| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/11/1997 | CN1151526A Semiconductor-type accelerometer and method for evaluating properties of sensor element formed |
| 06/10/1997 | US5638380 Method of increasing a number of gates within a logic block |
| 06/10/1997 | US5638331 Burn-in test circuit and method in semiconductor memory device |
| 06/10/1997 | US5638274 Electronic control apparatus for an air-bag system |
| 06/10/1997 | US5638272 Control unit for vehicle and total control system therefor |
| 06/10/1997 | US5638247 Circuit configuration for monitoring a plurality of coils |
| 06/10/1997 | US5638245 Electric power cut-off detection unit for a monitor |
| 06/10/1997 | US5638051 Method and apparatus for monitoring an electrical drive |
| 06/10/1997 | US5638006 Method and apparatus for wafer level prediction of thin oxide reliability using differentially sized gate-like antennae |
| 06/10/1997 | US5638005 Predictive waveform acquisition |
| 06/10/1997 | US5638004 Multiconductor continuity and intermittent fault analyzer with dynamic stimulation |
| 06/10/1997 | US5638003 Method and apparatus for testing surface breakdown of dielectric materials caused by electrical tracking |
| 06/10/1997 | US5638002 Measurement circuit for a modular system of electrical cells connected in series, in particular for a system of the storage batterytype |
| 06/10/1997 | US5637835 Automatic test detection of unsoldered thru-hole connector leads |
| 06/10/1997 | US5637812 Variable volume test chamber |
| 06/10/1997 | US5637793 Test chuck for armature testing |
| 06/10/1997 | US5636781 Apparatus and method for removing known good die using hot shear process |
| 06/05/1997 | WO1997020339A1 Socket for a tape carrier package |
| 06/05/1997 | WO1997020226A1 A programmable interface controller |
| 06/05/1997 | WO1997020225A1 Device and method for estimating remaining life of battery |
| 06/05/1997 | WO1997020224A2 Process and device for testing electric drives |
| 06/05/1997 | WO1997020223A1 Device for carrying out measurements on communication lines |
| 06/05/1997 | WO1997020221A2 Process and device for testing an impedance connected to a low-frequency amplifier |
| 06/05/1997 | WO1997020219A2 Process for producing signals identifying faulty loops in a polyphase electrical power supply network |
| 06/05/1997 | WO1997000452A3 Mura detection apparatus and method |
| 06/05/1997 | DE19648949A1 Test card for integrated circuits measuring low current levels |
| 06/05/1997 | DE19648475A1 Micro-contact pin structure for IC test card |
| 06/05/1997 | CA2238946A1 Process and device for testing electric drives |
| 06/05/1997 | CA2238821A1 A programmable interface controller |
| 06/05/1997 | CA2238506A1 Process for producing signals identifying faulty loops in a polyphase electrical power supply network |
| 06/04/1997 | EP0777309A2 Generating apparatus for vehicle |
| 06/04/1997 | EP0777126A1 Parameter determining means and/or mode determining means for electrical appliances |
| 06/04/1997 | EP0776481A1 Addressable serial test system |
| 06/04/1997 | EP0776479A1 System for monitoring a dual voltage ungrounded system |
| 06/04/1997 | EP0776478A1 Method and device for monitoring power-supply networks |
| 06/04/1997 | EP0529670B1 Test pattern generating apparatus |
| 06/04/1997 | EP0485976B1 Fault analysis apparatus for memories having redundancy circuits |
| 06/04/1997 | CN2255618Y Short-circuit fault displaying device |
| 06/04/1997 | CN2255617Y Short-circuit fault displaying device |
| 06/04/1997 | CN1151020A Method for separating secondary cell |
| 06/03/1997 | US5636372 Network timing analysis method which eliminates timing variations between signals traversing a common circuit path |
| 06/03/1997 | US5636256 Apparatus used for total reflection fluorescent X-ray analysis on a liquid drop-like sample containing very small amounts of impurities |
| 06/03/1997 | US5636229 Method for generating test patterns to detect an electric shortcircuit, a method for testing electric circuitry while using test patterns so generated, and a tester device for testing electric circuitry with such test patterns |
| 06/03/1997 | US5636228 Scan register with decoupled scan routing |
| 06/03/1997 | US5636227 Integrated circuit test mechansim and method |
| 06/03/1997 | US5636142 Digital processing circuit comprising test registers |
| 06/03/1997 | US5635894 For a data bus |
| 06/03/1997 | US5635854 Programmable logic integrated circuit including verify circuitry for classifying fuse link states as validly closed, validly open or invalid |
| 06/03/1997 | US5635850 Intelligent test line system |
| 06/03/1997 | US5635849 Miniature probe positioning actuator |
| 06/03/1997 | US5635847 Apparatus for testing circuits and/or burning-in chips |
| 06/03/1997 | US5635846 Test probe having elongated conductor embedded in an elostomeric material which is mounted on a space transformer |
| 06/03/1997 | US5635843 Auto harness integrity tester |
| 06/03/1997 | US5635842 Method of estimating residual capacity of battery |
| 06/03/1997 | US5635841 Electronic ignition control module test system |
| 06/03/1997 | US5635822 Safeguard for integrated power stages employing multiple bond-wires to a current lead of the package |
| 06/03/1997 | US5635813 Electronic apparatus, battery management system, and battery management method |
| 06/03/1997 | US5635780 Instrument holder and method for inspection of a dynamo-electric machine in a gap between a stator and a rotor and dynamo-electric machine having the instrument holder |
| 06/03/1997 | US5635715 Process for the characterization of an insulator and the corresponding electron microscope |
| 06/03/1997 | US5635651 Dynamometer fault detection system |
| 06/03/1997 | US5635410 Bias temperature treatment method |
| 06/03/1997 | US5634801 Electrical interconnect contact system |
| 06/03/1997 | US5634267 Method and apparatus for manufacturing known good semiconductor die |
| 05/29/1997 | WO1997015837A3 Flexibly suspended heat exchange head for a dut |
| 05/28/1997 | EP0776151A1 Method and apparatus for soldering inspection of circuit board |
| 05/28/1997 | EP0776086A2 Signal generator |
| 05/28/1997 | EP0775957A1 Test pattern generating method and test pattern generating system |
| 05/28/1997 | EP0775916A1 Device for testing electrical connectors |
| 05/28/1997 | EP0775318A1 Capacitive open-circuit test employing an improved threshold determination |
| 05/28/1997 | DE19545267A1 Verfahren zum Gewinnen von fehlerbehaftete Schleifen in einem mehrphasigen elektrischen Energieversorgungsnetz kennzeichnenden Signalen A method for obtaining faulty loops characteristic in a multi-phase electrical energy supply network signals |
| 05/28/1997 | DE19528698C1 System for measuring cable faults such as cable breaks and insulation faults |
| 05/28/1997 | CN2255115Y Full function type high efficiency contravariant power supply |
| 05/28/1997 | CN1150843A Method of cleaning probe tips of probe cards and apparatus for impelementing method |
| 05/28/1997 | CN1150712A Apparatus and method for discharging and charging multiple battery arrangement |
| 05/27/1997 | US5634001 Method to calculate hot-electron test voltage differential for assessing microprocessor reliability |
| 05/27/1997 | US5633879 Method for integrated circuit design and test |
| 05/27/1997 | US5633830 Random access memory block circuitry for programmable logic array integrated circuit devices |
| 05/27/1997 | US5633813 Apparatus and method for automatic test generation and fault simulation of electronic circuits, based on programmable logic circuits |
| 05/27/1997 | US5633812 Fault simulation of testing for board circuit failures |
| 05/27/1997 | US5633709 Propagation delay time measuring device |
| 05/27/1997 | US5633609 Clock system with internal monitor circuitry for secure testing |
| 05/27/1997 | US5633599 Semiconductor integrated circuit with a test circuit for input buffer threshold |
| 05/27/1997 | US5633598 For testing a printed circuit board |
| 05/27/1997 | US5633597 Micro interface technology system utilizing slide engagement mechanism |
| 05/27/1997 | US5633595 IC analysis system and electron beam probe system and fault isolation method therefor |
| 05/27/1997 | US5633592 Charge status indicator |
| 05/27/1997 | US5633582 Combined signal level meter and leakage detector |
| 05/27/1997 | US5633573 Battery pack having a processor controlled battery operating system |
| 05/27/1997 | US5633121 Method for examining surface of copper layer in circuit board and process for producing circuit board |
| 05/27/1997 | US5632631 Microelectronic contacts with asperities and methods of making same |
| 05/27/1997 | US5632079 Process for making integrated terminating resistor |
| 05/22/1997 | WO1997018481A1 Method and apparatus for use in iddq integrated circuit testing |
| 05/22/1997 | WO1997018479A1 Device for detecting errors in a sensor |
| 05/22/1997 | WO1997018478A1 Jig for inspecting male terminal of connector |
| 05/22/1997 | WO1997018477A2 Current measurement in turbogenerators |
| 05/22/1997 | WO1997018046A1 Electrical circuit component handler |
| 05/22/1997 | WO1997017829A1 Variable voltage component tester |
| 05/22/1997 | WO1997009344A3 Librairies of backbone-cyclized peptidomimetics |
| 05/22/1997 | DE19636232A1 Measurement probe device for generating surface image, esp. for atomic force microscopy |
| 05/22/1997 | DE19544391A1 Leakage detection and locating device for tubes or cables |