Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
03/1998
03/18/1998CN1176467A Method for testing semiconductor memory device and semiconductor memory device
03/17/1998US5729553 Semiconductor integrated circuit with a testable block
03/17/1998US5729158 Parametric tuning of an integrated circuit after fabrication
03/17/1998US5729151 System and method for testing a phase locked loop in an integrated circuit
03/17/1998US5729150 Low-current probe card with reduced triboelectric current generating cables
03/17/1998US5729149 Apparatus for holding a testing substrate in a semiconductor wafer tester and method for using the same
03/17/1998US5729145 Method and apparatus for detecting arcing in AC power systems by monitoring high frequency noise
03/17/1998US5729144 Systems and methods for determining location of a fault on an electric utility power distribution system
03/12/1998WO1998010297A1 Device and method to monitor sensors in vehicles
03/12/1998WO1998010269A1 Method and apparatus for imaging semiconductor device properties
03/12/1998WO1998002756A3 Method of and device for inspecting a PCB
03/12/1998WO1997043656A3 Wafer-level burn-in and test
03/12/1998DE19636821A1 Verfahren zur Prüfung elektrischer Bauteile und Vorrichtung zur Durchführung des Verfahrens A method for testing electrical components and apparatus for carrying out the method
03/12/1998DE19636443A1 Vorrichtung und Verfahren zur Überwachung von Sensoren in einem Fahrzeug Apparatus and method for monitoring sensors in a vehicle
03/12/1998DE19636384A1 Fault diagnosis device for automobile drive unit
03/12/1998DE19636338A1 Schaltungsanordnung zur Überwachung einer Elektronikauslöseeinrichtung für Niederspannungsschalter A circuit arrangement for monitoring an electronic tripping device for low-voltage switch
03/12/1998DE19636264A1 Diagnosis module for monitoring electric drives
03/12/1998DE19636193A1 Crystal quality determination method for semiconductor and solid state material
03/12/1998DE19635325A1 Constant temperature maintenance tank for handler used by IC tester
03/11/1998EP0828383A2 Electronic camera and battery voltage controlling method employed therein
03/11/1998EP0828332A1 Vacuum pump status evaluation system
03/11/1998EP0828257A2 Method and device for testing a memory circuit in a semiconductor device
03/11/1998EP0828163A1 Circuit with means to carry out a structural test without a dedicated test pin
03/11/1998EP0828162A2 Method and apparatus for terahertz imaging
03/11/1998EP0827608A1 Process for the computer-assisted measurement and testing of electric circuits, especially electronic modules, and testing station for implementing the process
03/11/1998EP0807259A4 Testable circuit and method of testing
03/11/1998EP0549949B1 Built-in self test circuit
03/11/1998EP0492609B1 Semiconductor device with voltage stress testing pads
03/11/1998CN1175751A Abnormality detecting device for phase advancing capacitor
03/11/1998CN1175695A Circuit and method for measuring propagation delay time of signal for measuring
03/11/1998CN1175694A Deterioration diagnosis method and device of electrical machine and apparatus
03/11/1998CN1037714C Method for measuring electric properties of battery
03/10/1998US5727021 Apparatus and method for providing a programmable delay with low fixed delay
03/10/1998US5727001 Circuit and method for testing an integrated circuit
03/10/1998US5727000 Signature analysis usage for multiple fault isolation
03/10/1998US5726999 Method and apparatus for universal programmable boundary scan driver/sensor circuit
03/10/1998US5726998 Partial scan path test of a semiconductor logic circuit
03/10/1998US5726997 Apparatus and method for testing of integrated circuits
03/10/1998US5726996 Process for dynamic composition and test cycles reduction
03/10/1998US5726995 Method and apparatus for selecting modes of an intergrated circuit
03/10/1998US5726994 Address multiplex semiconductor memory device for enabling testing of the entire circuit or for only partial components thereof
03/10/1998US5726920 Watchdog system having data differentiating means for use in monitoring of semiconductor wafer testing line
03/10/1998US5726911 Electric motor monitor
03/10/1998US5726905 Adaptive, on line, statistical method and apparatus for motor bearing fault detection by passive motor current monitoring
03/10/1998US5726636 Emergency telephone with automatic low-battery signaling
03/10/1998US5726580 Universal wafer carrier for wafer level die burn-in
03/10/1998US5726577 Apparatus for detecting and responding to series arcs in AC electrical systems
03/10/1998US5726576 Microwave sensor for detecting a discharge occurring in an electrical apparatus
03/10/1998US5726575 Path for acquiring a voltage pulse, and a method and a system for measuring partial discharges and provided with such a path
03/10/1998US5726574 Method of locating a fault in an electric power cable
03/10/1998US5726573 Test circuit for back-up battery with protection during test mode
03/10/1998US5726566 Apparatus for measuring an RF parameter
03/10/1998US5726556 Charging state display apparatus
03/10/1998US5726482 Device-under-test card for a burn-in board
03/10/1998US5726074 Method and apparatus for manufacturing semiconductor device
03/10/1998US5725995 Transistors and integrated circuits
03/05/1998WO1998009360A1 Circuit arrangement for monitoring of an electronic tripping device for low voltage switches
03/05/1998WO1998009220A1 Microprocessor subassembly
03/05/1998WO1998009177A1 Method of measurement for locating line faults on hvdc lines
03/05/1998WO1998001917A3 Accumulator and charging set for an accumulator
03/05/1998DE19736004A1 Device for detecting abnormalities in motor
03/05/1998DE19708003A1 Method of analysing failure or faults in measured semiconductor device
03/05/1998DE19636229A1 Method of determining degradation process in semiconductor lasers
03/05/1998DE19634366A1 Determining characteristic electric and mechanical parameters of asynchronous motor
03/05/1998DE19633922A1 Electronic component testing method, esp. for digital IC
03/04/1998EP0827266A2 High-side type motor current detecting circuit
03/04/1998EP0827249A2 Safety ground detector
03/04/1998EP0827192A2 Method of measuring carrier concentration of semiconductor, process of manufacturing semiconductor device and semiconductor wafer
03/04/1998EP0827157A2 Method and device for testing a semiconductor memory circuit
03/04/1998EP0827081A1 Testable sequential counter
03/04/1998EP0826974A2 Method and device for testing integrated circuits
03/04/1998EP0826973A2 Procedure for testing a multiple quantity of products
03/04/1998EP0826969A2 Substrate inspection apparatus and method therefore
03/04/1998EP0826649A1 Methods of making ferroelectric ceramic-polymer composites for voltage-variable dielectric tuning and structures using same
03/04/1998EP0826176A1 Integrated circuit arrangement
03/04/1998EP0826152A1 Method and apparatus for testing semiconductor dice
03/04/1998EP0825905A1 A method and device for sorting batteries
03/04/1998EP0731992A4 High-density interconnect technique
03/04/1998EP0727103B1 Apparatus for wiring a connector
03/04/1998EP0600594B1 Scan testing integrated circuits
03/04/1998CN2275719Y Contact protector for cell capacity detector
03/04/1998CN1175307A Top load socket for ball grid array devices
03/04/1998CN1175108A Charger
03/03/1998US5724645 Circuit for controlling a radio-frequency output voltage level and identifying the continuity of an inter facility link cable using a low frequency signal, and method thereof
03/03/1998US5724502 Test mode matrix circuit for an embedded microprocessor core
03/03/1998US5724387 Cable loss simulator for serial digital source using a passive network
03/03/1998US5724251 System and method for designing, fabricating and testing multiple cell test structures to validate a cell library
03/03/1998US5724248 Electronic device
03/03/1998US5724132 Extraneous substance inspection apparatus for patterned wafer
03/03/1998US5724055 Display apparatus and method of manufacture in which display luminance can be adjusted
03/03/1998US5724013 High-frequency integrated circuit
03/03/1998US5723990 Integrated circuit having high voltage detection circuit
03/03/1998US5723983 Method of evaluating semiconductor device without electrical influence of parasitic elements
03/03/1998US5723982 Apparatus for analyzing thin film property
03/03/1998US5723975 Apparatus and method for converting a voltage waveform into an optical signal
03/03/1998US5723875 Chip damage detecting circuit for semiconductor IC
03/03/1998US5723347 Semi-conductor chip test probe and process for manufacturing the probe
03/03/1998US5722514 Tray installation rack for test handler
02/1998
02/26/1998WO1998008292A1 Electric motor monitor
02/26/1998WO1998008257A1 Integrated circuit
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