G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
12/1997
12/03/1997	EP0810446A2 Method of testing module interconnections
12/03/1997	EP0810445A1 Method for the screen effectiveness determination of a part of a shielded cable
12/03/1997	EP0810444A1 Diagnosys circuit for possible faults during the driving phase of an electric load by a bridge stage
12/03/1997	EP0809809A1 Apparatus with rechargeable batteries and a device for calculating and indicating the number of remaining use sessions of the apparatus
12/03/1997	EP0809808A1 Method of determining an earth-fault current
12/03/1997	EP0755521B1 Process for checking the efficiency of an electric power station component
12/03/1997	EP0745015A4 Multi-wavelength laser optic system for probe station and laser cutting
12/03/1997	CN1166876A Method and device for testing of electronic components
12/03/1997	CN1166711A Electronic apparatus having function of displaying battery residual quantity and method for displaying battery residual quantity
12/03/1997	CN1166602A Method of monitoring electrical wear on selector switch disconnectors in high voltage station
12/02/1997	US5694444 Testable high count counter
12/02/1997	US5694403 System and method for sequential vector compaction in the presence of multiple three-state busses
12/02/1997	US5694401 Fault isolation using pseudo-random scan
12/02/1997	US5694399 Interface circuit
12/02/1997	US5694333 System and method for performing more efficient window context switching in an instrumentation system
12/02/1997	US5694331 Method for expressing and restoring image data
12/02/1997	US5694201 Control device for controlling a plurality of image forming apparatuses
12/02/1997	US5694063 For determining a quiescent power supply current of a device under test
12/02/1997	US5694052 Method and system for analysis and evaluation of semiconductor circuit performance characteristic
12/02/1997	US5694051 Inspecting transistors in an inverter circuit
12/02/1997	US5694049 For testing devices having leads
12/02/1997	US5694048 Monitor-detector assembly on silicon wafer board
12/02/1997	US5694047 Method and system for measuring antifuse resistance
12/02/1997	US5694044 Simultaneous surge test of two coils of an assembly of series connected coils
12/02/1997	US5694043 Connector checking device
12/02/1997	US5694024 Battery charger
12/02/1997	US5694021 System for executing charge control of a secondary battery and detecting the capacitance thereof
12/02/1997	US5694020 Battery powered electrical shaver or hair cutter
12/02/1997	US5693982 Semiconductor device socket
11/1997
11/27/1997	WO1997044859A1 Connectors for microelectronic elements
11/27/1997	WO1997044678A1 Fast vector loading for automatic test equipment
11/27/1997	WO1997044676A1 Microelectronic contact structure and method of making same
11/27/1997	WO1997044652A1 Detecting a bad cell in a storage battery
11/27/1997	DE19721313A1 Test specimen critical dimension measurement system for e.g. semiconductor manufacture
11/27/1997	DE19638324A1 Test system for operator controlled testing of electrical equipment of vehicle
11/27/1997	DE19626984C1 Verfahren zur rechnergestützten Ermittlung einer Systemzusammenhangsfunktion A method for computer-aided determination of a system relationship function
11/27/1997	DE19620073A1 Testing process for carbon brushes of electrical commutator machinery
11/26/1997	EP0809342A1 Arrangement for controlling the charge of a modular assembly of electrochemical cells connected in series and corresponding module for measuring the cells
11/26/1997	EP0809328A2 Electrical interconnect contact system
11/26/1997	EP0809255A2 Shift register cell
11/26/1997	EP0809199A2 Clock skew insensitive scan chain reordering
11/26/1997	EP0809116A1 Process and appliance for localising and determining faults in a cable
11/26/1997	EP0808462A1 Measuring system for enclosed high-voltage switchgear
11/26/1997	EP0808461A1 Jtag testing of buses using plug-in cards with jtag logic mounted thereon
11/26/1997	EP0808459A1 Top load socket for ball grid array devices
11/26/1997	EP0556894B1 A method for testing an integrated circuitry and an integrated circuit having a plurality of functional components and having junction/switch test components in interconnecting channels between functional components
11/26/1997	CN2268940Y Testing apparatus for seizure of underground motor
11/26/1997	CN1165955A Earthing fault monitoring method for high voltage line
11/25/1997	US5691991 Process for identifying defective interconnection net end points in boundary scan testable circuit devices
11/25/1997	US5691990 Hybrid partial scan method
11/25/1997	US5691940 Method and apparatus for programmable current limits
11/25/1997	US5691926 Integrated test tools for portable computer
11/25/1997	US5691814 Position measuring instrument
11/25/1997	US5691763 Terminated cable portion inspection device for stripped terminal crimping machine
11/25/1997	US5691742 Software battery gauge for portable computers
11/25/1997	US5691650 Apparatus for coupling a semiconductor device with a tester
11/25/1997	US5691649 Carrier having slide connectors for testing unpackaged semiconductor dice
11/25/1997	US5691648 Method and apparatus for measuring sheet resistance and thickness of thin films and substrates
11/25/1997	US5691643 Ground fault detecting apparatus and method for detecting ground fault of field circuit and exciting circuit by detecting ground fault current flowing from ground to neutral point of exciting circuit
11/25/1997	US5691624 Method and apparatus for detecting a full-charge condition while charging a battery
11/25/1997	US5691621 Battery pack having a processor controlled battery operating system
11/25/1997	US5691611 Abnormality detecting system and abnormality detecting method for rotor position detection means, and motor control system
11/25/1997	US5691570 Semiconductor device
11/25/1997	US5691544 Apparatus for obtaining three-dimensional data from multiple parts or devices in a multi-pocketed tray
11/25/1997	US5691210 Method for fabrication of probe structure and circuit substrate therefor
11/25/1997	US5691078 Remaining battery capacity meter and method for computing remaining capacity
11/25/1997	US5690467 IC tray handling apparatus
11/25/1997	US5690281 For mounting an electric part
11/20/1997	WO1997043813A1 Timing adjustment circuit for semiconductor test system
11/20/1997	WO1997043659A1 Network component diagnosis, using modelling by bands
11/20/1997	WO1997043658A1 Reusable die carrier for burn-in and burn-in process
11/20/1997	WO1997043657A1 Bus system and method of diagnosing subscribers interconnected via said bus-system
11/20/1997	WO1997043656A2 Wafer-level burn-in and test
11/20/1997	WO1997043654A1 Microelectronic spring contact elements
11/20/1997	WO1997043653A1 Contact tip structures for microelectronic interconnection elements and methods of making same
11/20/1997	WO1997043652A1 Probe needle
11/20/1997	DE3844960C2 Diagnostic connector for electrically driven pump
11/20/1997	DE19628366C1 Voltage monitoring circuit for monitoring connection of battery to electronic equipment contg. microcontroller supplied from voltage supply via buffer capacitor
11/20/1997	DE19619441A1 Bus-System und Verfahren zur Diagnose von über das Bus-System miteinander verbundenen Teilnehmern Bus system and method for the diagnosis of interconnected via the bus system participants
11/20/1997	DE19619347A1 Locating method for shorting to earth in electric networks, e.g. in photovoltaic generators
11/19/1997	EP0807826A2 Pilot cell for a battery
11/19/1997	EP0807259A1 Testable circuit and method of testing
11/19/1997	EP0807258A1 Test device for flat electronic assemblies
11/19/1997	EP0719431B1 Scan test circuit using fast transmission gate switch
11/19/1997	EP0679295A4 Load analysis system for fault detection.
11/19/1997	EP0471540B1 A semiconductor memory with a flag for indicating test mode
11/19/1997	CN1165560A Device for sensing of electric discharges in a test object
11/19/1997	CN1165416A Device for testing connectors
11/19/1997	CN1165401A Testing apparatus for non-packaged semiconductor chip
11/18/1997	US5689690 Timing signal generator
11/18/1997	US5689689 Clock circuits for synchronized processor systems having clock generator circuit with a voltage control oscillator producing a clock signal synchronous with a master clock signal
11/18/1997	US5689517 Apparatus for scannable D-flip-flop which scans test data independent of the system clock
11/18/1997	US5689516 Reset circuit for a programmable logic device
11/18/1997	US5689515 High speed serial data pin for automatic test equipment
11/18/1997	US5689466 Built in self test (BIST) for multiple RAMs
11/18/1997	US5689429 Finger wear detection for production line battery tester
11/18/1997	US5689345 Apparatus for testing amplifier for electromechanical gravure engraving machine
11/18/1997	US5689341 LCD panel test system
11/18/1997	US5689194 Acoustic motor current signature analysis system with audio amplified speaker output
11/18/1997	US5689193 For inspecting electrical properties of an object

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