| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/04/2007 | CN2919271Y Failure warning device of battery detecting device |
| 07/04/2007 | CN2919270Y Device for detecting squirrel-cage asynchronous electric motor broken bar and thin bar |
| 07/04/2007 | CN2919269Y Power line complete isolating voltage sensor |
| 07/04/2007 | CN2919268Y Device for detecting sequence of power supply line assembling fire and zero lines |
| 07/04/2007 | CN2919267Y Programmable random waveform combination circuit of direct current electronic loading device |
| 07/04/2007 | CN2919266Y Direct current electronic loading device |
| 07/04/2007 | CN2919265Y Veneer upper and lower electricity controlling device |
| 07/04/2007 | CN1993888A Method and device for the connection of inputs for microcontrollers and corresponding microcontroller |
| 07/04/2007 | CN1993626A Testing of a circuit that has an asynchronous timing circuit |
| 07/04/2007 | CN1993625A Scan-testable logic circuit |
| 07/04/2007 | CN1993624A Substrate inspection apparatus |
| 07/04/2007 | CN1992423A Electronic installation for maintaining the present status display and method thereof |
| 07/04/2007 | CN1992401A Method of selecting non-humidification operating condition for proton exchange membrane fuel cell |
| 07/04/2007 | CN1992269A 半导体集成电路设备 The semiconductor integrated circuit device |
| 07/04/2007 | CN1992087A Parts testing device and method and interface apparatus thereof |
| 07/04/2007 | CN1991949A Light emitting device |
| 07/04/2007 | CN1991940A Thin film transistor inspection system and method using the same |
| 07/04/2007 | CN1991939A Automatic laser auxiliary positioning system and method used for display device production line |
| 07/04/2007 | CN1991401A Hot environment simulator |
| 07/04/2007 | CN1991400A Dynamometer machine monitoring system having control and data acquisition function |
| 07/04/2007 | CN1991399A 连接器测试装置 A connector testing device |
| 07/04/2007 | CN1991398A Semiconductor testing device and semiconductor testing method |
| 07/04/2007 | CN1991397A Electronic equipment sensibility testing arrangement |
| 07/04/2007 | CN1991343A Method for inspecting patterns |
| 07/04/2007 | CN1991340A 检测系统 Detection System |
| 07/04/2007 | CN1991331A Transmission line anti-fatigue testing system |
| 07/04/2007 | CN1991326A System and methods for testing a wind turbine |
| 07/04/2007 | CN1991322A Motor test bench for submersible pump |
| 07/04/2007 | CN1990255A Printing material container, and board mounted on printing material container |
| 07/04/2007 | CN1989871A Cleaning member and probe device |
| 07/04/2007 | CN1324707C Semiconductor integrated circuits |
| 07/04/2007 | CN1324553C Method for checking LCD device |
| 07/04/2007 | CN1324383C Liquid crystal plate |
| 07/04/2007 | CN1324324C Photoelectric characteristic measuring method and apparatus for organic light emitting diodes |
| 07/04/2007 | CN1324323C Accurately positioning method and device for underground layered power cable defect position |
| 07/04/2007 | CN1324322C Method for quick detecting multiple strand different cable |
| 07/04/2007 | CN1324321C Method for testing flexible circuit board connection qualification and flexible circuit board with testing pad |
| 07/03/2007 | US7240304 Method for voltage drop analysis in integreted circuits |
| 07/03/2007 | US7240269 Timing generator and semiconductor testing device |
| 07/03/2007 | US7240267 System and method for conducting BIST operations |
| 07/03/2007 | US7240266 Clock control circuit for test that facilitates an at speed structural test |
| 07/03/2007 | US7240265 Apparatus for use in detecting circuit faults during boundary scan testing |
| 07/03/2007 | US7240264 Scan test expansion module |
| 07/03/2007 | US7240263 Apparatus for performing stuck fault testings within an integrated circuit |
| 07/03/2007 | US7240262 Scan-path circuit, logic circuit including the same, and method for testing integrated circuit |
| 07/03/2007 | US7240261 Scan chain diagnostics using logic paths |
| 07/03/2007 | US7240260 Stimulus generation |
| 07/03/2007 | US7240259 Pin coupler for an integrated circuit tester |
| 07/03/2007 | US7240258 Parallel test system and method |
| 07/03/2007 | US7240257 Memory test circuit and test system |
| 07/03/2007 | US7240256 Semiconductor memory test apparatus and method for address generation for defect analysis |
| 07/03/2007 | US7240253 Semiconductor storage device |
| 07/03/2007 | US7240252 Pulse interference testing in a CDMA communication system |
| 07/03/2007 | US7240231 System and method for synchronizing multiple instrumentation devices |
| 07/03/2007 | US7240134 Circuit with processing prevention unit |
| 07/03/2007 | US7240041 Network message processing using inverse pattern matching |
| 07/03/2007 | US7239978 Compactor independent fault diagnosis |
| 07/03/2007 | US7239973 Method and test adapter for testing an appliance having a smart card reader |
| 07/03/2007 | US7239968 Method and apparatus for predicting fan failure |
| 07/03/2007 | US7239849 Adaptive communication methods and apparatus |
| 07/03/2007 | US7239735 Pattern inspection method and pattern inspection device |
| 07/03/2007 | US7239680 Methods for performing channel diagnostics |
| 07/03/2007 | US7239564 Semiconductor device for rectifying memory defects |
| 07/03/2007 | US7239168 Current sensing in a two-phase motor |
| 07/03/2007 | US7239167 Utilizing clock shield as defect monitor |
| 07/03/2007 | US7239166 Portable multi-purpose toolkit for testing computing device hardware and software |
| 07/03/2007 | US7239165 Pulse transport apparatus, systems, and methods |
| 07/03/2007 | US7239164 Stack type semiconductor apparatus package and manufacturing method thereof |
| 07/03/2007 | US7239163 Die-level process monitor and method |
| 07/03/2007 | US7239162 Device for measurement and analysis of electrical signals of an integrated circuit component |
| 07/03/2007 | US7239161 Gantry-type XY stage |
| 07/03/2007 | US7239160 Method of electrical testing of an integrated circuit with an electrical probe |
| 07/03/2007 | US7239159 Method and apparatus for verifying planarity in a probing system |
| 07/03/2007 | US7239158 Holder for conductive contact |
| 07/03/2007 | US7239157 Optical trigger for PICA technique |
| 07/03/2007 | US7239152 Methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer |
| 07/03/2007 | US7239149 Search coil mount for facilitating inspection of a generator rotor in situ |
| 07/03/2007 | US7239147 Method and device for inspecting secondary battery precursor and method for manufacturing secondary battery using the inspection method |
| 07/03/2007 | US7239146 Indicator of remaining energy in storage cell of implantable medical device |
| 07/03/2007 | US7239128 Liquid crystal module inspecting apparatus and liquid crystal module |
| 07/03/2007 | US7239127 Apparatus and method for inspecting electronic circuits |
| 07/03/2007 | US7239126 System bench wireless mapping board |
| 07/03/2007 | US7239125 Method and apparatus for electronic meter testing |
| 07/03/2007 | US7238962 Semiconductor chip with test pads and tape carrier package using the same |
| 07/03/2007 | US7238958 Fault position identification system for a semiconductor device and method of identifying a fault position of a semiconductor device |
| 07/03/2007 | US7237718 Test system |
| 07/03/2007 | CA2441463C Safety electrical outlet with logic control circuit |
| 06/28/2007 | WO2007072988A1 Secondary cell degradation judging device and degradation judging method |
| 06/28/2007 | WO2007072789A1 Anistropic conductive connector, conversion adapter for inspection device having the anisotropic conductive connector, and method for manufacturing the anistropic conductive connector |
| 06/28/2007 | WO2007072738A1 Testing apparatus, adjusting apparatus, adjusting method and adjusting program |
| 06/28/2007 | WO2007071807A1 Testing adapter |
| 06/28/2007 | WO2007071519A1 Measurement arrangement for determining the characteristic line parameters by measuring scattering parameters |
| 06/28/2007 | WO2007051718A3 Structure and method for monitoring stress-induced degradation of conductive interconnects |
| 06/28/2007 | WO2007024298A3 Method, apparatus, and system for improving ethernet ring convergence time |
| 06/28/2007 | WO2007019072A3 Vertical probe card and air cooled probe head system |
| 06/28/2007 | WO2006107444A3 Method of monitoring a power distribution unit |
| 06/28/2007 | WO2006092632A3 Detecting partial discharge in high voltage cables |
| 06/28/2007 | WO2005086722A3 Optical current sensor with flux concentrator and method of attachment for non-circular conductors |
| 06/28/2007 | US20070150783 Methods and apparatus to abstract events in software applications or services |
| 06/28/2007 | US20070150782 Method and apparatus for affecting a portion of an integrated circuit |