Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
06/2007
06/28/2007US20070150781 Apparatus with programmable scan chains for multiple chip modules and method for programming the same
06/28/2007US20070150780 Semiconductor integrated circuit and method for controlling the same
06/28/2007US20070148796 ZQ calibration circuit and semiconductor device
06/28/2007US20070148794 Method for designing a semiconductor device capable of reflecting a time delay effect for dummy metal fill
06/28/2007US20070148791 Method of measuring film thickness and method of manufacturing semiconductor device
06/28/2007US20070147676 Substrate inspection device
06/28/2007US20070147278 System and method for retransmission of data
06/28/2007US20070147146 Semiconductor memory
06/28/2007US20070146697 Apparatus and method for testing defects
06/28/2007US20070146696 Apparatus and method for testing defects
06/28/2007US20070146524 Signal reading apparatus and test apparatus
06/28/2007US20070146183 High-speed digital multiplexer
06/28/2007US20070146049 Semiconductor integrated circuit device
06/28/2007US20070146003 Display apparatus and method of inspecting the same
06/28/2007US20070146002 Display device and pixel testing method thereof
06/28/2007US20070146001 On-chip substrate regulator test mode
06/28/2007US20070146000 Semiconductor test apparatus
06/28/2007US20070145999 Semiconductor Device Testing
06/28/2007US20070145998 Method and apparatus for characterizing features formed on a substrate
06/28/2007US20070145997 Wafer Scale Testing Using a 2 Signal JTAG Interface
06/28/2007US20070145996 Circuit board damping assembly
06/28/2007US20070145995 Optic probe for semiconductor characterization
06/28/2007US20070145994 Socket and test apparatus
06/28/2007US20070145993 Chip burning system
06/28/2007US20070145992 Semiconductor device testing system and semiconductor device testing method
06/28/2007US20070145991 Inspection unit
06/28/2007US20070145990 Inspection unit
06/28/2007US20070145989 Probe card with improved transient power delivery
06/28/2007US20070145988 Probe card assembly
06/28/2007US20070145983 Method and system for device characterization with array and decoder
06/28/2007US20070145982 System and method for detecting rail break or vehicle
06/28/2007US20070145981 Semiconductor leakage current detector and leakage current measurement method, semiconductor leakage current detector with voltage trimming function and reference voltage trimming method, and semiconductor intergrated circuit thereof
06/28/2007US20070145885 Organic el panel
06/28/2007US20070145363 Testing memory integrated circuits
06/28/2007DE202006002916U1 Vorrichtung zur Überprüfung einer elektrotechnischen Platine mit einer Leiterbahn An apparatus for checking an electrical printed circuit board with a conductor path
06/28/2007DE112005001161T5 Oszillationserfassungsvorrichtung und Prüfvorrichtung Oszillationserfassungsvorrichtung and Tester
06/28/2007DE10045568B4 Ereignisgestütztes Halbleiterprüfsystem Event-assisted semiconductor test system
06/27/2007EP1801970A1 Pulse generator, timing generator, and pulse width adjusting method
06/27/2007EP1801947A2 Method for compensating state of charge of battery and battery management system using the same
06/27/2007EP1801606A2 Method for compensating state of charge of battery, battery management system using the method, and hybrid vehicle having the battery management system
06/27/2007EP1801605A1 Method of adjusting soc for battery and battery management system using the same
06/27/2007EP1801604A2 Method for compensating state of charge of battery and battery management system using the same
06/27/2007EP1801603A1 Test simulator, test simulation program and recording medium
06/27/2007EP1801602A1 Device and process for positionning electronic microchips to be electrically tested
06/27/2007EP1801414A2 System and methods for testing a wind turbine
06/27/2007EP1800393A2 Automotive electrical system configuration using a two bus structure
06/27/2007EP1800143A1 Method for reconstruction of an electrical signal
06/27/2007EP1800142A2 Method and apparatus for determining concentration of defects and/or impurities in a semiconductor wafer
06/27/2007EP1352223A4 Testing apparatus with environmentally-controlled vibrator compartment
06/27/2007EP1274991B1 Current measuring apparatus for battery
06/27/2007EP1085332B1 Semiconductor integrated circuit, liquid crystal apparatus, electronic apparatus and method for adjusting semiconductor integrated circuit
06/27/2007CN2916925Y Contact device for testing electronic component
06/27/2007CN2916651Y 电池测试仪 Battery Tester
06/27/2007CN2916650Y Saline water cylinder for vessel generator test
06/27/2007CN2916649Y Saline water cylinders for vessel generator test
06/27/2007CN2916648Y Portable DC circuit breaker characteristic testing device
06/27/2007CN2916647Y High voltage switch insulation measuring apparatus
06/27/2007CN2916646Y System response test-based dynamic characteristic testing device for contact network
06/27/2007CN2916645Y Support base for image sensor test
06/27/2007CN1989738A Propagation of minimum guaranteed scheduling rates
06/27/2007CN1989503A Method for optimizing high frequency performance of via structures
06/27/2007CN1989417A Method and structure to develop a test program for semiconductor integrated circuits
06/27/2007CN1989416A Electronic component testing apparatus and method for configuring electronic component testing apparatus
06/27/2007CN1989415A Electronic component testing apparatus
06/27/2007CN1989414A Failsafe for differential circuit based on current sense scheme
06/27/2007CN1988770A Substrate inspection method, printed-wiring board, and electronic circuit device
06/27/2007CN1988371A Method of estimating load inertia for a motor
06/27/2007CN1988352A Three phase voltage symmetric output converter
06/27/2007CN1988315A Battery device
06/27/2007CN1988243A Battery having capacitance return function
06/27/2007CN1988242A Method for compensating state of charge of battery, battery management system and hybrid vehicle
06/27/2007CN1988170A Electroluminescent display device and method for detecting failure of the same
06/27/2007CN1988043A Method for detecting electronic magnetic disc
06/27/2007CN1987559A Method and apparatus for testing a liquid crystal cell
06/27/2007CN1987526A Real time lightning strike positioning system and positioning method
06/27/2007CN1987509A Power detecting system and method
06/27/2007CN1987508A Predicting method for lithiumion cell heat safety performance
06/27/2007CN1987507A Computer executable battery life time early warning method
06/27/2007CN1987506A System and its method for detecting master plate lithium cell electricity
06/27/2007CN1987505A Multiple cell electricity automatic studying system and its method
06/27/2007CN1987504A Semiconductor integrated circuit and designing method thereof
06/27/2007CN1987503A Computer module detecting method and detecting system
06/27/2007CN1987502A Detector
06/27/2007CN1987501A Method and system for device simulation using array and decoder
06/27/2007CN1987500A On-line monitoring system method for overhead line by potential method
06/27/2007CN1987499A Signal producing circuit for detecting earthing state
06/27/2007CN1987498A Method and device for lack of zero detection for three phase circuit
06/27/2007CN1987497A Error correction assistance system
06/27/2007CN1987496A Device for controlling power earthing/under voltage warning and its control method
06/27/2007CN1987495A Method for detecting resetting chip for air conditioner
06/27/2007CN1987494A Insulation impedance detecting method
06/27/2007CN1987493A Cable identifying method and cable identifying instrument
06/27/2007CN1987491A Electric power monitor for single phase AC electric device inspection and repair
06/27/2007CN1987437A X-ray detecting method for printed circuit board defect
06/27/2007CN1987396A Detecting method for composite air conditioner error connection line and distributing tube temperature sensor imperfect
06/27/2007CN1323436C Semiconductor device and manufacturing method thereof
06/27/2007CN1323299C Monitoring circuit for battery charge/discharge and monitoring method thereof
06/27/2007CN1323298C Chip core parallel packing circuit and method for system level chip test
06/26/2007US7237169 Cross-monitoring sensor system and method
06/26/2007US7237168 Design for test of analog module systems
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