| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/26/2007 | US7237167 Testing apparatus |
| 06/26/2007 | US7237166 System and method for evaluating a multiprocessor system using a random bus traffic generation technique |
| 06/26/2007 | US7237165 Method for testing embedded DRAM arrays |
| 06/26/2007 | US7237164 Area optimized edge-triggered flip-flop for high-speed memory dominated design |
| 06/26/2007 | US7237163 Leakage current reduction system and method |
| 06/26/2007 | US7237162 Deterministic BIST architecture tolerant of uncertain scan chain outputs |
| 06/26/2007 | US7237161 Remote integrated circuit testing method and apparatus |
| 06/26/2007 | US7237160 Semiconductor test management system and method |
| 06/26/2007 | US7237159 Test apparatus for testing an electronic device |
| 06/26/2007 | US7237158 Intelligent binning for electrically repairable semiconductor chips |
| 06/26/2007 | US7236965 Method and apparatus for case-based learning |
| 06/26/2007 | US7236918 Method and system for selective compilation of instrumentation entities into a simulation model of a digital design |
| 06/26/2007 | US7236903 Test apparatus and control method |
| 06/26/2007 | US7236867 Short-circuit detecting circuit device |
| 06/26/2007 | US7236624 Mark for visual inspection upon assembling a display |
| 06/26/2007 | US7236456 Using shadow Mcast/Bcast/Dlf counter and free pointer counter to balance unicast and Mcast/Bcast/Dlf frame ratio |
| 06/26/2007 | US7236454 Loop diagnosis system and method for disk array apparatuses |
| 06/26/2007 | US7236453 High available method for border gateway protocol version 4 |
| 06/26/2007 | US7236338 System and method for remotely detecting and locating faults in a power system |
| 06/26/2007 | US7235999 System monitor in a programmable logic device |
| 06/26/2007 | US7235998 System and method for measuring time dependent dielectric breakdown with a ring oscillator |
| 06/26/2007 | US7235997 CMOS leakage current meter |
| 06/26/2007 | US7235996 Functionality test method |
| 06/26/2007 | US7235995 Test apparatus and testing method |
| 06/26/2007 | US7235994 Defect monitor for semiconductor manufacturing capable of performing analog resistance measurements |
| 06/26/2007 | US7235993 High speed electromechanically driven test ahead |
| 06/26/2007 | US7235992 Semiconductor facility |
| 06/26/2007 | US7235991 Insert having independently movable latch mechanism for semiconductor package |
| 06/26/2007 | US7235990 Probe station comprising a bellows with EMI shielding capabilities |
| 06/26/2007 | US7235989 Electrical test device having isolation slot |
| 06/26/2007 | US7235988 Method for generating high-contrast images of semiconductor sites via one-photon optical beam-induced current imaging and confocal reflectance microscopy |
| 06/26/2007 | US7235984 Probe device and probe method |
| 06/26/2007 | US7235980 Cable detection apparatus and method |
| 06/26/2007 | US7235979 Apparatus and method for measuring loop insertion loss single-endedly |
| 06/26/2007 | US7235978 Device for measuring impedance of electronic component |
| 06/26/2007 | US7235977 Handheld tester for starting/charging systems |
| 06/26/2007 | US7235964 Test head positioning system and method |
| 06/26/2007 | US7235962 Inductor-based current sensing |
| 06/26/2007 | US7235949 Battery capacity detection apparatus and detection method |
| 06/26/2007 | US7235800 Electrical probing of SOI circuits |
| 06/26/2007 | US7235414 Using scatterometry to verify contact hole opening during tapered bilayer etch |
| 06/26/2007 | US7235413 Fabrication method of semiconductor integrated circuit device |
| 06/26/2007 | US7235326 Method and device for judging the condition of secondary batteries and method for regenerating secondary batteries |
| 06/26/2007 | US7234225 Method for manufacturing medical device having embedded traces and formed electrodes |
| 06/26/2007 | CA2370279C Modulator mis-wire test |
| 06/26/2007 | CA2297835C Fault-tolerant battery system employing intra-battery network architecture |
| 06/26/2007 | CA2235021C A method and apparatus for monitoring gas(es) in a dielectric fluid |
| 06/26/2007 | CA2207239C Apparatus for envelope detection of low current arcs |
| 06/26/2007 | CA2127306C Ground fault circuit interrupter incorporating miswiring prevention circuitry |
| 06/21/2007 | WO2007070453A2 Determination of ir-free voltage in hybrid vehicle applications |
| 06/21/2007 | WO2007069648A1 Testing apparatus and pin electronics card |
| 06/21/2007 | WO2007069647A1 Testing apparatus and pin electronics card |
| 06/21/2007 | WO2007069646A1 Testing apparatus and pin electronics card |
| 06/21/2007 | WO2007069595A1 Battery state judging method, and battery state judging device |
| 06/21/2007 | WO2007069098A1 Integrated circuit test method and test apparatus |
| 06/21/2007 | WO2007069097A1 Ic testing methods and apparatus |
| 06/21/2007 | WO2007038033A3 Method and apparatus for late timing transition detection |
| 06/21/2007 | WO2007036555A3 Switching device comprising a temperature detection unit |
| 06/21/2007 | WO2007008790A3 Probe card assembly with an interchangeable probe insert |
| 06/21/2007 | WO2007002297A3 Temporary planar electrical contact device and method using vertically-compressible nanotube contact structures |
| 06/21/2007 | US20070143653 Reduced pin count scan chain implementation |
| 06/21/2007 | US20070143652 Test circuit for semiconductor integrated circuit |
| 06/21/2007 | US20070143651 Systems and methods for providing output data in an LBIST system having a limited number of output ports |
| 06/21/2007 | US20070143643 Testing radio frequency and analogue circuits |
| 06/21/2007 | US20070143058 System and method for testing an input/output functional board |
| 06/21/2007 | US20070143043 System for wireless communications among plural electrical distribution devices of an electrical distribution enclosure |
| 06/21/2007 | US20070141734 Optical method for measuring thin film growth |
| 06/21/2007 | US20070141731 Semiconductor memory with redundant replacement for elements posing future operability concern |
| 06/21/2007 | US20070140114 Method and apparatus for multi-path load balancing using multiple metrics |
| 06/21/2007 | US20070140111 Method and system for preventing data packet loss in a redundant PDSN environment |
| 06/21/2007 | US20070139069 Method and apparatus for testing a liquid crystal cell |
| 06/21/2007 | US20070139068 Wafer-level flipchip package with IC circuit isolation |
| 06/21/2007 | US20070139067 Device for testing thin elements |
| 06/21/2007 | US20070139066 Integrated current sensor package |
| 06/21/2007 | US20070139065 Testing high frequency signals on a trace |
| 06/21/2007 | US20070139064 Method for determining temperature profile in semiconductor manufacturing test |
| 06/21/2007 | US20070139063 Apparatus and method for impedance matching in a backplane signal channel |
| 06/21/2007 | US20070139062 Test probe for semiconductor package |
| 06/21/2007 | US20070139061 Probing apparatus with guarded signal traces |
| 06/21/2007 | US20070139060 Method and system for compensating thermally induced motion of probe cards |
| 06/21/2007 | US20070139059 Optical measuring system for detecting geometric data of surfaces |
| 06/21/2007 | US20070139057 System and method for radio frequency identification tag direct connection test |
| 06/21/2007 | US20070139055 Electric Circuit Tracing System |
| 06/21/2007 | US20070139054 Stimulation-response measurement system and method using a chaotic lock-in amplifier |
| 06/21/2007 | US20070139053 Method and apparatus for testing magnetic head with TMR element |
| 06/21/2007 | US20070139052 Slant detection device |
| 06/21/2007 | US20070139051 Circuit arrangement comprising a multi-wire line for supplying current and emitting signals |
| 06/21/2007 | US20070139047 Method of controlling the operation of a solenoid |
| 06/21/2007 | US20070139034 Semiconductor Device and Testing Method Thereof, and Resistance Measurement Apparatus |
| 06/21/2007 | DE19811895B4 Verfahren zum Bestimmen verschiedenartiger Fehler eines digitalen Sendermodulators A method for determining different types of errors a digital transmitter modulator |
| 06/21/2007 | DE112005001769T5 Oszillatorschaltung und Prüfvorrichtung Oscillator circuit and Tester |
| 06/21/2007 | DE112005001762T5 Jittereinfügungsschaltung und Prüfvorrichtung Jittereinfügungsschaltung and Tester |
| 06/21/2007 | DE102005061018A1 Connection testing device and method for loudspeakers in audio system as in a motor vehicle and data carrier has test signal generator with condition monitor and correlation of actual and ideal values |
| 06/21/2007 | DE102005060324A1 Erfassung des Verschleißes einer Motoransteuerung Wear detection of a motor drive |
| 06/21/2007 | DE10149189B4 Handler für einen Vorrichtungstester und Verfahren zu dessen Betrieb Handler Tester for a device and method for its operation |
| 06/20/2007 | EP1798839A2 Battery management system and method |
| 06/20/2007 | EP1798838A2 Low pass filter |
| 06/20/2007 | EP1798115A1 Method of determining charging capacitance of capacitor |
| 06/20/2007 | EP1797619A2 Contact for electronic devices |
| 06/20/2007 | EP1797443A2 Charging method and circuit using indirect current sensing |