Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
07/2007
07/10/2007US7243281 Serial burn-in monitor
07/10/2007US7243280 Semiconductor circuit apparatus and test method thereof
07/10/2007US7243279 Method for separating shift and scan paths on scan-only, single port LSSD latches
07/10/2007US7243278 Integrated circuit tester with software-scaleable channels
07/10/2007US7243273 Memory testing device and method
07/10/2007US7243272 Testing of integrated circuit receivers
07/10/2007US7243087 Method and apparatus for solving bit-slice operators
07/10/2007US7243043 Method of testing hard disk drive and computer readable medium therefor
07/10/2007US7243038 Method and apparatus for testing circuit boards
07/10/2007US7242670 Method for controlling retransmission of information using state variables in radio communication system
07/10/2007US7242668 Network monitoring system responsive to changes in packet arrival variance and mean
07/10/2007US7242664 Hybrid protection using mesh restoration and 1:1 protection
07/10/2007US7242291 Arc fault circuit interrupter test circuit and test board
07/10/2007US7242212 Liquid crystal display panel test apparatus
07/10/2007US7242211 Hierarchical link instruction register core/embedded core wrapper enable signals
07/10/2007US7242210 Method and apparatus for circuit board inspection capable of monitoring inspection signals by using a signal monitor incorporated in the apparatus
07/10/2007US7242209 System and method for testing integrated circuits
07/10/2007US7242208 System and method for testing one or more dies on a semiconductor wafer
07/10/2007US7242207 Handler for testing semiconductor device
07/10/2007US7242206 Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method
07/10/2007US7242205 System and method for reducing heat dissipation during burn-in
07/10/2007US7242204 Substrate aligning system
07/10/2007US7242203 Probe retention kit, and system and method for probing a pattern of points on a printed circuit board
07/10/2007US7242200 System for measuring FET characteristics
07/10/2007US7242198 Method for using internal semiconductor junctions to aid in non-contact testing
07/10/2007US7242197 Current measuring apparatus, test apparatus, and coaxial cable and assembled cable for the apparatuses
07/10/2007US7242196 Power supply controller apparatus for detecting welding of contactors
07/10/2007US7242195 Integral spark detector in fitting which supports igniter in gas turbine engine
07/10/2007US7242179 Digital circuit for frequency and timing characterization
07/10/2007US7242178 Digital cable toning apparatus and method
07/10/2007US7242176 Systems and methods for evaluating electromagnetic interference
07/10/2007US7241689 Microprobe tips and methods for making
07/10/2007US7241636 Method and apparatus for providing structural support for interconnect pad while allowing signal conductance
07/10/2007US7240432 Method of manufacturing a semiconductor device testing contactor having a circuit-side contact piece and test-board-side contact piece
07/05/2007WO2007074765A1 Probe card
07/05/2007WO2007074614A1 Charged state estimation device and charged state estimation method of secondary battery
07/05/2007WO2007074509A1 Tcp handler and method of aligning connector in tcp handler
07/05/2007WO2007073686A1 A device for detecting the fault of the cable
07/05/2007WO2007073605A1 Fluid fuel cartridge with an integrated content module
07/05/2007WO2007059411A3 Locally in-order strobing
07/05/2007WO2007057179A3 Method for testing a passive infrared sensor
07/05/2007WO2007033119A3 System for sequentially measuring the output of a plurality of light sensors which generate current in response to incident light
07/05/2007WO2006002334A3 Intelligent probe chips/heads
07/05/2007US20070157175 Software resource testing
07/05/2007US20070157059 Apparatus and method for integrated functional built-in self test for an ASIC
07/05/2007US20070157058 Interconnect delay fault test controller and test apparatus using the same
07/05/2007US20070157057 Digital jitter detector
07/05/2007US20070157056 Method and apparatus for detecting defects in integrated circuit die from stimulation of statistical outlier signatures
07/05/2007US20070157055 Detection of tap register characteristics
07/05/2007US20070156368 Method and system for generating test pulses to test electronic elements
07/05/2007US20070156358 Method and device for fault location on three terminal power line
07/05/2007US20070156313 Wireless communication for diagnostic instrument
07/05/2007US20070155029 Methods for processing semiconductor devices in a singulated form
07/05/2007US20070154755 Apparatus for measuring an electrical characteristic of an electrochemical device
07/05/2007US20070152735 Semiconductor integrated circuit device
07/05/2007US20070152702 Starter zero current test apparatus and method
07/05/2007US20070152701 Apparatus for examining flat panel display device and examining method thereof
07/05/2007US20070152700 System and method for testing one or more dies on a semiconductor wafer
07/05/2007US20070152699 System and method for automatically measuring carrier density distribution by using capacitance-voltage characteristics of a MOS transistor device
07/05/2007US20070152698 Strip test method
07/05/2007US20070152697 Engaging device of circuit board
07/05/2007US20070152696 Water bond-out
07/05/2007US20070152695 Test equipment positional control manipulator
07/05/2007US20070152694 Motherboard test machine
07/05/2007US20070152693 Method and system of trace pull test
07/05/2007US20070152692 Connection verification technique
07/05/2007US20070152691 Wafer chuck
07/05/2007US20070152690 Wafer stage and related method
07/05/2007US20070152689 Modular probe card
07/05/2007US20070152688 Probe card capable of multi-probing
07/05/2007US20070152687 Mems probe card with elastic multi-layer structure
07/05/2007US20070152686 Knee probe having increased scrub motion
07/05/2007US20070152685 A probe array structure and a method of making a probe array structure
07/05/2007US20070152684 Apparatus and method for analyzing photo-emission
07/05/2007US20070152677 Surveillance device detection utilizing non-linear junction detection and reflectometry
07/05/2007US20070152676 Apparatus and method for detecting phase currents of inverter
07/05/2007US20070152675 Diagnostic method for monitoring a plug-in connection
07/05/2007US20070152674 Thermal Energy Management of Electronic Devices
07/05/2007US20070152673 Method and device of measuring interface trap density in semiconductor device
07/05/2007US20070152672 Organic electroluminescent display panel testing apparatus and method thereof
07/05/2007US20070152655 Handler for testing semiconductor devices
07/05/2007US20070152654 Integrated circuit (IC) transporting device for IC probe apparatus
07/05/2007DE69836407T2 Anordnung zur Überprüfung der Signalspannungspegelgenauigkeit in einer digitalen Testeinrichtung Arrangement for checking the signal voltage level accuracy in a digital test equipment
07/05/2007DE202007003971U1 Universal-Lampentester Universal lamp tester
07/05/2007DE202006002734U1 Vorrichtung zur Verschleißüberwachung der Bremsanlage in einem Fahrzeug Device to monitor wear of the brake system in a vehicle
07/05/2007DE10320925B4 Verfahren zum Testen von unbestückten Leiterplatten A method for testing of bare printed circuit boards
07/05/2007DE102005063045A1 Entladezustandsanzeige A discharge
07/05/2007DE102005004174B4 Verfahren zur Diagnose einer Kraftfahrzeugbatterie A method of diagnosing a motor vehicle battery
07/05/2007DE10196575B4 Scan-Vektor-Unterstützung für ein ereignisgestütztes Prüfsystem Scan vector support for an event-based testing system
07/05/2007DE10044264B4 Einrichtung zum Detektieren einer Sensorstörung für ein Fahrzeug Means for detecting a sensor failure for a vehicle
07/04/2007EP1804069A1 Method for managing charge levels of batteries in a plurality of apparatuses
07/04/2007EP1804068A1 System and method for testing integrated circuits
07/04/2007EP1804067A1 Low cost arc fault detection technique
07/04/2007EP1803240A2 Ethernet extension for the data center
07/04/2007EP1802987A1 Device for testing and regulating the temperature of electronic and/or electromechanical components
07/04/2007EP1802986A2 Evaluating the performance of an automotive switch network
07/04/2007EP1802985A2 Efficient protection mechanisms for protecting multicast traffic in a ring topology network utilizing label switching protocols
07/04/2007EP1420256B1 Method and device for determining sideband ratio of superconduction mixer using comb generator
07/04/2007EP1326079B1 Probe card
07/04/2007EP1213818B1 Electronic device method, method of controlling electronic device, method of estimating charge in rechargeable battery, and method of charging rechargeable battery