| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/30/2007 | CN1318853C Transition adjustment |
| 05/30/2007 | CN1318852C Device and method for guarding against a 'denial-of-service'to servers pack |
| 05/29/2007 | US7225418 Operation analyzing method for semiconductor integrated circuit device, analyzing system used in the same, and optimization design method using the same |
| 05/29/2007 | US7225379 Circuit and method for testing semiconductor device |
| 05/29/2007 | US7225378 Generating test patterns used in testing semiconductor integrated circuit |
| 05/29/2007 | US7225377 Generating test patterns used in testing semiconductor integrated circuit |
| 05/29/2007 | US7225376 Method and system for coding test pattern for scan design |
| 05/29/2007 | US7225375 Method and apparatus for detecting array degradation and logic degradation |
| 05/29/2007 | US7225374 ABIST-assisted detection of scan chain defects |
| 05/29/2007 | US7225373 Data transfer validation system |
| 05/29/2007 | US7225372 Testing board for semiconductor memory, method of testing semiconductor memory and method of manufacturing semiconductor memory |
| 05/29/2007 | US7225359 Method and apparatus for mapping signals of a device under test to logic analyzer measurement channels |
| 05/29/2007 | US7225358 Semiconductor integrated circuit device having operation test function |
| 05/29/2007 | US7225329 Enhanced CSU/DSU (channel service unit/data service unit) |
| 05/29/2007 | US7225288 Extended host controller test mode support for use with full-speed USB devices |
| 05/29/2007 | US7225064 Wireless communication for diagnostic instrument |
| 05/29/2007 | US7224828 Time resolved non-invasive diagnostics system |
| 05/29/2007 | US7224678 Wireless local or metropolitan area network with intrusion detection features and related methods |
| 05/29/2007 | US7224586 Method of maintaining an IC-module near a set-point |
| 05/29/2007 | US7224177 Apparatus and method for determining whether motor lock error occurs in sensorless motor |
| 05/29/2007 | US7224176 Semiconductor device having test element groups |
| 05/29/2007 | US7224175 Probe mark reading device and probe mark reading method |
| 05/29/2007 | US7224174 Optical alignment loops for the wafer-level testing of optical and optoelectronic chips |
| 05/29/2007 | US7224173 Electrical bias electrical test apparatus and method |
| 05/29/2007 | US7224171 Method for detecting output current of inverter and device therefor |
| 05/29/2007 | US7224170 Fault monitoring in a distributed antenna system |
| 05/29/2007 | US7224169 Methods and apparatus for non-contact testing and diagnosing of inaccessible shorted connections |
| 05/29/2007 | US7224168 Method and apparatus for automatic determination of lead-acid battery specific gravity |
| 05/29/2007 | US7224160 RF and pulse bias tee |
| 05/29/2007 | US7224142 Battery load power detecting system |
| 05/29/2007 | US7223975 Inspection apparatus for circuit pattern |
| 05/29/2007 | US7223622 Active-matrix substrate and method of fabricating same |
| 05/29/2007 | US7223616 Test structures in unused areas of semiconductor integrated circuits and methods for designing the same |
| 05/24/2007 | WO2007059315A2 Array test using the shorting bar and high frequency clock signal for the inspection of tft-lcd with integrated driver ic |
| 05/24/2007 | WO2007058037A1 Jig for inspecting substrate, and inspection probe |
| 05/24/2007 | WO2007057990A1 Electronic component test equipment and method for loading performance board on the electronic component test equipment |
| 05/24/2007 | WO2007057959A1 Device-mounted apparatus, test head, and electronic component testing apparatus |
| 05/24/2007 | WO2007057944A1 Electronic component test equipment and method for loading performance board on the electronic component test equipment |
| 05/24/2007 | WO2007057358A1 Resistive connection for a circuit of a foil-type sensor |
| 05/24/2007 | WO2007057343A1 Apparatus and method for testing the reading reliability of smart labels |
| 05/24/2007 | WO2007057179A2 Method for testing a passive infrared sensor |
| 05/24/2007 | WO2007030323A3 Detecting degradation of components during reliability-evaluation studies |
| 05/24/2007 | WO2006121501A3 Battery monitor |
| 05/24/2007 | WO2006057739A3 Interface for compressed data transfer between host system and parallel data processing system |
| 05/24/2007 | US20070118784 Self test circuit for a semiconductor intergrated circuit |
| 05/24/2007 | US20070118783 Runtime reconfiguration of reconfigurable circuits |
| 05/24/2007 | US20070118782 Removable and replaceable tap domain selection circuitry |
| 05/24/2007 | US20070118781 Organic electroluminescent display device |
| 05/24/2007 | US20070118780 Hierarchical access of test access ports in embedded core integrated circuits |
| 05/24/2007 | US20070118779 Intelligent Test System and Related Method for Testing an Electronic Product |
| 05/24/2007 | US20070118323 Method for analyzing measurement data of device under test, program, measurement data analyzing system |
| 05/24/2007 | US20070118319 System and method for testing control processes in a vehicle |
| 05/24/2007 | US20070118309 Battery monitor |
| 05/24/2007 | US20070118242 System and method for product yield prediction |
| 05/24/2007 | US20070117427 Digital electronic apparatus with suppressed radiant noise |
| 05/24/2007 | US20070117242 Providing photonic control over wafer borne semiconductor devices |
| 05/24/2007 | US20070116997 Active isolation system for fuel cell |
| 05/24/2007 | US20070115812 Sequence numbers for multiple quality of service levels |
| 05/24/2007 | US20070115024 System monitor in a programmable logic device |
| 05/24/2007 | US20070115023 Variable-structure diagnostics approach achieving optimized low-frequency data sampling for ema motoring subsystem |
| 05/24/2007 | US20070115022 Power supply having voltage blocking clamp |
| 05/24/2007 | US20070115021 Testing method for array substrate |
| 05/24/2007 | US20070115020 Functionality test method |
| 05/24/2007 | US20070115019 Method and apparatus for storing circuit calibration information |
| 05/24/2007 | US20070115018 Structure and method for monitoring stress-induced degradation of conductive interconnects |
| 05/24/2007 | US20070115017 Thin Module System and Method |
| 05/24/2007 | US20070115016 Radio frequency identification tag with embedded memory testing scheme and the method of testing the same |
| 05/24/2007 | US20070115015 Method of automatically carrying IC-chips, on a planar array of vacuum nozzles, to a variable target in a chip tester |
| 05/24/2007 | US20070115014 Incorporation of Isolation Resistor(s) into Probes using Probe Tip Spring Pins |
| 05/24/2007 | US20070115013 Chuck with integrated wafer support |
| 05/24/2007 | US20070115012 Reinforced guide panel for vertical probe card |
| 05/24/2007 | US20070115011 Probe apparatus |
| 05/24/2007 | US20070115010 Connection accessory for micro-probing |
| 05/24/2007 | US20070115005 Sensor detection apparatus and sensor |
| 05/24/2007 | US20070115004 Method and apparatus for interconnect diagnosis |
| 05/24/2007 | US20070115003 Non-destructive testing apparatus and non-destructive testing method |
| 05/24/2007 | US20070115001 System for driving a plurality of lamps and fault detecting circuit thereof |
| 05/24/2007 | US20070114971 Battery remaining capacity calculating method, battery remaining capacity calculating device, and battery remaining capacity calculating program |
| 05/24/2007 | US20070114529 Scan testing system, method and apparatus |
| 05/24/2007 | US20070113692 Fault diagnosis apparatus |
| 05/24/2007 | DE19808988B4 Target-Eingabe/Ausgabesystem zum Koppeln eines auf Hardwarelogik basierenden Emulators an ein Target-System Target input / output system for coupling a hardware-based logic emulator to a target system |
| 05/24/2007 | DE10300539B4 Schaltung und Verfahren zur Erfassung von Isolationsfehlern Circuit and method of detecting insulation faults, |
| 05/24/2007 | DE10253865B4 Verfahren zur Ermittelung von ein mehrphasiges elektrotechnisches Betriebsmittel charakterisierenden elektrischen Größen Method for determination of characterizing a multiphase electrical engineering equipment electrical quantities |
| 05/24/2007 | DE102005055341A1 Verfahren zur Erkennung von Statuszuständen/Fehlerzuständen Method for detecting status states / fault states |
| 05/24/2007 | DE102005046588A1 Vorrichtung und Verfahren zum Test und zur Diagnose digitaler Schaltungen Apparatus and method for testing and diagnosis of digital circuits |
| 05/24/2007 | DE10141025B4 Verfahren zum Testen von Wafern unter Verwendung eines Kalibrierwafers und zugehöriger Kalibriewafer A method for testing of wafers using a Kalibrierwafers and associated Kalibriewafer |
| 05/23/2007 | EP1788466A2 Method and apparatus for producing perturbation signals |
| 05/23/2007 | EP1788402A1 Internal impedance detector, internal impedance detecting method, degradation degree detector, and degradation degree detecting method |
| 05/23/2007 | EP1788401A1 Method and apparatus for testing electrical characteristics of object under test |
| 05/23/2007 | EP1788400A2 Elastic metal gate MOS transistor for surface mobility measurement in semiconductor materials |
| 05/23/2007 | EP1787472A1 Apparatus for verifying a low noise block output voltage |
| 05/23/2007 | EP1787234A2 A method and apparatus for calibrating and/or deskewing communications channels |
| 05/23/2007 | EP1787136A1 Test circuit and method for hierarchical core |
| 05/23/2007 | EP1787135A2 Traveling wave based relay protection |
| 05/23/2007 | EP1787134A1 System and method for message consolidation in a mesh network |
| 05/23/2007 | EP1787133A2 A method of designing a probe card apparatus with desired compliance characteristics |
| 05/23/2007 | EP1787132A2 Methods and apparatus for local outlier detection |
| 05/23/2007 | EP1787130A1 Interconnect assembly for a probe card |
| 05/23/2007 | EP1449083B1 Method for debugging reconfigurable architectures |
| 05/23/2007 | EP1266237B1 Method and arrangement for determination of the state of charge of a battery |