| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/22/1997 | US5651013 Programmable circuits for test and operation of programmable gate arrays |
| 07/22/1997 | US5651012 Implementation of half-path joining in a system for global performance analysis of a latch-based design |
| 07/22/1997 | US5651011 Method and apparatus for initiating and controlling test modes within an integrated circuit |
| 07/22/1997 | US5650938 Computer controlled method |
| 07/22/1997 | US5650937 Device and method for measuring the charge state of a nickel-cadmium accumulator |
| 07/22/1997 | US5650907 Circuit breaker |
| 07/22/1997 | US5650734 Programming programmable transistor devices using state machines |
| 07/22/1997 | US5650732 Semiconductor device test system |
| 07/22/1997 | US5650731 Photovoltaic oxide charge measurement probe technique |
| 07/22/1997 | US5650728 Fault detection system including a capacitor for generating a pulse and a processor for determining admittance versus frequency of a reflected pulse |
| 07/22/1997 | US5650727 Circuit continuity testing device |
| 07/22/1997 | US5650712 Method for detecting remaining battery current, voltage, and temperature capacity by continuously monitoring |
| 07/22/1997 | US5650710 Apparatus for controlling a charging start time and charging period for a storage battery in an electric vehicle to complete charging at a scheduled boarding time |
| 07/22/1997 | US5650579 Miniature air gap inspection crawler |
| 07/22/1997 | US5650336 Method of presuming life time of semiconductor device |
| 07/17/1997 | WO1997025797A1 Signal distribution system |
| 07/17/1997 | WO1997025795A1 Clock signal distribution system |
| 07/17/1997 | WO1997025719A1 Test pattern generator |
| 07/17/1997 | WO1997025717A1 Test pattern generator |
| 07/17/1997 | WO1997025664A1 Signal deskewing system for synchronous logic circuit |
| 07/17/1997 | WO1997025626A1 Test generation using signal flow graphs |
| 07/17/1997 | WO1997020221A3 Process and device for testing an impedance connected to a low-frequency amplifier |
| 07/17/1997 | WO1997018477A3 Current measurement in turbogenerators |
| 07/17/1997 | DE19700513A1 Semiconductor testing system for semiconductor integrated circuits logically linked with CAD data from CAD computer |
| 07/17/1997 | DE19610555A1 Leak voltage detector circuit for MOS capacitor of e.g. DRAM |
| 07/16/1997 | EP0784211A2 Method of preparing a plan-view sample of an integrated circuit for transmission electron microscopy, and methods of observing the sample |
| 07/16/1997 | EP0784210A2 Apparatus for detecting trouble location in wire harnesses |
| 07/16/1997 | EP0784209A2 Method for detecting trouble location in wire harnesses and wire harness to be used in the method |
| 07/16/1997 | EP0784208A2 A system for testing a fault detecting means |
| 07/16/1997 | EP0784207A1 Lan tester |
| 07/16/1997 | EP0784206A2 Means for measuring the electric field |
| 07/16/1997 | EP0783705A1 Method and apparatus for automated wafer level testing and reliability data analysis |
| 07/16/1997 | EP0783703A1 Fault sensor device with radio transceiver |
| 07/16/1997 | CN2257925Y Electric power earthing safety operation indicator |
| 07/16/1997 | CN1154742A Electric vehicle propulsion system power bridge with built-in test |
| 07/16/1997 | CN1154478A Accelerative senser, method formfg. same and shock testing device utilizing the senser |
| 07/15/1997 | USRE35561 Method and apparatus for the detection and location of faults and partial discharges in shielded cables |
| 07/15/1997 | US5649150 Scannable last-in-first-out register stack |
| 07/15/1997 | US5648975 Method and device for generating test patterns for testing integrated circuit |
| 07/15/1997 | US5648974 System having multiple subsystems and test signal source resident upon common substrate |
| 07/15/1997 | US5648973 I/O toggle test method using JTAG |
| 07/15/1997 | US5648920 Method and apparatus for deriving total lateral diffusion in metal oxide semiconductor transistors |
| 07/15/1997 | US5648730 Large integrated circuit with modular probe structures |
| 07/15/1997 | US5648729 Board positioning method and apparatus of the methods |
| 07/15/1997 | US5648728 Method and apparatus for positioning a workpiece |
| 07/15/1997 | US5648726 Remotely accessible electrical fault detection |
| 07/15/1997 | US5648725 Device for treating magnet wire |
| 07/15/1997 | US5648723 Method and apparatus for separating and analyzing composite AC/DC waveforms |
| 07/15/1997 | US5648722 Apparatus and method for determining the state of an electrical switch within an HVAC system |
| 07/15/1997 | US5648717 Battery charge gauge with current integrator and method for guaging battery charge |
| 07/15/1997 | US5648661 Integrated circuit wafer comprising unsingulated dies, and decoder arrangement for individually testing the dies |
| 07/15/1997 | US5648275 Method for detecting defects in semiconductor insulators |
| 07/15/1997 | US5647750 Socket for a tape carrier package |
| 07/10/1997 | WO1997024913A1 Method of positioning ic and ic handler using the same |
| 07/10/1997 | WO1997024785A1 Conductive contactor |
| 07/10/1997 | WO1997024742A1 Method and apparatus for locating partial discharge in electrical transformers |
| 07/10/1997 | WO1997024670A1 Monitoring control device |
| 07/10/1997 | WO1997024624A1 Antenna adapter |
| 07/10/1997 | WO1997024623A1 Method and apparatus for combining writes to memory |
| 07/10/1997 | WO1997024622A1 I/o pin electronic circuit |
| 07/10/1997 | DE4007187C2 Integrierte Halbleiterschaltungseinrichtung A semiconductor integrated circuit device |
| 07/09/1997 | EP0783200A1 A method for charging a rechargeable battery |
| 07/09/1997 | EP0783170A1 Apparatus and method for the acquisition and analysis of a three-dimensional distribution of discrete points |
| 07/09/1997 | EP0782747A1 Memory with stress circuitry for detecting defects |
| 07/09/1997 | EP0689733B1 A method for determining a stator flux estimate for an asynchronous machine |
| 07/09/1997 | EP0480421B1 Testable RAM architecture in a microprocessor having embedded cache memory |
| 07/09/1997 | CN2257630Y Universal multifunction automatic charger |
| 07/09/1997 | CN1154161A Fault detection circuit for sensing leakage currents between power source and chassis |
| 07/08/1997 | US5646948 Apparatus for concurrently testing a plurality of semiconductor memories in parallel |
| 07/08/1997 | US5646865 Automotive diagnostic communications |
| 07/08/1997 | US5646813 Method and apparatus for reducing ESD during thermal shock testing |
| 07/08/1997 | US5646776 Compact specimen inspection station |
| 07/08/1997 | US5646567 Scan testable double edge triggered scan cell |
| 07/08/1997 | US5646547 Logic cell which can be configured as a latch without static one's problem |
| 07/08/1997 | US5646542 Probing adapter for testing IC packages |
| 07/08/1997 | US5646541 Apparatus and method for measuring circuit network |
| 07/08/1997 | US5646540 Apparatus and method for measuring electromagnetic ageing parameter of a circuit element and predicting its values |
| 07/08/1997 | US5646534 Battery monitor for electric vehicles |
| 07/08/1997 | US5646521 Analog channel for mixed-signal-VLSI tester |
| 07/08/1997 | US5646509 Battery capacity test and electronic system utilizing same |
| 07/08/1997 | US5646508 Battery pack having a processor controlled battery operating system |
| 07/08/1997 | US5646454 Electronic safety device for vehicle occupants including a memory device for storing fault conditions and associated control commands |
| 07/08/1997 | US5646422 Semiconductor integrated circuit device |
| 07/08/1997 | US5646406 Stroboscopic photometer |
| 07/08/1997 | US5645949 Battery cell having an internal circuit for controlling its operation |
| 07/08/1997 | US5645577 Connection indicator for medical device |
| 07/03/1997 | WO1997023827A1 Method for setting the operating mode of an integrated circuit and an integrated circuit |
| 07/03/1997 | WO1997023784A1 Machine for the electric test of printed circuits with adjustable position of the sound needles |
| 07/03/1997 | WO1997011590A3 Method of detecting the position and displacement of layers on multilayered circuit boards |
| 07/03/1997 | DE19652890A1 Delay time measuring method for generating random pulse sequence |
| 07/03/1997 | DE19651713A1 Sequential control comparator circuit for use with appliance test equipment |
| 07/03/1997 | DE19633700A1 Scanning path forming circuit supplying logic circuit as testing circuit |
| 07/03/1997 | DE19603107A1 Self pre-ageing circuit device for semiconductor memory e.g. application specific memory |
| 07/02/1997 | EP0782003A2 Means for EMC-testing electrical appliances |
| 07/02/1997 | EP0781457A1 Electrochemical cell label with integrated tester |
| 07/02/1997 | EP0781420A1 A circuit provided with facilities for i ddq?-testing of a bias generator |
| 07/02/1997 | EP0781419A1 Method and device for making connection |
| 07/02/1997 | EP0781216A1 Electronic safety device for motor vehicle passengers |
| 07/02/1997 | EP0757870A4 Self-powered powerline sensor |
| 07/02/1997 | EP0729584B1 Device for electrically testing an electrical connection member |