| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/23/2007 | EP1254461B1 Testable rom chip for a data memory redundant logic |
| 05/23/2007 | CN2904420Y Fault and oscillation detector in relay protector based on DSP |
| 05/23/2007 | CN2904000Y Spark detector for aircraft CD motor |
| 05/23/2007 | CN2903999Y Chip tester |
| 05/23/2007 | CN2903998Y Tester |
| 05/23/2007 | CN2903997Y 闪灯集成电路测试仪 Flash IC tester |
| 05/23/2007 | CN2903992Y Waveform generator circuit for sleeve tester |
| 05/23/2007 | CN2903991Y Tester for detecting image sensing element |
| 05/23/2007 | CN1969492A Dynamic forwarding adjacency |
| 05/23/2007 | CN1969491A System and method for preserving multicast data forwarding during control failures in a router |
| 05/23/2007 | CN1969193A Method for managing a rechargeable battery storage |
| 05/23/2007 | CN1969192A Socket cover and test interface |
| 05/23/2007 | CN1969191A System, apparatus and method for detection of electrical faults |
| 05/23/2007 | CN1968876A Chip part conveyance method, its device, appearance inspection method, and its device |
| 05/23/2007 | CN1968058A Airborne communication navigation testing station |
| 05/23/2007 | CN1968026A Semiconductor integrated circuits and test methods thereof |
| 05/23/2007 | CN1967967A A system for managing the supply of electrical energy in a motor vehicle |
| 05/23/2007 | CN1967964A Rechargeable battery pack for a power tool |
| 05/23/2007 | CN1967797A Method of adjusting the operating region of a tool component to a pre-determined element |
| 05/23/2007 | CN1967616A Transceiver and adjusting system for transceiver |
| 05/23/2007 | CN1967318A Inspecting system of flat panel display |
| 05/23/2007 | CN1967317A Inspection method and apparatus of flat display pane |
| 05/23/2007 | CN1967279A Circuit for measuring synchronized sampler of flying capacitance |
| 05/23/2007 | CN1967278A Method and system for testing parameters of synchronization electric motor |
| 05/23/2007 | CN1967277A Integrated circuit test |
| 05/23/2007 | CN1967276A Measuring method for original trigger signal of cold cathode strip lamp driving system and reduction device |
| 05/23/2007 | CN1967275A PCB Online testing and maintain system and method thereof |
| 05/23/2007 | CN1967274A Automatic test technology of ASIC device |
| 05/23/2007 | CN1967273A Method of forming a diagnostic circuit |
| 05/23/2007 | CN1967272A Tester for maintainability of electron device |
| 05/23/2007 | CN1967271A Error display system |
| 05/23/2007 | CN1967270A Method and system for testing battery impedance spectroscopy |
| 05/23/2007 | CN1967262A Bracket and its production method |
| 05/23/2007 | CN1967261A Inspection device and inspection method |
| 05/23/2007 | CN1967188A Vehicle diagnostic test and reporting method |
| 05/23/2007 | CN1317802C Extensible cell state monitoring circuit for cell managing system |
| 05/22/2007 | US7222325 Method for modifying an integrated circuit |
| 05/22/2007 | US7222316 Board design aiding apparatus, board design aiding method and board design aiding program |
| 05/22/2007 | US7222290 Method and apparatus for receiver detection on a PCI-Express bus |
| 05/22/2007 | US7222282 Embedded micro computer unit (MCU) for high-speed testing using a memory emulation module and a method of testing the same |
| 05/22/2007 | US7222280 Diagnostic process for automated test equipment |
| 05/22/2007 | US7222279 Semiconductor integrated circuit and test system for testing the same |
| 05/22/2007 | US7222278 Programmable hysteresis for boundary-scan testing |
| 05/22/2007 | US7222277 Test output compaction using response shaper |
| 05/22/2007 | US7222276 Scan test circuit including a control test mode |
| 05/22/2007 | US7222275 Test apparatus and writing control circuit |
| 05/22/2007 | US7222274 Testing and repair methodology for memories having redundancy |
| 05/22/2007 | US7222272 Semiconductor integrated circuit and testing method thereof |
| 05/22/2007 | US7222261 Automatic test equipment for design-for-test (DFT) and built-in-self-test circuitry |
| 05/22/2007 | US7222186 Content transferring technique |
| 05/22/2007 | US7222043 Electronic device environmental effect prediction |
| 05/22/2007 | US7222041 High-speed digital multiplexer |
| 05/22/2007 | US7222040 Methods and apparatus for producing an IC identification number |
| 05/22/2007 | US7222038 Detecting a defective area of an inspected apparatus |
| 05/22/2007 | US7222034 In-circuit measurement of saturation flux density Bsat, coercivity Hc, and permiability of magnetic components using a digital storage oscilloscope |
| 05/22/2007 | US7222031 Power supply for tetherless workstations |
| 05/22/2007 | US7222026 Equipment for and method of detecting faults in semiconductor integrated circuits |
| 05/22/2007 | US7221992 Defect detection using multiple sensors and parallel processing |
| 05/22/2007 | US7221991 System and method for monitoring manufacturing apparatuses |
| 05/22/2007 | US7221813 Signal acquisition probing and voltage measurement systems using an electro-optical cavity |
| 05/22/2007 | US7221657 Processing different size packet headers for a packet-based conversational service in a mobile communications system |
| 05/22/2007 | US7221655 Apparatus and method for caching counter values in network packet traffic sampling |
| 05/22/2007 | US7221653 Fast flow control methods for communication networks |
| 05/22/2007 | US7221652 System and method for tolerating data link faults in communications with a switch fabric |
| 05/22/2007 | US7221648 Rate adaptation in a wireless communication system |
| 05/22/2007 | US7221181 Directional power detection by quadrature sampling |
| 05/22/2007 | US7221180 Device and method for testing electronic components |
| 05/22/2007 | US7221179 Bendable conductive connector |
| 05/22/2007 | US7221178 Working system for circuit boards |
| 05/22/2007 | US7221177 Probe apparatus with optical length-measuring unit and probe testing method |
| 05/22/2007 | US7221176 Vacuum prober and vacuum probe method |
| 05/22/2007 | US7221175 Self-aligning docking system for electronic device testing |
| 05/22/2007 | US7221174 Probe holder for testing of a test device |
| 05/22/2007 | US7221173 Method and structures for testing a semiconductor wafer prior to performing a flip chip bumping process |
| 05/22/2007 | US7221172 Switched suspended conductor and connection |
| 05/22/2007 | US7221171 Enhanced subsurface membrane interface probe (MIP) |
| 05/22/2007 | US7221166 Fault location using measurements from two ends of a line |
| 05/22/2007 | US7221147 Method and socket assembly for testing ball grid array package in real system |
| 05/22/2007 | US7221146 Guarded tub enclosure |
| 05/22/2007 | US7221145 Simplified power monitoring system for electrical panels |
| 05/22/2007 | US7221144 Micro-electromechanical system (MEMS) based current and magnetic field sensor having improved sensitivities |
| 05/22/2007 | US7221142 Measuring devices |
| 05/22/2007 | US7221137 Apparatus with storage for measuring stray currents from subway rails and power lines |
| 05/22/2007 | US7220990 Technique for evaluating a fabrication of a die and wafer |
| 05/22/2007 | US7220989 Test apparatus for a semiconductor package |
| 05/22/2007 | US7220606 Integrated circuit identification |
| 05/22/2007 | US7220604 Method and apparatus for repairing shape, and method for manufacturing semiconductor device using those |
| 05/18/2007 | WO2007056278A2 Continuous reservoir monitoring for fluid pathways using 3d microseismic data |
| 05/18/2007 | WO2007056257A2 Semi-automatic multiplexing system for automated semiconductor wafer testing |
| 05/18/2007 | WO2007056226A2 Method for determining information about the internal workings of a chip based on electro-magnetic emissions therefrom |
| 05/18/2007 | WO2007055713A2 Pin electronics implemented system and method for reduced index time |
| 05/18/2007 | WO2007055101A1 Battery condition diagnosis apparatus |
| 05/18/2007 | WO2007055012A1 Contact unit and testing system |
| 05/18/2007 | WO2007055004A1 Electronic parts tester and method of setting best press condition of electronic parts tester contact arm |
| 05/18/2007 | WO2007053937A1 A method and an apparatus for simultaneous 2d and 3d optical inspection and acquisition of optical inspection data of an object |
| 05/18/2007 | WO2007035488A3 Arc fault detection and confirmation using voltage and current analysis |
| 05/18/2007 | WO2006055273A3 A system and method to scout for routes in a wireless network |
| 05/18/2007 | WO2006052716A3 System and method for performing receiver-assisted slot allocation in a multihop communication network |
| 05/18/2007 | WO2006030356A3 Content status provision related to volatile memories |
| 05/18/2007 | CA2625429A1 Continuous reservoir monitoring for fluid pathways using 3d microseismic data |