| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/12/2007 | US7231565 Method for performing built-in and at-speed test in system-on-chip |
| 06/12/2007 | US7231563 Method and apparatus for high speed testing of latch based random access memory |
| 06/12/2007 | US7231562 Memory module, test system and method for testing one or a plurality of memory modules |
| 06/12/2007 | US7231561 Apparatus and method for data pattern alignment |
| 06/12/2007 | US7231560 Apparatus and method for testing motherboard having PCI express devices |
| 06/12/2007 | US7231552 Method and apparatus for independent control of devices under test connected in parallel |
| 06/12/2007 | US7231337 Using assignment decision diagrams with control nodes for sequential review during behavioral simulation |
| 06/12/2007 | US7231310 Method for evaluating semiconductor device |
| 06/12/2007 | US7231309 Method and apparatus for testing a bridge circuit |
| 06/12/2007 | US7230981 Integrated data jitter generator for the testing of high-speed serial interfaces |
| 06/12/2007 | US7230927 Non-blocking expandable call center architecture |
| 06/12/2007 | US7230917 Apparatus and technique for conveying per-channel flow control information to a forwarding engine of an intermediate network node |
| 06/12/2007 | US7230915 Upper and lower relays and network system |
| 06/12/2007 | US7230914 Method and system for synchronizing a standby route distributor in a distributed routing platform |
| 06/12/2007 | US7230812 Predictive applications for devices with thin dielectric regions |
| 06/12/2007 | US7230720 Film thickness measuring method of member to be processed using emission spectroscopy and processing method of the member using the measuring method |
| 06/12/2007 | US7230553 Parallel source/capture architecture |
| 06/12/2007 | US7230447 Fault tolerant selection of die on wafer |
| 06/12/2007 | US7230446 Semiconductor logic circuit device having pull-up/pull-down circuit for input buffer pad and wafer-probing testing method therefor |
| 06/12/2007 | US7230445 System monitor in a programmable logic device |
| 06/12/2007 | US7230444 Method for measuring characteristics of FETs |
| 06/12/2007 | US7230443 Non-contact mobile charge measurement with leakage band-bending and dipole correction |
| 06/12/2007 | US7230442 Semi-conductor component testing process and system for testing semi-conductor components |
| 06/12/2007 | US7230441 Wafer staging platform for a wafer inspection system |
| 06/12/2007 | US7230440 Curved spring structure with elongated section located under cantilevered section |
| 06/12/2007 | US7230439 Method for detecting and monitoring wafer probing process instability |
| 06/12/2007 | US7230437 Mechanically reconfigurable vertical tester interface for IC probing |
| 06/12/2007 | US7230436 Laser beam inspection equipment |
| 06/12/2007 | US7230434 Multi-layered capacitor |
| 06/12/2007 | US7230433 Connector test device |
| 06/12/2007 | US7230430 Fast microcalorimetry for electrochemical cells |
| 06/12/2007 | US7230420 Magnetoresistive element lifecycle tester with temperature control |
| 06/12/2007 | US7230417 Test system of semiconductor device having a handler remote control and method of operating the same |
| 06/12/2007 | US7230416 Inspecting apparatus for liquid crystal displays |
| 06/12/2007 | US7230412 Distinguishing network interface card from short circuit condition in power over ethernet system |
| 06/12/2007 | US7230411 Voltage sensing apparatus for medium-voltage electrical power distribution systems |
| 06/12/2007 | US7229858 Semiconductor wafer and semiconductor device manufacturing method using the same |
| 06/07/2007 | WO2007065060A2 Information protection using properties of a printed electronic circuit |
| 06/07/2007 | WO2007065012A2 Apparatus and method for adjusting an orientation of probes |
| 06/07/2007 | WO2007064824A2 Merchandise marking with programmable transponders |
| 06/07/2007 | WO2007064435A2 Method of determining a target mesa configuration of an electrostatic chuck |
| 06/07/2007 | WO2007064143A1 System, method, and article of manufacture for determining an estimated battery parameter vector |
| 06/07/2007 | WO2007064110A1 Apparatus and method of testing for battery |
| 06/07/2007 | WO2007063949A1 Mounting board capable of evaluating wiring pattern characteristics |
| 06/07/2007 | WO2007063924A1 Conversion device, conversion method, program, and recording medium |
| 06/07/2007 | WO2007063647A1 Partial discharge charge quantity measuring method and device |
| 06/07/2007 | WO2007063029A2 Nanoscale fault isolation and measurement system |
| 06/07/2007 | WO2007062943A1 Apparatus for detecting an electrical variable of a rechargeable battery and method for producing said apparatus |
| 06/07/2007 | WO2007062850A2 Docking device for coupling a handling device to a test head for electronic components |
| 06/07/2007 | WO2007062612A1 Monitoring unit for monitoring the load of an electric motor |
| 06/07/2007 | WO2007042551B1 Test head device |
| 06/07/2007 | WO2007018829B1 Measurement of current-voltage characteristic curves of solar cells and solar modules |
| 06/07/2007 | WO2007010493A3 Testable integrated circuit, system in package and test instruction set |
| 06/07/2007 | WO2007005446A3 Method and apparatus for determining stuck-at fault locations in cell chains using scan chains |
| 06/07/2007 | WO2006117779A3 Augmenting semiconductor's devices quality and reliability |
| 06/07/2007 | WO2006028857B1 Ieee std.1149.4 compatible analog bist methodology |
| 06/07/2007 | US20070130492 Testable design methodology for clock domain crossing |
| 06/07/2007 | US20070130491 Error detection of digital logic circuits using hierarchical neural networks |
| 06/07/2007 | US20070130490 Information protection using properties of a printed electronic circuit |
| 06/07/2007 | US20070130489 Systems and methods for LBIST testing using isolatable scan chains |
| 06/07/2007 | US20070130488 Semiconductor device and data storage apparatus |
| 06/07/2007 | US20070129906 Method and apparatus for maintaining an imaging device |
| 06/07/2007 | US20070128906 Needle-like member, conductive contact, and conductive contact unit |
| 06/07/2007 | US20070126720 Error display system |
| 06/07/2007 | US20070126460 Flat panel display, fabricating method thereof, fabricating apparatus thereof, picture quality controlling method thereof, picture quality controlling apparatus |
| 06/07/2007 | US20070126459 Method for testing semiconductor components using bonded electrical connections |
| 06/07/2007 | US20070126458 Methods and systems for determining one or more properties of a specimen |
| 06/07/2007 | US20070126457 Wafer holder, and heating unit and wafer prober provided with the wafer holder |
| 06/07/2007 | US20070126456 Test socket |
| 06/07/2007 | US20070126455 Semiconductor test apparatus and performance board |
| 06/07/2007 | US20070126454 Apparatus and method of detecting defective substrate |
| 06/07/2007 | US20070126453 Apparatus for testing a semiconductor device |
| 06/07/2007 | US20070126452 Apparatus and method for a wire wrapping process |
| 06/07/2007 | US20070126451 Method for testing the quality of light-permeable thin film |
| 06/07/2007 | US20070126450 Sensor differentiated fault isolation |
| 06/07/2007 | US20070126449 System and method for measuring performance of a voltage regulator module attached to a microprocessor |
| 06/07/2007 | US20070126448 System-on-a-chip pipeline tester and method |
| 06/07/2007 | US20070126447 Testing apparatus and method |
| 06/07/2007 | US20070126446 Ground-signal-ground (gsg) test structure |
| 06/07/2007 | US20070126445 Integrated circuit package testing devices and methods of making and using same |
| 06/07/2007 | US20070126444 Probe with trapezoidal contactor and device based on application thereof, and method of producing them |
| 06/07/2007 | US20070126443 Method of Manufacturing A Probe Card |
| 06/07/2007 | US20070126442 Probe chip and probe card |
| 06/07/2007 | US20070126441 Probe card transfer assist apparatus and inspection equipment using same |
| 06/07/2007 | US20070126440 Probe Card Assembly With A Mechanically Decoupled Wiring Substrate |
| 06/07/2007 | US20070126439 Methods and apparatus for creating a high speed connection between a device under test and automatic test equipment |
| 06/07/2007 | US20070126438 Probing apparatus, probing circuit board and probing system for high-voltage matrix probing |
| 06/07/2007 | US20070126437 Printed circuit board and inspected unit |
| 06/07/2007 | US20070126436 Molecular quantum memory |
| 06/07/2007 | US20070126435 Apparatus And Method For Adjusting An Orientation Of Probes |
| 06/07/2007 | US20070126432 Capacitive physical quantity sensor and method of diagnosing the same |
| 06/07/2007 | US20070126430 System and method for testing power durability of saw filter |
| 06/07/2007 | US20070126429 Semiconductor intergrated circuit device |
| 06/07/2007 | US20070126428 Anti-islanding protection systems for synchronous machine based distributed generators |
| 06/07/2007 | US20070126427 Method for measuring electromagnetic radiation pattern and gain of radiator using tem waveguide |
| 06/07/2007 | US20070126414 Jitter generation |
| 06/07/2007 | US20070126413 Communication pad mounting structure of refrigerator |
| 06/07/2007 | US20070124932 Probe with trapezoidal contactor and device based on application thereof, and method of producing them |
| 06/06/2007 | EP1793445A1 Method for determining the acid stratification of a battery |
| 06/06/2007 | EP1793235A1 Monitoring System for High-Voltage Switch Gears |