Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
06/2007
06/06/2007EP1793231A2 Electrical Test Apparatus for Testing an Electrical Test Piece and Corresponding Method
06/06/2007EP1792194A2 Integrated circuit yield and quality analysis methods and systems
06/06/2007EP1738522A4 Method and system for monitoring the health of wireless telecommunication networks
06/06/2007EP1574865B1 Pressing member and electronic component handling device
06/06/2007EP1537425B1 Method and apparatus for detecting wear in components of high voltage electrical equipment
06/06/2007EP1402506A4 Methods and systems for measuring display attributes of a fed
06/06/2007EP1377981B1 Method and system to optimize test cost and disable defects for scan and bist memories
06/06/2007EP1297347B1 Apparatus and method for the measurement and monitoring of electrical power generation and transmission
06/06/2007EP0920446B1 Conformationally constrained backbone cyclized somatostatin analogs
06/06/2007DE112005001645T5 Präzise Zeitmessvorrichtung und Verfahren dafür Precise timing device and method therefor
06/06/2007DE102006056611A1 Screening housing for terminal device e.g., mobile phone, has holder for inserting test object into given position
06/06/2007DE102006054735A1 Elektrische Kontakteinrichtung und elektrische Prüfvorrichtung für die Prüfung eines elektrischen Prüflings Electrical contact means and electrical test equipment for testing an electrical device under test
06/06/2007DE102006054734A1 Elektrische Prüfvorrichtung für die Prüfung eines elektrischen Prüflings sowie entsprechendes Verfahren Electrical test equipment for testing a device under test electrical and corresponding method
06/06/2007DE102005057577A1 Leistungstransistor-Schalteinrichtung und Verfahren zur Funktionsprüfung einer derartigen Leistungstransistor-Schalteinrichtung Power transistor switching device and method for functional testing of such a power transistor switching device
06/06/2007DE102005056231A1 Electrically driven vehicle part`s e.g. steering column, function controlling method for use at conveyor belt, involves determining elapsed times of ultrasonic signal that depend on momentary position of backrest and seat cushion
06/06/2007DE102005056038A1 Battery`s e.g. lead battery, state of charge determining method, involves determining state of charge by weighted combination of initial value of expert system with parameter that is obtained by current integration of electric current
06/06/2007DE10129706B4 Kontaktarm und Prüfgerät mit Kontaktarm für Elektronische Bauelemente Contact and tester with contact for Electronic Components
06/06/2007CN2909504Y Simple high-tension circuit breaker analog device
06/06/2007CN2909315Y Liquid crystal module test platform for mixed voltage system
06/06/2007CN2909282Y Testing box for safety property of power battery of electric motor car
06/06/2007CN2909281Y Lightning arrester monitor tester
06/06/2007CN2909280Y Safety property all-purpose tester
06/06/2007CN2909279Y Angle reglator and display device detector using the angle regulator
06/06/2007CN2909278Y Device for simultaneous testing multiple determinand
06/06/2007CN2909264Y Simple changing mechanism of high sensitivity application investigating device
06/06/2007CN2909209Y On-line test instrument for vehicle start system
06/06/2007CN1977440A Method and device for detecting uninterrupted power supply
06/06/2007CN1977370A Lead solder indicator and method
06/06/2007CN1977364A Method and apparatus for reducing aspect ratio dependent etching in time division multiplexed etch processes
06/06/2007CN1977344A Compliant electrical contact assembly
06/06/2007CN1977178A Improved jitter generation
06/06/2007CN1977177A Inspection device
06/06/2007CN1977176A System and method for facilitating end-to-end quality of service in message transmissions employing message queues
06/06/2007CN1976160A A large electric system vulnerable line identifying method
06/06/2007CN1976029A 半导体集成电路器件 The semiconductor integrated circuit device
06/06/2007CN1975741A System and method for product yield prediction
06/06/2007CN1975688A Transmission delay and dithering measure
06/06/2007CN1975526A Device for checking liquid crystal board and method for making LCD
06/06/2007CN1975453A Device and method for estimating the inputtable/outputtable power of a secondary battery
06/06/2007CN1975452A Electric vehicle accumulator internal resistance pulse detecting method
06/06/2007CN1975451A DC electric machine temperature rise testing method and apparatus
06/06/2007CN1975450A 集成电路测试器 IC tester
06/06/2007CN1975449A Method and an integrated circuit for performing a test
06/06/2007CN1975448A Thermoelectric power generating component performance measuring device and method thereof
06/06/2007CN1975447A Sensor substrate and check method and device using same
06/06/2007CN1975446A Silicon controlled trigger current detection prewarning circuit
06/06/2007CN1975445A System and method for pulsed signal device characterization utilizing an adaptive matched filterbank
06/06/2007CN1975444A Accumulator cell internal resistance and degradation state on-line monitoring method and system
06/06/2007CN1975440A Universal test interface between a device under test and a test head
06/06/2007CN1975439A Probe card transfer assist apparatus and inspection equipment using same
06/06/2007CN1975345A Test method of microsctructure body and micromachine
06/06/2007CN1974905A 针织机 Knitting machine
06/06/2007CN1320776C Loop diagnositc mode for ADSL modems
06/06/2007CN1320621C Delay time insertion based on event testing system
06/06/2007CN1320460C Method of testing hard disk drive
06/06/2007CN1320385C Power driven coaxial rotating rapid orientating system and method
06/06/2007CN1320369C Production of testing clamping device with connection wires and clamping device
06/06/2007CN1320368C Assembly for LSI test and method for the test
06/06/2007CN1320367C Sequence generation with high-time-precision by using general-purpose operating system in semiconductor test system
06/06/2007CN1320366C Detection method and device for live insulator in high-voltage transmission line
06/06/2007CN1320365C Method for metering transformer loss
06/05/2007US7228484 Method and apparatus for implementing redundancy enhanced differential signal interface
06/05/2007US7228479 IEEE Std. 1149.4 compatible analog BIST methodology
06/05/2007US7228478 Built-in self-test (BIST) for high performance circuits
06/05/2007US7228477 Apparatus and method for testing circuit units to be tested
06/05/2007US7228476 System and method for testing integrated circuits at operational speed using high-frequency clock converter
06/05/2007US7228475 Program, test apparatus and testing method
06/05/2007US7228474 Semiconductor device and method and apparatus for testing such a device
06/05/2007US7228473 Integrated module having a plurality of separate substrates
06/05/2007US7228472 System and method to control data capture
06/05/2007US7228471 System and method for testing a data storage device without revealing memory content
06/05/2007US7228470 Semiconductor testing circuit, semiconductor storage device, and semiconductor testing method
06/05/2007US7228464 PICA system timing measurement and calibration
06/05/2007US7228461 System, method, and user interface for acceptance testing
06/05/2007US7228457 Performing diagnostic operations upon a data processing apparatus with power down support
06/05/2007US7228440 Scan and boundary scan disable mechanism on secure device
06/05/2007US7228349 System and method for interacting with users over a communications network
06/05/2007US7228262 Semiconductor integrated circuit verification system
06/05/2007US7228105 Field test chamber arrangement
06/05/2007US7227844 Non-standard concatenation mapping for payloads
06/05/2007US7227841 Packet input thresholding for resource distribution in a network switch
06/05/2007US7227837 Fault tolerant virtual tandem switch
06/05/2007US7227785 Memory devices with page buffer having dual registers and method of using the same
06/05/2007US7227580 Knife edge tracking system and method
06/05/2007US7227374 LCD inspection apparatus
06/05/2007US7227373 On-chip substrate regulator test mode
06/05/2007US7227372 Voltage monitoring apparatus in a semiconductor probe station
06/05/2007US7227371 High performance probe system
06/05/2007US7227370 Semiconductor inspection apparatus and manufacturing method of semiconductor device
06/05/2007US7227369 Micro probe 2
06/05/2007US7227368 Testing head contact probe with an eccentric contact tip
06/05/2007US7227367 Current transformer test device and method
06/05/2007US7227365 Connector insertion apparatus for connecting a testing apparatus to a unit under test
06/05/2007US7227364 Test circuit for and method of identifying a defect in an integrated circuit
06/05/2007US7227352 Contact probe, measuring pad used for the contact probe, and method of manufacturing the contact probe
06/05/2007US7227351 Apparatus and method for performing parallel test on integrated circuit devices
06/05/2007US7227349 Method and apparatus for the digital and analog triggering of a signal analysis device
06/05/2007US7227335 Method and apparatus for diagnosing the condition of a rechargeable battery
06/05/2007US7227333 Battery, device and charger
06/05/2007US7227313 Organic electroluminescent device