Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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09/23/1997 | US5670884 Connector testing device |
09/23/1997 | US5670883 Integrated circuit interlevel conductor defect characterization test structure and system |
09/23/1997 | US5670871 Polymeric film electrooptic sensor device |
09/23/1997 | US5670867 Current sensing circuit |
09/23/1997 | US5670429 Process of conveying an encapsulated electronic component by engaging an integral resin projection |
09/23/1997 | US5669987 Abnormality detection method, abnormality detection apparatus, and solar cell power generating system using the same |
09/23/1997 | US5669774 Ball grid array socket |
09/23/1997 | CA2069858C Circuit for measuring battery current |
09/18/1997 | WO1997034309A1 Device and method for monitoring a mechanism provided with a sucking coil |
09/18/1997 | WO1997034161A1 Method for monitoring of tap changers by acoustic analysis |
09/18/1997 | WO1997034160A1 Locating a fault in an electrical power cable |
09/18/1997 | WO1997034159A1 A method and a device for space-charge measurement in cables using a pulsed electroacoustic method |
09/18/1997 | WO1997034157A1 Fuse programmable for preventing a semiconductor device from operating |
09/18/1997 | WO1997034156A1 Apparatus for measuring parameters of an electronic device |
09/18/1997 | DE4445311C2 Zeitsignal-Erzeugungsschaltung Timing signal generating circuit |
09/18/1997 | DE4244901C2 Impact determination unit for gas cushion systems with detector unit |
09/18/1997 | DE19709234A1 Diagnosis of electrolytic capacitor in vehicle airbag auxiliary power supply |
09/18/1997 | DE19632457C1 Switching circuit for function monitoring for vehicle wheel RPM measuring sensor |
09/18/1997 | CA2200276A1 Single operation detecting apparatus for a distributed power supply |
09/18/1997 | CA2200275A1 Single operation detecting apparatus for a distributed power supply |
09/17/1997 | EP0795756A2 Procedure for estimating the life span of a power semiconductor element |
09/17/1997 | EP0795222A1 Process for detecting a ground fault in an electric energy transmission line |
09/17/1997 | EP0795200A1 Mounting electronic components to a circuit board |
09/17/1997 | CN2262711Y Transformer loss intelligent tester |
09/17/1997 | CN1159586A Method of measuring delay time and random pulse train generating circuit used in such method |
09/16/1997 | US5668983 Precise stopping of a high speed microprocessor clock |
09/16/1997 | US5668819 Mask control device for LSI tester |
09/16/1997 | US5668818 System and method for scan control of a programmable fuse circuit in an integrated circuit |
09/16/1997 | US5668771 Programmable logic array integrated circuits |
09/16/1997 | US5668745 Method useful in a computer system |
09/16/1997 | US5668492 Integrated circuit clocking technique and circuit therefor |
09/16/1997 | US5668482 Bus maintenance circuit |
09/16/1997 | US5668470 Automatic testing system for magnetoresistive heads |
09/16/1997 | US5668312 Portable apparatus for testing electronic engine control systems |
09/16/1997 | US5668032 Active matrix ESD protection and testing scheme |
09/16/1997 | US5667538 Electrochromic thin film state-of-charge detector for on-the-cell application |
09/16/1997 | US5667300 Non-contact photothermal method for measuring thermal diffusivity and electronic defect properties of solids |
09/16/1997 | US5667077 For handling assembled multiple chip modules |
09/12/1997 | WO1997033370A1 Temperature-compensated driver circuit |
09/12/1997 | WO1997033180A1 Probe for fault actuation devices |
09/12/1997 | WO1997033159A1 Process and device for radioscopically inspecting soldered points in electronic units |
09/12/1997 | WO1997021085A3 Electric monitoring of cables and the like for detecting damages thereof |
09/12/1997 | CA2248315A1 Probe for fault actuation devices |
09/11/1997 | DE19714173A1 Automatic testing unit for 4=wire leads and indicator of results |
09/11/1997 | DE19633711A1 Semiconductor component testing system |
09/11/1997 | DE19608710A1 Semiconductor chip in measuring system aligning and positioning apparatus |
09/11/1997 | DE19608126A1 Testing unit for testing DC series motors or generators |
09/10/1997 | EP0794495A2 Automated analysis of a model-based diagnostic system |
09/10/1997 | EP0794438A2 Electronic equipment with residual battery quantity display function and methods of displaying the residual battery quantity |
09/10/1997 | EP0794437A2 Apparatus for inspecting a structure comprising a probe to be inserted through a gap in the structure |
09/10/1997 | EP0793862A1 Smart battery device |
09/10/1997 | EP0793807A1 Method and device for testing of electronic components |
09/10/1997 | EP0793591A1 Method of detecting an inoperable pump motor in an anti-lock braking system |
09/10/1997 | CN2262246Y Automatic detecting and warning device for vehicle lamp bulb |
09/10/1997 | CN1159278A Antenna and feeder cable tester |
09/10/1997 | CN1159227A Semiconductor device tester and semiconductor device testing system |
09/10/1997 | CN1158814A Semiconductor device transporting and handling apparatus |
09/09/1997 | US5666368 System and method for testing the operation of registers in digital electronic systems |
09/09/1997 | US5666077 Method and apparatus for detecting an operating voltage level in an integrated circuit |
09/09/1997 | US5666075 Electronic circuit comprising a comparator |
09/09/1997 | US5666071 Device and method for programming high impedance states upon select input/output pads |
09/09/1997 | US5666065 In an automotive supplemental inflatable restraint system |
09/09/1997 | US5666062 Voltage measuring using electro-optic material's change in refractive index |
09/09/1997 | US5666060 Test method and apparatus for testing a protective relay system |
09/09/1997 | US5666049 Semiconductor testing apparatus, semiconductor testing circuit chip, and probe card |
09/09/1997 | US5666029 Fluorescent emergency ballast self test circuit |
09/09/1997 | US5665905 Calibration standard for 2-D and 3-D profilometry in the sub-nanometer range and method of producing it |
09/09/1997 | US5665610 Semiconductor device checking method |
09/08/1997 | CA2171267A1 Glass coated pipe system and testing method |
09/05/1997 | CA2170914A1 Light and device indicating presence of electricity circulating in a circuit |
09/04/1997 | WO1997032367A1 Method for producing a connection of data transmission lines, and plug connector |
09/04/1997 | WO1997032220A1 Method of and circuit for testing an electrical actuator drive stage |
09/04/1997 | WO1997012310A3 Digital trimming of on-chip analog components |
09/04/1997 | DE19607795A1 Method for detecting ionising contaminants in electronic components |
09/04/1997 | DE19607698A1 Electrical check for firm connection between plug halves |
09/04/1997 | DE19607534A1 Verfahren zur Herstellung einer Verbindung von Datenübertragungsleitungen und Steckerverbinder A process for preparing a compound of data transmission lines and plug connector |
09/03/1997 | EP0793345A1 Pseudo-NMOS or PMOS inverter |
09/03/1997 | EP0793300A2 Pin connector, pin connector holder and packaging board for mounting electronic component |
09/03/1997 | EP0793112A1 Fault location arrangement in an enclosed rigid line and fault location method therefor |
09/03/1997 | EP0793111A2 Malfunction diagnosis system and method for on-vehicle electronic control units |
09/03/1997 | EP0793110A2 Method for measuring an electronic object with a network analyser |
09/03/1997 | EP0793107A2 Apparatus for triggering alarms and waveform capture in an electric power system |
09/03/1997 | EP0793104A2 Electrical system monitoring apparatus with programmable custom display |
09/03/1997 | EP0792519A1 Interconnection elements for microelectronic components |
09/03/1997 | EP0792517A1 Electrical contact structures from flexible wire |
09/03/1997 | EP0792486A1 Test apparatus/method for level sensitive scan designs |
09/03/1997 | EP0792465A1 A device for sensing of electric discharges in a test object |
09/03/1997 | EP0792463A1 Mounting spring elements on semiconductor devices, and wafer-level testing methodology |
09/03/1997 | EP0792462A1 Probe card assembly and kit, and methods of using same |
09/03/1997 | EP0792450A1 Variable volume test chamber |
09/03/1997 | EP0705439B1 Process and device for testing an integrated circuit soldered on a board |
09/03/1997 | EP0402134B1 Delay fault testing apparatus |
09/03/1997 | CN2261629Y Acoustic and optic alarm for fuse break-off and emergent switching-on device |
09/02/1997 | US5663991 Integrated circuit chip having built-in self measurement for PLL jitter and phase error |
09/02/1997 | US5663970 Circuit and method for testing frequencies |
09/02/1997 | US5663968 Margin test method and apparatus for intergrated services digital networks |
09/02/1997 | US5663967 Method of isolating a defect in an integrated circuit device |
09/02/1997 | US5663966 System and method for minimizing simultaneous switching during scan-based testing |
09/02/1997 | US5663718 Device for the automatic testing of joints in electrical high voltage lines |
09/02/1997 | US5663657 For measuring photovoltage/reflectivity of a semiconductor surface |