Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
05/1998
05/20/1998CN2282193Y Acousto-optic display multifuncional test pencil
05/20/1998CN1182482A Method and device for monitoring deterioration of battery
05/20/1998CN1182222A Electronic camera and battery voltage controlling method employed therein
05/19/1998US5754963 Method and apparatus for diagnosing and isolating faulty sensors in a redundant sensor system
05/19/1998US5754827 Method and apparatus for performing fully visible tracing of an emulation
05/19/1998US5754621 X-ray inspection method and apparatus, prepreg inspecting method, and method for fabricating multi-layer printed circuit board
05/19/1998US5754561 Large scale integrated circuit equipped with a normal internal logic testing circuit and unconnected/substandard solder testing circuit
05/19/1998US5754559 Method and apparatus for testing integrated circuits
05/19/1998US5754558 Method and apparatus for screening a nonvolatile semiconductor memory device
05/19/1998US5754556 Semiconductor memory tester with hardware accelerators
05/19/1998US5754435 Method and apparatus for calculating power consumption of integrated circuit
05/19/1998US5754410 Multi-chip module with accessible test pads
05/19/1998US5754298 Method and apparatus for imaging semiconductor device properties
05/19/1998US5754114 Safety ground detector
05/19/1998US5754057 Contact mechanism for test head of semiconductor test system
05/19/1998US5754053 In service cable failure detector and method
05/19/1998US5754052 Device for measuring storage battery cell parameters
05/19/1998US5754041 Device for measuring voltage/current characteristics with means to prevent output transients during changes in settings
05/19/1998US5754040 Apparatus for testing medium voltage primary distribution cables
05/19/1998US5752771 Integrated circuit module fixing mechanism for temperature cycling test
05/14/1998WO1998020498A1 Defect analysis memory for memory tester
05/14/1998WO1998020497A1 Memory test system with defect compression
05/14/1998WO1998020356A1 Method of detecting and locating a high-resistance earth fault in an electric power network
05/14/1998DE19750321A1 Integrated circuit tester for hand-held instruments
05/14/1998DE19710471A1 Test instrument for evaluating reliability of connecting wires in semiconductors
05/14/1998DE19709226A1 Circuit arrangement for generating high frequency alternating voltages and currents with high power esp. for partial discharge measurement at gradient coils
05/14/1998CA2402600A1 Sensing device for a powerline
05/14/1998CA2270917A1 Memory test system with defect compression
05/13/1998EP0841822A1 Failure diagnostic apparatus
05/13/1998EP0841701A1 Component characteristics measurement circuit in an integrated semiconductor circuit system
05/13/1998EP0841698A2 Wafer level contact sheet and method of assembly
05/13/1998EP0841697A2 Method of using a permanent z-axis material
05/13/1998EP0841695A2 High planarity, low CTE base and method of making the same
05/13/1998EP0841574A2 Integrated motor and diagnostic apparatus and method of operating same
05/13/1998EP0841573A2 Method and apparatus for performing testing of double-sided ball grid array device
05/13/1998EP0841572A2 Wafer-level burn-in system
05/13/1998EP0841571A2 Wafer level burn-in base unit substrate and assembly
05/13/1998EP0841570A2 Automatic detection of shorted loudspeakers in automotive audio systems
05/13/1998EP0841568A2 A method of wafer level burn-in
05/13/1998EP0841559A2 Solder testing apparatus
05/13/1998EP0841532A1 Method and apparatus for measuring electrical waveforms using atomic force microscopy
05/13/1998EP0840897A1 Functional test process for a mechanical switching element
05/13/1998EP0787305B1 Switching device with monitoring the wear of at least one contact
05/13/1998EP0729603A4 Atg test station
05/13/1998EP0620920B1 Method for determining the short-circuit inductance of an asynchronous machine
05/13/1998CN2281542Y Miniature semiautomatic digital display instrument for determining dielectric strength of dielectric oil
05/13/1998CN1181662A Method and apparatus for testing counter and serial access memory
05/13/1998CN1181658A Semiconductor device
05/13/1998CN1181546A Semiconductor integrated circuit
05/13/1998CN1181541A Semiconductor integrated circuit with multiple flip-flop
05/13/1998CN1181506A Printed circuit board test apparatus and method
05/13/1998CN1181505A Semiconductor device and internal function identification method of semiconductor device
05/13/1998CN1181335A Electricity leakage alarm for ship
05/12/1998US5751955 Method of synchronizing a pair of central processor units for duplex, lock-step operation by copying data into a corresponding locations of another memory
05/12/1998US5751932 Fail-fast, fail-functional, fault-tolerant multiprocessor system
05/12/1998US5751766 Non-invasive digital communications test system
05/12/1998US5751738 Pattern generator cicuit for semiconductor test systerm
05/12/1998US5751737 Boundary scan testing device
05/12/1998US5751736 Testable electronic system
05/12/1998US5751728 Semiconductor memory IC testing device
05/12/1998US5751525 EOS/ESD Protection circuit for an integrated circuit with operating/test voltages exceeding power supply rail voltages
05/12/1998US5751262 Method and apparatus for testing emissive cathodes
05/12/1998US5751217 Method and apparatus for assessing available battery life in a rechargeable battery
05/12/1998US5751163 Parallel programming of in-system (ISP) programmable devices using an automatic tester
05/12/1998US5751159 Semiconductor array and switches formed on a common substrate for array testing purposes
05/12/1998US5751158 Method and apparatus for selectively deriving a boosted voltage exceeding an internal voltage
05/12/1998US5751153 Method and apparatus for characterizing a multiport circuit
05/12/1998US5751151 Integrated circuit test apparatus
05/12/1998US5751150 Bidirectional load and source cycler
05/12/1998US5751149 Method and apparatus for high frequency time domain reflectometry
05/12/1998US5751148 Method for detecting electrical connection between antenna and receiver for a motor vehicle
05/12/1998US5751141 IDDQ -testing of bias generator circuit
05/12/1998US5751136 Checking method of connection between secondary battery and battery charger and checking device
05/12/1998US5751134 Gas gauging system and method for monitoring battery capacity for battery powered electronic devices
05/12/1998US5751132 Electric motor monitoring circuit
05/12/1998US5751015 Semiconductor reliability test chip
05/12/1998US5750997 Method and apparatus for observing wiring patterns of printed circuit board
05/12/1998US5750981 Non-contact electro-optic detection of photovoltages created in a semiconductor by a probe beam
05/12/1998US5750908 Testing system with real time/off line functionality allocation
05/12/1998US5749738 Electrical interconnect contact system
05/12/1998US5749698 Substrate transport apparatus and substrate transport path adjustment method
05/12/1998CA2047378C Optical magnetic-field sensor
05/08/1998CA2220386A1 Automatic detection of shorted loudspeakers in automotive audio systems
05/07/1998WO1998019422A1 Computer network cross-connect panel providing physical layer monitoring
05/07/1998WO1998019221A1 Electronic timepiece
05/07/1998WO1998019174A1 Component testing device
05/07/1998WO1998019173A1 Device noise measurement system
05/07/1998DE19718120A1 Integrated microprocessor circuit chip
05/07/1998DE19645515A1 Automatic battery charge measuring method
05/07/1998DE19645335A1 Test bay for rail-borne vehicle
05/07/1998CA2270140A1 Computer network cross-connect panel providing physical layer monitoring
05/07/1998CA2269777A1 Device noise measurement system
05/06/1998EP0840415A1 Method for detecting fault arcs and arc monitoring device therefor
05/06/1998EP0840329A1 Method and apparatus for testing counter and serial access memory containing it
05/06/1998EP0840328A2 Method and device for testing memory circuits
05/06/1998EP0840227A1 Method and apparatus for determining IDDQ
05/06/1998EP0840219A1 An integrated circuit device and method of communication therewith
05/06/1998EP0840218A1 An integrated circuit device and method of communication therewith
05/06/1998EP0840217A1 An integrated circuit with TAP (test access port) controller
05/06/1998EP0840135A2 Method for diagnosing battery condition
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