Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
06/2007
06/05/2007US7226270 Apparatus for transferring semiconductor device in handler
06/05/2007US7226021 System and method for detecting rail break or vehicle
06/05/2007US7225538 Resilient contact structures formed and then attached to a substrate
06/05/2007US7225531 Index head in semicondcutor device test handler
06/01/2007CA2560791A1 Arc fault detector
05/2007
05/31/2007WO2007062372A1 Method and apparatus for interconnect diagnosis
05/31/2007WO2007062221A2 Systems and methods for testing conductive members employing electromagnetic back scattering
05/31/2007WO2007061566A1 Enhanced multicast vlan registration
05/31/2007WO2007060098A1 Circuit arrangement and method for testing the function of a power transistor
05/31/2007WO2007059973A1 Runtime reconfiguration of reconfigurable circuits
05/31/2007WO2007059725A1 Method for determining storage battery operating conditions
05/31/2007WO2007027758A3 Functional cells for automated i/o timing characterization of an integrated circuit
05/31/2007WO2007022409A3 Aerospace light-emitting diode (led) - based lights life and operation monitor compensator
05/31/2007WO2007021732A3 Selectable jtag or trace access with data store and output
05/31/2007WO2006127389A3 Power supply output monitor
05/31/2007WO2006099498A3 Semiconductor wafer metrology apparatus and methods
05/31/2007US20070124638 Test apparatus and test method
05/31/2007US20070124637 Method and an integrated circuit for performing a test
05/31/2007US20070124636 Phase synchronization for wide area integrated circuits
05/31/2007US20070124635 Integration circuit and test method of the same
05/31/2007US20070124634 Test circuit, method and apparatus for supporting circuit design, and computer product
05/31/2007US20070124633 Scan driver and organic light emitting display device
05/31/2007US20070124632 Touch sensing apparatus
05/31/2007US20070124631 Bit field selection instruction
05/31/2007US20070124098 Heterogeneous multipath path network test system
05/31/2007US20070124093 Method for locating line-to-ground fault point of underground power cable system
05/31/2007US20070124092 Internal bias measure with onboard ADC for electronic devices
05/31/2007US20070123082 Interconnect Assemblies And Methods
05/31/2007US20070122128 Method and system for loading substrate supports into a substrate holder
05/31/2007US20070121634 System and method for distributing addresses
05/31/2007US20070121497 Accounting based on active packet time
05/31/2007US20070121495 Method and apparatus for managing flow control in PCI express transaction layer
05/31/2007US20070121489 Transaction detection in link based computing system
05/31/2007US20070121485 System and method for adjusting a pid controller in a limited rotation motor system
05/31/2007US20070120700 System and method for voice alarm in measuring a workpiece
05/31/2007US20070120573 Semiconductor switch circuit
05/31/2007US20070120571 Method for determining information about the internal workings of a chip based on electro-magnetic emissions therefrom
05/31/2007US20070120570 Trailer illumination system test device and method of use
05/31/2007US20070120569 Communication semiconductor chip, calibration method, and program
05/31/2007US20070120567 Monitoring system for high-voltage switches
05/31/2007US20070120554 Detecting method and detecting apparatus for detecting internal of rechargeable battery, rechargeable battery pack having said detecting apparatus therein, apparatus having said detecting apparatus therein, program in which said detecting method is incorporated, and medium in which said program is stored
05/31/2007US20070120534 Method of measuring intrinsic resistance of battery and apparatus of same
05/31/2007US20070120530 Abnormality monitoring apparatus in load drive circuit
05/31/2007US20070120237 Semiconductor integrated circuit
05/31/2007US20070120202 Semiconductor Integrated Circuit Device and Method of Testing the Same
05/31/2007US20070120125 Semiconductor Integrated Circuit Device and Method of Testing the Same
05/31/2007US20070119814 Apparatus and method for detecting an endpoint in a vapor phase etch
05/31/2007DE19952272B4 Verfahren und System zum Prüfen von auf eingebetteten Bausteinen basierenden integrierten Systemchip-Schaltungen Method and system for testing based on embedded devices integrated system chip circuits
05/31/2007DE112005001590T5 Verzögerungsmessverfahren Delay measurement method
05/31/2007DE102006031881A1 Verbindungszubehör für Mikrosondierung Connects equipment for micro-probing
05/31/2007DE102006007423A1 Vorrichtung und Verfahren zum Testen der Lesezuverlässigkeit von Smart Labels Apparatus and method for testing the reading reliability of smart labels
05/31/2007DE102005062148A1 Verfahren zum Ermitteln des Betriebszustands eines Akkumulators A method for determining the operating state of an accumulator
05/31/2007DE102005056930A1 Halbleiter-Bauelement-Test-Verfahren, Halbleiter-Bauelement-Testgerät, sowie zwischen ein Testgerät und ein zu testendes Halbleiter-Bauelement geschaltete Einrichtung A semiconductor device testing method, semiconductor device tester as well as connected between a test apparatus and a semiconductor device to be tested device
05/31/2007DE102005056779A1 Mobiles Telematik-Diagnosesystem für Fahrzeuge Mobile Telematics diagnostic system for vehicles
05/31/2007DE102005056279A1 Test-Vorrichtung und Verfahren zum Testen von elektronischen Bauelementen Test Apparatus and method for testing electronic components
05/31/2007DE102005055954A1 Schaltungsanordnung und Verfahren zur Funktionsüberprüfung eines Leistungstransistors Circuit arrangement and method for functional verification of a power transistor
05/31/2007DE102005055272A1 Verfahren und Vorrichtung zur Ermittlung von Leckströmen in batteriegespeisten Netzen Method and apparatus for determination of leakage current in battery powered systems
05/31/2007DE102005054544A1 Isolation error locating device for alternating voltage system, has current transformers implemented with bias by injecting bias alternating voltage into measuring circuit, where voltage in measuring circuit increases inductive resistance
05/31/2007DE102005052956B3 Arrangement for detecting and locating the positions of insulation faults in the heating rods of points heating systems, has means for applying an impulse voltage between the heating output lines and earth
05/31/2007DE102005009317B4 Verfahren und Vorrichtung zur Bestimmung einer Laserschwelle einer Laserdiode Method and apparatus for determining a lasing threshold of a laser diode
05/31/2007CA2630996A1 Systems and methods for testing conductive members employing electromagnetic back scattering
05/30/2007EP1791407A1 Method for manufacturing multilayer printed circuit board with through hole
05/30/2007EP1790990A1 Test device, configuration method, and device interface
05/30/2007EP1790989A1 Test emulator, emulation program, and semiconductor device manufacturing method
05/30/2007EP1790062A2 Arrangement in an electrical machine
05/30/2007EP1789812A2 Double sided probing structures
05/30/2007EP1553622B1 Anisotropic conductivity testconnector
05/30/2007CN2906637Y Battery power tester for electric bicycle
05/30/2007CN2906636Y Battery pack monitoring device for automatic guide car
05/30/2007CN2906635Y Silicon controlled tester for electric locomotive in mine
05/30/2007CN2906634Y Network cable tester port expander
05/30/2007CN2906633Y Socket test module
05/30/2007CN2906632Y Portable dynamic PMU performance tester
05/30/2007CN2906616Y Network-based intelligent aluminum foil TV characteristic test system
05/30/2007CN2906582Y Keystroke tester
05/30/2007CN1973423A System and method for detecting an operational fault condition in a power supply
05/30/2007CN1973251A Synchronization between low frequency and high frequency digital signals
05/30/2007CN1973210A Inspection device for circuit board and inspection method for circuit board
05/30/2007CN1973207A Sheetlike probe, its manufacturing method and its application
05/30/2007CN1973206A Dual channel source measurement unit for semiconductor device testing
05/30/2007CN1972555A Printed circuit board and inspected-unit
05/30/2007CN1972381A Electronic equipment provided with battery check device and method for controlling same
05/30/2007CN1972196A External wireless network apparatus with charging module
05/30/2007CN1971695A Electroluminescence display device and its detection method
05/30/2007CN1971302A Inverter of voltage polarity, detecting circuit and method of charge and discharge current of battery
05/30/2007CN1971301A An examining system for battery
05/30/2007CN1971300A Apparatus for measuring switch characters and apparatus for enlarging dimension of switch sampling
05/30/2007CN1971299A Input and output board testing system and method
05/30/2007CN1971298A Thyristor phase-selecting switch experiment device
05/30/2007CN1971297A Testing device of converter and its testing method
05/30/2007CN1971296A Universal testing interface device and its universal testing system
05/30/2007CN1971295A A novel method for measuring current carrier mobility of magnetic semiconductor
05/30/2007CN1971288A Thin-film probe card
05/30/2007CN1971285A Probe card capable of transmitting differential signal pairs
05/30/2007CN1971217A Multiple-degree-of-freedom motion attitude angle detection mechanism
05/30/2007CN1970331A System and method for monitoring an electrical power relay in a hybrid electric vehicle
05/30/2007CN1319238C Generator protecting monitor and its use
05/30/2007CN1319215C Moving limiting unit of electron element testing socket
05/30/2007CN1319101C Lift stop intelligent detection method and device for leakage protector
05/30/2007CN1318972C Method, system and high-speed storage for autonomous error recovery for memory devices