| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/20/2007 | EP1797442A2 Integrated circuit with input and/or output bolton pads with integrated logic. |
| 06/20/2007 | EP1797441A1 Method and installation for analyzing an integrated circuit |
| 06/20/2007 | EP1624308B1 Probe for testing electric conduction |
| 06/20/2007 | EP1546947B1 Method and system for debugging using replicated logic |
| 06/20/2007 | EP1275277B1 Process for stacking layers that form a multilayer printed circuit |
| 06/20/2007 | CN2914341Y Multiple power supplies with self-testing function and communication interface |
| 06/20/2007 | CN2914287Y Spring plunger piston |
| 06/20/2007 | CN2914213Y Theft-proof and monitoring device of high-tension transmission line insulator arc-over pole and tower material |
| 06/20/2007 | CN2914104Y Testing device of electric motor |
| 06/20/2007 | CN2914103Y Portable testing apparatus |
| 06/20/2007 | CN2914102Y Cable fault detector for open jet plotter |
| 06/20/2007 | CN2914101Y Connection discriminating device |
| 06/20/2007 | CN2914100Y Monolithic voltage detector of fuel battery group |
| 06/20/2007 | CN2914098Y Probe equipment |
| 06/20/2007 | CN2914097Y Circuit board negative testing machine with structure of supporting glass sheet |
| 06/20/2007 | CN2914096Y Circuit board negative testing machine with pinch roller structure |
| 06/20/2007 | CN1985554A Ic插座 Ic Socket |
| 06/20/2007 | CN1985459A System and method for generating a jittered test signal |
| 06/20/2007 | CN1985410A 'Two-step contact' clamping mechanism of flexible printing circuit for magnetic-head suspending assembly |
| 06/20/2007 | CN1985183A Estimator of battery charge state |
| 06/20/2007 | CN1985182A Evaluation of output signal of device under test |
| 06/20/2007 | CN1985181A Semiconductor integrated circuit, checking device and method of checking semiconductor integrated circuit |
| 06/20/2007 | CN1985180A Device and method for inspection of circuit board |
| 06/20/2007 | CN1983990A Parallel testing method and system |
| 06/20/2007 | CN1983810A Method and device for repeated switching cell-phone |
| 06/20/2007 | CN1983760A Power supply apparatus and method for line connection type fuel cell system |
| 06/20/2007 | CN1983759A Power supply control apparatus and method for line connection type fuel cell system |
| 06/20/2007 | CN1983691A Battery discriminating method |
| 06/20/2007 | CN1983584A Semiconductor device and inspection method thereof |
| 06/20/2007 | CN1982952A Display substrate and method for testing the same |
| 06/20/2007 | CN1982912A Battery detecting system and method |
| 06/20/2007 | CN1982911A Method for designing JTAG Bridge interface sequence and its realizing device |
| 06/20/2007 | CN1982910A Method for testing EFlash serial interface based on selective bit number |
| 06/20/2007 | CN1982909A Configurations and method for carrying out wafer level unclamped inductive switching tests |
| 06/20/2007 | CN1982908A Method for real-time generating flash-storage testing vector |
| 06/20/2007 | CN1982907A Method for testing transistor life |
| 06/20/2007 | CN1982906A Structure and method for testing metal interconnecting charge transfer |
| 06/20/2007 | CN1982905A Method for inspecting electrical-property quality of surface-plated component and circuit board |
| 06/20/2007 | CN1982904A Apparatus, unit and method for testing image sensor packages |
| 06/20/2007 | CN1982903A Rear-panel testing system |
| 06/20/2007 | CN1982902A Method for analyzing BEOL testing chip on-line failure |
| 06/20/2007 | CN1982901A Structure and method for testing metal interconnecting wire charge transfer |
| 06/20/2007 | CN1982900A Grounding inspector and electrostatic spraying system |
| 06/20/2007 | CN1982896A Inspection fixture for printed wiring board |
| 06/20/2007 | CN1982893A Method for discriminating welding disc and black disc failure state |
| 06/20/2007 | CN1982857A Method, apparatus and system for automatically measuring luminescent device |
| 06/20/2007 | CN1982843A System and method for inspecting differential signal line deviation |
| 06/20/2007 | CN1322627C Device and method for valuting recharge rate of cell |
| 06/20/2007 | CN1322568C Prober and probe testing method for temperature-controlling object to be tested |
| 06/20/2007 | CN1322567C Semiconductor device contactor |
| 06/20/2007 | CN1322332C High-volage transmitting-line multiple-path high-precision GPS single-end fault positioning method and apparatus |
| 06/20/2007 | CN1322331C Single-phase grounding selection for small-current system |
| 06/20/2007 | CN1322307C Apparatus for surface inspection and method and apparatus for inspecting substrate |
| 06/20/2007 | CN1322170C Method for improvement of current efficiency in electrolysis |
| 06/20/2007 | CA2571298A1 Systems and methods for testing a wind turbine |
| 06/19/2007 | US7234099 High reliability memory module with a fault tolerant address and command bus |
| 06/19/2007 | US7234094 Automaton synchronization during system verification |
| 06/19/2007 | US7234093 Resource management during system verification |
| 06/19/2007 | US7234092 Variable clocked scan test circuitry and method |
| 06/19/2007 | US7234091 Method and apparatus for transferring hidden signals in a boundary scan test interface |
| 06/19/2007 | US7234090 Method and apparatus for selective scan chain diagnostics |
| 06/19/2007 | US7234089 Tristate buses |
| 06/19/2007 | US7234088 Method and apparatus for generating signal transitions used for testing an electronic device |
| 06/19/2007 | US7233871 Inspection window guard banding |
| 06/19/2007 | US7233576 Method and apparatus for transferring data from an ATM connection table to memory for use by an application program |
| 06/19/2007 | US7233163 Mapping variations in local temperature and local power supply voltage that are present during operation of an integrated circuit |
| 06/19/2007 | US7233162 Arrangements having IC voltage and thermal resistance designated on a per IC basis |
| 06/19/2007 | US7233161 Integrated circuit and associated packaged integrated circuit having an integrated marking apparatus |
| 06/19/2007 | US7233160 Wafer probe |
| 06/19/2007 | US7233159 Ergonomic, rotatable electronic component testing apparatus |
| 06/19/2007 | US7233157 Test board for high-frequency system level test |
| 06/19/2007 | US7233156 Capacity load type probe, and test jig using the same |
| 06/19/2007 | US7233155 Electrooptic device, electronic apparatus, and method for making the electrooptic device |
| 06/19/2007 | US7233153 Method and system for determining location of phase-to-earth fault |
| 06/19/2007 | US7233152 Short detection circuit and short detection method |
| 06/19/2007 | US7233151 Apparatus and method for diagnosing failure of fuel level sensors |
| 06/19/2007 | US7232994 Contact hole standard test device, method of forming the same, method of testing contact hole, method and apparatus for measuring a thickness of a film, and method of testing a wafer |
| 06/19/2007 | US7232695 Method and apparatus for completely covering a wafer with a passivating material |
| 06/19/2007 | US7232694 System and method for active array temperature sensing and cooling |
| 06/19/2007 | US7232328 Insert and electronic component handling apparatus provided with the same |
| 06/14/2007 | WO2007066911A1 Internal impedance measuring device of stationary battery and method thereof |
| 06/14/2007 | WO2007066656A1 Test device and adjusting method |
| 06/14/2007 | WO2007066643A1 Probe pin, probe card, and probe device |
| 06/14/2007 | WO2007066541A1 Test device and test method |
| 06/14/2007 | WO2007066396A1 Semiconductor device and method of analyzing failures |
| 06/14/2007 | WO2007022540A3 Embedded wireless benchmarking systems and methods |
| 06/14/2007 | WO2007009852A3 Method and circuit for determining the presence of a false connection between an electronic appliance, especially a household appliance, and a network alternating voltage source |
| 06/14/2007 | WO2006075122A8 Latch circuit including a data retention latch |
| 06/14/2007 | WO2005081828A3 System, method, and apparatus for connectivity testing |
| 06/14/2007 | US20070136634 Reception apparatus and reception method |
| 06/14/2007 | US20070136632 General-purpose procedure input circuit |
| 06/14/2007 | US20070136631 Method and system for testing backplanes utilizing a boundary scan protocol |
| 06/14/2007 | US20070136630 Semiconductor test system and method |
| 06/14/2007 | US20070136629 Method for testing semiconductor integrated circuit and method for verifying design rules |
| 06/14/2007 | US20070136023 Method of using automated test equipment to screen for leakage inducing defects after calibration to intrinsic leakage |
| 06/14/2007 | US20070134824 Probe card and method for manufacturing probe card |
| 06/14/2007 | US20070133775 Method for reducing the cost of handling incoming/outgoing phone calls |
| 06/14/2007 | US20070133254 Test mode control device using nonvolatile ferroelectric memory |
| 06/14/2007 | US20070133253 Test mode control device using nonvolatile ferroelectric memory |
| 06/14/2007 | US20070132525 Method and device for testing a phase locked loop |