For The Inspection Of TFT-LCD With Integrated Driver IC |
| 05/17/2007 | US20070109010 Electronic component testing apparatus and method for electronic component testing |
| 05/17/2007 | US20070109009 Method and apparatus for die testing on wafer |
| 05/17/2007 | US20070109008 Novel test structure for speeding a stress-induced voiding test and method of using the same |
| 05/17/2007 | US20070109007 Elastic metal gate MOS transistor for surface mobility measurement in semiconductor materials |
| 05/17/2007 | US20070109006 Digital leakage detector |
| 05/17/2007 | US20070109005 Embedded test circuitry and a method for testing a semiconductor device for breakdown, wearout or failure |
| 05/17/2007 | US20070109004 Pin-type probes for contacting electronic circuits and methods for making such probes |
| 05/17/2007 | US20070109003 Test Pads, Methods and Systems for Measuring Properties of a Wafer |
| 05/17/2007 | US20070109002 System and method for testing a link control card |
| 05/17/2007 | US20070109001 System for evaluating probing networks |
| 05/17/2007 | US20070109000 Inspection device and inspection method |
| 05/17/2007 | US20070108999 Thin film probe card |
| 05/17/2007 | US20070108998 Semiconductor integrated circuit having multiple semiconductor chips with signal terminals |
| 05/17/2007 | US20070108997 Fabrication method of semiconductor integrated circuit device and probe card |
| 05/17/2007 | US20070108996 Probing apparatus and method for adjusting probing apparatus |
| 05/17/2007 | US20070108991 Diagnostic circuit and method therefor |
| 05/17/2007 | US20070108990 Arc monitoring system |
| 05/17/2007 | US20070108989 Method and apparatus for time domain reflection test of transmission line |
| 05/17/2007 | US20070108988 Electronic judging apparatus for working state of the equipment |
| 05/17/2007 | US20070108987 Current measuring apparatus, test apparatus, and coaxial cable and assembled cable for the apparatuses |
| 05/17/2007 | US20070108986 Systems and methods for performing differential measurements in an electrical system |
| 05/17/2007 | US20070108985 Apparatus and method for diagnosing failure of fuel level sensors |
| 05/17/2007 | US20070108984 Ionization test for electrical verification |
| 05/17/2007 | US20070108983 Commutator for power supply testing |
| 05/17/2007 | US20070108965 Planarity diagnostic system, e.g., for microelectronic component test systems |
| 05/17/2007 | US20070108964 Utilizing clock shield as defect monitor |
| 05/17/2007 | US20070108963 Electrical distribution system and modular high power board contactor therefor |
| 05/17/2007 | US20070108960 Fuel cell voltage measurement device |
| 05/17/2007 | US20070108942 Method and system for protection of a lithium-based multicell battery pack including a heat sink |
| 05/16/2007 | EP1786003A1 Resistive connection for a circuit of a foil-type sensor |
| 05/16/2007 | EP1785737A1 High resolution time stamps for periodic samples |
| 05/16/2007 | EP1785736A2 Defect analysis device and method for printed circuit boards |
| 05/16/2007 | EP1785735A1 Heavy object turning apparatus |
| 05/16/2007 | EP1784652A1 Methods and apparatus for transmitting group communication signals |
| 05/16/2007 | EP1678514B1 Battery sensor and method for operation of a battery sensor |
| 05/16/2007 | EP1491906B1 An integrated device with an improved BIST circuit for executing a structured test |
| 05/16/2007 | EP1085896B1 Conformationally constrained backbone cyclized somatostatin analogs |
| 05/16/2007 | EP0840134B1 A method of effecting communication using a test access port (TAP) controller |
| 05/16/2007 | CN2901334Y Comprehensive test table electric contact device for leakage breaker |
| 05/16/2007 | CN2901333Y Temperature rise and heat resistance detector of semiconductor PN junction diode device |
| 05/16/2007 | CN2901332Y Line fault detector |
| 05/16/2007 | CN2901331Y Connecting type power source leakage current detector of human body analogue impedance module |
| 05/16/2007 | CN2901330Y AC/DC withstand voltage insulation detector with high precision and high speed detecting and control circuit |
| 05/16/2007 | CN2901318Y Pressure frame moving mechanism for test instrument |
| 05/16/2007 | CN1965611A Heater power control circuit and burn-in apparatus using the same |
| 05/16/2007 | CN1965372A Methods and apparatus for interfacing between test system and memory |
| 05/16/2007 | CN1965243A Devices and methods for detecting operational failures of relays |
| 05/16/2007 | CN1965242A Test method and test device for testing an integrated circuit |
| 05/16/2007 | CN1965241A Method for diagnosing status of burn-in apparatus |
| 05/16/2007 | CN1965239A Wireless quality-of-service detection method |
| 05/16/2007 | CN1965227A Method of assessing the risk of whiskers appearing on the surface of a metallic deposit |
| 05/16/2007 | CN1964077A Capacitor and manufacturing method thereof, semiconductor device containing the capacitor |
| 05/16/2007 | CN1964020A Fabrication method of semiconductor integrated circuit device and probe card |
| 05/16/2007 | CN1963941A Non-connected induction system of disk |
| 05/16/2007 | CN1963879A System and method for detecting online of built on stilts power transmission sequence |
| 05/16/2007 | CN1963554A Method for testing security of battery |
| 05/16/2007 | CN1963553A System and method for testing battery |
| 05/16/2007 | CN1963552A Integration circuit and test method of the same |
| 05/16/2007 | CN1963551A High resolution time stamps for periodic samples |
| 05/16/2007 | CN1963550A Method and apparatus for testing integrated circuit |
| 05/16/2007 | CN1963549A Method and system for testing installation direction of polarity of capacitor automatically |
| 05/16/2007 | CN1963548A Inspection method and device for semiconductor equipment |
| 05/16/2007 | CN1963547A Method, apparatus and system for identifying type of cables and transfer cable apparatus |
| 05/16/2007 | CN1963546A Removable Helmholtz coil used for field assay |
| 05/16/2007 | CN1963531A Probe card capable of replacing electron accessory rapidly |
| 05/16/2007 | CN1963429A Clamping device of circuit board and testing apparatus using the same |
| 05/16/2007 | CN1963428A Method and system for testing flexible elements |
| 05/16/2007 | CN1963421A Testing apparatus for high temperature, superconducting, magnetic suspension and dynamic performance and testing method with the same |
| 05/16/2007 | CN1962338A Insulation-free track circuit compensation capacitor on-line active measuring device |
| 05/16/2007 | CN1316582C Method and device for measuring time on semiconductor module with semiconductor chip |
| 05/16/2007 | CN1316398C System and method for modifying a video stream based on a client or network environment |
| 05/16/2007 | CN1316258C Power supply device |
| 05/16/2007 | CN1316257C Motor winding welding and coil resistance testing method and system |
| 05/16/2007 | CN1316256C Electric network geomagnetic induction current monitoring method and apparatus |
| 05/16/2007 | CN1316255C Testing system for electronic equipment |
| 05/16/2007 | CN1316253C Inverse needle regulating harness for liftable probe card and needle regulating method |
| 05/15/2007 | US7219314 Application-specific methods for testing molectronic or nanoscale devices |