Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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06/18/1998 | DE19652173A1 Charge exchange process for functional testing of accumulator systems |
06/18/1998 | DE19651726A1 Vorrichtung zur Zustandserfassung von n Kondensatorkannen einer Hochspannungskondensatorbatterie Apparatus for determining the condition of n capacitor cans a high voltage capacitor bank |
06/18/1998 | DE19650974A1 Electric conductor testing method |
06/17/1998 | EP0848492A1 Method for diagnosing abnormality of circuit member of inverter driving controller for driving and controlling motor |
06/17/1998 | EP0848329A2 Test access interface for integrated circuits |
06/17/1998 | EP0848260A2 Test station for electronic devices, in particular mobile telephones |
06/17/1998 | EP0847553A1 System for testing a computer built into a control device |
06/17/1998 | EP0847534A1 Methodology for testing a microcontroller chip adapted to control a liquid crystal display |
06/17/1998 | EP0787304A4 Numerical comparator |
06/17/1998 | CN2284405Y Electricity leakage alarm |
06/17/1998 | CN1185047A IC socket for BGA package |
06/17/1998 | CN1185032A Checking system |
06/17/1998 | CN1184941A Semiconductor device testing apparatus |
06/17/1998 | CN1184940A Insulated device diagnosing system and partial discharge detecting method |
06/17/1998 | CN1038784C High speed circuit chip electro-optic sampling analyser |
06/16/1998 | US5768570 Delay time stabilization circuit |
06/16/1998 | US5768290 Semiconductor integrated circuit device incorporating fuse-programmable pass/fail identification circuit and pass/fail determination method thereof |
06/16/1998 | US5768289 Dynamically controlling the number of boundary-scan cells in a boundary-scan path |
06/16/1998 | US5768288 Method and apparatus for programming a programmable logic device having verify logic for comparing verify data read from a memory location with program data |
06/16/1998 | US5768177 Controlled delay circuit for use in synchronized semiconductor memory |
06/16/1998 | US5768159 Method of simulating AC timing characteristics of integrated circuits |
06/16/1998 | US5768155 Fast undersampling |
06/16/1998 | US5768152 Performance monitoring through JTAG 1149.1 interface |
06/16/1998 | US5768077 Earthing wire disconnection detection apparatus and leakage detection apparatus having an earthing wire disconnection detection function conductor |
06/16/1998 | US5767781 Method for detection of failed heater in a daisy chain connection |
06/16/1998 | US5767717 High performance dynamic logic compatible and scannable transparent latch |
06/16/1998 | US5767709 Synchronous test mode initalization |
06/16/1998 | US5767706 Generates rate signals of desired time intervals depending on rate data |
06/16/1998 | US5767694 Information processing apparatus with a mode setting circuit |
06/16/1998 | US5767693 Method and apparatus for measurement of mobile charges with a corona screen gun |
06/16/1998 | US5767691 Probe-oxide-semiconductor method and apparatus for measuring oxide charge on a semiconductor wafer |
06/16/1998 | US5767690 Test head cooling system |
06/16/1998 | US5767689 Bare chip test carrier with an improved holding structure for a semiconductor chip |
06/16/1998 | US5767688 For detecting a voltage of a sample |
06/16/1998 | US5767684 Method and apparatus for measuring partial discharges in cables |
06/16/1998 | US5767668 Remote current sensor |
06/16/1998 | US5767661 Battery charger |
06/16/1998 | US5767527 Semiconductor device suitable for testing |
06/16/1998 | US5766979 Wafer level contact sheet and method of assembly |
06/16/1998 | US5765664 Elevator drive fault detector |
06/11/1998 | WO1998025389A2 Emergency telephone with automatic low-battery signaling |
06/11/1998 | WO1998025322A1 Antenna adapter |
06/11/1998 | WO1998025154A1 Measuring instrument for a loaded dc/dc converter |
06/11/1998 | WO1998025153A2 Measurement instrument amplitude calibration |
06/11/1998 | WO1998025152A1 A test fixture |
06/11/1998 | WO1998025151A1 Protective pipe element for sheathed cable for controlling the integrity of the sheath |
06/11/1998 | WO1998025124A1 Method and apparatus for inspecting spark plug while spark plug is installed in engine |
06/11/1998 | CA2274015A1 Protective pipe element for sheathed cable for controlling the integrity of the sheath |
06/10/1998 | EP0847139A2 Delay difference adjustment circuit and phase adjuster |
06/10/1998 | EP0847060A1 Memory tester APG with flexible Z register programming |
06/10/1998 | EP0846956A2 Scan path circuit with holding means |
06/10/1998 | EP0846955A1 Sensor test arrangement and method |
06/10/1998 | EP0846953A2 Printed circuit board inspecting apparatus, and method of using a universal-type printed circuit board inspecting apparatus |
06/10/1998 | EP0846614A1 Moving apparatus with drive power assisting device and movement controlling method |
06/10/1998 | EP0846371A1 Cmos buffer circuit having power-down feature |
06/10/1998 | EP0846271A1 Method of locating a single-phase ground fault in a power distribution network |
06/10/1998 | DE19734908A1 Semiconductor memory with numerous pairs of bit lines |
06/10/1998 | CN2283863Y Multifunction relay testing instrument |
06/10/1998 | CN1184367A Winding machine having pinhole detection function |
06/10/1998 | CN1184330A Semi-conductor memory device |
06/10/1998 | CN1184257A Apparatus and method for testing stator |
06/10/1998 | CN1184021A Integrated circuit assembling and disassembling device and its assembling and disassembling head |
06/09/1998 | US5764952 Diagnostic system including a LSI or VLSI integrated circuit with a diagnostic data port |
06/09/1998 | US5764823 Optical switch for isolating multiple fiber optic strands |
06/09/1998 | US5764657 Method and apparatus for generating an optimal test pattern for sequence detection |
06/09/1998 | US5764656 Method for a fast scan GRA cell circuit |
06/09/1998 | US5764655 Built in self test with memory |
06/09/1998 | US5764654 Semiconductor integrated circuit device having a test circuit |
06/09/1998 | US5764650 Intelligent binning for electrically repairable semiconductor chips |
06/09/1998 | US5764598 Delay time measurement apparatus for delay circuit |
06/09/1998 | US5764592 External write pulse control method and structure |
06/09/1998 | US5764583 In a two-dimensional array |
06/09/1998 | US5764573 Semiconductor device capable of externally and readily identifying set bonding optional function and method of identifying internal function of semiconductor device |
06/09/1998 | US5764462 Field ground fault detector and field ground fault relay for detecting ground corresponding to DC component extracted ground fault current |
06/09/1998 | US5764409 Elimination of vibration by vibration coupling in microscopy applications |
06/09/1998 | US5764079 Sample and load scheme for observability of internal nodes in a PLD |
06/09/1998 | US5764073 Method of estimating the reliability of module circuits |
06/09/1998 | US5764072 Dual contact probe assembly for testing integrated circuits |
06/09/1998 | US5764070 Structure for testing bare integrated circuit devices |
06/09/1998 | US5764065 Remote contamination sensing device for determining contamination on insulation of power lines and substations |
06/09/1998 | US5764063 Monitor for battery pack |
06/09/1998 | US5764047 Measurement of power supply dc current by means of a small ac current |
06/09/1998 | US5764044 Process for producing time dependent waveforms of positive and negative symmetrical sequence components of a power system's voltages or currents |
06/09/1998 | US5764034 Battery gauge for a battery operated infusion pump |
06/09/1998 | US5764033 Rechargeable battery protection circuit |
06/09/1998 | US5764031 Method and apparatus for supplying a power source to an electronic apparatus |
06/09/1998 | US5762504 Electric connection unit |
06/09/1998 | US5761958 For a dc dynamometer |
06/04/1998 | WO1998024294A1 Apparatus for inspecting electronic component insertion in a printed circuit board and the method therefor |
06/04/1998 | WO1998024026A1 Device for controlling conformity of consumption of an electronic component in a testing machine |
06/04/1998 | WO1998023968A1 Pattern generator |
06/04/1998 | WO1998018066A3 Method and system for assessing a measurement procedure and measurement-induced uncertainties on a batchwise manufacturing process of discrete products |
06/04/1998 | DE19751064A1 Electric connection arrangement for vehicle measuring device |
06/04/1998 | DE19743211A1 Integrated circuit mounting and dismounting system |
06/04/1998 | DE19649788A1 Meßvorrichtung für einen belasteten Gleichspannungswandler Measuring device for a loaded DC-DC converter |
06/04/1998 | DE19610555C2 Leckspannungs-Detektorschaltung für einen MOS Kondensator Leak voltage detection circuit for a MOS capacitor |
06/03/1998 | EP0845810A1 Large-scale-integration circuit device and method of manufacturing same |
06/03/1998 | EP0845788A2 A memory array test circuit with failure notification |
06/03/1998 | EP0845682A2 Portable information terminal apparatus capable of correctly detecting power supply voltage |
06/03/1998 | EP0845681A2 Electric motor monitoring arrangement |