| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/14/2007 | US20070132480 Power supply noise resistance testing circuit and power supply noise resistance testing method |
| 06/14/2007 | US20070132479 Thermal stratification test apparatus and method providing cyclical and steady-state stratified environments |
| 06/14/2007 | US20070132478 Semiconductor Fuse Covering |
| 06/14/2007 | US20070132477 System and methods for test time outlier detection and correction in integrated circuit testing |
| 06/14/2007 | US20070132476 Method of forming circuit pattern on printed circuit board |
| 06/14/2007 | US20070132475 Semiconductor device test method and device |
| 06/14/2007 | US20070132474 Automated platform for electronic apparatus environmental testing & method of use |
| 06/14/2007 | US20070132473 Methods and apparatus for inline variability measurement of integrated circuit components |
| 06/14/2007 | US20070132472 Semiconductor integrated circuit and method for testing the same |
| 06/14/2007 | US20070132471 Method and apparatus for testing integrated circuits over a range of temperatures |
| 06/14/2007 | US20070132470 Temperature characteristic inspection device |
| 06/14/2007 | US20070132469 Inspection device and method |
| 06/14/2007 | US20070132468 Probe test apparatus |
| 06/14/2007 | US20070132467 Probe card for tests on photosensitive chips and corresponding illumination device |
| 06/14/2007 | US20070132466 Probe cards employing probes having retaining portions for potting in a retention arrangement |
| 06/14/2007 | US20070132465 Probe station comprising a bellows with emi shielding capabilities |
| 06/14/2007 | US20070132464 Magnetic-field-measuring probe |
| 06/14/2007 | US20070132459 State detecting method and insulation resistance detector |
| 06/14/2007 | US20070132458 Voltage indicator test mechanism |
| 06/14/2007 | US20070132457 Voltage detector and insulator interface |
| 06/14/2007 | US20070132445 Proximity sensitive defect monitor |
| 06/14/2007 | US20070132444 Fixture for circuit board |
| 06/14/2007 | US20070132443 System and method for testing integrated circuit timing margins |
| 06/14/2007 | DE202007004874U1 Kombinierte Überstrom- und Unterbrechungserkennung für Freileitungen Combined overcurrent and interrupt detection for overhead lines |
| 06/14/2007 | DE10226615B4 Teilentladungsmessvorrichtung und Verfahren zur Messung von Teilentladungen an Motorwicklungen mit einer Pulsspannung variabler Amplitude und variabler Anstiegszeit Partial-discharge measuring device and method for the measurement of partial discharges at the motor windings with a voltage of variable amplitude and variable pulse rise time |
| 06/14/2007 | DE102005059417A1 Indication message transmitting method for vehicle, involves determining battery charge condition, and transmitting message automatically from transmission device to receiving device when condition exceeds and/or falls below threshold |
| 06/14/2007 | DE102005058719A1 Autonomous capacitor testing circuit arrangement for motor vehicle, has measuring circuit measuring voltage characteristics at capacitor, and evaluation circuit testing capacitance of capacitor by evaluation of measured characteristics |
| 06/14/2007 | DE102005057508A1 Dockingvorrichtung zum Kuppeln einer Handhabungsvorrichtung mit einem Testkopf für elektronische Bauelemente Docking device for coupling a handling apparatus having a test head for electronic components |
| 06/14/2007 | DE102005057117A1 Vorrichtung zum Erfassen einer elektrischen Größe eines Akkumulators und Verfahren zur Herstellung derselbigen A device for detecting an electrical quantity of a battery and method for producing the same |
| 06/14/2007 | CA2530781A1 Electrical component monitoring system |
| 06/13/2007 | EP1796157A1 Semiconductor wafer evaluating method and semiconductor wafer evaluating apparatus |
| 06/13/2007 | EP1795909A1 Transport frame and optional fixture for battery powered electronic devices |
| 06/13/2007 | EP1795907A1 An impulsive impedance meter for electric power systems |
| 06/13/2007 | EP1794862A1 Method and system for determining the soc of a rechargeable battery |
| 06/13/2007 | EP1794607A2 Method and apparatus for remotely buffering test channels |
| 06/13/2007 | EP1794606A1 Configuring redundancy in a supervisory process control system |
| 06/13/2007 | EP1794605A1 Object-based operation and maintenance (oam) systems and related methods and computer program products |
| 06/13/2007 | EP1794539A1 Arrangement and method for monitoring the degradation of a component by using a time domain reflectometer |
| 06/13/2007 | EP1549961B1 Test head positioning apparatus |
| 06/13/2007 | EP1446675B8 Directional element to determine faults on ungrounded power systems |
| 06/13/2007 | EP0953987B1 Synchronous semiconductor storage device |
| 06/13/2007 | CN2912065Y Analogue capacity outputting device of motor protection device |
| 06/13/2007 | CN2911703Y Fault positioner for communication cable |
| 06/13/2007 | CN2911702Y Switching module for high voltage and conduction testing machine |
| 06/13/2007 | CN1981417A Power supply loading indicators and methods |
| 06/13/2007 | CN1981203A Supporting calibration and diagnostics in an open architecture test system |
| 06/13/2007 | CN1981202A Datalog support in a modular test system |
| 06/13/2007 | CN1981201A Testing a pipeline in an ic |
| 06/13/2007 | CN1981200A Method and structure to develop a test program for semiconductor integrated circuits |
| 06/13/2007 | CN1981199A QAM signal analysis in a network |
| 06/13/2007 | CN1979995A Charging equipment |
| 06/13/2007 | CN1979942A Display circuit for residual electricity quantity of secondary cell |
| 06/13/2007 | CN1979688A Memory detection clamp |
| 06/13/2007 | CN1979687A Full detecting method for inlaid flash memory of simplified base pin |
| 06/13/2007 | CN1979686A Safety detecting method for system integrated chip with built-in non-volatile memory |
| 06/13/2007 | CN1979434A Semiconductor integrated circuit and method for controlling the same |
| 06/13/2007 | CN1979208A Detection method for hard-disc state display lamp and detection system |
| 06/13/2007 | CN1979207A Battery fuel gauge circuit |
| 06/13/2007 | CN1979206A System and methods for testing or analyzing an integrated circuit |
| 06/13/2007 | CN1979205A Methods for variability measurement of integrated circuit components and integrated circuit components |
| 06/13/2007 | CN1979204A Detecting apparatus for high-pressure matrix detection, detection circuit-board and detection system |
| 06/13/2007 | CN1979203A Device for detecting charging circuit board |
| 06/13/2007 | CN1979202A Method for parallelly detecting synchronous communication chips |
| 06/13/2007 | CN1979201A Method for parallelly detecting synchronous communication chips |
| 06/13/2007 | CN1979200A Method for parallelly detecting multiple chips of synchronous communication |
| 06/13/2007 | CN1979199A Method for measuring analoge signal using digit detector |
| 06/13/2007 | CN1979198A Detecting system and method for input/output board |
| 06/13/2007 | CN1979197A Method for increasing synchronous detecting number of chips |
| 06/13/2007 | CN1979196A Detecting device and detecting system |
| 06/13/2007 | CN1979195A 故障检测方法 Fault detection method |
| 06/13/2007 | CN1979194A Electrical test apparatus for testing an electrical test piece and corresponding method |
| 06/13/2007 | CN1979193A Ageing test apparatus and ageing test plate |
| 06/13/2007 | CN1979192A Smart detection system for detecting electronic product and method therefor |
| 06/13/2007 | CN1979191A Portable multi-channel photoelectronic chip detection signal generating device and detection method |
| 06/13/2007 | CN1979190A Display telecontrolled diagnosis system and control method |
| 06/13/2007 | CN1979189A TFI liquid-crystal module lighting device and parameter arranging method |
| 06/13/2007 | CN1979188A Electronic product detecting system |
| 06/13/2007 | CN1979187A Testing device of multi-drive-mode LCD drive circuit and testing method |
| 06/13/2007 | CN1979186A Electronic product detecting method |
| 06/13/2007 | CN1979185A Novel high-pressure frequency variator low energy-consumption load testing method |
| 06/13/2007 | CN1979181A Fuel-cell single-cell voltage detecting circuit |
| 06/13/2007 | CN1979178A Vertrical probe clasp mfg. method |
| 06/13/2007 | CN1979177A Micro-hole guide with reinforcing structure |
| 06/13/2007 | CN1979176A Method for producing in batch vertical probe clasp micro-hole guide plate |
| 06/13/2007 | CN1979137A Substrate inspection device, method and device for setting inspection logic |
| 06/13/2007 | CN1321478C Battery and maintenance service system for power supply device |
| 06/13/2007 | CN1321328C Wavelet diagnostic system for initial failure of electromotor and method for diagnosing malfunction of electromotor |
| 06/13/2007 | CN1321327C Transportation mechanism, mobile probe board transportation apparatus, using same, and detector thereof |
| 06/13/2007 | CN1321326C Insulated electric resistant testing method |
| 06/13/2007 | CN1321264C Heating control method for oxygen sensor of automotive engine |
| 06/12/2007 | US7231621 Speed verification of an embedded processor in a programmable logic device |
| 06/12/2007 | US7231615 Methods and apparatus for transforming sequential logic designs into equivalent combinational logic |
| 06/12/2007 | US7231573 Delay management system |
| 06/12/2007 | US7231572 Method and circuit for parametric testing of integrated circuits with an exclusive-or logic tree |
| 06/12/2007 | US7231571 Single-pass methods for generating test patterns for sequential circuits |
| 06/12/2007 | US7231570 Method and apparatus for multi-level scan compression |
| 06/12/2007 | US7231569 Scan flip-flop circuit with reduced power consumption |
| 06/12/2007 | US7231568 System debugging device and system debugging method |
| 06/12/2007 | US7231567 Method and/or apparatus for performing static timing analysis on a chip in scan mode with multiple scan clocks |
| 06/12/2007 | US7231566 Initializing an output memory circuit of a scan cell |