Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
06/1998
06/03/1998EP0845680A1 Making and testing an integrated circuit using high density probe points
06/03/1998EP0845677A1 A method of using a temporary z-axis material
06/03/1998EP0845383A1 Controller for on-vehicle battery
06/03/1998EP0845131A1 Electronic diagnostic system
06/03/1998EP0845107A1 Measurement system for electric disturbances in a high-voltage switchboard plant
06/03/1998EP0844946A2 System for checking the resistance of a load connected to a transformer
06/03/1998EP0788729A4 Programmable high density electronic testing device
06/03/1998EP0758771B1 An electronic circuit or board tester and a method of testing an electronic device
06/03/1998CN1183647A Acceleration test method of semiconductor memory
06/03/1998CN1183639A Test structure for estimating defects at isolation edge of semiconductor element and test method using the same
06/03/1998CN1183564A Method and apparatus for testing CPU register bit reverse caused by single particle effect
06/03/1998CN1183563A Failure diagnosis device
06/03/1998CN1183337A Electric appliances inspecting system
06/02/1998US5761489 Method and apparatus for scan testing with extended test vector storage in a multi-purpose memory system
06/02/1998US5761337 Method and apparatus for inspection of the appearance of bumps
06/02/1998US5761336 Aperture optimization method providing improved defect detection and characterization
06/02/1998US5761216 Bit error measurement system
06/02/1998US5761215 Scan based path delay testing of integrated circuits containing embedded memory elements
06/02/1998US5761214 Method for testing integrated circuit devices
06/02/1998US5761213 Method and apparatus to determine erroneous value in memory cells using data compression
06/02/1998US5761145 Efficient method for obtaining usable parts from a partially good memory integrated circuit
06/02/1998US5761100 Period generator for semiconductor testing apparatus
06/02/1998US5761072 Battery state of charge sensing system
06/02/1998US5761064 Defect management system for productivity and yield improvement
06/02/1998US5761036 Socket assembly for electrical component
06/02/1998US5760892 Method of analyzing failure of semiconductor device by using emission microscope and system for analyzing failure of semiconductor device
06/02/1998US5760720 Digital trimming of on-chip analog components
06/02/1998US5760643 Integrated circuit die with selective pad-to-pad bypass of internal circuitry
06/02/1998US5760614 Potential detecting circuit and semiconductor integrated circuit
06/02/1998US5760613 Method and corresponding circuit detecting an open load
06/02/1998US5760600 Test device for insulated-gate field effect transistor and testing circuit and testing method using the same
06/02/1998US5760599 Method and apparatus for testing semiconductor integrated circuits
06/02/1998US5760598 Method and apparatus for testing quiescent current in integrated circuits
06/02/1998US5760597 Method of and apparatus for measuring lifetime of carriers in semiconductor sample
06/02/1998US5760596 Testing series passive components without contacting the driven node
06/02/1998US5760595 High temperature electromigration stress test system, test socket, and use thereof
06/02/1998US5760594 Contamination monitoring using capacitance measurements on MOS structures
06/02/1998US5760592 Method and device for inspecting connectors
06/02/1998US5760591 Method of and apparatus for determining an electric wiring state
06/02/1998US5760590 Cable integrity tester
06/02/1998US5760588 Dual rate thermochromic battery tester
06/02/1998US5760587 For detecting an electrical conductivity leakage path in a vehicle
06/02/1998US5760481 Encapsulated electronic component containing a holding member
06/02/1998US5758776 Integrated circuit tray with flexural bearings
06/02/1998US5758537 Method and apparatus for mounting, inspecting and adjusting probe card needles
05/1998
05/28/1998WO1998022951A1 Memory tester with data compression
05/28/1998WO1998022830A2 Battery management system and battery simulator
05/28/1998WO1998022829A1 Integrated circuit device tester
05/28/1998WO1998022828A1 Device and method for analysing faults on networks
05/28/1998WO1998000944A3 Test detection apparatus and method
05/28/1998DE19752212A1 Error event counting method
05/28/1998DE19751546A1 Pattern generator
05/28/1998DE19728171A1 Semiconductor for evaluation of defects to isolation edge
05/28/1998DE19648905A1 Switching circuit for monitoring three-phase mains safety
05/27/1998EP0844658A2 Integrated circuit, method of fabrication and evaluation of the same
05/27/1998EP0844562A2 Method and apparatus for producing self-diagnostic information from a circuit board
05/27/1998EP0844486A2 Electronic apparatus incorporating battery
05/27/1998EP0843915A1 Efficient in-system programming structure and method for non-volatile programmable logic devices
05/27/1998EP0843825A1 Semiconductor wafer test and burn-in
05/27/1998EP0843824A1 Method of testing a connection which includes a conductor in an integrated circuit
05/27/1998EP0843823A1 Detection and location of current leakage paths and detection of oscillations
05/27/1998EP0843822A2 A bidirectional load and source cycler
05/27/1998EP0664889B1 Method for accelerated degradation testing of semiconductor devices
05/27/1998CN1182881A Integrated circuit
05/27/1998CN1182880A Method for testing and evaluating lightning strike and equipment thereof
05/26/1998US5758063 Testing mapped signal sources
05/26/1998US5757820 Method for testing interconnections between integrated circuits using a dynamically generated interconnect topology model
05/26/1998US5757819 Integrated circuit test controller
05/26/1998US5757818 Method and apparatus for scan out testing of integrated circuits with reduced test circuit area
05/26/1998US5757816 IDDQ testing of integrated circuits
05/26/1998US5757815 Semiconductor memory test system
05/26/1998US5757814 Memory and test method therefor
05/26/1998US5757811 System for testing a fault detecting means
05/26/1998US5757645 Diagnostic method for motor vehicles for checking electronically controlled systems
05/26/1998US5757346 Liquid crystal display driving device and liquid crystal inspection method using the same
05/26/1998US5757228 Output driver circuit for suppressing noise generation and integrated circuit device for burn-in test
05/26/1998US5757204 Method and circuit for detecting boron ("B") in a semiconductor device using threshold voltage ("V") fluence test
05/26/1998US5757203 Multiple on-chip IDDQ monitors
05/26/1998US5757202 Semiconductor device having a test mode setting circuit
05/26/1998US5757201 Universal testing device for electronic modules with different configurations and operating parameters
05/26/1998US5757200 Lead press mechanism for IC test handler
05/26/1998US5757199 Test carrier for semiconductor integrated circuit and method of testing semiconductor integrated circuit
05/26/1998US5757198 Method and apparatus for detecting an IC defect using charged particle beam
05/26/1998US5757194 Automatic broadband electromagnetic generator
05/26/1998US5757193 Apparatus for detecting defects of wiring board
05/26/1998US5757192 Method and apparatus for detecting a bad cell in a storage battery
05/26/1998US5757159 Height stage for positioning apparatus
05/26/1998US5757027 Semiconductor wafer testing method and apparatus
05/26/1998US5756370 Making temporary electrical connection for testing
05/26/1998CA2065341C Method and apparatus for high precision weighted random pattern generation
05/22/1998WO1998021701A1 Balanced type magnetically actuated proximity switch and radio frequency monitoring system
05/22/1998WO1998021599A1 Computerized testing method and system
05/22/1998WO1998021596A2 Lightning test method and apparatus
05/20/1998EP0843317A2 Method for testing of a field divided memory chip during run-time of a computer while maintaining real-time conditions
05/20/1998EP0842439A1 Low cost cmos tester
05/20/1998EP0842438A1 Prober and tester with compact interface for integrated circuits-containing wafer held docked in a vertical plane
05/20/1998DE19750173A1 IC test arrangement for testing several ICs simultaneously
05/20/1998DE19749663A1 Semiconductor component test apparatus
05/20/1998DE19730347A1 Static semiconductor memory with several memory cells
05/20/1998DE19647686A1 Electromagnetic test signal sequence generation unit
1 ... 1331 1332 1333 1334 1335 1336 1337 1338 1339 1340 1341 1342 1343 1344 1345 1346 1347 1348 1349 1350 1351 ... 1523