Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
12/1997
12/29/1997EP0733203A4 Battery monitor adjusted by rate of current
12/29/1997EP0648017B1 Device for monitoring phase skew between two clock signals
12/29/1997EP0585354B1 Multilayer female component for refastenable fastening device
12/24/1997WO1997048569A1 Controller for on-vehicle battery
12/24/1997CN1168474A Telecommunication cable failure monitoring method
12/24/1997CN1036804C Lightning arrester leakance detecting and action recorder
12/24/1997CA2208653A1 Cell evaluating method and cell evaluating apparatus
12/23/1997US5701335 Frequency independent scan chain
12/23/1997US5701309 Automated test equipment digital tester expansion apparatus
12/23/1997US5701308 Circuit for testing one or more integrated circuits
12/23/1997US5701307 Low overhead input and output boundary scan cells
12/23/1997US5701306 Semiconductor integrated circuit which can be tested by an LSI tester having a reduced number of pins
12/23/1997US5701267 Semiconductor storage device with macro-cell with monitoring of input data
12/23/1997US5701089 Alternator/starter testing device
12/23/1997US5701088 Method of evaluating a MIS-type semiconductor device
12/23/1997US5701087 Prescaler IC test method capable of executing alternate current test by the use of IC tester for direct current test
12/23/1997US5701086 Connecting test equipment to adjacent legs of an IC or the like by interdigitating conductive wedges with the legs
12/23/1997US5701085 Apparatus for testing flip chip or wire bond integrated circuits
12/23/1997US5701082 Probe for sensing moculated signals and method of using same
12/23/1997US5701081 Instrument used for the live troubleshooting of short circuits
12/23/1997US5701079 Connector terminal checking device
12/23/1997US5701078 Method of measuring residual capacity of a Ni/MH cell
12/23/1997US5701044 Process and device for monitoring the temperature of an electric generator
12/23/1997US5700698 Method for screening non-volatile memory and programmable logic devices
12/23/1997US5700089 Battery tester with load temperature detection
12/23/1997CA2023173C Battery voltmeter
12/20/1997CA2179447A1 Method for testing battery capacity
12/18/1997WO1997047981A1 Digital logic simulation/emulation system
12/18/1997WO1997047980A2 Method for testing digital circuits within synchronously sampled data detection channel
12/18/1997WO1997047491A1 Controller for on-vehicle battery
12/18/1997DE19725237A1 Controlling drive motor speed of battery-powered lawn mower
12/18/1997DE19702862A1 Fault analysis using emission microscope for LSI semiconductor
12/18/1997DE19623841A1 Semiconductor integrated circuit test apparatus
12/18/1997DE19623808A1 Measurement device e.g. for internal state of turbogenerator excitation system
12/18/1997DE19623436A1 Apparatus for displaying performance of electromagnetic (EM) relay or valve
12/18/1997CA2228127A1 Method for testing digital circuits within synchronously sampled data detection channel
12/17/1997EP0813282A1 Ground fault detection apparatus for a device connected to a power distribution or transmission network, and corresponding method
12/17/1997EP0813281A2 Apparatus for envelope detection of low current arcs
12/17/1997EP0813151A1 Monitoring control device
12/17/1997EP0813069A2 Device for determining the current flowing through an inductor
12/17/1997EP0813068A1 Detecting and localising appliance for flaws in the electromagnetic protection of a system
12/17/1997EP0812965A1 Battery-driven working machine
12/17/1997EP0812428A1 Method and apparatus for combining writes to memory
12/17/1997EP0812427A1 Unipolar earth leakage recognition process for three phase mains
12/17/1997EP0609334B1 SELF DIAGNOSTIC pH SENSOR
12/17/1997EP0523173B1 Apparatus and method for calorimetrically determining battery charge state
12/17/1997CN2270976Y Electric cable tester
12/17/1997CN2270975Y Two phase ac electroprobe
12/17/1997CN1168004A IC mounting/demounting system and mounting/demounting head therefor
12/17/1997CN1167921A Automatic multi-probe PWB test apparatus and method
12/16/1997US5699282 Methods and test structures for measuring overlay in multilayer devices
12/16/1997US5699103 Method for producing a calibrated array of light-emitting diodes and apparatus including the calibrated array
12/16/1997US5699050 Battery capacity meter
12/16/1997US5699001 Driver circuit for semiconductor test system
12/16/1997US5698992 Programmable logic module and architecture for field programmable gate array device
12/16/1997US5698989 Film sheet resistance measurement
12/16/1997US5698985 Cross-talk measurement instrument with source indication as a function of distance
12/16/1997US5698983 Method and apparatus for measuring and displaying remaining battery capacity as a two dimensional dot curve
12/16/1997US5698971 Device for detecting the end of battery life, power supply circuit having the device, and a portable machine having the power supply circuit
12/16/1997US5698965 Apparatus and method for determining the current state of charge of a battery by monitoring battery voltage increases above and decreases below a threshold
12/16/1997US5698963 Battery charging circuit with charging rate control
12/16/1997US5698962 Memory effect sensitive battery monitoring apparatus for electric vehicles
12/16/1997US5698961 Battery analyzer/conditioner system and method of using same
12/16/1997US5697801 Connector terminal inspecting device
12/11/1997WO1997046891A1 Method of testing a connection which includes a conductor in an integrated circuit
12/11/1997WO1997041460A3 Combined laser/flir optics system
12/11/1997DE2954748C2 Reception unit for printed circuit banking card
12/11/1997DE19723434A1 Testing apparatus for semiconductors in integrated circuits
12/11/1997DE19720708A1 High-speed monitor for study of pattern defect on semiconductor wafer
12/11/1997DE19704658A1 Computer aided design for semiconductor element
12/11/1997DE19638393C1 Leakage resistance measurement circuit e.g for airbag control device
12/11/1997DE19622532A1 Testing method for checking and determining position of splices in telecommunications cable
12/10/1997EP0811989A2 A method and apparatus for testing an integrated circuit memory array
12/10/1997EP0811850A2 High resolution supply current test system
12/10/1997EP0811167A1 Manipulator for automatic test equipment test head
12/10/1997EP0523973B1 A configurable self-test for embedded RAMs
12/10/1997CN1167564A Method of positioning IC and IC handler using the same
12/10/1997CN1167541A Device for measuring voltages along solid-insulated bus bars in medium-voltage switchgear
12/10/1997CN1167359A Checker using measuring device, arm device and cylindrical surface peripheral movement
12/10/1997CN1167335A Semiconductor checking device
12/09/1997US5696951 Signal deskewing system for synchronous logic circuit
12/09/1997US5696777 Device for the serial transmission of data between at least two terminals
12/09/1997US5696773 Apparatus for performing logic and leakage current tests on a digital logic circuit
12/09/1997US5696772 Test vector compression/decompression system for parallel processing integrated circuit tester
12/09/1997US5696771 Method and apparatus for performing partial unscan and near full scan within design for test applications
12/09/1997US5696452 Arrangement and method for improving room-temperature testability of CMOS integrated circuits optimized for cryogenic temperature operation
12/09/1997US5696451 Identification of pin-open faults by capacitive coupling
12/09/1997US5696450 Automatic safety test equipment for printed circuit board
12/09/1997US5696437 Intelligent low battery detection circuit for a paging receiver
12/09/1997US5696435 Fast battery charger for a device having a varying electrical load during recharging
12/09/1997US5696404 Semiconductor wafers with device protection means and with interconnect lines on scribing lines
12/09/1997CA2101475C On-line battery impedance measurement
12/04/1997WO1997045911A1 Back-up battery management system for an uninterruptible dc power supply
12/04/1997WO1997045748A1 Method for testing electronic components
12/04/1997WO1997045747A1 Electro-optical and magneto-optical sensing apparatus and method for characterizing free-space electromagnetic radiation
12/04/1997WO1997045316A1 Moving apparatus with drive power assisting device and movement controlling method
12/04/1997DE3913219C3 Integrierte Halbleiterschaltung mit mehreren Schaltungen, die logischen Tests unterworfen werden A semiconductor integrated circuit with multiple circuits, the logical tests are subjected to
12/04/1997DE19722811A1 Quality measuring device for PBX telephone communication paths
12/04/1997DE19722414A1 Method and device for testing semiconductor interference analysis memory
12/04/1997DE19711683A1 IC mounting/demounting device and mounting/demounting head